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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2

Natural sunlight accelerated weathering of photovoltaic modules

Photovoltaic modules are exposed to the equivalent of ten years of sunlight aging in an accelerated exposure testing and evaluation program, the objective being to determine the long-term durability characteristics of flat plate modules in comparatively short periods of time. The modules are illuminated with concentrated sunlight in a large, sun-tracking, Fresnel-reflecting solar concentrator. The effects of the accelerated exposure are assessed by performing periodic visual inspections and electrical measurements. It is found that field-experienced failure modes are duplicated, that acceleration factors of 6x to 8x are readily attainable, and that the test method is feasible as a predictive tool for photovoltaic module lifetime durability.

Zerlaut, G. A.↗

Corrosion detection and evaluation

Report details comprehensive study of nondestructive methods for detecting and/or evaluating up to six different types of corrosion: general, galvanic filiform, pitting, intergranular, and stress. Studied methods include: visual/optical inspection, radiography, penetrant inspection, analysis by polarized light, electrical conductivity measurements, pH analysis, and ultrasonic inspection.

Kammerer, C. C.↗

Bubble-domain circuit wafer evaluation coil set

Coil structures have been designed to permit nondestructive testing of bubble wafers. Wafers can be electrically or optically inspected and operated from quasi-static frequency to maximum device operating frequency.

Chen, T. T.↗

Micro-focus X-ray imaging

The acceptance of surface mounting in the electronics industry has been slowed by problems with component availability, electrical testing, and inspection. Industry suppliers and users have been working to solve these problems, and they are easing. Component manufacturers are offering substantially more devices in surface mountable packages. Automated test equipment vendors are offering test fixtures for surface mount circuit boards. And just recently, solder connection inspection has been automated through a partership effort with a major electronics manufacturer. The results achieved in this effort are presented.

Juha, Michael↗

Detectors Ensure Function, Safety of Aircraft Wiring

Pedro Medelius waited patiently in his lab at Kennedy Space Center. He had just received word that a colleague was bringing over a cable from a Space Shuttle solid rocket booster to test Medelius new invention. Medelius was calm until his colleague arrived, with about 30 other people. "Talk about testing under pressure," says Medelius. "There were people there from the Navy, the Air Force, and the Federal Aviation Administration." After the group s arrival, Medelius took a deep breath and connected his Standing Wave Reflectometer (SWR) to the cable. He wiggled the cable around, and the display showed a fault (a short or open circuit in wire) about an inch and a half inside the connector on the cable. His colleague questioned the results, because he had already checked that area on the cable. Medelius used the SWR to check again but got the same result. "That is when we took the cable apart and looked inside," Medelius says. "Lo and behold, that was exactly where the fault was." The impetus for Medelius new wire inspection technology came about in 1999 when one of the space shuttles lost power due to a fault somewhere in its more than 200 miles of electrical wiring. "The backup circuit was activated and prevented a major dysfunction, but nevertheless, there was a problem with the wiring," Medelius describes. Even though technicians used a device called a multimeter to measure the electrical current to find which wire had a fault, it could not pinpoint exactly where on the wire the fault was located. For that, technicians had to visually inspect the wire. "Sometimes they would have to remove the whole wire assembly and visually inspect every single wire. It was a very tedious operation because the wires are behind cabinets. They go all over the place in the shuttle," says Medelius. "NASA needed an instrument capable of telling them exactly where the faults were occurring." To meet NASA s needs for a highly precise device to inspect electrical power bundles, wires, and connectors, Medelius devised the SWR. "It came down to what was affected when a wire is short circuited or opened," he says. "We worked out a few equations based on physical principles." The SWR proved very sensitive, and the technology was patented.

Source record↗

Quasi-Static Electric Field Generator

A generator for producing an electric field for with an inspection technology system is provided. The generator provides the required variable magnitude quasi-static electric fields for the "illumination" of objects, areas and volumes to be inspected by the system, and produces human-safe electric fields that are only visible to the system. The generator includes a casing, a driven, non-conducting and triboelectrically neutral rotation shaft mounted therein, an ungrounded electrostatic dipole element which works in the quasi-static range, and a non-conducting support for mounting the dipole element to the shaft. The dipole element has a wireless motor system and a charging system which are wholly contained within the dipole element and the support that uses an electrostatic approach to charge the dipole element.

Generazio, Edward R.↗

An Electron Backscatter Diffraction (EBSD)-Based Automated Tool for Ceramic Capacitor Grain Size Analysis

Ceramic capacitors continue to be recurring problem parts for NASA, despite best efforts to screen out potential defects and failures through environmental and electrical testing and nondestructive inspection techniques such as acoustic microscopy. The physical properties of ceramic capacitors necessitates thin dielectric layers capable of withstanding significant electric fields. Any defects in those ceramic layers can result in reduced insulation resistance failure modes including short circuit failures, so the quality and consistency of the dielectric material is critical. The size of the individual ceramic grains in the dielectric material is a critical parameter. However, judging “grain size” is not so simple—in a single capacitor there can be wide variation in grain sizes observed. It is theorized that by studying the grain size distributions of “known good” and “known bad” lots of capacitors, some conclusions could be drawn that would allow us to better predict to the reliability of future lots based on grain size distributions. The initial goal of this effort was to find or develop an automated tool that could inspect a capacitor and return grain size distribution results.

Robert Hodson↗

Influence of Fiber Content, Thermal Cycles and Creep on Electrical Resistivity Measurements of SiCf/SiC Minicomposites

Fiber-reinforced Ceramic Matrix Composites (CMCs) are currently being used in high-temperature applications such as jet engine components. In such extreme environment applications, materials are exposed to many mechanical and thermal loading cycles during the life of the component. This exposure can degrade the component, and thus, components need to be monitored and inspected during service. The electrical resistivity nondestructive evaluation technique has been shown to be very sensitive to damage in CMCs, and although its performance is highly dependent on temperature, this temperature-dependence is still not well understood. Therefore, this current study aims to establish the influence of thermal cycles, creep, CVI-SiC matrix cracks and fiber volume fraction on the electrical resistance of Hi Nicalon and Hi-Nicalon Type S SiC fiber-reinforced minicomposites with BN interphases. Minicomposites with 97% CVI-SiC matrix volume fraction were used to characterize the electrical resistivity of the CVI-SiC matrix. Next, models were constructed to calculate fiber resistivity and onset and evolution of damage during tensile testing at room-temperature. The thermal cycles were achieved by heating as-received and precracked specimens to 1200°C and then cooling them to room temperature, with or without applied stress on fibers.

creep↗

Taking the Heat: Handling the Shuttle's RCC Wing Panels

Innovative inspection technology was developed to inspect the Reinforced Carbon-Carbon (RCC) wing panels on the vehicle, thus eliminating need to remove/reinstall all 44 RCC panels for inspections per processing flow. Manually holding inspection tools up to the RCC panels was a 3-person job with high risk of personnel injury and flight hardware damage. To further enhance ergonomics, reduce personnel/flight hardware risks, and improve repeatability, an inspection cart and fixture were constructed to physically secure the instruments for Inspectors during 652 inspection points per flow. The electric lift used to handle RCCs was also utilized to raise the heavy, bulky inspection equipment up to the wing leading edge.

Stegles, Katrine S.↗

Accelerated degradation of silicon metallization systems

Clemson University has been engaged for the past five years in a program to determine the reliability attributes of solar cells by means of accelerated test procedures. The cells are electrically measured and visually inspected and then subjected for a period of time to stress in excess of that normally encountered in use, and then they are reinspected. Changes are noted and the process repeated. This testing has thus far involved 23 different unencapsulated cell types from 12 different manufacturers, and 10 different encapsulated cell types from 9 different manufacturers. Reliability attributes of metallization systems can be classified as major or minor, depending on the severity of the effects observed. As a result of the accelerated testing conducted under the Clemson program, major effects have been observed related to contact resistance and to mechanical adherence and solderability. This paper does not attempt a generalized survey of accelerated test results, but rather concentrates on one particular attribute of metallization that has been observed to cause electrical degradation - increased contact resistance due to Schottky barrier formation. In this example basic semiconductor theory was able to provide an understanding of the electrical effects observed during accelerated stress testing.

Lathrop, J. W.↗

Checking Fits With Digital Image Processing

Computer-aided video inspection of mechanical and electrical connectors feasible. Report discusses work done on digital image processing for computer-aided interface verification (CAIV). Two kinds of components examined: mechanical mating flange and electrical plug.

Davis, R. M.↗

Electric Potential and Electric Field Imaging with Applications

The technology and techniques for remote quantitative imaging of electrostatic potentials and electrostatic fields in and around objects and in free space is presented. Electric field imaging (EFI) technology may be applied to characterize intrinsic or existing electric potentials and electric fields, or an externally generated electrostatic field may be used for (illuminating) volumes to be inspected with EFI. The baseline sensor technology, electric field sensor (e-sensor), and its construction, optional electric field generation (quasistatic generator), and current e-sensor enhancements (ephemeral e-sensor) are discussed. Demonstrations for structural, electronic, human, and memory applications are shown. This new EFI capability is demonstrated to reveal characterization of electric charge distribution, creating a new field of study that embraces areas of interest including electrostatic discharge mitigation, crime scene forensics, design and materials selection for advanced sensors, dielectric morphology of structures, inspection of containers, inspection for hidden objects, tether integrity, organic molecular memory, and medical diagnostic and treatment efficacy applications such as cardiac polarization wave propagation and electromyography imaging.

Generazio, Ed↗

FAST Observations of Acceleration Processes in the Cusp--Evidence for Parallel Electric Fields

The existence of precipitating keV ions in the Earth's cusp originating at the magnetosheath provide unique means to test our understanding of particle acceleration and parallel electric fields in the lower altitude acceleration region. On numerous occasions, the FAST (The Fast Auroral Snapshot) spacecraft has encountered the Earth's cusp regions near its apogee of 4175 km which are characterized by their signatures of dispersed keV ion injections. The FAST instruments also reveal a complex microphysics inherent to many, but not all, of the cusp regions encountered by the spacecraft, that include upgoing ion beams and conics, inverted-V electrons, upgoing electron beams, and spikey DC-coupled electric fields and plasma waves. Detailed inspection of the FAST data often show clear modulation of the precipitating magnetosheath ions that indicate that they are affected by local electric potentials. For example, the magnetosheath ion precipitation is sometimes abruptly shut off precisely in regions where downgoing localized inverted-V electrons are observed. Such observations support the existence of a localized process, such as parallel electric fields, above the spacecraft which accelerate the electrons downward and consequently impede the precipitating ion precipitation. Other acceleration events in the cusp are sometimes organized with an apparent cellular structure that suggests Alfven waves or other large-scale phenomena are controlling the localized potentials. We examine several cusp encounters by the FAST satellite where the modulation of energetic session on acceleration particle populations reveals evidence of localized acceleration, most likely by parallel electric fields.

Pfaff, R. F.. Jr.↗

Post-Test Inspection of NASA's Evolutionary Xenon Thruster Long-Duration Test Hardware: Discharge Chamber

The NEXT Long-Duration Test is part of a comprehensive thruster service life assessment intended to demonstrate overall throughput capability, validate service life models, quantify wear rates as a function of time and operating condition, and identify any unknown life-limiting mechanisms. The test was voluntarily terminated in February 2014 after demonstrating 51,184 hours of high-voltage operation, 918 kg of propellant throughput, and 35.5 MN-s of total impulse. The post-test inspection of the thruster hardware began shortly afterwards with a combination of non-destructive and destructive analysis techniques, and is presently nearing completion. This paper presents relevant results of the post-test inspection for the discharge chamber as well as other miscellaneous components such as the high-voltage propellant isolators and electrical cabling. Comparison of magnetic field measurements taken during pretest and post-test inspections indicate that the field strength did not degrade, consistent with performance data obtained during the test. Inspection of discharge chamber mesh samples show a deposition coating primarily composed of grid material that is approximately 15 micrometers in thickness. This thickness is well within the retention capability of the mesh and is therefore not expected to present any issues. Approximately 3.1 grams of deposition flakes were found at the bottom of the discharge chamber, composed primarily of grid material and carbon. Calculated size histograms of these flakes indicate that 99% have a maximum dimension of 200 micrometers or smaller, which is significantly less than the ion optics grid gap. Larger flakes that are capable of causing a grid-to-grid short will be analyzed to determine if their formation will occur in flight or is a facility effect. The high-voltage propellant isolators as well as numerous other electrical insulators were inspected and no evidence of arcing or any other issues were found.

Electric Propulsion↗

Post-test Inspection of NASA’s Evolutionary Xenon Thruster Long-Duration Test Hardware: Discharge Chamber

The NEXT Long-Duration Test is part of a comprehensive thruster service life assessment intended to demonstrate overall throughput capability, validate service life models, quantify wear rates as a function of time and operating condition, and identify any unknown life-limiting mechanisms. The test was voluntarily terminated in February 2014after demonstrating 51,184 hours of high-voltage operation, 918 kg of propellant throughput, and 35.5 MN-s of total impulse. The post-test inspection of the thruster hardware began shortly afterwards with a combination of non-destructive and destructive analysis techniques, and is presently nearing completion. This paper presents relevant results of the post-test inspection for the discharge chamber as well as other miscellaneous components such as the high-voltage propellant isolators and electrical cabling. Comparison of magnetic field measurements taken during pretest and post-test inspections indicate that the field strength did not degrade, consistent with performance data obtained during the test. Inspection of discharge chamber mesh samples show a deposition coating primarily composed of grid material that is approximately 15 μm in thickness. This thickness is well within the retention capability of the mesh and is therefore not expected to present any issues. Approximately 3.1 grams of deposition flakes were found at the bottom of the discharge chamber, composed primarily of grid material and carbon. Calculated size histograms of these flakes indicate that 99% have a maximum dimension of 200 μm or smaller, which is significantly less than the ion optics grid gap. Larger flakes that are capable of causing a grid-to-grid short will be analyzed to determine if their formation will occur in flight or is a facility effect. The high-voltage propellant isolators as well as numerous other electrical insulators were inspected and no evidence of arcing or any other issues were found.

Rohit Shastry↗

Magnetic field mapper

Magnetic field mapper locates imperfections in cadmium sulphide solar cells by detecting and displaying the variations of the normal component of the magnetic field resulting from current density variations. It can also inspect for nonuniformities in other electrically conductive materials.

Masters, R. M.↗