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Results for “ELECTRONIC EQUIPMENT TESTING”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2

All sources NASA NTRS DOE OSTI

NASA NTRS1965

Components and sub-assemblies SNAP 8 radiation effects test program, volume III

Irradiation testing of electronic components and subassemblies in Radiation Effects Reactor

MATERIALS TESTING REACTOR↗

NASA NTRS1966

LEM electronics reliability.

Lunar Excursion Module /LEM/ reliability program, discussing engineering, manufacturing and techniques of design and qualification testing of electronic components

QUALITY CONTROL↗

NASA NTRS1967

Desensitizing of microcircuits to variations in temperature and production spread. Phase III - Computer aided sensitivity analysis

Desensitizing microcircuits to variations in temperature and performance parameters - computer aided sensitivity analysis

MICROCIRCUIT↗

NASA NTRS1967

Pegasus detector system evaluation tool Final report

Test tool to simulate critical portions of Pegasus meteoroid detector electronics

TEST EQUIPMENT↗

NASA NTRS1967

Desensitizing of microcircuits to variations in temperature and production spread. Phase IV - Tolerance in performance criteria due to production spread of parameters

Desensitizing microcircuits to variations in temperature and production spread - tolerance in performance criteria due to production spread of parameters

TEST METHOD↗

NASA NTRS1965

Research achievements review series no. 10

Improvements in space vehicle stage checkout, structural nondestructive testing, and electronic component testing within quality control program

CHECKOUT EQUIPMENT↗

NASA NTRS1967

Adaptation of models for minority-carrier devices to integrated circuits

Adaptation of models for minority carrier devices, and applicability in computer design evaluation studies of integrated circuits

ELECTRONIC EQUIPMENT TESTING↗

NASA NTRS1966

The electronic checkout and integration of Orbiting Geophysical Observatory experiments.

Electronic checkout, environmental qualification and integration of OGO by spacecraft simulator and performance analysis system

ENVIRONMENTAL TESTING↗

NASA NTRS1967

Automatic integrated circuit test equipment.

Automatic high speed IC test equipment and procedure

AUTOMATIC CONTROL↗

NASA NTRS1966

Study of failure and reliability in microelectronic devices Fifth quarterly report, Sep. - Nov. 1966

Microelectronic device life tests and failure mechanisms

MICROELECTRONICS↗

NASA NTRS1967

Integrated circuits in action. IV.

Postmortem flaw detection methods and equipment for IC failure analysis

TEST EQUIPMENT↗

NASA NTRS1965

Novel probe simplifies electronic component testing

Test probe, in conjunction with standard equipment, tests axial-lead electronic components in their original packages. The probe can be modified to test any electronic component with automatic or nonautomatic equipment.

Syner, W. F.↗

NASA NTRS1966