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22 records · Page 2

Telescope Alignment From Sparsely Sampled Wavefront Measurements Over Pupil Subapertures

Alignment of two-element telescopes is a classic problem. During recent integration and test of the Space Interferometry Mission s (SIM s) Astrometric Beam Combiner (ABC), the innovators were faced with aligning two such telescope subsystems in the presence of a further complication: only two small subapertures in each telescope s pupil were accessible for measuring the wavefront with a Fizeau interferometer. This meant that the familiar aberrations that might be interpreted to infer system misalignments could be viewed only over small sub-regions of the pupil, making them hard to recognize. Further, there was no contiguous surface of the pupil connecting these two subapertures, so relative phase piston information was lost; the underlying full-aperture aberrations therefore had an additional degree of ambiguity. The solution presented here is to recognize that, in the absence of phase piston, the Zygo measurements primarily provide phase tilt in the subaperture windows of interest. Because these windows are small and situated far from the center of the (inaccessible) unobscured full aperture, any aberrations that are higher-order than tilt will be extremely high-order on the full aperture, and so not necessary or helpful to the alignment. Knowledge of the telescope s optical prescription allows straightforward evaluation of sensitivities (subap mode strength per unit full-aperture aberration), and these can be used in a predictive matrix approach to move with assurance to an aligned state. The technique is novel in every operational way compared to the standard approach of alignment based on full-aperture aberrations or searching for best rms wavefront. This approach is closely grounded in the observable quantities most appropriate to the problem. It is also more intuitive than inverting full phase maps (or subaperture Zernike spectra) with a ray-tracing program, which must certainly work in principle, but in practice met with limited success. Even if such classical alignment techniques became practical, the techniques reported here form a reassuringly transparent and intuitive check on the course of the alignment with very little computational effort.

Bloemhof, Eric E.↗

The Fourier-Kelvin Stellar Interferometer Mission Concept

The Fourier-Kelvin Stellar Interferometer (FKSI) is a mission concept for an imaging interferometer for the mid-infrared spectral region (5-30 microns). FKSI is conceived as a scientific and technological precursor to TPF as well as Space Infrared Interferometric Telescope (SPIRIT), Submillimeter Probe Evolution of Cosmic Structure (SPECS), and Single Aperture for Infrared Observatory (SAFIR). It will also be a high angular resolution system complementary to Next Generation Space Telescope (NGST). The scientific emphasis of the mission is on the evolution of protostellar systems, from just after the collapse of the precursor molecular cloud core, through the formation of the disk surrounding the protostar, the formation of planets in the disk, and eventual dispersal of the disk material. FKSI will also search for brown dwarfs and Jupiter mass and smaller planets, and could also play a very powerful role in the investigation of the structure of active galactic nuclei and extra-galactic star formation. We are in the process of studying alternative interferometer architectures and beam combination techniques, and evaluating the relevant science and technology tradeoffs. Some of the technical challenges include the development of the cryocooler systems necessary for the telescopes and focal plane array, light and stiff but well-damped truss systems to support the telescopes, and lightweight and coolable optical telescopes. The goal of the design study is to determine if a mid-infrared interferometry mission can be performed within the cost and schedule requirements of a Discovery class mission. At the present time we envision the FKSI as comprised of five one meter diameter telescopes arranged along a truss structure in a linear non-redundant array, cooled to 35 K. A maximum baseline of 20 meters gives a nominal resolution of 26 mas at 5 microns. Using a Fizeau beam combination technique, a simple focal plane camera could be used to obtain both Fourier and spectral data simultaneously for a given orientation of the array. The spacecraft will be rotated to give sufficient Fourier data to reconstruct complex images of a broad range of astrophysical sources.

Danchi, W. C.↗

Stitching interferometry for ellipsoidal x-ray mirrors

Ellipsoidal mirrors, which can efficiently produce a two-dimensional focusing beam with a single mirror, are superior x-ray focusing optics, especially when compared to elliptical-cylinder mirrors in the Kirkpatrick–Baez geometry. However, nano-focusing ellipsoidal mirrors are not commonly used for x-ray optics because achieving the accuracy required for the surface metrology of nano-focusing ellipsoidal mirrors is difficult due to their small radius of curvature along the short ellipsoidal axis. Here, we developed a surface metrology system for nano-focusing ellipsoidal mirrors using stitching interferometric techniques. The developed system simultaneously measures sub-aperture shapes with a microscopic interferometer and the tilt angles of the sub-aperture shapes with a large Fizeau interferometer. After correcting the systematic errors included in the sub-aperture shapes, the entire mirror shape is calculated by stitching the sub-aperture shapes based on the obtained relative angles between partially overlapped sub-apertures. In this study, we developed correction methods for systematic errors in sub-aperture shapes that originated from off-axis aberrations produced in the optics of the microscopic interferometer. The systematic errors on an ellipsoidal mirror were estimated by measuring a series of tilted plane substrates and the ellipsoidal substrate. From measurements of an ellipsoidal mirror with a 3.6-mm radius of curvature at the mirror center, we obtained a measurement repeatability of 0.51 nm (root-mean-square) in an assessment area of 0.5 mm × 99.18 mm. This value satisfies the requirements for surface metrology of nano-focusing x-ray mirrors. Thus, the developed metrology system should be applicable for fabricating nano-focusing ellipsoidal mirrors.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Introduction to the Sub-pixel Spatial Resolution Interferometry Process

In this paper we describe a method called "Sub-Pixel Spatial Resolution Interferometry" used to increase the spatial resolution of interferometric measurements of precision optical surfaces. In this process, multiple interferometric measurements are made as the optic under test (or the CCD array)in shifted at sub-pixel increments. The measurements are then combined to construct a measurement with higher spatial resolution than the original measurements. The process will be described and initial results obtained using this process with a commercially available Fizeau interferometer will be presented.

Mooney, James T.↗