Search NASA⌕ Search

SEARCH · Search NASA

Results for “ID”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 37 records · Page 2

INL CRMO XRF Report 2025-02: Provenance Determinations for 1,124 Projectile Points from Lands and Collections Managed by the U.S. Department of Energy-Idaho Operations Office (DOE-ID)

This report presents provenance determinations for 1,124 obsidian and fine-grained volcanic (FGV) projectile points from lands and collections managed by the U.S. Department of Energy-Idaho Operations Office (DOE-ID). These determinations were made using energy-dispersive X-ray fluorescence (ED-XRF) spectrometry at the Idaho National Laboratory (INL) Cultural Resource Management Office (CRMO) under the direction of Dr. Kyle Freund.

58 GEOSCIENCES↗

Remote ID for Rapid Assessment of Flight and Vehicle Information

The ability to rapidly identify UAS (Unmanned Aircraft Systems) in the field has emerged as a critical need for the integration of small UASs into the national airspace and counter-UAS operations. This paper proposes an architecture for rapid retrieval of UAS information leveraging NASA's current Unmanned Aircraft System (UAS) Traffic Management (UTM) system. The proposed architecture utilizes UTM components: FIMS (Flight Information Management System), USS (UAS Service Supplier), and vehicle registration and model database in order to provide assessment of the UAS reported in the field including the ability to distinguish between participating and non- participating UTM actors. Detailed system descriptions are provided and preliminary results from field tests conducted during UTM TCL (Technical Capability Level) 3 are discussed. It is found that 94 percent of the remote ID look-ups were successful. The average time of a look-up is found to be 1.2 seconds. Failure cases are examined and recommendations on next steps to advance UAS remote identification are provided.

USS (UAS Service Supplier)↗

Pair density wave and s ± id superconductivity in a strongly coupled lightly doped Kondo insulator

Here, we investigate the large Kondo coupling limit of the Kondo-Heisenberg model on one- and two-dimensional lattices. Focusing on the possible superconducting states when slightly doping the Kondo insulator state, we identify different pairing modes to be most stable in different parameter regimes. Possibilities include uniform s-wave, pair-density-wave with momentum π (in both one and two dimensions) and uniform s ± id x 2 -y 2 wave (in two dimensions). We attribute these exotic pairing states to the presence of various pair-hopping terms with a "wrong'' sign in the effective model, a mechanism that is likely universal for inducing pairing states with spatially modulated pair wavefunctions.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

High-energy-resolution inelastic X-ray scattering spectrometer at beamline 30-ID of the Advanced Photon Source

Inelastic X-ray scattering is a powerful and versatile technique for studying lattice dynamics in materials of scientific and technological importance. In this article, the design and capabilities of the momentum-resolved high-energy-resolution inelastic X-ray spectrometer (HERIX) at beamline 30-ID of the Advanced Photon Source are reported. The instrument operates at 23.724 keV and has an energy resolution of 1.3–1.7 meV. It can accommodate momentum transfers of up to 72 nm -1 , at a typical X-ray flux of 4.5 × 10 9 photons s -1 meV -1 at the sample. A suite of in situ sample environments are provided, including high pressure, static magnetic fields and uniaxial strains, all at high or cryogenic temperatures.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗

Combining Laue diffraction with Bragg coherent diffraction imaging at 34-ID-C

Measurement modalities in Bragg coherent diffraction imaging (BCDI) rely on finding a signal from a single nanoscale crystal object which satisfies the Bragg condition among a large number of arbitrarily oriented nanocrystals. However, even when the signal from a single Bragg reflection with ( hkl ) Miller indices is found, the crystallographic axes on the retrieved three-dimensional (3D) image of the crystal remain unknown, and thus localizing in reciprocal space other Bragg reflections becomes time-consuming or requires good knowledge of the orientation of the crystal. Here, the commissioning of a movable double-bounce Si (111) monochromator at the 34-ID-C endstation of the Advanced Photon Source is reported, which aims at delivering multi-reflection BCDI as a standard tool in a single beamline instrument. The new instrument enables, through rapid switching from monochromatic to broadband (pink) beam, the use of Laue diffraction to determine crystal orientation. With a proper orientation matrix determined for the lattice, one can measure coherent diffraction patterns near multiple Bragg peaks, thus providing sufficient information to image the full strain tensor in 3D. The design, concept of operation, the developed procedures for indexing Laue patterns, and automated measuring of Bragg coherent diffraction data from multiple reflections of the same nanocrystal are discussed.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗

AMX – the highly automated macromolecular crystallography (17-ID-1) beamline at the NSLS-II

The highly automated macromolecular crystallography beamline AMX/17-ID-1 is an undulator-based high-intensity (>5 × 10 12 photons s −1 ), micro-focus (7 µm × 5 µm), low-divergence (1 mrad × 0.35 mrad) energy-tunable (5–18 keV) beamline at the NSLS-II, Brookhaven National Laboratory, Upton, NY, USA. It is one of the three life science beamlines constructed by the NIH under the ABBIX project and it shares sector 17-ID with the FMX beamline, the frontier micro-focus macromolecular crystallography beamline. AMX saw first light in March 2016 and started general user operation in February 2017. At AMX, emphasis has been placed on high throughput, high capacity, and automation to enable data collection from the most challenging projects using an intense micro-focus beam. Here, the current state and capabilities of the beamline are reported, and the different macromolecular crystallography experiments that are routinely performed at AMX/17-ID-1 as well as some plans for the near future are presented.

36 MATERIALS SCIENCE↗

Laser, vacuum and gas reaction chamber for operando measurements at NSLS-II's 28-ID-2

We present a laser reaction chamber that we have developed for in situ/operando X-ray diffraction measurements at the NSLS-II 28-ID-2 X-ray powder diffraction beamline. This chamber allows for rapid and dynamic sample heating under specialized gas environments, spanning ambient conditions down to vacuum pressures. We demonstrate the capabilities of this setup through two applications: laser-driven heating in polycrystalline iron oxide and in single-crystal WTe 2 . Our measurements reveal the ability to resolve chemical reaction kinetics over minutes with 1 s time resolution. This setup advances opportunities for in situ/operando X-ray diffraction studies of both bulk and single-crystal materials.

36 MATERIALS SCIENCE↗

Sequence ID Map (SeqIDMap) v1.0

This is a web service that allows users to request an identifier for a sequence in a specific database, given another identifier for the same sequence with respect to another given database. This process is called ID mapping. It's a minimalist service (fast, no database server) that will be significantly easier to use in a container environment.

Johnson, Jeffrey↗

HEX 2-piece ID Absorber: Steady and Transient Thermal FEA

Radiation fans from Insertion Devices and Bending Magnets are “trimmed” by various water-cooled absorbers located strategically downstream of those sources. Mostly, the absorber surfaces onto which power is deposited are constructed from Glidcop Al-15 (rarely OFHC copper). On the basis of Tech Note 327 a re-design for improved thermal performance has evolved to a two-piece ID Absorber configuration; one between dipole chamber and quadrupole, another after the sextupole, each with reduced incident angle. The ring’s Active Interlock (AI) system protects against overheating by disabling mis-steered beam within an allotted time. SRP (Synchrotron Radiation Protection) protocol has a limiting maximum allowable temperature of 100*C at any point when subject to mis-steered beam for a fixed period before AI activation. After 0.2 msec, radiation exceeding +/- 0.5mm offset and +/- 0.25 mrad angular error from the HEX SCW will trip in fault. AI specification allows 1.0 msec to fully dump the electron beam.

36 MATERIALS SCIENCE↗

Mixed Material Scintillator Systems Particle ID Modelling Report

AMixed-Material Scintillator System (MMSS) is a radiation detector using a scintillator made of a heterogeneous, structured mixture of two or more materials. MMSSs are designed so that the structured mixing of materials encodes properties of the radiation detected in the scintillator. This allows for new radiation detectors with advantages over detectors using traditional homogeneous scintillators. This report contains results from this project’s second task, to model and quantify the promise of the MMSSs invented earlier in the project. Those inventions have been divided into two categories, and this report focuses on the first category: MMSS inventions the use zones of differently-colored scintillators to detect and characterize neutron sources. We call this category particle-ID, or PID, detectors. Inventions using gradients designed to encode the position of radiation interactions using gradients will be discussed in a future report.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

Dose Measurement and Monte Carlo FLUKA simulations for the FE and FOE of the 27-ID HEX Beamline

The 27-ID High Energy Engineering X-ray Scattering (HEX) beamline, commissioned in 2024, operates within the Hard X-ray Scattering and Spectroscopy program at Brookhaven Lab’s National Synchrotron Light Source II (NSLS-II). The high energy spectrum at the HEX beamline extends up to several hundred keV, making it well suited for applications such as imaging large engineering samples, including fully assembled batteries, fuel cells, etc.

43 PARTICLE ACCELERATORS↗

Fine wavelength id for tunable laser local oscillators

A wavelength ID device which consists of an electronic show that the etalon has a finesse F 30 which is maintainable for several days. These tests also demonstrate that the etalon system is capable of resonance frequency stability during similar time periods. With currently available coatings, this level of performance is achievable over an optical bandwidth delta lambda = 3 micrometers centered at lambda = 10 micrometers.

Savage, M. G.↗

ID wafering technology

Improvements in ID saws leading to lower costs for producing silicon wafers for solar cells are described. The relationships between crystal size and blade size and between the length of time it takes to slice a wafer and wafer thickness are discussed. The influence of ingot production methods on wafering performance is considered. A cost sensitivity analysis of slicing a 10 cm square ingot and economic analyses of slicing a four inch and a six inch ingot are presented. A wafering cost model based on the IPEG 2 is given.

Aharonyan, P.↗

Minimum silicon wafer thickness for ID wafering

An analytical model, based on fracture mechanics analysis, is proposed for estimating the minimum wafer thickness as a function of the diameter requirement for solar cells. The conditions under which the model can be applied are discussed with reference to the critical flaw size, the applied force, and the width of the side support. It is shown that the equivalent cantilever force applied during ID slicing can be estimated from the wafering mechanical yield data. The width of the wafer side support was found to be a significant factor in controlling the minimum allowable wafer thickness during slicing. Wafer side support width requirements were found to increase with decreasing wafer thickness.

Chen, C. P.↗

Minimum wafer thickness by rotated ingot ID wafering

The efficient utilization of materials is critical to certain device applications such as silicon for photovoltaics or diodes and gallium-gadolinium-garnet for memories. A variety of slicing techniques has been investigated to minimize wafer thickness and wafer kerf. This paper presents the results of analyses of ID wafering of rotated ingots based on predicted fracture behavior of the wafer as a result of forces during wafering and the properties of the device material. The analytical model indicated that the minimum wafer thickness is controlled by the depth of surface damage and the applied cantilever force. Both of these factors should be minimized. For silicon, a minimum thickness was found to be approximately 200 x 10 - 6th m for conventional sizes of rotated ingot wafering. Fractures through the thickness of the wafer rather than through the center supporting column were found to limit the minimum wafer thickness. The model suggested that the use of a vacuum chuck on the wafer surface to enhance cleavage fracture of the center supporting core and, with silicon, by using 111-line-type ingots could have potential for reducing minimum wafer thickness.

Chen, C. P.↗