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At least 37 records · Page 2

Portable reflectometer.

Portable integrating sphere reflectometer, describing optical system, construction, etc

Finkel, M. W.

A Computer Aided Broad Band Impedance Matching Technique Using a Comparison Reflectometer

An improved broadband impedance matching technique was developed. The technique is capable of resolving points in the waveguide which generate reflected energy. A version of the comparison reflectometer was developed and fabricated to determine the mean amplitude of the reflection coefficient excited at points in the guide as a function of distance, and the complex reflection coefficient of a specific discontinuity in the guide as a function of frequency. An impedance matching computer program was developed which is capable of impedance matching the characteristics of each disturbance independent of other reflections in the guide. The characteristics of four standard matching elements were compiled, and their associated curves of reflection coefficient and shunt susceptance as a function of frequency are presented. It is concluded that an economical, fast, and reliable impedance matching technique has been established which can provide broadband impedance matches.

Gordy, R. S.

X-ray reflectometer for optical efficiency and scatter measurements

An instrument has been developed to determine the reflection efficiency and scatter characteristics of optical samples at X-ray wavelengths from 1.5 to 113 A. The reflectometer operates in an oil-free vacuum chamber and measures the reflection efficiency and scatter characteristics as a function of the angle of incidence. The reflection efficiency is given for 8.34-A radiation incident on a fused silica sample finished to a flatness of one-tenth of a wavelength. The experimental reflection efficiency is compared with the theoretical data. The scatter curves are given for the direct X-ray beam and for the beam reflected from the fused silica sample at an angle of incidence of 50 arcmin. The full-width-at-half-maximum (FWHM) resolution of the instrument is approximately 13 arcsec, as determined by a least-squares smoothing of the experimental data.

Reynolds, J. M.

Automated data acquisition and processing for a Hohlraum reflectometer

A computer and data acquisition board were used to automate a Perkin-Elmer Model 13 spectrophotometer with a Hohlraum reflectivity attachment. Additional electronic circuitry was necessary for amplification, filtering, and debouncing. The computer was programmed to calculate spectral emittance from 1.7 to 14.7 micrometers and also total emittance versus temperature. Automation of the Hohlraum reflectometer reduced the time required to determine total emittance versus temperature from about three hours to about 40 minutes.

Difilippo, Frank

An analysis of the effects of secondary reflections on dual-frequency reflectometers

The error-producing mechanism involving secondary reflections in a dual-frequency, distance measuring reflectometer is examined analytically. Equations defining the phase, and hence distance, error are derived. The error-reducing potential of frequency-sweeping is demonstrated. It is shown that a single spurious return can be completely nullified by optimizing the sweep width.

Hearn, C. P.

System and Method for Optical Frequency Domain Reflectometer

Systems, methods, and devices of the various embodiments enable mitigation of the effects of birefringence in Optical Frequency Domain Reflectometer (OFDR) sensing fiber. Various embodiments enable the measurement of the polarization state of the light in a sensing fiber throughout the entire sensing cable in a highly distributed manner typical of OFDR systems. Various embodiments enable the production of a distributed fiber birefringence measurement throughout the length of an OFDR sensing fiber. Various embodiments may enable OFDR to be 100% polarization diverse, meaning that polarization effects in the fiber optic cables and sensing fiber do not negatively effect measurements. Additionally, the highly distributed measurement of the polarization state and related birefringence in a sensing fiber of the various embodiments may enable new types of measurements such as pressure, twisting, and bending along the sensing fiber.

Moore, Jason P.

The Lunar Flashlight CubeSat Instrument: A Compact SWIR Laser Reflectometer to Quantify and Map Water Ice on the Surface of the Moon

The Lunar Flashlight (LF) mission will send a CubeSat to lunar orbit via NASA’s Space Launch System (SLS) test flight. The LF spacecraft will carry a novel instrument to quantify and map water ice harbored in the permanently shadowed craters of the lunar South Pole. The LF instrument, an active multi-band reflectometer which employs four high power diode lasers in the 1-2 μm infrared band, will measure the reflectance of the lunar surface near water ice absorption peaks. We present the detailed instrument design and system engineering required to deploy this instrument within very demanding CubeSat resource allocations.

Shelton, Jacob

Lunar Flashlight Science Ground and Flight Measurements and Operations Using a Multi-band Laser Reflectometer

The Lunar Flashlight cubesat mission was designed and flown to collect new data on the abundance and distribution of water ice frost in lunar permanently shadowed regions (PSRs) using active laser spectroscopy. Key advantages of active spectroscopy are that it can collect surface reflectance data in locations and conditions where passive spectroscopy cannot operate, specifically nightside locations where no indirect lighting is available, and in the deepest parts of PSRs where indirect lighting may be too faint for passive spectroscopy. Lunar Flashlight launched in 2022 but because of a propulsion system failure, did not make it to the Moon to conduct its science investigation. However, Lunar Flashlight proved to be an extremely successful technology demonstration mission, meeting or exceeding all its technology-focused mission goals, including demonstrating its instrument functionality. This paper describes the extensive ground and test campaigns to characterize the Lunar Flashlight laser reflectometer instrument and its planned utility for science observations, along with recommendations for future instrument design, development, verification, and use.

Moon

Special purpose reflectometer uses modified ulbricht sphere

Modified Ulbricht sphere measures stray radiation caused by irregularities in the reflective surface of an optical test specimen. The test specimen is positioned between a light source and exit port and all diffusely scattered radiation is measured by a photomultiplier tube in the sphere.

Gorstein, M.