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Results for “Single Event Effect (SEE) testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS1997

Antifuse FPGA for Space Applications

This paper presents viewgraphs of Antifuse FPGA (Field Programmable Gate Array) for Space Applications. The topics include: 1) A32140DX TID Test; 2) A1280XL Proton Test; 3) SEU (Single Event Upsets) Rate Calculation; 4) Recent Products Test; 5) A1460A TID (Traveling Ionospheric Disturbances) Test; 6) I100 Proton Test; 7) 100/RHI100 SEU Test; 8) I100/RH100 TID Test; 9) A1020S TID Test; 10) TID Charge Pump Failure; 11) Radiation Testing; and SEE (Single Event Effects) Test Setup.

Wang, Jih-Jong↗
NASA NTRS2019

Proton Testing of nVidia Jetson TX2

Single-Event Effects (SEE) testing was conducted on the nVidia Jetson TX2 System on Chip (SOC). Testing was conducted at Massachusetts General Hospital's (MGH) Francis H. Burr Proton Therapy Center on June 2nd, 2019.

System on Chip (SOC)↗
NASA NTRS2008

Phillips SA8016BW 2.5 GHz Synthesizer SEE Testing

This viewgraph presentation reviews the Single Event Effects (SEE) testing of the Phillips SA8016BW 2.5 GHz Synthesizer that was chose by the GLAST Program for Frequency Generation. Included in this are diagrams of the phased-locked loop (PLL), the synthesizer, and heater.

Carts, Marty↗
NASA NTRS2019

Proton Testing of AMD Ryzen 3 1200 Microprocessors

Single-Event Effects (SEE) testing was conducted on the AMD Ryzen 3 1200 microprocessor. Testing was conducted at Massachusetts General Hospital's (MGH) Francis H. Burr Proton Therapy Center on June 2nd, 2019.

single event functional interrupt (SEFI)↗
NASA NTRS2019

Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

The goal of this study was to perform an independent investigation of single event destructive and transient susceptibility of the Microsemi RTG4 device. The devices under test were the Microsemi RTG4 field programmable gate array (FPGA) Rev C. The devices under test will be referenced as the DUT or RTG4 Rev C throughout this document. The DUT was configured to have various test structures that are geared to measure specific potential susceptibilities of the device. DesignDevice susceptibility was determined by monitoring the DUT for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) was checked throughout heavy-ion testing by monitoring device current.

Field Programmable Gate Array (FPGA)↗
NASA NTRS2004

Virtex-II Pro SEE Test Methods and Results

The objective of this coarse Single Event Effect (SEE) test is to determine the suitability of the commercial Virtex-II Pro family for use in spaceflight applications. To this end, this test is primarily intended to determine any Singe Event Latchup (SEL) susceptibilities for these devices. Secondly, this test is intended to measure the level of Single Event Upset (SEU) susceptibilities and in a general sense where they occur. The coarse SEE test was performed on a commercial XC2VP7 device, a relatively small single processor version of the Virtex-II Pro. As the XC2VP7 shares the same functional block design and fabrication process with the larger Virtex-II Pro devices, the results of this test should also be applicable to the larger devices. The XC2VP7 device was tested on a commercial Virtex-II Pro development board. The testing was performed at the Cyclotron laboratories at Texas A&M and Michigan State Universities using ions of varying energy levels and fluences.

Petrick, David↗
NASA NTRS2017

An Improved SEL Test of the ADV212 Video Codec

Single-event effect (SEE) test data is presented on the Analog Devices ADV212. Focus is given to the test setup used to improve data quality and validate single-event latchup (SEL) protection circuitry.

Single-event effect (SEE); microelectronic devices↗
NASA NTRS2017

An Improved SEL Test of the ADV212 Video Codec

Single-event effect (SEE) test data is presented on the Analog Devices ADV212. Focus is given to the test setup used to improve data quality and validate single-event latch-up (SEL) protection circuitry.

Single-event effect (SEE); microelectronic devices↗
NASA NTRS2019

Proton Testing of AMD e9173 GPU

Single-Event Effects (SEE) testing was conducted on the AMD e9173 Graphics Processor Unit (GPU). Testing was conducted at Massachusetts General Hospital's (MGH) Francis H. Burr Proton Therapy Center.

Single-Event Effects (SEE)↗
NASA NTRS2011

Recent Power MOSFET Test Results

The results of recent Single Event Effect (SEE) testing of newly available power MOSFETS are presented.

radiation hard power solutions↗
NASA NTRS2017

Considerations for GPU SEE Testing

This presentation will discuss the considerations an engineer should take to perform Single Event Effects (SEE) testing on GPU devices. Notable topics will include setup complexity, architecture insight which permits cross platform normalization, acquiring a reasonable detail of information from the test suite, and a few lessons learned from preliminary testing.

NASA Electronic Parts and Packaging (NEPP) Program↗
NASA NTRS2017

Proton Testing of nVidia Jetson TX1

Single-Event Effects (SEE) testing was conducted on the nVidia Jetson TX1 System on Chip (SOC); herein referred to as device under test (DUT). Testing was conducted at Massachusetts General Hospitals (MGH) Francis H. Burr Proton Therapy Center on October 16th, 2016 using 200MeV protons. This testing trip was purposed to provide a baseline assessment of the radiation susceptibility of the DUT as no previous testing had been conducted on this component.

Proton testing↗
NASA NTRS2017

Proton Testing of nVidia GTX 1050 GPU

Single-Event Effects (SEE) testing was conducted on the nVidia GTX 1050 Graphics Processor Unit (GPU); herein referred to as device under test (DUT). Testing was conducted at Massachusetts General Hospitals (MGH) Francis H. Burr Proton Therapy Center on April 9th, 2017 using 200-MeV protons. This testing trip was purposed to provide a baseline assessment of the radiation susceptibility of the DUT as no previous testing had been conducted on this component.

Proton testing↗
NASA NTRS2018

Proton Testing of nVidia GTX 1050 GPU, Part 2

Single-Event Effects (SEE) testing was conducted on the nVidia GTX 1050 Graphics Processor Unit (GPU); herein referred to as device under test (DUT). Testing was conducted at Massachusetts General Hospital's (MGH) Francis H. Burr Proton Therapy Center on April 28th, 2018 using 200-MeV protons. This testing trip was purposed to provide additional radiation susceptibility data from payloads compiled in Q3FY18. While not all radiation-induced errors are critical, the effects on the application need to be considered. More so, failure of the device and an inability to reset itself should be considered detrimental to the application. Radiation effects on electronic components are a significant reliability issue for systems intended for space.

Single-Event Effects (SEE)↗
NASA NTRS2019

Proton Testing of AMD Ryzen 3 2200G Microprocessors

Single-Event Effects (SEE) testing was conducted on the AMD Ryzen 3 2200G microprocessor with integrated graphics. Testing was conducted at Massachusetts General Hospital's (MGH) Francis H. Burr Proton Therapy Center on June 2nd, 2019.

radiation tesing↗