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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

Binary pseudo-random array standards for calibration of 3D optical surface profilers used for metrology with significantly curved x-ray optics

High-accuracy metrology is vitally important in manufacturing ultra-high-quality free-form mirrors designed to manipulate X-ray light with nanometer-scale wavelengths. The current capabilities and possibility for improvements in X-ray mirror manufacturing are limited by inherent imperfections of the integrated metrology tools. In the case of Fizeau interferometry, metrology tools are currently calibrated with super-polished flat test-standard/reference mirrors. This is acceptable for measuring slightly curved X-ray optics. However, for even moderately curved aspherical X-ray mirrors the flat-reference calibration is not sufficiently accurate and stitching Fizeau interferometer-based surface metrology is used to mitigate the problem. But still, the retrace and aberration errors, as well as the limited spatial resolution, described with the instrument transfer function (ITF), can be transferred into the optical surface topography of X-ray mirrors obtained in stitching metrology. For ITF calibration, we have developed an original technique, based on test standards structured as two-dimensional (2D) highly-randomized (HR) binary pseudo-random arrays (BPRAs). The technique employs the unique properties of the HR BPRA patterns in the spatial frequency domain., i.e. the inherent 2D power spectral density of the HR BPRA pattern has a deterministic white-noise-like character that allows direct determination of the ITF with uniform sensitivity over the entire spatial frequency range and field-of-view of an instrument. Here, we explore technological, metrological, and analytical aspects essential for calibration of the retrace and aberration errors of Fizeau interferometers using different types of tilted test samples, including a super-polished reference mirror for the re-trace calibration and the uniformly redundant array (URA) BPRA standards for the geometrical distortion (aberration) calibration. While the first method was previously demonstrated by researchers at DIAMOND Light Source, a method based on the URA BPRA is described and demonstrated here for the first time. We outline the design and fabrication process used in fabrication of URA BPRA test standards, and present the results of application of the URA BPRA standards demonstrating the high efficacy of our approach to geometrical distortion calibration of Fizeau interferometers. We also discuss the possible sources of unexpected peculiarities of the systematic errors, including an astigmatic character of the retrace error, observed with Fizeau interferometers at the Advanced Light Source X-Ray Optics Laboratory.

Munechika, Keiko↗
NASA NTRS2008

Metrology - Beyond the Calibration Lab

We rely on data from measurements every day; a gas-pump, a speedometer, and a supermarket weight scale are just three examples of measurements we use to make decisions. We generally accept the data from these measurements as "valid." One reason we can accept the data is the "legal metrology" requirements established and regulated by the government in matters of commerce. The measurement data used by NASA, other government agencies, and industry can be critical to decisions which affect everything from economic viability, to mission success, to the security of the nation. Measurement data can even affect life and death decisions. Metrology requirements must adequately provide for risks associated with these decisions. To do this, metrology must be integrated into all aspects of an industry including research, design, testing, and product acceptance. Metrology, the science of measurement, has traditionally focused on the calibration of instruments, and although instrument calibration is vital, it is only a part of the process that assures quality in measurement data. For example, measurements made in research can influence the fundamental premises that establish the design parameters, which then flow down to the manufacturing processes, and eventually impact the final product. Because a breakdown can occur anywhere within this cycle, measurement quality assurance has to be integrated into every part of the life-cycle process starting with the basic research and ending with the final product inspection process. The purpose of this paper is to discuss the role of metrology in the various phases of a product's life-cycle. For simplicity, the cycle will be divided in four broad phases, with discussions centering on metrology within NASA. .

Mimbs, Scott M.↗
NASA NTRS2018

LUVOIR Primary Mirror Segment Alignment Control With Joint Laser Metrology and Segment Edge Sensing

An approach is developed for the alignment and stability maintenance of the LUVOIR segmented primary mirror using a segment state estimation and wavefront control method based on a hybrid segment motion sensing architecture of laser truss metrology and segment edge sensors. Our current computer model was generated for LUVOIR Architecture Option A with a 15-meter aperture, 120segment primary mirror. The methodology and simulation results will be presented and analyzed. JPL has a long history of technology development in laser metrology and edge sensors, including work in SIM [7], Keck and TMT [8], CCAT [3] and LUVOIR [1]. We will discuss our current efforts of LUVOIR laser metrology and edge-sensor models development, showing sensitivities of sensor measurements to various mirror eigenmodes, removing global modes and strengthening weak modes by performing joint (hybrid) laser-metrology and edge sensing. We will define and derive an important performance metric called wavefront error multiplier (WEM), and show that WEM provides a simple link between sensor errors and the closed-loop (controlled) system wavefront error. We will show WEM values for several hybrid sensor configuration options studied. We will discuss an algorithm for mirror shape control and maintenance through segment state and wavefront estimations using joint edge-metrology sensing. We will compare simulated performance of mirror state estimation, wavefront estimation and wavefront control based on joint edge-metrology sensing among several sensor configurations, and show the impact of sensor error distributions on the segmented mirror alignment performance. Mirror shape control performance will be also be evaluated in terms of imaging contrast between inner working angles (IWA) and outer working angles (OWA) of a LUVOIR coronagraph. The research was carried out at the Jet Propulsion Laboratory, California Institute of Technology, under a contract with the National Aeronautics and Space Administration. LUVOIR is a mission concept under study for the next astronomy Decadal Survey—the information presented in this paper is pre-decisional and is provided for planning and discussion purposes only.

Shelton, Chris↗
NASA NTRS2002

Optical metrology for Starlight Separated Spacecraft Stellar Interferometry Mission

We describe a high-precision inter-spacecraft metrology system designed for NASA 's StarLight mission, a space-based separated-spacecraft stellar interferometer. It consists of dual-target linear metrology, based on a heterodyne interferometer with carrier phase modulation, and angular metrology designed to sense the pointing of the laser beam and provides bearing information. The dual-target operation enables one metrology beam to sense displacement of two targets independently. We present the current design, breadboard implementation of the Metrology Subsystem in a stellar interferometer testbed and the present state of development of flight qualifiable subsystem components.

metrology stellar interferometry formation flying↗
NASA NTRS2008

Range-Gated Metrology: An Ultra-Compact Sensor for Dimensional Stabilization

Point-to-point laser metrology systems can be used to stabilize large structures at the nanometer levels required for precision optical systems. Existing sensors are large and intrusive, however, with optical heads that consist of several optical elements and require multiple optical fiber connections. The use of point-to-point laser metrology has therefore been limited to applications where only a few gauges are needed and there is sufficient space to accommodate them. Range-Gated Metrology is a signal processing technique that preserves nanometer-level or better performance while enabling: (1) a greatly simplified optical head - a single fiber optic collimator - that can be made very compact, and (2) a single optical fiber connection that is readily multiplexed. This combination of features means that it will be straightforward and cost-effective to embed tens or hundreds of compact metrology gauges to stabilize a large structure. In this paper we describe the concept behind Range-Gated Metrology, demonstrate the performance in a laboratory environment, and give examples of how such a sensor system might be deployed.

laser metrology↗
NASA NTRS2015

The Development of a Deflectometer for Accurate Surface Figure Metrology

Marshall Space Flight Center is developing the method of direct fabrication for high resolution full-shell x-ray optics. In this technique the x-ray optics axial profiles are figured and polished using a computer-controlled ZeekoIRP600X polishing machine. Based on the Chandra optics fabrication history about one third of the manufacturing time is spent on moving a mirror between fabrication and metrology sites, reinstallation and alignment with either the metrology or fabrication instruments. Also, the accuracy of the alignment significantly affects the ultimate accuracy of the resulting mirrors. In order to achieve higher convergence rate it is highly desirable to have a metrology technique capable of in situ surface figure measurements of the optics under fabrication, so the overall fabrication costs would be greatly reduced while removing the surface errors due to the re-alignment necessary after each metrology cycle during the fabrication. The goal of this feasibility study is to demonstrate if the Phase Measuring Deflectometry can be applied for in situ metrology of full shell x-ray optics. Examples of the full-shell mirror substrates suitable for the direct fabrication

X-ray optics metrology↗
DOE OSTI2020

Super-resolution surface slope metrology of x-ray mirrors

We present experimental, analytical, and numerical methods developed for reconstruction (deconvolution) of one-dimensional (1D) surface slope profiles over the spatial frequency range where the raw data are significantly perturbed due to the limited resolution of the measurement instrument. We characterize the spatial resolution properties of a profiler with the instrument's transfer function (ITF). To precisely measure the ITF, we apply a recently developed method utilizing test surfaces with 1D linear chirped height profiles of constant slope amplitude. Based on the results of the ITF calibration, we determine parameters of an analytical model for the ITF that is used in the original reconstruction software. Here, we treat surface slope metrology data obtained with the Optical Surface Measuring System (OSMS), using as a sensor an electronic autocollimator (AC) ELCOMAT-3000. The spatial resolution of the OSMS is limited by the size of the AC light-beam-collimating aperture. For the purposes of this investigation, the OSMS is equipped with a circular aperture with a diameter of 2.5 mm. This is a typical arrangement of most AC-based slope profilers developed for surface slope metrology of state-of-the-art x-ray mirrors. Using the example of surface slope metrology of two state-of-the-art elliptically shaped x-ray focusing mirrors, we demonstrate that the developed data reconstruction procedure allows us to significantly improve the accuracy of surface slope metrology with the OSMS over the spatial wavelength range from ~1.6 mm to 7 mm. Thus, the amplitude of the quasi-periodic error characteristic of the deterministic polishing process used appears to be higher by a factor of~2 than is apparent from the rough metrology data. Underestimation of the surface slope errors in this spatial wavelength range can lead to serious errors in the expected performance of x-ray mirrors in synchrotron beamlines, especially at modern light sources utilizing coherent x rays, where the perturbations can lead to increased speckle-like intensity variation.

47 OTHER INSTRUMENTATION↗
NASA NTRS2011

Cryogenic Thermal Vacuum Testing with Remote Optical Metrology

Flexure Engineering was awarded an SBIR to research and develop technology needed to build a thermal vacuum chamber made to take laser radar metrology through a window. The XATF test is proof of concept for this, and demonstrated the need for such a chamber. XATF refers to two pieces of critical ground support equipment for NASA's JWST (James Webb Space Telescope) Integrated Science Instrument Module (ISIM), the ISIM Alignment Target Fixture (IATF) and the Master Alignment Target Fixture (MATF). These optical alignment assemblies require characterization while under cryogenic temperature. A thermal vacuum chamber equipped with a shroud cooled with gaseous and liquid nitrogen was used. An inner shroud was cooled with liquid helium to approximately 30K. The XATF assemblies were kinematically mounted and oriented inside the inner shroud such that the optical targets were visible from outside an optical window on one of the chamber ports. Laser radar and theodolite mounted outside the window took measurements of various optical targets. Two cold cycles were completed. A third cycle was aborted. Metrology was successfully taken. There were some problems with the helium system. The cryo pumps were turned off to reduce vibrations during metrology. Many new technologies and testing methods must be developed for JWST and future programs that will require precision measurements. These technologies will be applicable to other cold temperature applications, such as lunar missions and superconductors. Remote metrology technologies can also be applicable to testing in harsh environments. Facilities with remote metrology capability will be valuable.

Boyd, Guinevere↗
DOE OSTI2023

Time-Energy Uncertainty Relation for Noisy Quantum Metrology

Detection of very weak forces and precise measurement of time are two of the many applications of quantum metrology to science and technology. To sense an unknown physical parameter, one prepares an initial state of a probe system, allows the probe to evolve as governed by a Hamiltonian 𝐻 for some time 𝑡, and then measures the probe. If 𝐻 is known, we can estimate 𝑡 by this method; if 𝑡 is known, we can estimate classical parameters on which 𝐻 depends. The accuracy of a quantum sensor can be limited by either intrinsic quantum noise or by noise arising from the interactions of the probe with its environment. In this work, we introduce and study a fundamental trade-off, which relates the amount by which noise reduces the accuracy of a quantum clock to the amount of information about the energy of the clock that leaks to the environment. Specifically, we consider an idealized scenario in which a party Alice prepares an initial pure state of the clock, allows the clock to evolve for a time that is not precisely known, and then transmits the clock through a noisy channel to a party Bob. Meanwhile, the environment (Eve) receives any information about the clock that is lost during transmission. We prove that Bob’s loss of quantum Fisher information about the elapsed time is equal to Eve’s gain of quantum Fisher information about a complementary energy parameter. We also prove a similar, but more general, trade-off that applies when Bob and Eve wish to estimate the values of parameters associated with two noncommuting observables. We derive the necessary and sufficient conditions for the accuracy of the clock to be unaffected by the noise, which form a subset of the Knill-Laflamme error-correction conditions. A state and its local time-evolution direction, if they satisfy these conditions, are said to form a metrological code. We provide a scheme to construct metrological codes in the stabilizer formalism. We show that there are metrological codes that cannot be written as a quantum error-correcting code with similar distance in which the Hamiltonian acts as a logical operator, potentially offering new schemes for constructing states that do not lose any sensitivity upon application of a noisy channel. We discuss applications of the trade-off relation to sensing using a quantum many-body probe subject to erasure or amplitude-damping noise.

metrology↗
DOE OSTI2025

Noise Constraints on Sensitivity Scaling in Quantum Nonlinear Metrology

Quantum-enhanced metrology surpasses classical metrology by improving estimation precision scaling with a resource 𝑁 (e.g., particle number or energy) from 1/√𝑁 to 1/𝑁. Through the use of nonlinear effects, Roy and Braunstein [Exponentially enhanced quantum metrology, Phys. Rev. Lett. 100, 220501 (2008)] derived a 1/𝑁 2 scaling. However, later works argued this exponential improvement is unphysical and that even modest gains, like 1/𝑁 2 , may vanish under noise. We show that, in the presence of small errors, the nonlinear interactions enabling metrological enhancement induce emergent errors. Here, the errors propagate through the sensing protocol and are magnified proportional to any intended nonlinear enhancement. We identify a critical value of the parameter to be estimated, for a fixed error, below which the emergent errors can be avoided.

Quantum Fisher information↗
NASA NTRS2014

Ambient Optomechanical Alignment and Pupil Metrology for the Flight Instruments Aboard the James Webb Space Telescope

The James Webb Space Telescope science instruments are in the final stages of being integrated into the Integrated Science Instrument Module (ISIM) element. Each instrument is tied into a common coordinate system through mechanical references that are used for optical alignment and metrology within ISIM after element-level assembly. In addition, a set of ground support equipment (GSE) consisting of large, precisely calibrated, ambient, and cryogenic structures are used as alignment references and gauges during various phases of integration and test (I&T). This GSE, the flight instruments, and ISIM structure feature different types of complimentary metrology targeting. These GSE targets are used to establish and track six degrees of freedom instrument alignment during I&T in the vehicle coordinate system (VCS). This paper describes the optomechanical metrology conducted during science instrument integration and alignment in the Spacecraft Systems Development and Integration Facility (SSDIF) cleanroom at NASA Goddard Space Flight Center (GSFC). The measurement of each instrument's ambient entrance pupil location in the telescope coordinate system is discussed. The construction of the database of target locations and the development of metrology uncertainties is also discussed.

Optomechanical Alignment↗
NASA NTRS2008

Metrology Optical Power Budgeting in SIM Using Statistical Analysis Techniques

The Space Interferometry Mission (SIM) is a space-based stellar interferometry instrument, consisting of up to three interferometers, which will be capable of micro-arc second resolution. Alignment knowledge of the three interferometer baselines requires a three-dimensional, 14-leg truss with each leg being monitored by an external metrology gauge. In addition, each of the three interferometers requires an internal metrology gauge to monitor the optical path length differences between the two sides. Both external and internal metrology gauges are interferometry based, operating at a wavelength of 1319 nanometers. Each gauge has fiber inputs delivering measurement and local oscillator (LO) power, split into probe-LO and reference-LO beam pairs. These beams experience power loss due to a variety of mechanisms including, but not restricted to, design efficiency, material attenuation, element misalignment, diffraction, and coupling efficiency. Since the attenuation due to these sources may degrade over time, an accounting of the range of expected attenuation is needed so an optical power margin can be book kept. A method of statistical optical power analysis and budgeting, based on a technique developed for deep space RF telecommunications, is described in this paper and provides a numerical confidence level for having sufficient optical power relative to mission metrology performance requirements.

stellar interferometry↗
DOE OSTI2023

Improving metrology with quantum scrambling

Quantum scrambling describes the spreading of information into many degrees of freedom in quantum systems, such that the information is no longer accessible locally but becomes distributed throughout the system. This idea can explain how quantum systems become classical and acquire a finite temperature, or how in black holes the information about the matter falling in is seemingly erased. We probe the exponential scrambling of a multiparticle system near a bistable point in phase space and utilize it for entanglement-enhanced metrology. A time-reversal protocol is used to observe a simultaneous exponential growth of both the metrological gain and the out-of-time-order correlator, thereby experimentally verifying the relation between quantum metrology and quantum information scrambling. Our results show that rapid scrambling dynamics capable of exponentially fast entanglement generation are useful for practical metrology, resulting in a 6.8(4)-decibel gain beyond the standard quantum limit.

Science & Technology - Other Topics↗
NASA NTRS1989

On-orbit Metrology and Calibration Requirements for Space Station Activities Definition Study

The Space Station is the focal point for the commercial development of space. The long term routine operation of the Space Station and the conduct of future commercial activities suggests the need for in-space metrology capabilities analogous when possible to those on-Earth. The ability to perform periodic calibrations and measurements with proper traceability is imperative for the routine operation of the Space Station. An initial review, however, indicated a paucity of data related to metrology and calibration requirements for in-space operations. This condition probably exists because of the highly developmental aspect of space activities to date, their short duration, and nonroutine nature. The on-orbit metrology and calibration needs of the Space Station were examined and assessed. In order to achieve this goal, the following tasks were performed: an up-to-date literature review; identification of on-orbit calibration techniques; identification of sensor calibration requirements; identification of calibration equipment requirements; definition of traceability requirements; preparation of technology development plans; and preparation of the final report. Significant information and major highlights pertaining to each task is presented. In addition, some general (generic) conclusions/observations and recommendations that are pertinent to the overall in-space metrology and calibration activities are presented.

Cotty, G. M.↗
NASA NTRS1966

Apollo Metrology Program

This paper introduces the metrology requirements in the recently published Apollo Program handbook, NHB 5400.2, entitled, 'Apollo Metrology Requirements Manual.' The major elements and control practices required for a comprehensive metrology system are identified. The elements are presented to you with sufficient detail of control practices to provide the scope of a total metrology program. The Manual is for implementation by the Apollo Space Flight Centers, their testing sites and contractors. The benefits of implementing these requirements are equally applicable to any Government or industry standards and calibration laboratory operations.

Porter, W. A.↗
NASA NTRS1999

A Multichannel Averaging Phasemeter for Picometer Precision Laser Metrology

The Micro-Arcsecond Metrology (MAM) team at the Jet Propulsion Laboratory has developed a precision phasemeter for the Space Interferometry Mission (SIM). The current version of the phasemeter is well-suited for picometer accuracy distance measurements and tracks at speeds up to 50 cm/sec, when coupled to SIM's 1.3 micron wavelength heterodyne laser metrology gauges. Since the phasemeter is implemented with industry standard FPGA chips, other accuracy/speed trade-off points can be programmed for applications such as metrology for earth-based long-baseline astronomical interferometry (planet finding), and industrial applications such as translation stage and machine tool positioning. The phasemeter is a standard VME module, supports 6 metrology gauges, a 128 MHz clock, has programmable hardware averaging, and a maximum range of 232 cycles (2000 meters at 1.3 microns).

Halverson, Peter G.↗
NASA NTRS2004

Incoming Metrology of Segmented X-Ray Mandrels at MSFC

The Constellation-X Spectroscopy X-ray telescope (SXT) is designed to be built from X-ray optic segments. The X-ray segments will be fabricated from the segmented mandrels using a replication process. The purpose of the incoming metrology is to map the surface of the mandrels, so the performance of the X-ray optics produced can be predicted. Three Constellation-X segmented mandrels have been delivered to MSFC for incoming metrology. The segmented mandrels are 30-degree sections of a cylindrical surface and have diameters of 1.0 m, 1.2 m and 1.6 m. The maximum dimensions of the optical surface are 1.0 m axial length and 0.5 m azimuthal segment length. The metrology of the mandrels consists of the measurement of their slope differences, roundness, absolute radius, axial profile and microroughness. Accuracy goals for each type of measurement and the accuracy of the instruments used for the measurements will be discussed. The results of the mandrel metrology together with the performance predictions will be presented.

Gubarev, Mikhail↗
NASA NTRS2004

Optical Metrology for the Segmented Optics on the Constellation-X Spectroscopy X-Ray Telescope

We present the metrology requirements and metrology implementation necessary to prove out the reflector technology for the Constellation X(C-X) spectroscopy X-ray telescope (SXT). This segmented, 1.6m diameter highly nested Wolter-1 telescope presents many metrology and alignment challenges. In particular, these mirrors have a stringent imaging error budget as compared to their intrinsic stiffness; This is required for Constellation-X to have sufficient effective area with the weight requirement. This has implications for the metrology that can be used. A variety of contract and noncontact optical profiling and interferometric methods are combined to test the formed glass substrates before replication and the replicated reflector segments.The reflectors are tested both stand-alone and in-situ in an alignment tower.Some of these methods have not been used on prior X-ray telescopes and some are feasible only because of the segmented approach used on the SXT. Methods discussed include high precision coordinate measurement machines using very low force or optical probe axial interferometric profiling azimuthal circularity profiling and use of advanced null optics such as conical computer generated hologram (CGHs).

Content, David↗