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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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NASA NTRS2014

Single Event Effect Testing of the Texas Instruments' MAX4595 Single-Channel Analog Switch

The Texas Instruments'™ (TI) MAX4595 was tested for single event latch-up (SEL) response at the Texas A&M University Cyclotron Facility (TAMU) on 26 October 2014. The device was exercised in varied load conditions to replicate its intended application with concerns about destructive effects on the commercial device.

single event latch-up (SEL)↗