Active cleaning technique for removing contamination from optical surfaces in space
Development of gas plasma cleaning technique for removing contaminants from optical surfaces in space environments
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Development of gas plasma cleaning technique for removing contaminants from optical surfaces in space environments
Clear, easily cleaned sacrificial coats of polytetrafluoroethylene, polyurethane, silicone, or other low-outgassing organic films help maintain optical properties of surfaces of radiators, solar panels, and other components. Contamination removed by erosion of coats. Applied by conventional spraying or other techniques. Originally coats intended to protect surfaces of radiators on spacecraft in low orbit around the Earth. On Earth, used to protect optical surfaces against damage during manufacture or protect and facilitate cleaning of optical surfaces particularly delicate or otherwise not cleaned easily.
Research in developing an active cleaning technique for removing contaminants from optical surfaces in space is reported. In situ contamination/cleaning experiments were conducted on gold and platimum coated mirrors, which were contaminated by exposure to UV radiation in a 1,3, butadiene environment. Argon and oxygen plasma exposure cleaned the mirrors equally well. Silicone cleaning experiments were also conducted. Exposure of the contaminated mirrors to helium, oxygen, and hydrogen plasmas restored the reflectance at the shorter wavelengths and degraded it at the longer wavelengths.
Report discusses use of scanning tunneling microscopy and atomic force microscopy to measure roughnesses of optical surfaces. These techniques offer greater spatial resolution than other techniques. Report notes scanning tunneling microscopes and atomic force microscopes resolve down to 1 nm.
Automated electron microprobe analyses were performed on tape lift samples from the Technology Mirror Assembly (TMA) optical surfaces. Details of the analyses are given, and the contamination of the mirror surfaces is discussed. Based on the automated analyses of the tape lifts from the TMA surfaces and the control blank, we can conclude that the particles identified on the actual samples were not a result of contamination due to the handling or sampling process itself and that the particles reflect the actual contamination on the surface of the mirror.
This paper will review the relative sensitivities and practicalities of the common surface analytical methods that are used to detect and identify unwelcome adsorbants on optical surfaces. The compared methods include visual inspection, simple reflectometry and transmissiometry, ellipsometry, infrared absorption and attenuated total reflectance spectroscopy (ATR), Auger electron spectroscopy (AES), scanning electron microscopy (SEM), secondary ion mass spectrometry (SIMS), and mass accretion determined by quartz crystal microbalance (QCM). The discussion is biased toward those methods that apply optical thin film analytical techniques to spacecraft optical contamination problems. Examples are cited from both ground based and in-orbit experiments.
This paper presents a new method for simultaneously retrieving aerosol and surface reflectance properties from combined airborne and ground-based direct and diffuse radiometric measurements. The method is based on the standard Aerosol Robotic Network (AERONET) method for retrieving aerosol size distribution, complex index of refraction, and single scattering albedo, but modified to retrieve aerosol properties in two layers, below and above the aircraft, and parameters on surface optical properties from combined datasets (Cloud Absorption Radiometer (CAR) and AERONET data). A key advantage of this method is the inversion of all available spectral and angular data at the same time, while accounting for the influence of noise in the inversion procedure using statistical optimization. The wide spectral (0.34-2.30 m) and angular range (180 ) of the CAR instrument, combined with observations from an AERONET sunphotometer, provide sufficient measurement constraints for characterizing aerosol and surface properties with minimal assumptions. The robustness of the method was tested on observations made during four different field campaigns: (a) the Southern African Regional Science Initiative 2000 over Mongu, Zambia, (b) the Intercontinental Transport Experiment-Phase B over Mexico City, Mexico (c) Cloud and Land Surface Interaction Campaign over the Atmospheric Radiation Measurement (ARM) Central Facility, Oklahoma, USA, and (d) the Arctic Research of the Composition of the Troposphere from Aircraft and Satellites (ARCTAS) over Elson Lagoon in Barrow, Alaska, USA. The four areas are dominated by different surface characteristics and aerosol types, and therefore provide good test cases for the new inversion method.
Particulate contamination analysis was carried out on samples taken from the Verification Engineering Test Article (VETA) x-ray detection system. A total of eighteen tape lift samples were taken from the VETA optical surfaces. Initially, the samples were tested using a scanning electron microscope. Additionally, particle composition was determined by energy dispersive x-ray spectrometry. Results are presented in terms of particle loading per sample.
Masks of improved design developed for use in fabrication of aspherical, rotationally symmetrical surfaces of mirrors, lenses, and lens molds by evaporative deposition onto rotating substrates. In deposition chamber, source and mask aligned with axis of rotation of substrate. Mask shadows source of rotating substrate. Azimuthal opening (as function of radius) in mask proportional to desired thickness (as function of radius) to which material deposited on substrate. Combination of improved masks and modern coating chambers provides optical surfaces comparable or superior to those produced by conventional polishing, computer-controlled polishing, replication from polished molds, and diamond turning, at less cost in material, labor, and capital expense.
During the fabrication of the mirrors for the Extreme Ultraviolet Explorer (EUVE), methods for evaluating the surface quality of the optics have been developed. Measurement of soft X-ray scattering profiles allows for the determination of the surface roughness and correlation lengths for highly polished metal surfaces. With this method, the surface parameters for one of the Wolter Schwarzschild type I mirrors that had been fabricated for the EUVE mission have been determined. The techniques employed, the theoretical basis for the method, and the data that had been taken are presented. The measurements show that the best mirrors have a surface roughness of 20A rms or less.
Coronagraph telescope and instrument optics for spatial frequencies within and beyond the spatial control bandwidth of the wave front control system. Three different wave front control systems are considered: a zero-path difference Michelson interferometer with two deformable mirrors at a pupil image; a sequential pair of deformable mirrors with one placed at a pupil image; and the Visible Nuller spatially-filtered controller. We show that the optical bandwidth limits the useful outer working angle.
A computer program for the evaluation of surface ripple effects on an optical system is discussed. The program consists of a modification of conventional ray tracing so that the effects of all roughness frequency scales on image quality can be analyzed. The code is designed to deal with image quality problems arising in connection with X-ray telescopes and near-normal incidence systems used in the infrared, visible, and near-UV parts of the spectrum. The emphasis of the program analysis is on narrow angle scattering and its effect on image quality. The intent is to provide the optical engineer with a measure of the sensitivity of image quality to various surface characteristics. The paper will highlight some of the unique modeling features of the code, and illustrate some system examples.
Edge data of a measured surface map of a circular optic result in large variance or "spectral leakage" behavior in the corresponding Power Spectral Density (PSD) data. In this paper we present two new, alternative methods for reducing such variance in the PSD data by replacing the zeros outside the circular area of a surface map by non-zero values either obtained from a PSD fit (method 1) or taken from the inside of the circular area (method 2).
Ultraviolet measurements of oil contamination in optical mirrors
In FY2020, KSC’s Applied Physics Lab created a computer based image processing system to allow inspection of the new visors being developed for the Artemis Program. This system was based on an ASTM standard where the distortion of an image is used to determine the optical aberrations in a visor, but this approach is restricted to small fields-of-view (small areas of the visor) and is limited in its ability to reliably detect and measure distortion. From our experience with flat surface inspection, we know that other optical techniques can offer higher sensitivity and accuracy. [1] This memorandum describes a method to model and measure the distortion in curved optical surfaces using moir´e interferometry. We were able to apply this process to examine samples of the xEMU Artemis astronaut helmets. Design details are provided along with examples to illustrate performance.
It is suggested that Freeman's (1970) result that the disk portions of spiral galaxies have a preferred central surface brightness might be the consequence of observing optically thick ensembles of a standard mix of stars and dust. Regardless of whether this hypothesis is correct, the observation that elliptical galaxies usually have central surface brightnesses considerably greater than the disk portions of spirals can be understood if there is much less dust within the elliptical systems. In particular, ellipticals probably have dust-to-total-mass ratios at least a factor of 100 smaller than in the disk portions of spirals, although there is no evidence that the dust-to-interstellar-gas ratios are different. When stars were forming within ellipticals, these galaxies were probably dustier than they are now, and their visible light output could have been substantially affected. It will probably be necessary to establish the dust content of galaxies as a function of redshift to use these objects as cosmological probes.
Glass and glass ceramic samples exposed to the low earth orbit environment for approximately 5.5 years on the Long Duration Exposure Facility (LDEF) were found to display limited degradation in optical transmission. Commercial optical quality fused silica samples display decreases in transmission in the 200 to 400 nm wavelength region, and this degradation appears to be a consequence of surface contamination. The contamination, found only on internal surfaces of samples, was measured by medium energy backscattering spectrometry and found to be primarily carbon. Additional thin film contamination by a species with atomic mass near 64, which was present at the level of about 8 x 10 exp 14/sq. cm has not been identified. These observations are consistent with the interpretation that organic binders used in the black absorbing paint (Chem Glaze Z-306) inside the sample holding tray were concentrated in the vicinity of the samples and photolytically cracked by solar UV radiation. The resulting decomposition products were deposited on the interior sample surface and gave rise to the optical transmission loss. No detectable contamination was observed on the external or space exposed surface of the samples. No measurable damage was detected which could be attributed to the direct action of gamma or UV radiation on the glass samples. These results emphasize the need for special precautions in the preparation of spacecraft carrying precision optical components on long duration missions.
In proposed method of obtaining information on strain at surface of material specimen, magnetic coat (like that on magnetic tape) or optical coat (like that on compact disk) applied to all or part of surface monitored. Coating layer and associated measuring equipment, taken together, constitute system called "material strain monitor" (MSM). MSM important in research in materials and mechanics; in particular, expected to compete strongly with systems based on image-analysis and laser techniques now being developed to obtain information on strain fields.