Lattice vibrations in silicon - Microscopic dielectric model.
Si lattice vibrations, calculating phonon dispersion curves from microscopic model by dielectric screening theory
SEARCH · Search NASA
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.
Si lattice vibrations, calculating phonon dispersion curves from microscopic model by dielectric screening theory
Olefins of high molecular weight in microscopic algae, discussing hydrocarbon composition investigation by gas chromatography mass spectrometry
Computerized image simulation to interpret crystal dislocations in field ion microscope images, investigating dislocations in various lattice systems by shell model
Scanning microscope uses a field-emission tip for the electron source, an electron gun that simultaneously accelerates and focuses electrons from the source, and one auxiliary lens to produce a final probe size at the specimen on the order of angstroms.
Computer experiments on the microscopic behavior of one dimensional electrostatic plasma
Microscopic energy deposition from passing protons in tissue sphere
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Physical basis
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Nonthermal effects in Read diodes
Radiation damage of vanadium carbide lattice by electron microscope beam bombardment
High resolution and image intensity of field ion microscope at low temperatures
Electron microscope application to study of biological microstructure
Application of electron microscopes to study of human perception and development of prosthetic sensors
Meteorite impact recognition from microscopic structure of rocks
Microscopic time lapse movies in solid/liquid interface profile during melting and freezing of materials for spacecraft thermal control as reversible heat sink
Plastic backing films removal from carbon electron microscope replicas by maintaining specimens in horizontal position
Mechanism absolutely immobilizes microscope stage at a preset focus, preserving focus indefinitely. The lock is a second-class lever consisting of a straight body having a fulcrum with a cylindrical bearing surface at one end and a thumbscrew at the other end.
Development and testing of atom probe field-ion microscope and quantitative measurements of atomic order in platinum and nickel alloys
Microscopic structure analysis of inverted nuclear coexistence using Hartree-Fock method