Evaluating the Taylor hardening model in polycrystalline Ti using high energy X-ray diffraction microscopy
High energy X-ray diffraction microscopy (HEDM) was employed to index nearly 1000 grains in a polycrystalline Ti specimen and characterize their deformation during an incremental tensile test. For each grain, the positions of its associated diffraction peaks were used for analyzing its evolving crystal orientation and stress tensor. The azimuthal breadth of each peak at different load steps was measured, allowing measurement of initial yielding and providing an estimate of the dislocation density evolution in each grain. Furthermore, the Taylor hardening model was evaluated grain by grain using the above data, indicating that it can represent hardening in most grains. The yield stress and the strain hardening coefficient for all grains were statistically analyzed with respect to grain orientation, grain size, slip systems, and the surrounding neighborhood to examine how the yield stress and hardening are correlated.