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At least 379 records · Page 21

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NASA NTRS1987

Four quadrant control circuit for a brushless three-phase dc motor

A control circuit is provided for a brushless three-phase dc motor which affords four quadrant control from a single command. The control circuit probes acceleration of the motor in both clockwise and counterclockwise directions and braking and generation in both clockwise and counterclockwise directions. In addition to turning on individual transistors of the transistor pairs connected to the phase windings of the motor for 120 deg periods while the other transistor of that pair is off, the control circuit also provides, in a future mode of operation, turning the two transistors of each pair on and off alternately at a phase modulation frequency during such a 120 deg period. A feedback signal is derived which is proportional to the motor current and which has a polarity consistent with the command signal, such that negative feedback results.

Nola, Frank J.↗

NASA NTRS1987

In-circuit fault injector user's guide

A fault injector system, called an in-circuit injector, was designed and developed to facilitate fault injection experiments performed at NASA-Langley's Avionics Integration Research Lab (AIRLAB). The in-circuit fault injector (ICFI) allows fault injections to be performed on electronic systems without special test features, e.g., sockets. The system supports stuck-at-zero, stuck-at-one, and transient fault models. The ICFI system is interfaced to a VAX-11/750 minicomputer. An interface program has been developed in the VAX. The computer code required to access the interface program is presented. Also presented is the connection procedure to be followed to connect the ICFI system to a circuit under test and the ICFI front panel controls which allow manual control of fault injections.

Padilla, Peter A.↗

NASA NTRS1988

Adjustable, Audible Continuity Tester For Delicate Circuits

Unit adjustable to resistances up to 35 ohms. Adjustable, audible electrical-continuity tester gives audible indication. Used safely on circuit boards in which semiconductor components installed, and on complementary metal oxide/semiconductor integrated circuits. Tester compact and circuit simple. Built from inexpensive standard components.

Mcalister, William B.↗

NASA NTRS1988

Searching Circuit For A Servoloop

Feedback error voltage forced into range of stability. Circuit connected in series with error-voltage line of feedback loop. When loop operates normally in stable region, searching circuit does not disturb operation, and error-voltage output of loop filter is control voltage. When servo unlocks and error-voltage output of loop filter wanders into unstable range, searching circuit forces control voltage to sweep through stable region repeatedly until lock recovered. Consists of two halves identical except polarities of some parts in each half opposite of corresponding parts in other half.

Sigman, E. H.↗

NASA NTRS1987

Integrated photo-responsive metal oxide semiconductor circuit

An infrared photoresponsive element (RD) is monolithically integrated into a source follower circuit of a metal oxide semiconductor device by depositing a layer of a lead chalcogenide as a photoresistive element forming an ohmic bridge between two metallization strips serving as electrodes of the circuit. Voltage from the circuit varies in response to illumination of the layer by infrared radiation.

Jhabvala, Murzban D.↗

NASA NTRS1987

HSPICE modelling of a solar array circuit controlled by a fet switch

This paper presents a method of modeling a solar array circuit controlled by a hexfet switch on HSPICE. HSPICE models are developed for the solar array current voltage (IV) characteristic and the IRF150 hexfet. Computer simulations are made to verify rate of current change at the load. The equivalent LC circuit for the same current control is modeled to show savings in weight and power in choosing the fet switch over an LC circuit.

Cox, Deanna D.↗

NASA NTRS1989

Power-Supply-Conditioning Circuit

Fluctuations of voltage suppressed in power supplies for precise radio-frequency circuits. Circuit suppresses both periodic and random deviations of dc supply voltage from desired steady level. Highly-stable feedback voltage regulator, conditioner intended in conjunction with conventional power-supply circuit to provide constant voltage to atomic frequency standard or other precise oscillator. Without conditioners, outputs of most commercial power supplies contain fluctuations causing unacceptably-large phase and amplitude modulation of precise oscillators.

Primas, L. E.↗

NASA NTRS1989

Spread Of Charge From Ion Tracks In Integrated Circuits

Single-event upsets (SEU's) propagate to adjacent cells in integrated memory circuits. Findings of experiments in lateral transport of electrical-charge carriers from ion tracks in 256K dynamic randon-access memories (DRAM's). As dimensions of integrated circuits decrease, vulnerability to SEU's increases. Understanding gained enables design of less vulnerable circuits.

Zoutendyk, John A.↗

NASA NTRS1989

Output-Isolation And Protection Circuit

Output-isolation circuit couples precise analog signals (-10 to +10 V, 0 to 20 kHz) from computer or from other electronic equipment to external electronic equipment that may be at different ground potential. Circuit functions in presence of common-mode voltages up to 2,500 Vac or 3,500 Vdc. To prevent damage from accidental connection of output leads to powerlines or other sources of high voltage, circuit includes features that protect input and output signal lines against normal-mode overvoltages up to 120 V ac or dc.

Wagner, Charles A.↗

NASA NTRS1989

Removing Bonded Integrated Circuits From Boards

Small resistance heater makes it easier, faster, and cheaper to remove integrated circuit from hybrid-circuit board, package, or other substrate for rework. Heater, located directly in polymeric bond interface or on substrate under integrated-circuit chip, energized when necessary to remove chip. Heat generated softens adhesive or solder that bonds chip to substrate. Chip then lifted easily from substrate.

Rice, John T.↗

NASA NTRS1989

External electro-optic probing of millimeter-wave integrated circuits

An external, noncontact electro-optic measurement system, designed to operate at the wafer level with conventional wafer probing equipment and without any special circuit preparation, has been developed. Measurements have demonstrated the system's ability to probe continuous and pulsed signals on microwave integrated circuits on arbitrary substrates with excellent spatial resolution. Experimental measurements on a variety of digital and analog circuits, including a GaAs selectively-doped heterostructure transistor prescaler, an NMOS silicon multiplexer, and a GaAs power amplifier MMIC are reported.

Whitaker, J. F.↗

NASA NTRS1989

External electro-optic probing of millimeter-wave integrated circuits

Whitaker, J. F.↗

NASA NTRS1989

Design and implementation of a multi-sensor robot system for printed circuit board insertion

The design and implementation of a robot system equipped with multiple sensors are described. The robotic assembly system couples the task sequence of the robot with information from different sensors, enabling the system to handle uncertainties encountered during task execution. The target task involves the insertion of a printed circuit board into a card cage. The sensors used are an overhead three-dimensional vision system, a fingertip cross-fire sensor, and a 6-DOF force/torque sensor. The vision system is used to locate the printed circuit boards and the insertion slots. Information provided by the cross-fire sensor is used to complement the information from the vision system in order to obtain a proper grasping location on the printed circuit board. A fuzzy-logic-based system is used to interpret the forces and torques generated by the force/torque sensor during the insertion process. The repeated success of this assembly task over many experimental trials verifies the modeling and controller assumptions.

Sood, Deepak↗

NASA NTRS1990

Asymmetric Memory Circuit Would Resist Soft Errors

Some nonlinear error-correcting codes more efficient in presence of asymmetry. Combination of circuit-design and coding concepts expected to make integrated-circuit random-access memories more resistant to "soft" errors (temporary bit errors, also called "single-event upsets" due to ionizing radiation). Integrated circuit of new type made deliberately more susceptible to one kind of bit error than to other, and associated error-correcting code adapted to exploit this asymmetry in error probabilities.

Buehler, Martin G.↗

NASA NTRS1990

Gallium Arsenide Domino Circuit

Advantages include reduced power and high speed. Experimental gallium arsenide field-effect-transistor (FET) domino circuit replicated in large numbers for use in dynamic-logic systems. Name of circuit denotes mode of operation, which logic signals propagate from each stage to next when successive stages operated at slightly staggered clock cycles, in manner reminiscent of dominoes falling in a row. Building block of domino circuit includes input, inverter, and level-shifting substages. Combinational logic executed in input substage. During low half of clock cycle, result of logic operation transmitted to following stage.

Yang, Long↗

NASA NTRS1990

Starting Circuit For Erasable Programmable Logic Device

Voltage regulator bypassed to supply starting current. Starting or "pullup" circuit supplies large inrush of current required by erasable programmable logic device (EPLD) while being turned on. Operates only during such intervals of high demand for current and has little effect any other time. Performs needed bypass, acting as current-dependent shunt connecting battery or other source of power more nearly directly to EPLD. Input capacitor of regulator removed when starting circuit installed, reducing probability of damage to transistor in event of short circuit in or across load.

Cole, Steven W.↗

NASA NTRS1990

Electro-optical Probing Of Terahertz Integrated Circuits

Electro-optical probe developed to perform noncontact, nondestructive, and relatively noninvasive measurements of electric fields over broad spectrum at millimeter and shorter wavelengths in integrated circuits. Manipulated with conventional intregrated-circuit-wafer-probing equipment and operated without any special preparation of integrated circuits. Tip of probe small electro-optical crystal serving as proximity electric-field sensor.

Bhasin, K. B.↗

NASA NTRS1990

Equivalent circuit models for ac impedance data analysis

A least-squares fitting routine has been developed for the analysis of ac impedance data. It has been determined that the checking of the derived equations for a particular circuit with a commercially available electronics circuit program is essential. As a result of the investigation described, three equivalent circuit models were selected for use in the analysis of ac impedance data.

Danford, M. D.↗