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Results for “FILM THICKNESS”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 55 records · Page 3
All sourcesNASA NTRSDOE OSTI
NASA NTRS1982

Film thickness measurement for spiral groove and Rayleigh step lift pad self-acting face seals

One Rayleigh step lift pad and three spiral groove self-acting face seal configurations were tested to measure film thickness and frictional torque as a function of shaft speed. The seals were tested at a constant face load of 73 N (16.4 lb) with ambient air at room temperature and atmospheric pressure as the fluid medium. The test speed range was from 7000 to 17,000 rpm. The measured film thickness was compared with theoretical data from mathematical models. The mathematical models overpredicted the measured film thickness at the lower speeds of the test speed range and underpredicted the measured film thickness at the higher speeds of the test speed range.

Dirusso, E.↗
NASA NTRS1979

Elastohydrodynamic film thickness measurements of artificially produced nonsmooth surfaces

Optical interferometry is used to measure the elastohydrodynamic (EHD) film thickness associated with artificially produced nonsmooth surfaces. The nonsmooth surfaces are produced by modifying the surfaces of highly-polished balls with irregularities in the form of multiple grooves and dents. By closely spacing these irregularities it is possible not only to produce depressions on the surface of the balls but also to generate pseudo asperities. The average roughness wavelength of this artificially-produced, nonsmooth, surface approximates the average fundamental roughness wavelength found on surfaces of some mechanical elements operating under concentrated contact. By comparing the measured film thickness profiles to the stylus traces of the irregularities, it was possible to observe the local deformations associated with micro-EHD pressure generation. In both pure rolling and pure sliding conditions the artificially-produced asperities are deformed and complete separation exists between them and the mating surface. Such findings demonstrate the importance of local surface topography and resulting micro-EHD effects on the film thickness between rough surfaces in concentrated contact. Sliding data are presented which demonstrate a severe constriction, caused by the irregularities, at the exit of the Hertzian region.

Cusano, C.↗
NASA NTRS1981

The effects of artificially-produced defects on the film thickness distribution in sliding EHD point contacts

Effects of artificially produced dents and grooves on the elastohydrodynamic film thickness profile in a sliding point contact are investigated using optical interferometry. Defects on the surface of a highly polished ball are held stationary at various locations within the vicinity of the contact region while the disk is rotating. It is shown that defects can dramatically change the film thickness which exists when no defects are present in or near the contact, and it is shown that the change in thickness is mainly a function of the position of the defects in the inlet region, the geometry of the defects, the orientation of the defects in the case of grooves, and the depth of the defect relative to the central film thickness.

Cusano, C.↗
NASA NTRS1974

Traction and film thickness measurements under starved elastohydrodynamic conditions

Results of traction and film thickness measurements made for a point contact geometry under starved elastohydrodynamic rolling and sliding conditions are reviewed. These results indicate that the variation of film thickness with the location of the inlet lubricant boundary under combination rolling and sliding behaves identically with that found previously under pure rolling conditions. The maximum shear rate is shown to depend on the degree of starvation and has no theoretical limit. The relative increase in traction due to starvation is influenced by thermal and fluid rheological conditions within the Hertz region.

Wedeven, L. D.↗
NASA NTRS1977

Laser drilling of vias in dielectric for high density multilayer LSHI thick film circuits

A design analysis of a high density multilevel thick film digital microcircuit used for large scale integration is presented. The circuit employs 4 mil lines, 4 mil spaces and requires 4 mil diameter vias. Present screened and fired thick film technology is limited on a production basis to 16 mil square vias. A process whereby 4 mil diameter vias can be fabricated in production using laser technology was described along with a process to produce 4 mil diameter vias for conductor patterns which have 4 mil lines and 4 mil spacings.

Cocca, T.↗
NASA NTRS1979

Elastohydrodynamic film thickness measurements of artificially-produced nonsmooth surfaces

Optical interferometry is used to measure the elastohydrodynamic (EHD) film thickness associated with artificially produced, nonsmooth surfaces. The nonsmooth surfaces are produced by modifying the surfaces of highly-polished balls with irregularities in the form of multiple grooves and dents. By closely spacing these irregularities, it is possible not only to produce depressions on the surface of the balls but also to generate pseudo asperities. The average roughness wavelength of this artificially-produced, nonsmooth surface approximates the average fundamental roughness wavelength found on surfaces of some mechanical elements operating under concentrated contact. By comparing the measured film thickness profiles to the stylus traces of the irregularities, it is possible to observe the local deformations associated with micro-EHD pressure generation. In both pure rolling and pure sliding conditions, the artificially-produced 'asperities' are deformed and complete separation exists between them and the mating surface. Such findings demonstrate the importance of local surface topography and resulting micro-EHD effects on the film thickness between rough surfaces in concentrated contact. In addition, sliding data are presented which demonstrate a severe constriction, caused by the irregularities, at the exit of the Hertzian region.

Cusano, C.↗
NASA NTRS1978

Minimum film thickness in elliptical contacts for different regimes of fluid-film lubrication

The film-parameter equations are provided for four fluid-film lubrication regimes found in elliptical contacts. These regimes are isoviscous-rigid; viscous-rigid; elastohydrodynamic of low-elastic-modulus materials, or isoviscous-elastic; and elastohydrodynamic, or viscous-elastic. The influence or lack of influence of elastic and viscous effects is the factor that distinguishes these regimes. The film-parameter equations for the respective regimes come from earlier theoretical studies by the authors on elastohydrodynamic and hydrodynamic lubrication of elliptical conjunctions. These equations are restated and the results are presented as a map of the lubrication regimes, with film-thickness contours on a log-log grid of the viscosity and elasticity parameters for five values of the ellipticity parameter. The results present a complete theoretical film-parameter solution for elliptical contacts in the four lubrication regimes.

Hamrock, B. J.↗
NASA NTRS2003

Quartz Microbalance Study of 400-angstrom Thick Films near the lambda Point

In a recent measurement we observed the thinning of an adsorbed helium film induced by the confinement of critical fluctuations a few millikelvin below the lambda point. A capacitor set-up was used to measure this Casimir effect. In this poster we will present our measurement of an adsorbed helium film of 400 angstroms near the lambda point with a quartz microbalance. For films this thick, we must take into account the non-linear dynamics of the shear waves in the fluid. In spite of the added complications, we were able to confirm the thinning of the film due to the Casimir effect and the onset of the superfluid transition. In addition, we observe a sharp anomaly at the bulk lambda point, most likely related to critical dissipation of the first sound. This work is carried out in collaboration with Rafael Garcia, Stephen Jordon and John Lazzaretti. This work is funded by NASA's Office of Biological and Physical Research under grant.

Chan, Moses H. W.↗
NASA NTRS2004

Implementation of a Thick-Film Composite Li-Ion Microcathode Using Carbon Nanotubes as the Conductive Filler

This paper describes the development of a thick-film microcathode for use in Li-ion microbatteries in order to provide increased power and energy per area. These cathodes take advantage of a composite porous electrode structure, utilizing carbon nanotubes (CNT) as the conductive filler. The use of carbon nanotubes was found to significantly reduce the measured resistance of the electrodes, increase active material accessibility, and improve electrode performance. In particular, the cycling and power performance of the thick-film cathodes was significantly improved, and the need for compression was eliminated. Cathode thickness and CNT content were optimized to maximize capacity and power performance. Power capability of >50 mW/sq cm (17 mA/sq cm) with discharge capacity of >0.17 mAh/sq cm was demonstrated. The feasibility of fabricating thick-film microcathodes capable of providing the power and capacity needed for use in autonomous microsensor systems was also demonstrated.

Lin, Qian↗
NASA NTRS1976

Discrete component bonding and thick film materials study

The bonding reliability of discrete capacitor chips bonded with solders and conductive epoxies was examined along with the thick film resistor materials consisting of iron oxide phosphate and vanadium oxide phosphates. It was concluded from the bonding reliability studies that none of the wide range of types of solders examined is capable of resisting failure during thermal cycling while the conductive epoxy gives substantially lower failure rates. The thick film resistor studies proved the feasibility of iron oxide phosphate resistor systems although some environmental sensitivity problems remain. One of these resistor compositions has inadvertently proven to be a candidate for thermistor applications because of the excellent control achieved upon the temperature coefficient of resistance. One new and potentially damaging phenomenon observed was the degradation of thick film conductors during the course of thermal cycling.

Kinser, D. L.↗
NASA NTRS1985

Fast approach for calculating film thicknesses and pressures in elastohydrodynamically lubricated contacts at high loads

The film thicknesses and pressures in elastohydrodynamically lubricated contacts have been calculated for a line contact by using an improved version of Okamura's approach. The new approach allows for lubricant compressibility, the use of Roelands' viscosity, a general mesh (nonconstant step), and accurate calculations of the elastic deformation. The new approach is described, and the effects on film thickness, pressure, and pressure spike of each of the improvements are discussed. Successful runs have been obtained at high pressure (to 4.8 GPa) with low CPU times.

Houpert, L. G.↗
NASA NTRS1986

Fast approach for calculating film thicknesses and pressures in elastohydrodynamically lubricated contacts at high loads

The film thicknesses and pressures in elastohydrodynamically lubricated contacts have been calculated for a line contact by using an improved version of Okamura's approach. The new approach allows for lubricant compressibility, the use of Roelands' viscosity, a general mesh (nonconstant step), and accurate calculations of the elastic deformation. The new approach is described, and the effects on film thickness, pressure, and pressure spike of each of the improvements are discussed. Successful runs have been obtained at high pressure (to 4.8 GPa) with low CPU times.

Houpert, L. G.↗
NASA NTRS1972

Properties of conductive thick-film inks

Ten different conductive inks used in the fabrication of thick-film circuits were evaluated for their physical and handling properties. Viscosity, solid contents, and spectrographic analysis of the unfired inks were determined. Inks were screened on ceramic substrates and fired for varying times at specified temperatures. Selected substrates were given additional firings to simulate the heat exposure received if thick-film resistors were to be added to the same substrate. Data are presented covering the (1) printing characteristics, (2) solderability using Sn-63 and also a 4 percent silver solder, (3) leach resistance, (4) solder adhesion, and (5) wire bonding properties. Results obtained using different firing schedules were compared. A comparison was made between the various inks showing general results obtained for each ink. The changes in firing time or the application of a simulated resistor firing had little effect on the properties of most inks.

Holtze, R. F.↗
NASA NTRS1974

Correlation of elastohydrodynamic film thickness measurements for fluorocarbon type 2 ester, and polyphenyl ether lubricants

A minimum films thickness correlation applicable to heavily loaded elastohydrodynamic (EHD) contacts was formulated from experimental data obtained by an X-ray transmission technique. The correlation, based on data generated with fluorocarbon, type II ester, and polyphenyl ether lubricants, extends a previous analysis developed from data for a synthetic paraffinic oil. The resulting correlation represents the data of the four lubricants reasonably well over a large range of operating conditions. Contained within the derived relation is a factor to account for the high-load dependence displayed by the measurements beyond that which is provided for by the theory. Thermal corrections applied to a commonly used film thickness formula showed little improvement to the general disagreement that exists between theory and test. Choice of contact geometry and material are judged to have a relatively mild influence on the form of the semiempirical model.

Loewenthal, S. H.↗
NASA NTRS1979

Lubricant limiting shear stress effect on EHD film thickness

A Grubin-like EHD inlet analysis utilizing a non-linear viscous fluid model with a limiting shear stress is reported. The shear rheological equation requirs only a low shear stress viscosity and the limiting shear stress both functions of pressure. Values employed for these properties are taken from measurements on typical lubricants. Reductions of EHD film thickness are found to be up to 40 percent compared with the standard Grubin prediction for typical operating conditions. Slide-roll ratio, limiting shear stress dependence on pressure, and atmospheric pressure value of limiting shear stress are new variables required to determine film thickness with the first two being more important than the last. The EHD film thickness is reduced by increasing slide-roll ratio and/or decreasing the pressure dependence of the limiting shear stress.

Gecim, B.↗