Electron microprobe analyses of the widmanstaetten structure of nine iron meteorites.
Compositional variation of iron meteorites analyzed with electron microprobe, investigating Widmanstatten structures
X-RAY ANALYSIS↗
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Computer programs EMX and EMX2 for electron microprobe data processing
Computer programs EMX and EMX2 for electron microprobe data processing
DATA PROCESSING↗
Mineralogical modal analysis with the electron microprobe X-ray analyzer.
Combination of point counting and electron microprobe techniques in mineralogical planimetric integration analysis
ELECTRON BOMBARDMENT↗
Electron microprobe study of spherules from Atlantic Ocean sediments.
Spherules from Atlantic Ocean sediments studied by electron microprobe, noting terrestrial alteration and contamination of surfaces
METEORITE↗
Vacuum system of ion-microprobe mass spectrometer.
Vacuum system of ion microprobe mass spectrometer noting design criteria, operation and results
VACUUM SYSTEM↗
The electron microprobe for chemical analysis
Electron microprobe for X-ray fluorescence chemical analysis
X-RAY FLUORESCENCE↗
The electron microprobe X-ray analyzer and its application in mineralogy.
Monograph on electron microprobe X-ray analyzer and application in mineralogy
MINERALOGY↗
Electron Microprobe Analyses of Powders Darkened by Simulated Solar-Wind Irradiation
Electron microprobe analysis of quartz and alumina darkening upon solar wind ion bombardment, noting existence of iron, tungsten and carbon in samples
SOLAR WIND↗
Microprobe investigation of brittle segregates in aluminum MIG and TIG welds
Quantitative microprobe analysis of segregated particles in aluminum MIG /Metal Inert Gas/ and TIG /Tungsten Inert Gas/ welds indicated that there were about ten different kinds of particles, corresponding to ten different intermetallic compounds. Differences between MIG and TIG welds related to the individual cooling rates of these welds.
Larssen, P. A.↗
Microprobe Attachment for Quantitative Studies of Cathode Luminescence
Monochromator photomultiplier attachment to electron microprobe for measuring luminescence of enstatite
Greer, R. T.↗
Solid-state energy-dispersion spectrometer for electron-microprobe X-ray analysis.
Lithium drifted silicon solid state spectrometer for detection and energy dispersion of X rays in electron microprobe X ray analyzer
Fitzgerald, R.↗
Microspectrochemical analysis of minerals with the laser microprobe.
Laser microprobe microspectrochemical quantitative analysis of mineral trace elements involving sample vaporization by laser beam
Keil, K.↗
Electron microprobe techniques for failure analysis of silicon planar devices.
Electron microprobe analyzer for failure analysis of silicon planar devices, discussing integrated circuit metallization
Cline, J. E.↗
Electron-microprobe determination of the angular distribution of sputtered aluminum atoms.
Sputtered atoms angular distribution measured by collecting atoms on Cu surface and determining surface densities of thin films by electron microprobe
Hasseltine, E. H.↗
Laser microprobe facility used in the elemental analysis of small feature of a sample
Laser microprobe facility is effective in the elemental analysis of small areas of heterogeneous samples. The instrument uses the focused beam of a pulsed laser to evaporate a small volume of material from a relatively massive sample.
Baldwin, J. M.↗
Technique for pinpointing submicron particles in the electron microprobe
Series of electron micrographs at successively lower magnifications can localize the substrate area sufficiently for a particle to be picked up by the beam of the electron microprobe. This approach could be modified to apply to fractographic studies, particularly of oxidation products stripped from fractures.
Miller, E. L.↗
Electron microprobe analysis of vanadium in the presence of titanium.
Electron microprobe analysis of vanadium in presence of titanium by compositional measurement of chromite in chondritic meteorites
Bunch, T. E.↗
X-ray fluorescence and electron microprobe techniques for determination of thin-film thicknesses.
X ray fluorescence and electron microprobe for determining thin film thickness
Cline, J. E.↗