X-rays from Centaurus A and the far-infrared background radiation
X ray and far IR measurement inconsistency from Centaurus A, discussing metagalactic submillimeter background
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X ray and far IR measurement inconsistency from Centaurus A, discussing metagalactic submillimeter background
DANTE is a diagnostic used to measure the x-radiation drive produced by heating a high-Z cavity (“hohlraum”) with high-powered laser beams. It records the spectrally and temporally resolved radiation flux at x-ray energies between 50 eV and 20 keV. Each sensor configuration on DANTE is composed of filters, mirrors, and x-ray diodes to define 18 different x-ray channels whose output is voltage as a function of time. The absolute flux is then determined from the photometric calibration of the sensor configuration and a spectral reconstructing algorithm. The reconstruction of the spectra vs time from the measured voltages and known response of each channel has presented challenges. Here we demonstrate a novel approach here for quantifying the error on the determined flux based on the channel sensor configuration and most commonly used reconstruction algorithm. In general, we find that the integrated spectral flux from a hohlraum can robustly be reconstructed (within ~14%) using a traditional unfold approach with as few as ten channels due to the underlying assumption of a largely Planckian spectral intensity distribution.
Here, we report an X-ray radiation-induced modification of the structure and gas permeation behavior of ZIF-8 membranes. With 300 min irradiation time, CO 2 permeance decreases by only 9 %, while N 2 and CH 4 permeances reduce by 75 and 65 %, respectively, leading to 3.7- and 2.6-fold enhancements in ideal selectivity for CO 2 /N 2 and CO 2 /CH 4 .
Spectrometer monitoring soft solar X-ray radiation in 1 to 400 angstrom wavelength range
Besides the identified sources of cosmic pulse X-ray radiation with globular clusters NGC 6624, NGC 1851 and MXB 1730-335 several new identifications were made. The source in Norma was probably identified with globular cluster NGC 5927, the source in Aquila with globular cluster NGC 6838 (M71), and the source in Puppis with globular cluster NGC 2298. Gamma pulses discovered by the Vela satellites and X-ray pulses thoroughly measured by the SAS-3, Ariel-5, and ANS satellites are thought to be the same phenomenon. The sources of such a radiation must be some kind of peculiarity at the central part of globular clusters; it is most probably a massive black hole. The sources of hard pulse radiation which cannot be identified with globular clusters are considered to be a new kind of galactic object, invisible globular clusters, which are naked nuclei of globular clusters.
Solar microwave and soft X ray radiation emission correlation to determine flare peak temperature and solid angle
In Wendelstein 7-X (W7-X), stable plasma detachment in ECRH hydrogen plasmas is routinely achieved with the standard magnetic configuration, containing five magnetic islands in the scrape-off layer (SOL). Plasma detachment induced by intrinsic carbon impurities is characterized by a high radiation fraction (ƒ rad ) with significantly reduced divertor heat load and particle flux. In this work, we present the radiation dynamics during the detached plasma (DP) phase, such as the shift of radiation zones in radial and poloidal directions towards the X-points as ƒ rad increases (∼0.6–0.9), as well as the penetration of the radiation layer into the confinement region in the deep DP phase with ƒ rad approaching unity. In particular, a structure of multi-X-point radiation (multi-XPR) with an up/down asymmetry in the DP phase is highlighted, which is revealed by bolometer tomography and is further confirmed by video diagnostics. The multi-XPR structure forms helical 3D bands aligned with W7-X field periodicity. Field reversal experiments show that the brightest XPR displaces between the upper and lower SOL regions, suggesting the E× B drift effects. This paper presents the multi-XPR structure observed in the W7-X plasma in detail for the first time. A simplified model considering the influence of the poloidal E× B drift ( V d ) on the impurity flow in the SOL shows that the downstream drift toward the target or target shadow region ( V d < 0) decreases the impurity content, while the upstream drift toward the LCFS ( V d > 0) increases the impurity content. On this basis, the poloidal drift potentially leads to an up/down asymmetry of impurity density in the SOL despite the symmetry magnetic topology. The dynamics of the up/down asymmetry in the multi-XPR structure is also related to the magnitude V d /D (normalized to the impurity diffusivity), with an additional effect owing to the radial inward shift of the emission zone. These results provide new insights into impurity-induced detachment dynamics and provide a basis for improving 3D modeling of impurity transport, which typically does not consider drifts.
Theoretical models explaining the hard-X-ray, soft-X-ray, and EUV emission of accretion-disk cataclysmic variables in terms of the disk boundary layer (DBL) are developed on the basis of a survey of the published observational data. The data are compared with model predictions in graphs for systems with high or low (greater than or less than 10-Pg/s) accretion rates. Good agreement is obtained both at low accretion rates, where an optically thin rarefied hot (Te = 10 to the 8th K) DBL radiates most of its energy as hard X-rays, and at high accretion rates, where an optically thick 100,000-K DBL radiates most of its energy in the EUV and as soft X-rays. Detailed analysis of the old nova V603 Aql suggests that previous models predicting more detections of soft-X-ray/EUV emissions from thick-DBL objects (Ferland et al., 1982) used inappropriate dwarf masses, interstellar column densities, or classical-nova space densities.
X-rays are an energetic and penetrating form of ionizing electromagnetic radiation, which can degrade NASA flight hardware. The main concern posed by such radiation is degradation of active electronic devices and, in some cases, diodes. Non-electronic components are only damaged at doses that far exceed the point where any electronic device would be destroyed. For the purposes of this document, flight hardware can be taken to mean an entire instrument, the flight electronics within the instrument or the individual microelectronic devices in the flight electronics. This document will discuss and describe the ways in which NASA flight hardware might be exposed to x-rays, what is and isn't a concern, and how to tell the difference. First, we must understand what components in flight hardware may be vulnerable to degradation or failure as a result of being exposed to ionizing radiation, such as x-rays. As stated above, bulk materials (structural metals, plastics, etc.) are generally only affected by ionizing radiation at very high dose levels. Likewise, passive electronic components (e.g. resistors, capacitors, most diodes) are strongly resistant to exposure to x-rays, except at very high doses. The main concerns arise when active components, that is, components like discrete transistors and microelectronic devices, are exposed to ionizing radiation. Active components are designed to respond to minute changes in currents and voltages in the circuit. As such, it is not surprising that exposure to ionizing radiation, which creates ionized and therefore electrically active particles, may degrade the way the hardware performs. For the most part, the mechanism for this degradation is trapping of the charges generated by ionizing radiation by defects in dielectric materials in the hardware. As such, the degree of damage is a function of both the quantity of ionizing radiation exposure and the physical characteristics of the hardware itself. The metric that describes the level of exposure to ionizing radiation is total ionizing dose (TID). The unit of TID is the rad, which is defined as 100 ergs absorbed per gram of material. Dose can be expressed in other units, for example grays (gy), where 1 gy = 100 rads. The actual fluence of radiation needed to deliver a rad depends on the absorbing material, so units of dose are usually stated in reference to the material of interest. That is, for microelectronic devices, the unit of dose is generally rad (Si) or rad (SiO2). However, the definition of absorbed dose in this fashion has the advantage that the type of radiation causing the ionization can be normalized so that a realistic and adequate comparison can be made. The sensitivity of microelectronic parts to TID varies over many orders of magnitude. (Note: Doses to humans are typically expressed in rems-or roentgen-equivalent-man-which measures tissue damage, and depends on the type of radiation, as well as the dose in rads.) Thus far, the "softest" parts tested at NASA showed damage at 500 rads (Si), while parts that are radiation-hardened by design can remain functional to doses on the order of 107 rads (Si). This broad range of sensitivity highlights one of the most important considerations when considering the effects of radiation on electronic parts: In order to determine whether a radiation exposure is a concern for a particular part, one must understand the technologies used in the part and their vulnerabilities to TID damage. A NASA radiation expert should be consulted to obtain such information.
Abstract Ultrafast high-brightness X-ray pulses have proven invaluable for a broad range of research. Such pulses are typically generated via synchrotron emission from relativistic electron bunches using large-scale facilities. Recently, significantly more compact X-ray sources based on laser-wakefield accelerated (LWFA) electron beams have been demonstrated. In particular, laser-driven sources, where the radiation is generated by transverse oscillations of electrons within the plasma accelerator structure (so-called betatron oscillations) can generate highly-brilliant ultrashort X-ray pulses using a comparably simple setup. Here, we experimentally demonstrate a method to markedly enhance the parameters of LWFA-driven betatron X-ray emission in a proof-of-principle experiment. We show a significant increase in the number of generated photons by specifically manipulating the amplitude of the betatron oscillations by using our novel Transverse Oscillating Bubble Enhanced Betatron Radiation scheme. We realize this through an orchestrated evolution of the temporal laser pulse shape and the accelerating plasma structure. This leads to controlled off-axis injection of electrons that perform large-amplitude collective transverse betatron oscillations, resulting in increased radiation emission. Our concept holds the promise for a method to optimize the X-ray parameters for specific applications, such as time-resolved investigations with spatial and temporal atomic resolution or advanced high-resolution imaging modalities, and the generation of X-ray beams with even higher peak and average brightness.
Nonflaring solar X-ray and microwave radiation flux correlation from satellite data
Solar cycle and slowly varying components correlation with soft X ray radiation based on spacecraft measurements
Surfaces of the aluminized Teflon FEP multi-layer thermal insulation on the Hubble Space Telescope (HST) were found to be cracked and curled in some areas at the time of the second servicing, mission in February 1997, 6.8 years after HST was deployed in low Earth orbit (LEO). As part of a test program to assess environmental conditions which would produce embrittlement sufficient to cause cracking of Teflon on HST, samples of Teflon FEP with a backside layer of vapor deposited aluminum were exposed to vacuum ultraviolet (VUV) and soft x-ray radiation of various energies using facilities at the National Synchrotron Light Source. Brookhaven National Laboratory. Samples were exposed to synchrotron radiation of narrow energy bands centered on energies between 69 eV and 1900 eV. Samples were analyzed for ultimate tensile strength and elongation. Results will be compared to those of aluminized Teflon FEP retrieved from HST after 3.6 years and 6.8 years on orbit and will he referenced to estimated HST mission doses of VUV and soft x-ray radiation.
Abstract Density ramps with ion grad B drift directed into lower single null KSTAR L-mode plasmas are associated with a simultaneous and abrupt reduction of the divertor particle flux on both low- and high-field-side targets when the mid-plane line averaged electron density reaches a given level. Target embedded Langmuir probe signals show a clear ‘cliff edge’ behavior similar to that observed in the divertor target electron temperature in DIII-D H-mode plasmas (Eldon et al 2017 Nucl. Fusion 57 066039; McLean et al 2015 J. Nucl. Mater. 463 533–6). The collapse of the particle flux is observed along the whole divertor target area (from private flux region to the far scrape-off layer (SOL)). The critical upstream density of this target flux cliff is invariant under fuel gas throughput modulation. The transition along the cliff occurs in tens of milliseconds. With the cliff, carbon impurities and deuterium neutrals transported through the X-point to the core produce a strong radiation spot near the X-point, seen on bolometric signals, and increase the upstream density. The experimental observations are consistent with time-dependent SOLPS-ITER simulations, which also demonstrate an abrupt transition of the target flux and upstream density with the increase in X-point radiation. The timescale of the cliff predicted by SOLPS-ITER is consistent with the experiment, although, it is influenced by gas throughput or time-dependent numerical methods. In the L-mode phase space of separatrix electron density and temperature, branches are divided based on target temperature, because the latter is strongly coupled to the radiation front and ionization front due to the monotonic characteristic of the parallel electron temperature distribution. Since the H-mode condition operates at a much higher upstream density and electron temperature in phase space, dissipation from sputtered carbon alone leads to the density limit before reaching the X-point radiation condition. This is therefore consistent with the fact that cliffs have never been observed in H-mode KSTAR experiments.
Here, the work is devoted to experimental study of soft X-ray radiation spectra of laser produced plasma in a wide spectral range 5–100 Å at the “Kamerton” facility (GPI) with pulse duration 70 ps, pulse energy 1–5 J, wavelength 0.53 microns at which the laser intensity (power flux density) of 7×10 14 – 3.5×10 15 W/cm 2 was achieved. A spectrograph was used, which had transmission diffraction gratings with a ratio of the elementary gap to the period of the structure of 0.25 and 0.41. Detection was performed on both UV-4 X-ray photo film and Fuji TR fluorescent imaging plate. Solid samples from Al, Si, Ti, Cu, Ta and W were used as targets. The ionization states of the plasma corresponding to various electron temperatures were calculated, which made it possible to estimate the electron temperature by comparison these calculation results with the experimentally obtained spectra. The estimated electron temperature, which depends on the laser pulse energy and the target material, varied within the range of 100–450 eV. To verify the correctness of the temperature estimations obtained by such comparison a numerical simulation of plasma radiation was carried out by the use of PrismSPECT computer program. It was found that the results of this simulation are in a good agreement with estimations on the base of experimentally obtained spectra. The analysis of these spectra showed that tantalum, tungsten or titanium targets are the best candidates among the tested ones for the use of laser produced plasma as a radiation source in the "water window" spectral range (23–44 Å) for applications in biology and medicine.
The present study investigated the effects of gamma-ray, electron beam, and X-ray radiation on polymers in EVA/EVOH/EVA multilayer films. Spectroscopic methods, including FTIR and UV–Vis, were employed in conjunction with chemometric treatments such as PCA, SIMPLISMA treatments, and PLS models. The feasibility of dose prediction on multilayer film, given a known dose, is attainable across various irradiation technologies. Both gamma ray and X-ray exhibit comparable effects on the multilayer film, and it is feasible to anticipate the dose released on the film by utilizing UV–Vis spectra or infrared spectra for gamma ray or X-ray of a predetermined dose.
Since the Hubble Space Telescope (HST) was deployed in low Earth orbit in April 1990, two servicing missions have been conducted to upgrade its scientific capabilities. Minor cracking of second-surface metalized Teflon FEP (DuPont; fluorinated ethylene propylene) surfaces from multilayer insulation (MLI) was first observed upon close examination of samples with high solar exposure retrieved during the first servicing mission, which was conducted 3.6 years after deployment. During the second HST servicing mission, 6.8 years after deployment, astronaut observations and photographic documentation revealed significant cracks in the Teflon FEP layer of the MLI on both the solar- and anti-solar-facing surfaces of the telescope. NASA Goddard Space Flight Center directed the efforts of the Hubble Space Telescope MLI Failure Review Board, whose goals included identifying the low-Earth-orbit environmental constituent(s) responsible for the cracking and embrittling of Teflon FEP which was observed during the second servicing mission. The NASA Lewis Research Center provided significant support to this effort. Because soft x-ray radiation from solar flares had been considered as a possible cause for the degradation of the mechanical properties of Teflon FEP (ref. 1), the effects of soft xray radiation and vacuum ultraviolet light on Teflon FEP were investigated. In this Lewisled effort, samples of Teflon FEP with a 100-nm layer of vapor-deposited aluminum (VDA) on the backside were exposed to synchrotron radiation of various vacuum ultraviolet and soft x-ray wavelengths between 18 nm (69 eV) and 0.65 nm (1900 eV). Synchrotron radiation exposures were conducted using the National Synchrotron Light Source at Brookhaven National Laboratory. Samples of FEP/VDA were exposed with the FEP surface facing the synchrotron beam. Doses and fluences were compared with those estimated for the 20-yr Hubble Space Telescope mission.
Intense hard x-ray pulses from a free-electron laser induce irreversible structural damage in a perovskite oxide epitaxial heterostructure when pulse fluences exceed a threshold value. The intensity of x-ray diffraction from a 25-nm thick epitaxial BiFeO 3 layer on a SrTiO 3 (STO) substrate measured using a series of pulses decreases abruptly with a per-pulse fluence of 2.7 x 10(6) photons mu m -2 at a photon energy of 9.7 keV but remains constant for 1.3 x 10 6 photons mu m -2 or less. The damage resulted in the destruction of the BiFeO 3 thin film within the focal spot area and the formation of a deep cavity penetrating into the STO substrate via the removal of tens of nanometers of material per pulse. The damage threshold occurs at a fluence that is insufficient to heat the absorption volume to the melting point. The morphology of the ablated sample is consistent with fracture rather than melting. Together, these results indicate that the damage occurs via a nonthermal process consistent with ultrafast ionization of the absorption volume.