Application of dynamic programming to optimizing the orbital control process of a 24 hour communication satellite
Optimization of 24-hour communication satellite orbital control process
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Statistical Process Control and Analysis on the Water Content Measurements in NASA Glenn’s Icing Research Tunnel
The Icing Research Tunnel at NASA Glenn follows the recommended practice for calibration outlined in SAE’s ARP5905. The calibration team has followed the schedule of a full calibration every five years with a check calibration done every six months following. The liquid water content of the IRT has maintained stability within the stated specifications of variation within +/- 10% of the curve fit equation generated from calibration data. Using past measurements and data trends, IRT characterization engineers wanted to develop methods for the ability to know when data were not within variation. Trends can be observed in the liquid water content measurement process by constructing statistical process control charts. This paper describes data processing procedures for the Multi-Element Sensor in the IRT, including collision efficiency corrections, canonical correlation analysis, process for rejection of data, and construction of control charts. Data are presented to display the control capability to meet defined liquid water content specifications of the IRT with the Multi-Element Sensor mounted in the center of the test section.
Statistical Process Control↗
Statistical Process Control and Analysis on the Water Content Measurements in NASA Glenn’s Icing Research Tunnel
The Icing Research Tunnel at NASA Glenn follows the recommended practice for calibration outlined in SAE’s ARP5905. The calibration team has followed the schedule of a full calibration every five years with a check calibration done every six months following. The liquid water content of the IRT has maintained stability within the stated specifications of variation within +/- 10% of the curve fit equation generated from calibration data. Using past measurements and data trends, IRT characterization engineers wanted to develop methods for the ability to know when data were not within variation. Trends can be observed in the liquid water content measurement process by constructing statistical process control charts. This paper describes data processing procedures for the Multi-Element Sensor in the IRT, including collision efficiency corrections, canonical correlation analysis, process for rejection of data, and construction of control charts. Data are presented to display the control capability to meet defined liquid water content specifications of the IRT with the Multi-Element Sensor mounted in the center of the test section.
Statistical Process Control↗
Derivation of sequential, real-time, process-control programs
The use of weakest-precondition predicate transformers in the derivation of sequential, process-control software is discussed. Only one extension to Dijkstra's calculus for deriving ordinary sequential programs was found to be necessary: function-valued auxiliary variables. These auxiliary variables are needed for reasoning about states of a physical process that exists during program transitions.
Marzullo, Keith↗
Methods of measurement for semiconductor materials, process control, and devices
Activities directed toward the development of methods of measurement for semiconductor materials, process control, and devices are described. Topics investigated include: measurements of transistor delay time; application of the infrared response technique to the study of radiation-damaged, lithium-drifted silicon detectors; and identification of a condition that minimizes wire flexure and reduces the failure rate of wire bonds in transistors and integrated circuits under slow thermal cycling conditions. Supplementary data concerning staff, standards committee activities, technical services, and publications are included as appendixes.
Bullis, W. M.↗
Methods of measurement for semiconductor materials, process control, and devices
Activities directed toward the development of methods of measurement for semiconductor materials, process control, and devices are described. Accomplishments include the determination of the reasons for differences in measurements of transistor delay time, identification of an energy level model for gold-doped silicon, and the finding of evidence that it does not appear to be necessary for an ultrasonic bonding tool to grip the wire and move it across the substrate metallization to make the bond. Work is continuing on measurement of resistivity of semiconductor crystals; study of gold-doped silicon; development of the infrared response technique; evaluation of wire bonds and die attachment; measurement of thermal properties of semiconductor devices, delay time, and related carrier transport properties in junction devices, and noise properties of microwave diodes; and characterization of silicon nuclear radiation detectors.
Bullis, W. M.↗
Methods of measurement for semiconductor materials, process control, and devices Quarterly report, 1 Oct. - 31 Dec. 1969
Methods of measurement for semiconductor material, process control, and devices
Bullis, W. M.↗
Methods of measurement for semiconductor materials, process control, and devices Quarterly report, 1 Jan. - 31 Mar. 1970
Methods of measurement for semiconductor materials process control, and devices
Baroody, A. J., Jr.↗
Existence of a robust optimal control process for efficient measurements in a two-qubit system
The verification of quantum entanglement is essential for quality control in quantum communication. In this work we propose an efficient protocol to directly verify the two-qubit entanglement of a known target state through a single-expectation-value measurement. Our method provides exact entanglement quantification using the concurrence measure without performing quantum state tomography. We prove the existence of a unitary transformation that drives a known initial state of a two-qubit system to a designated final state, where the trace over a chosen observable directly yields the concurrence of the initial state. Furthermore, we implement an optimal control process of that transformation and demonstrate its effectiveness through numerical simulations. We also show that this process is robust to environmental noise. Our approach offers advantages in directly verifying entanglement with low circuit depth, making it suitable for industrial-scale quality control of entanglement generation. Our results presented here provide mathematical justification for our earlier computational experiments.
Rodriguez, Ricardo [McPherson Coll.] (ORCID:000000↗
Methods of measurement for semiconductor materials, process control, and devices
Tuning and photovoltaic methods and identification of test conditions for measurement of semiconductor materials, process control, and devices
Bullis, W. M.↗
Knowledge-based process control and diagnostics for orbital cryogen transfer
AFDex is a rule based system designed to provide intelligent process control, diagnosis, and error recovery for a Shuttle based cryogenic experiment, SHOOT (Superfluid Helium On-Orbit Transfer). This paper describes the AFDex system in the context of traditional associative, model-based, and qualitative systems and discusses the implications of this first expert system in space.
Raymond, Eric A.↗
Adaptive process control using fuzzy logic and genetic algorithms
Researchers at the U.S. Bureau of Mines have developed adaptive process control systems in which genetic algorithms (GA's) are used to augment fuzzy logic controllers (FLC's). GA's are search algorithms that rapidly locate near-optimum solutions to a wide spectrum of problems by modeling the search procedures of natural genetics. FLC's are rule based systems that efficiently manipulate a problem environment by modeling the 'rule-of-thumb' strategy used in human decision making. Together, GA's and FLC's possess the capabilities necessary to produce powerful, efficient, and robust adaptive control systems. To perform efficiently, such control systems require a control element to manipulate the problem environment, and a learning element to adjust to the changes in the problem environment. Details of an overall adaptive control system are discussed. A specific laboratory acid-base pH system is used to demonstrate the ideas presented.
Karr, C. L.↗
Adaptive Process Control with Fuzzy Logic and Genetic Algorithms
Researchers at the U.S. Bureau of Mines have developed adaptive process control systems in which genetic algorithms (GA's) are used to augment fuzzy logic controllers (FLC's). GA's are search algorithms that rapidly locate near-optimum solutions to a wide spectrum of problems by modeling the search procedures of natural genetics. FLC's are rule based systems that efficiently manipulate a problem environment by modeling the 'rule-of-thumb' strategy used in human decision-making. Together, GA's and FLC's possess the capabilities necessary to produce powerful, efficient, and robust adaptive control systems. To perform efficiently, such control systems require a control element to manipulate the problem environment, an analysis element to recognize changes in the problem environment, and a learning element to adjust to the changes in the problem environment. Details of an overall adaptive control system are discussed. A specific laboratory acid-base pH system is used to demonstrate the ideas presented.
Karr, C. L.↗
Test and inspection for process control of monolithic circuits
Report details the test and inspection procedures for the mass production of high reliability integrated circuits. It covers configuration control, basic fundamentals of quality control, control charts, wafer process evaluation, general process evaluation, evaluation score system, and diffusion evaluation.
Spangenberg, E.↗
Microprocessor systems for industrial process control
Six computers operate synchronously and are interconnected by three independent data buses. Processors control one subsystem. Some can control buses to transfer data at 1 megabit per second. Every 2.5 msec each processor examines list of things to do during next interval. This spacecraft control system could be adapted for controlling complex industrial processes.
Lesh, F. H.↗
Intelligent laser soldering inspection and process control
Component assembly on printed circuitry keeps making giant strides toward denser packaging and smaller dimensions. From a single layer to multilayer, from through holes to surface mounted components and tape applied bonds, unrelenting progress results in new, difficult problems in assembling, soldering, inspecting and controlling the manufacturing process of the new electronics. Among the major problems are the variables introduced by human operators. The small dimensions and the tight assembly tolerances are now successfully met by machines which are faster and more precise than the human hand. The same is true for soldering. But visual inspection of the solder joints is now so severely limited by the ever shrinking area accessible to the human eye that the inspector's diagnosis cannot be trusted any longer. Solutions to correcting these problems are discussed.
Vanzetti, Riccardo↗
Laboratory process control using natural language commands from a personal computer
PC software is described which provides flexible natural language process control capability with an IBM PC or compatible machine. Hardware requirements include the PC, and suitable hardware interfaces to all controlled devices. Software required includes the Microsoft Disk Operating System (MS-DOS) operating system, a PC-based FORTRAN-77 compiler, and user-written device drivers. Instructions for use of the software are given as well as a description of an application of the system.
Will, Herbert A.↗
Methods of measurement for semiconductor materials, process control, and devices Quarterly report, 1 Jul. - 30 Sep. 1970
NBS activities in developing methods of measurement for semiconductor materials, process control, and devices
Bullis, W. M.↗