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Surveyor lunar roving vehicle, phase I. Volume IV - Reliability Final report
Reliability of Surveyor lunar roving vehicle design - mathematical models, failure modes, and predictions
Ballistic Impact of Braided Composites with a Soft Projectile
Impact tests using a soft gelatin projectile were performed to identify failure modes that occur at high strain energy density during impact loading. Failure modes were identified for aluminum plates and for composites plates and half-rings made from triaxial carbon fiber braid having a 0/+/- 60deg architecture. For aluminum plates, a large hole formed as a result of crack propagation from the initiation site at the center of the plate. For composite plates, fiber tensile failure occurred in the back ply at the center of the plate. Cracks then propagated from this site along the +/-60deg fiber directions until triangular flaps opened to form a hole. For composite half-rings fabricated with 0deg fibers aligned circumferentially, fiber tensile failure also occurred in the back ply. Cracks first propagated from this site perpendicular the 0deg fibers. The cracks then turned to follow the +/-60deg fibers and 0deg fibers until rectangular flaps opened to form a hole. Damage in the composites was localized near the impact site, while cracks in the aluminum extended to the boundaries.
Relating Measured Component Damage to Assessed Component Reliability in Reliability Integrity Management (RIM)
There is currently no widely agreed detailed general method for licensing a novel plant incorporating novel materials (or materials being deployed in novel environments); in many such situations, there are no directly applicable engineering code cases for decision-makers (including regulators) to rely on. It may be possible to develop an approach to licensing such a plant that is based on the Reliability and Integrity Management (RIM) approach delineated in ASME BPVC Section XI Division 2. NRC Regulatory Guide 1.246, Rev.0, endorses, with conditions, the subject portion of the ASME Code. But that portion of the ASME code is written at a very high level, and there are fundamental technical challenges associated with applying it literally to licensing a real plant. In the RIM approach, applicants need to do the following (among other things): • Allocate target reliabilities to structures, systems, and components (SSCs) that collectively support the top-level plant safety and availability objectives; • Understand failure modes of those SSCs, and the degradation mechanisms that could lead to those failure modes; • Develop and propose a program of surveillances that will identify degradation prior to failure of SSCs; • Provide a means of reporting results, taking actions for anomalous or undesirable conditions, and give the regulator assurance of continued safe operations. Applying RIM in a specific case will call for advances in the state of practice of relating physical observables to functional reliability of certain component types. Except where a given level of damage corresponds to a failed (or nearly failed) state, it is not practical to establish a precise quantitative relationship between physical observables and reliability. This paper focuses on managing risk of passive component failures based on observable damage parameters. A simple approach to cumulative damage modeling will be illustrated with a view to possible use in RIM applications.
Analysis and Optimization of Test Plans for Advanced Exploration Systems Reliability and Supportability
Future crewed exploration missions beyond Low Earth Orbit (LEO) will operate farther from Earth and be logistically isolated for longer than any previous human spaceflight mission. Under these conditions, supportability and reliability willbestronger drivers of mission mass and risk than they have been in the past. Items with high failure rates, or uncertain failure rates, can result in high spares mass requirements and/or high risk on deep space missions. Testing is a critical element of system development which provides the opportunity to identify and resolve design issues, defects, or other failure modes before they cause problems during a mission. Reliability growth programs can reduce failure rates by identifying and remove failure modes via design changes, and long-duration life testing can provide valuable data to reduce failure rate estimate uncertainty and verify (to some level of confidence) that components are as reliable as expected. Testing activities take time and resources, however, and must be incorporated into program plans in order to be fully effective. This paper presents an integrated reliability test plan analysis and optimization methodology, which has been used to inform Advanced Exploration Systems (AES) Life Support Systems (LSS) ground test planning for future missions. The methodology determines the optimal number of test units to purchase and allocation of test time –split between reliability growth and uncertainty reduction testing –across a given set of items in order to minimize spares mass for a given mission under constraints on total test cost and schedule. Model outputs also include expected spares mass after testing and the expected number of modifications or refurbishments during testing, both of which can inform program planning. Discussion of the model, conclusions, and future work are also presented.
Analysis and Optimization of Test Plans for Advanced Exploration Systems Reliability and Supportability
Future crewed exploration missions beyond Low Earth Orbit (LEO) will operate farther from Earth and be logistically isolated for longer than any previous human spaceflight mission. Under these conditions, supportability and reliability willbestronger drivers of mission mass and risk than they have been in the past. Items with high failure rates, or uncertain failure rates, can result in high spares mass requirements and/or high risk on deep space missions. Testing is a critical element of system development which provides the opportunity to identify and resolve design issues, defects, or other failure modes before they cause problems during a mission. Reliability growth programs can reduce failure rates by identifying and remove failure modes via design changes, and long-duration life testing can provide valuable data to reduce failure rate estimate uncertainty and verify (to some level of confidence) that components are as reliable as expected. Testing activities take time and resources, however, and must be incorporated into program plans in order to be fully effective. This paper presents an integrated reliability test plan analysis and optimization methodology, which has been used to inform Advanced Exploration Systems (AES) Life Support Systems (LSS) ground test planning for future missions. The methodology determines the optimal number of test units to purchase and allocation of test time –split between reliability growth and uncertainty reduction testing –across a given set of items in order to minimize spares mass for a given mission under constraints on total test cost and schedule. Model outputs also include expected spares mass after testing and the expected number of modifications or refurbishments during testing, both of which can inform program planning. Discussion of the model, conclusions, and future work are also presented.
Advancing reliability assessments of photovoltaic modules and materials using combined-accelerated stress testing
Previously undiscovered failure modes in photovoltaic (PV) modules continue to emerge in field installations despite passing protocols for design qualification and quality assurance. Failure to detect these modes prior to widespread use could be attributed to the limitations of present-day standard accelerated stress tests (ASTs), which are primarily designed to identify known degradation or failure modes at the time of development by applying simultaneous or sequential stress factors (usually two at most). Here, we introduce an accelerated testing method known as the combined-accelerated stress test (C-AST), which simultaneously combines multiple stress factors of the natural environment. Simultaneous combination of multiple stress factors allows for improved identification of failure modes with better ability to detect modes not known a priori. A demonstration experiment was conducted that reproduced the field-observed cracking of polyamide- (PA-) and polyvinylidene fluoride (PVDF)–based backsheet films, a failure mode that was not detected by current design qualification and quality assurance testing requirements. In this work, a two-phase testing protocol was implemented. The first cycle (“Tropical”) is a predominantly high-humidity and high-temperature test designed to replicate harsh tropical climates. The second cycle (“Multi-season”) was designed to replicate drier and more temperate conditions found in continental or desert climates. Testing was conducted on 2 × 2-cell crystalline-silicon cell miniature modules constructed with both ultraviolet (UV)–transmitting and UV-blocking encapsulants. Cracking failures were observed within a cumulative 120 days of the Tropical condition for one of the PA-based backsheets and after 84 days of Tropical cycle followed by 42 days of the Multi-season cycle for the PVDF-based backsheet, which are both consistent with failures seen in fielded modules. In addition to backsheet cracking, degradation modes were observed including solder/interconnect fatigue, various light-induced degradation modes, backsheet delamination, discoloration, corrosion, and cell cracking. The ability to simultaneously apply multiple stress factors may allow many of the test sequences within the standardized design qualification procedure to be performed using a single test setup.
Poster - 30: Use of a Hazard-Risk Analysis for development of a new eye immobilization tool for treatment of choroidal melanoma
Purpose: Our treatment for choroidal melanoma utilizes the GTC frame. The patient looks at a small LED to stabilize target position. The LED is attached to a metal arm attached to the GTC frame. A camera on the arm allows therapists to monitor patient compliance. To move to mask-based immobilization we need a new LED/camera attachment mechanism. We used a Hazard-Risk Analysis (HRA) to guide the design of the new tool. Method: A pre-clinical model was built with input from therapy and machine shop personnel. It consisted of an aluminum frame placed in aluminum guide posts attached to the couch top. Further development was guided by the Department of Defense Standard Practice - System Safety hazard risk analysis technique. Results: An Orfit mask was selected because it allowed access to indexes on the couch top which assist with setup reproducibility. The first HRA table was created considering mechanical failure modes of the device. Discussions with operators and manufacturers identified other failure modes and solutions. HRA directed the design towards a safe clinical device. Conclusion: A new immobilization tool has been designed using hazard-risk analysis which resulted in an easier-to-use and safer tool compared to the initial design. The remaining risks are all low probability events and not dissimilar from those currently faced with the GTC setup. Given the gains in ease of use for therapists and patients as well as the lower costs for the hospital, we will implement this new tool.
2023 Risk Management Plan and Register for Low-Power WEC for Non-Grid Applications
This is an updated risk management plan and risk register for the design, build and test of a novel, remote, low-power wave energy converter (WEC) for non-grid applications. This Columbia Power Technologies project seeks to develop a prototype low-power WEC that lowers the total cost of ownership and provides robust, new capabilities for customers in the maritime environment. The testing location for this prototype is the U.S. Navy Wave Energy Test Site (WETS) in Kaneohe Bay, O'ahu, Hawai'i. Detailed in the Risk Management Plan document is a Failure Modes, Effects, and Criticality Analysis (FMEC) that systematically identifies all potential failure modes and their effects on the system. Risk registers for major subsystems were completed according to the methodology described in the Risk Management Plan and are also included here.
Analysis, testing, and evaluation of faulted and unfaulted Wye, Delta, and open Delta connected electromechanical actuators
Mathematical models capable of simulating the transient, steady state, and faulted performance characteristics of various brushless dc machine-PSA (power switching assembly) configurations were developed. These systems are intended for possible future use as primemovers in EMAs (electromechanical actuators) for flight control applications. These machine-PSA configurations include wye, delta, and open-delta connected systems. The research performed under this contract was initially broken down into the following six tasks: development of mathematical models for various machine-PSA configurations; experimental validation of the model for failure modes; experimental validation of the mathematical model for shorted turn-failure modes; tradeoff study; and documentation of results and methodology.
A Review of Transmission Diagnostics Research at NASA Lewis Research Center
This paper presents a summary of the transmission diagnostics research work conducted at NASA Lewis Research Center over the last four years. In 1990, the Transmission Health and Usage Monitoring Research Team at NASA Lewis conducted a survey to determine the critical needs of the diagnostics community. Survey results indicated that experimental verification of gear and bearing fault detection methods, improved fault detection in planetary systems, and damage magnitude assessment and prognostics research were all critical to a highly reliable health and usage monitoring system. In response to this, a variety of transmission fault detection methods were applied to experimentally obtained fatigue data. Failure modes of the fatigue data include a variety of gear pitting failures, tooth wear, tooth fracture, and bearing spalling failures. Overall results indicate that, of the gear fault detection techniques, no one method can successfully detect all possible failure modes. The more successful methods need to be integrated into a single more reliable detection technique. A recently developed method, NA4, in addition to being one of the more successful gear fault detection methods, was also found to exhibit damage magnitude estimation capabilities.
Assessment of Stirling Technology Has Provided Critical Data Leading Toward Flight Readiness of the Stirling Converter
The NASA Glenn Research Center is supporting the development of a Stirling converter with the Department of Energy (DOE, Germantown, Maryland) for an advanced Stirling Radioisotope Power System (SRPS) to provide spacecraft onboard electric power for NASA space science missions. A key technology assessment completed by Glenn and DOE has led to the SRPS being identified as a high-efficiency power source for such deep space missions as the Europa Orbiter and the Solar Probe. In addition, the Stirling system is now being considered for unmanned Mars rovers, especially where mission profiles may exclude the use of photovoltaic power systems, such as exploration at high Martian latitudes or for missions of long duration. The SRPS efficiency of over 20 percent will reduce the required amount of radioisotope by more than a factor of 3 in comparison to current radioisotope thermoelectric generators. This significantly reduces radioisotope cost, radiological inventory, and system cost, and it provides efficient use of scarce radioisotope resources. In support of this technology assessment, Glenn conducted a series of independent evaluations and tests to determine the technology readiness of a 55-We Stirling converter developed by Stirling Technology Company (Kennewick, Washington) and DOE. Key areas evaluated by Glenn included: 1) Radiation tolerance of materials; 2) Random vibration testing of the Stirling converter in Glenn's Structural Dynamics Lab to simulate operation in the launch environment; 3) Electromagnetic interference and compatibility (EMI/EMC) of the converter operating in Glenn's EMI lab; Independent failure modes, effects, and criticality analysis, and life and reliability 4. Independent failure modes, effects, and criticality analysis, and life and reliability assessment; and 5) SRPS cost estimate. The data from these evaluations were presented to NASA Headquarters and the Jet Propulsion Laboratory mission office by a joint industry/Government team consisting of DOE, Glenn, and Lockheed Martin Astronautics. This team concluded that there are no technical reasons that would rule out using the Stirling converter for deep space missions. As a direct result of the successful testing at Glenn, the DOE/Stirling Technology Company 55-We Stirling converter has been baselined for the SRPS. Glenn is now continuing an in-house project to assist in developing the Stirling converter for readiness for space qualification and mission implementation. As part of this effort, the Stirling converter will be further characterized under launch environment random vibration testing, methods to reduce converter EMI will be developed, and an independent performance verification will be completed. Converter life assessment and permanent magnet aging characterization tasks are also underway. Substitute organic materials for the linear alternator and piston bearing coatings for use in a high-radiation environment have been identified and have now been incorporated in Stirling converters built by Stirling Technology Company for Glenn. Electromagnetic and thermal finite element analyses for the alternator are also being conducted.
NASA's Evolutionary Xenon Thruster (NEXT) Project Qualification Propellant Throughput Milestone: Performance, Erosion, and Thruster Service Life Prediction After 450 kg
The NASA s Evolutionary Xenon Thruster (NEXT) program is tasked with significantly improving and extending the capabilities of current state-of-the-art NSTAR thruster. The service life capability of the NEXT ion thruster is being assessed by thruster wear test and life-modeling of critical thruster components, such as the ion optics and cathodes. The NEXT Long-Duration Test (LDT) was initiated to validate and qualify the NEXT thruster propellant throughput capability. The NEXT thruster completed the primary goal of the LDT; namely to demonstrate the project qualification throughput of 450 kg by the end of calendar year 2009. The NEXT LDT has demonstrated 28,500 hr of operation and processed 466 kg of xenon throughput--more than double the throughput demonstrated by the NSTAR flight-spare. Thruster performance changes have been consistent with a priori predictions. Thruster erosion has been minimal and consistent with the thruster service life assessment, which predicts the first failure mode at greater than 750 kg throughput. The life-limiting failure mode for NEXT is predicted to be loss of structural integrity of the accelerator grid due to erosion by charge-exchange ions.
Status of the NASA's Evolutionary Xenon Thruster (NEXT) Long-Duration Test After 30,352 Hours of Operation
The NASA s Evolutionary Xenon Thruster (NEXT) program is tasked with significantly improving and extending the capabilities of current state-of-the-art NSTAR thruster. The service life capability of the NEXT ion thruster is being assessed by thruster wear test and life-modeling of critical thruster components, such as the ion optics and cathodes. The NEXT Long-Duration Test (LDT) was initiated to validate and qualify the NEXT thruster propellant throughput capability. The NEXT thruster completed the primary goal of the LDT; namely to demonstrate the project qualification throughput of 450 kg by the end of calendar year 2009. The NEXT LDT has demonstrated 30,352 hr of operation and processed 490 kg of xenon throughput--surpassing the NSTAR Extended Life Test hours demonstrated and more than double the throughput demonstrated by the NSTAR flight-spare. Thruster performance changes have been consistent with a priori predictions. Thruster erosion has been minimal and consistent with the thruster service life assessment, which predicts the first failure mode at greater than 750 kg throughput. The life-limiting failure mode for NEXT is predicted to be loss of structural integrity of the accelerator grid due to erosion by charge-exchange ions.
Preliminary Cyber-Informed Dynamic Branch Conditions for Analysis with the Dynamic Simplified Cyber MELCOR Model
Instrumentation and control of nuclear power is transforming from analog to modern digital assets. These control systems perform key safety and security functions. This transformation is occurring in new plant designs as well as in the existing fleet of plants as the operation of those plants is extended to 60 years. This transformation introduces new and unknown exploits involving both digital asset induced safety issues and security exploits. Traditional the open literature of nuclear power risk assessment tools and cyber security assessment methods have not been modified or developed to address the unique nature of cyber failure modes and of cyber security threats. Starting in 2015, Sandia National Laboratories (SNL) embarked on a two year dynamic cyber-risk informed project to facilitate the analysis of unique cyber failure modes and the time sequencing of cyber faults, both malicious and non-malicious, and impose those cyber exploits and cyber faults onto a nuclear power plant accident sequence simulator code to assess how cyber exploits and cyber faults could interact with a plant's digital instrumentation and control (DI and C) system in the absence of digital controls. This will be achieved by coupling SNL's existing dynamic scheduler code (ADAPT), nuclear accident simulator code (MELCOR), and cyber Emulytics code (SCEPTRE) to demonstrate real-time simulation of cyber exploits and their impact on automatic DI and C responses. Studying such potential time-sequenced cyber-attacks and their risks (i.e., the associated impact and the associated degree of difficulty to achieve the attack vector) as they pertain to accident management will provide a risk informed basis for developing effective cyber security controls for nuclear power. This paper will discuss the rationale behind the proposed generic cyber exploits for an abstracted Pressurized Water Reactor that has adopted a unified DI and C System. Other papers related to this project submitted to this conference discuss: - The MELCOR model for this abstracted reactor, called the Dynamic Simplified Cyber (DSC) model, - Modifications to ADAPT to: Extend the framework for multiple simulators, Incorporation of importance measures into dynamic event tree analysis, Sort and reduce the dynamic event tree based upon inputs to or outputs from the tree, and - A feasibility study for using density based clustering methods with dynamic time wrapping to cluster and prune dynamic event trees. (authors)
A Screening Method Using Pulsed-Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors
Bulk metal foil and thin film resistors occasionally contain localized defects within the etched resistor pattern. Common defects of this type include in-line constrictions referred to as notches, unremoved resistor material bridges between adjacent pattern lines, and embedded non-conductive particles in the resistor material. Such defects are prone to fracture due to thermomechanical fatigue during powered operation, especially power cycling, resulting in positive resistance change and open circuit failure modes. Common screening methods of optical microscopy, short time overload power tests (e.g., 6.25x rated power for 5 seconds) and burn-in (e.g., 1.5x rated power for 100 hours) are useful, but they are not always effective at removing devices with such defects. An improved method has been developed to screen for localized resistor pattern defects. The method involves the application of brief, high power electrical pulses at a low duty cycle while inspecting the resistor with a high resolution, high speed infrared camera. The following test conditions were found to be suitable for this purpose: 6.25x rated power, 1 to 5 pulses, 50 ms pulse width and 10% duty cycle. During the power pulsing, localized constrictions in the resistor pattern are identifiable as hot spots via the infrared camera. Reject criteria can be established based on observations of hot spots. To assess its effectiveness, a total of two hundred eighty (280) surface mount foil resistors (40 each from 7 different lots) were screened using this infrared technique. The screening identified twenty-nine (29) resistors with significant hot spots in the resistor pattern. All 280 resistors were then subjected to an industry standard 10,000 hour life test at 1x rated power at 70°C with power cycled for 90 minutes on and 30 minutes off. During life testing, three resistors exhibited positive resistance change failure mode. All three failures were due to thermomechanical fatigue failure of localized bridge defects at the locations identified via infrared screening. The results of this evaluation illustrate the benefits of the pulsed-power infrared detection screening technique to identify reliability suspect foil or thin film resistors that may escape common screening methods.
A Screening Method Using Pulsed-Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors
Bulk metal foil and thin film resistors occasionally contain localized defects within the etched resistor pattern. Common defects of this type include in-line constrictions referred to as notches, unremoved resistor material bridges between adjacent pattern lines, and embedded non-conductive particles in the resistor material. Such defects are prone to fracture due to thermomechanical fatigue during powered operation, especially power cycling, resulting in positive resistance change and open circuit failure modes. Common screening methods of optical microscopy, short time overload power tests (e.g., 6.25x rated power for 5 seconds) and burn-in (e.g., 1.5x rated power for 100 hours) are useful, but they are not always effective at removing devices with such defects. An improved method has been developed to screen for localized resistor pattern defects. The method involves the application of brief, high power electrical pulses at a low duty cycle while inspecting the resistor with a high resolution, high speed infrared camera. The following test conditions were found to be suitable for this purpose: 6.25x rated power, 1 to 5 pulses, 50 ms pulse width and 10% duty cycle. During the power pulsing, localized constrictions in the resistor pattern are identifiable as hot spots via the infrared camera. Reject criteria can be established based on observations of hot spots. To assess its effectiveness, a total of two hundred eighty (280) surface mount foil resistors (40 each from 7 different lots) were screened using this infrared technique. The screening identified twenty-nine (29) resistors with significant hot spots in the resistor pattern. All 280 resistors were then subjected to an industry standard 10,000 hour life test at 1x rated power at 70°C with power cycled for 90 minutes on and 30 minutes off. During life testing, three resistors exhibited positive resistance change failure mode. All three failures were due to thermomechanical fatigue failure of localized bridge defects at the locations identified via infrared screening. The results of this evaluation illustrate the benefits of the pulsed-power infrared detection screening technique to identify reliability suspect foil or thin film resistors that may escape common screening methods.
Some Aspects of the Failure Mechanisms in BaTiO3-Based Multilayer Ceramic Capacitors
The objective of this presentation is to gain insight into possible failure mechanisms in BaTiO3-based ceramic capacitors that may be associated with the reliability degradation that accompanies a reduction in dielectric thickness, as reported by Intel Corporation in 2010. The volumetric efficiency (microF/cm3) of a multilayer ceramic capacitor (MLCC) has been shown to not increase limitlessly due to the grain size effect on the dielectric constant of ferroelectric ceramic BaTiO3 material. The reliability of an MLCC has been discussed with respect to its structure. The MLCCs with higher numbers of dielectric layers will pose more challenges for the reliability of dielectric material, which is the case for most base-metal-electrode (BME) capacitors. A number of MLCCs manufactured using both precious-metal-electrode (PME) and BME technology, with 25 V rating and various chip sizes and capacitances, were tested at accelerated stress levels. Most of these MLCCs had a failure behavior with two mixed failure modes: the well-known rapid dielectric wearout, and so-called 'early failures." The two failure modes can be distinguished when the testing data were presented and normalized at use-level using a 2-parameter Weibull plot. The early failures had a slope parameter of Beta >1, indicating that the early failures are not infant mortalities. Early failures are triggered due to external electrical overstress and become dominant as dielectric layer thickness decreases, accompanied by a dramatic reduction in reliability. This indicates that early failures are the main cause of the reliability degradation in MLCCs as dielectric layer thickness decreases. All of the early failures are characterized by an avalanche-like breakdown leakage current. The failures have been attributed to the extrinsic minor construction defects introduced during fabrication of the capacitors. A reliability model including dielectric thickness and extrinsic defect feature size is proposed in this presentation. The model can be used to explain the Intel-reported reliability degradation in MLCCs with respect to the reduction of dielectric thickness. It can also be used to estimate the reliability of a MLCC based on its construction and microstructure parameters such as dielectric thickness, average grain size, and number of dielectric layers. Measures for preventing early failures are also discussed in this document.