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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Neutrons can effectively be used to screen electronic parts intended to be used in Low Earth Orbit. This paper compares neutron with proton environments in spacecraft and discusses recent comparison testing.
Wind tunnel test data are analysed to determine ground effects and the effectiveness of the aerodynamic control surfaces to provide a technology base for a Navy type A V/STOL airplane. Three 14CM (5.5 inch) turbopowered simulators were used to power the model which was tested primarily in the following configurations: (1) VTOL with flaps deployed, gear down, and engines tilted to 80 deg, 90 deg, and 95 deg, (2) STOL with flap and gear down and engines tilted to 50 deg; and (3) Loiter with flaps and gear up and L/C nacelles off. Data acquired during the tests are included as an appendix.
An overview is presented of the space radiation environment and its effects on electrical, electronic, and electromechanical parts. Relevant test standards and guidelines are listed. Test standards and guidelines are necessary to ensure best practices, minimize and bound systematic and random errors, and to ensure comparable results from different testers and vendors. Test standards are by their nature static but exist in a dynamic environment of advancing technology and radiation effects research. New technologies, failure mechanisms, and advancement in our understanding of known failure mechanisms drive the revision or development of test standards. Changes to standards must be weighed against their impact on cost and existing part qualifications. There must be consensus on new best practices. The complexity of some new technologies exceeds the scope of existing test standards and may require development of a guideline specific to the technology. Examples are given to illuminate the value and limitations of key radiation test standards as well as the challenges in keeping these standards up to date.
An accelerated life test of sufficient duration to generate a minimum of 50% cumulative failures in lots of CMOS devices was conducted to provide a basis for determining the consistency of activation energy at 250 C. An investigation was made to determine whether any thresholds were exceeded during the high temperature testing, which could trigger failure mechanisms unique to that temperature. The usefulness of the 250 C temperature test as a predictor of long term reliability was evaluated.
Single event effects measurements were conducted on an ACPL-785E optocoupler at NASA Space Radiation Laboratory. Measurements with a periodic input signal show single event transients and a radiation-induced time delay of the output signal.
Single event effects measurements were conducted on a ACPL-785E optocoupler at NASA Space Radiation Laboratory. Measurements with a periodic input signal show single event transients and a radiation-induced time delay of the output signal.
Thermal mixing effectiveness characteristics of an eighteen lobe, scalloped and unscalloped, partial, forced mixer were measured in a high-bypass turbofan engine. Data were also obtained without the mixer installed, i.e., free mixing. Tests were conducted at four combinations of simulated flight conditions from 0.3 to 0.8 Mach number and from 6,096 meters (20,000 ft) to 13,715 m (45,000 ft) altitude, mixing chamber lengths of L/D=0.52 and 0.65 were tested. For this range of test conditions and mixer configurations, the forced mixing effectiveness varied from 59 to 68 percent. Values of mixing effectiveness and total pressure loss were calculated from temperature and pressure data obtained at the mixer inlet and exhaust nozzle exit.
Thermal mixing effectiveness characteristics of an eighteen lobe, scalloped and unscalloped, partial, forced mixer were measured in a high-bypass turbofan engine. Data were also obtained without the mixer installed, i.e. free mixing. Tests were conducted at four combinations of simulated flight conditions from 0.3 to 0.8 Mach number and from 6,096 meters (20,000 ft) to 13,715 m (45,000 ft) altitude. Mixing chamber lengths of L/D = 0.52 and 0.65 were tested. For this range of test conditions and mixer configurations the forced mixing effectiveness varied from 59 to 68 percent. Values of mixing effectiveness and total pressure loss were calculated from temperature and pressure data obtained at the mixer inlet and exhaust nozzle exit.
The purpose of this test was to characterize the single-event effects (SEE) susceptibility of the Texas Instrument (TI) DRV8881 2.5A Dual H-Bridge Motor Driver. The device’s output was monitored for changes during exposure to heavy-ions at Lawrence Berkeley National Laboratory (LBNL) 88-inch Cyclotron. The main goal of testing was to test for destructive SEEs. Nondestructive SEEs were recorded during testing but not fully characterized. Testing was performed on November 9th and 11th, 2022.
Nondestructive characterization techniques have been used to steer development and testing of CMCs. Computed tomography is used to determine the volumetric integrity of the CMC plates and components. Thermography is used to determine the near surface integrity of the CMC plates and components. For process and material development, information such as density uniformity, part delamination, and dimensional tolerance conformity is generated. The information from the thermography and computed tomography is correlated and then specimen cutting maps are superimposed on the thermography images. This enables for tighter data and potential explanation of off nominal test data. Examples of nondestructive characterization utilization to make decisions in process and material development and testing are presented.
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.
A remotely controlled high-energy fiber-optic light delivery technique is employed to examine the implementation of a laser-light-sheet flow-visualization system. During testing, video data are enhanced in real time using digital image processing techniques. A summary of test results for an advanced VSTOL configuration in ground effect, and techniques for the generation of 3D reconstructions for the flowfield are outlined. The system performed well during all phases of the test and proved to be an extremely useful asset to the overall test program. The most useful application of the flow visualization system was the interactive real-time flow field analysis made during the actual testing.
The 250 C, 200C and 125C accelerated tests are described. The wear-out distributions from the 250 and 200 C tests were used to estimate the activation energy between the two test temperatures. The duration of the 125 C test was not sufficient to bring the test devices into the wear-out region. It was estimated that, for the most complex of the three devices types, the activation energy between 200 C and 125 C should be at least as high as that between 250 C and 200 C. The practicality of the use of high temperature for the accelerated life tests from the point of view of durability of equipment is assessed. Guidlines for the development of accelerated life-test conditions are proposed. The use of the silicon nitride overcoat to improve the high temperature accelerated life-test characteristics of CMOS microcircuits is described.
Charged particle sources are integral devices used by Marshall Space Flight Center s Environmental Effects Branch (EM50) in order to simulate space environments for accurate testing of materials and systems. By using these sources inside custom vacuum systems, materials can be tested to determine charging and discharging properties as well as resistance to sputter damage. This knowledge can enable scientists and engineers to choose proper materials that will not fail in harsh space environments. This paper combines the steps utilized to build a low energy electron gun (The "Skevington 3000") as well as the methods used to characterize the output of both the Skevington 3000 and a manufactured Xenon ion source. Such characterizations include beam flux, beam uniformity, and beam energy. Both sources were deemed suitable for simulating environments in future testing.
The purpose of this testing was to examine the potential for destructive single event effects (SEE) in Broadcom’s ACPL-785E optocoupler in support of a NASA GSFC flight program. SEE testing was conducted NASA Space Radiation Laboratory (NSRL) at Brookhaven National Laboratory where devices with unmodified packaging were irradiated with high energy ions that have sufficient range to pass through the packaging of the device.
This study is to determine the heavy ion induced single event effect (SEE) susceptibility of the Qorvo’s NBB-400 cascadable broadband GaAs amplifier DC to 8GHz.
(none given)From OBJECTIVES: Specific objectives of the working group are to support the innovation, development, evaluation and implementation of test methods, metrics and tools based on failure engineering/physics and/or root cause evaluations. Data sources systems and tools shall be developed and implemented that: 1) provide improved preventions, controls, analyses and tests (PACT) & field failure data collection, 2) facilities data analysis, archiving, retrieval, failure physics and/or root cause evaluations and 3) enable new and existing technology suitability evaluations to be performed.
Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test results showcase application-specific results for the commercial part in its intended application.