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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 721 records · Page 40
All sourcesNASA NTRSDOE OSTI
DOE OSTI2026

Impact of front-end parameters of the ARCADIA MD3 on charged particle detection

The ARCADIA INFN R&D project developed a Fully Depleted Monolithic Active Pixel Sensor (FD-MAPS) using a customized LFoundry 110 nm CIS process. The first in-beam characterization of the ARCADIA Main Demonstrator 3 (MD3) sensor with 200 $μ$m active thickness has been performed at the Fermilab Test Beam Facility with a 120 GeV proton beam. The Device Under Test (DUT) is tested with a trigger-less telescope composed of two ARCADIA MD3 tracking planes. This early study investigates the effect of the front-end parameters on the tracking performance.

Pantouvakis, C. [Padua U.; INFN, Padua]↗
NASA NTRS2006

Single Event Effects Test Results for the Actel ProASIC Plus and Altera Stratix-II Field Programmable Gate Arrays

This work describes radiation testing of Actel's ProASIC Plus and Altera's Stratix-II FPGAs. The Actel Device Under Test (DUT) was a ProASIC Plus APA300-PQ208 nonvolatile, field reprogrammable device which is based on a 0.22micron flash-based LVCMOS technology. Limited investigation has taken place into flash based FPGA technologies, therefore this test served as a preliminary reference point for various SEE behaviors. The Altera DUT was a Stratix-II EP2S60F1020C4. Single Event Upset (SEU) and Single Event Latchup (SEL) were the focus of these studies. For the Actel, a latchup test was done at an effective LET of 75.0 MeV-sq cm/mg at room temperature, and no latchup was detected when irradiated to a total fluence of 1 x 10(exp 7) particles/sq cm. The Altera part was shown to latchup at room temperature.

heavy ions↗
DOE OSTI2019

Neutron radiation hardness testing of 650V / 7.5 A GaN power HEMT

In this work, we have performed neutron radiation hardness testing for commercially available 650 V/7.5 A GaN power HEMT. The devices were tested at Los Alamos Neutron Science Center (LANSCE) inside Irradiation of Chips Electronics, ICE house-1 at a flux density of 10(6) n/cm(2) -s and energy level above 1 MeV, which is approximately 10(6) times higher than neutron radiation at airliner flight height (30,000 ft). During the experiments, the devices were stressed electrically, thermally and irradiated with neutron radiation. We have observed degradation of AlGaN layer due to accelerated neutron radiation (1.54 x 10(10) n/cm(2) above 1.5 MeV neutron energy) under electrical stress condition. We have performed parametric defect analysis through step-by-step application of neutron irradiation, thermal stress and electrical bias, and observed highest degradation of threshold voltage (0.14 V) for combined electrical stress and neutron irradiation.

36 MATERIALS SCIENCE↗
NASA NTRS2007

Determining Desirable Cursor Control Device Characteristics for NASA Exploration Missions

The Crew Exploration Vehicle (CEV) that will travel to the moon and Mars, and all future Exploration vehicles and habitats will be highly computerized, necessitating an accurate method of interaction with the computers. The design of a cursor control device will have to take into consideration g-forces, vibration, gloved operations, and the specific types of tasks to be performed. The study described here is being undertaken to begin identifying characteristics of cursor control devices that will work well for the unique Exploration mission environments. The objective of the study is not to identify a particular device, but to begin identifying design characteristics that are usable and desirable for space missions. Most cursor control devices have strengths and weaknesses; they are more appropriate for some tasks and less suitable for others. The purpose of this study is to collect some initial usability data on a large number of commercially available and proprietary cursor control devices. A software test battery was developed for this purpose. Once data has been collected using these low-level, basic point/click/drag tasks, higher fidelity, scenario-driven evaluations will be conducted with a reduced set of devices. The standard tasks used for testing cursor control devices are based on a model of human movement known as Fitts law. Fitts law predicts that the time to acquire a target is logarithmically related to the distance over the target size. To gather data for analysis with this law, fundamental, low-level tasks are used such as dragging or pointing at various targets of different sizes from various distances. The first four core tasks for the study were based on the ISO 9241-9:(2000) document from the International Organization for Standardization that contains the requirements for non-keyboard input devices. These include two pointing tasks, one dragging and one tracking task. The fifth task from ISO 9241-9, the circular tracking task was not used because it is a movement that is not applicable to most of the applications used on aviation displays. Additionally, we opted to add a multi-size and multi-distance pointing task, and two ecologically more valid tasks which included text selection, and interaction with drop down menus, sliders, and checkboxes. The Visual Basic test battery tracks the task and trial numbers, measures the pointing, tracking or dragging time, as well as the number and types of errors. The testing session includes a practice set for each input device, then the randomized 7 tasks, and finally a questionnaire about the device. This is repeated for all the devices tested within a session. The experiment is a within-subjects design, with participants returning for multiple sessions to test additional devices. The input devices will be compared based on objective performance data from the tasks, as well as subjective feedback and ratings on the questionnaire.

Aniko Sandor↗
DOE OSTI2018

Wave Energy Prize -- Carderock Test Design and Rigging to Accommodate Diversity of Device Types

Wave Energy Prize Carderock Test Design and Rigging to Accommodate Diversity of Device Types presentation from the Water Power Technologies Office Peer Review, FY14-FY16. The challenge was to determine testing conditions, develop processing algorithms, and execute tests for equitable and consistent evaluation of different wave energy converter (WEC) technologies.

13 HYDRO ENERGY↗
NASA NTRS2004

Single Event Effects in Highly Scaled Devices for Space Applications

This paper discusses single-event upset (SEU) in memories and microprocessors that are the "drivers" of highly scaled commercial integrated circuits. Despite the decrease in critical charge that occurs for highly scaled CMOS devices, recent test data has shown that SEU rates are actually somewhat lower for scaled devices compared to older devices with larger feature size. Hard errors, which are increasingly important for memories, are discussed along with conventional soft errors. Functional errors in memories and microprocessors are particularly significant, and tend to dominate the response of highly scaled devices from an application standpoint. Predictions for future devices are made using the Semiconductor Industry Roadmap along with recent modeling and radiation test results.

microelectronics↗
NASA NTRS2018

Food Sanitation Device for Use in Microgravity

EDEN is a transportation/orbital habitat that carries large amounts of crew members, food, and supplies from Earth to Mars and back, but can also act as a permanent, simulated-1g-environment space station in Martian orbit. The focus of the project is to create a temporary, but long-term living environment that focuses on human health and food production. The project is composed of four major habitable parts (in addition to other major components). Moving from the center out, the first is a central core that acts as a hub that connects to the structural spokes, the main propulsion rockets and serves as a place for other spacecraft to dock onto, in addition to housing some of the basic station control, navigation and automated computer systems. The second set of parts are the spokes that connect the ring to the central core; these are the primary structural components with elevators in the middle carrying people from the ring to the core. The ‘lower’ portions, near the ring and it’s 1g environment, also act as storage centers. The third part is the 2-story outer ring This project served as an engineering senior design project at Temple University, and as part of NASA’s eXploration and Habitation (X-Hab) 2018 Academic Innovation Challenge. The goal of the project was to design, construct, and test a device which would be used in microgravity to sanitize produce. This is part of a NASA’s effort to grow and sanitize fresh produce on the International Space Station (ISS), in order to provide more nutritious meal options to the astronauts. Our team designed a 3-D printed spherical device with UV-C LEDs lining the interior. The designed device consists of an 8” spherical chamber, 10 UV-C LEDs, and a touchscreen user interface to control the device. Our design meets the project requirements by offering several features: a simple user interface, minimal crew time to operate, no waste produced, and the ability to sanitize multiple types of produce. The main reductions in Salmonella bacteria and Aspergillus Flavus mold were not verified. However, the aerobic plate count requirement was greatly exceeded and validated. Testing of the device resulted in visual results confirming significant decrease in E. coli activity with increased UV-C exposure, as well as quantitative results confirming significant reduction in CFU/g for the aerobic plate count. These reductions achieved from 1.464 x 10 7 to 2 x 10 4 CFU/g (2.86 log reduction) after 5 minutes, were significantly more than the requirements given by NASA ( of the craft, which holds all of the food production along with medical bays, a control center and a few parks. This ring also integrates the rigid keystone modules, which are the interface between the spokes, the expandable-construction portions of the ring and the habitation pods. The keystone modules also incorporate redundant, distributed ECLSS systems, medical storage, airlocks, and other integral station functions. The last parts are the habitation pods; these hold the sleeping quarters along with the bathrooms, showers, kitchen space and lounge areas. These expandable modules latch onto the keystone modules of the ring, which serves as a circulatory link between the different habitation pods.

Damien Gordon↗
NASA NTRS1991

Timing system for firing widely spaced test nuclear detonations

The national weapons design laboratories (Los Alamos National Laboratory and Lawrence Livermore National Laboratory) test fire nuclear devices at the Nevada Test Site (NTS), which is spread over an area of over 1200 square miles (a bit larger than the state of Rhode island). On each test there are hundreds of high time resolution recordings made of nuclear output waveforms and other phenomena. In order to synchronize these recordings with each other, with the nuclear device, and with offsite recordings, there is a requirement that the permanent command center and the outlying temporary firing sites be time tied to each other and to UTC to permit firing the shot at a predetermined time with an accuracy of about a microsecond. The system is so designed that this can reduce to about 100 nanoseconds if it should prove necessary in the future.

Ralph E. Partridge↗
DOE OSTI2018

Zeolitic imidazolate framework-coated acoustic sensors for room temperature detection of carbon dioxide and methane

The integration of nanoporous materials such as metal organic frameworks (MOFs) with sensitive transducers can result in robust sensing platforms for monitoring gases and chemical vapors for a range of applications. Here, we report on an integration of the zeolitic imidazolate framework – 8 (ZIF-8) MOF with surface acoustic wave (SAW) and thickness shear mode quartz crystal microbalance (QCM) devices to monitor carbon dioxide (CO 2 ) and methane (CH 4 ) under ambient conditions. The MOF was directly coated on the Y-Z LiNbO 3 SAW delay lines (operating frequency, f 0 = 436 MHz) and AT-cut quartz TSM resonators (resonant frequency, f 0 = 9 MHz) and the devices were tested for various gases in N 2 under ambient conditions. The devices were able to detect the changes in CO 2 or CH 4 concentrations with relatively higher sensitivity to CO 2 , which was due to its higher adsorption potential and heavier molecular weight. The sensors showed full reversibility and repeatability which were attributed to the physisorption of the gases into the MOF and high stability of the devices. Both types of sensors showed linear responses relative to changes in the binary gas compositions thereby allowing to construct calibration curves which correlated well with the expected mass changes in the sorbent layer based on mixed-gas gravimetric adsorption isotherms measured on bulk samples. For 200 nm thick films, the SAW sensitivities to CO 2 and CH 4 were 1.44 × 10 -6 /vol% and 8 × 10 -8 /vol%, respectively, against the QCM sensitivities 0.24 × 10-6/vol% and 1 × 10 -8 /vol%, respectively, which were evaluated as the fractional change in the signal. The SAW sensors were also evaluated for 100 nm–300 nm thick films, the sensitivities of which were found to increase with the thickness due to the increased number of pores for the adsorption of a larger amount of gases. Finally, in addition, the MOF-coated SAW delay lines had a good response in wireless mode, demonstrating their potential to operate remotely for the detection of the gases at emission sites across the energy infrastructure.

36 MATERIALS SCIENCE↗
DOE OSTI2016

Engineering the switching dynamics of TiO{sub x}-based RRAM with Al doping

Titanium oxide (TiO{sub x}) has attracted a lot of attention as an active material for resistive random access memory (RRAM), due to its versatility and variety of possible crystal phases. Although existing RRAM materials have demonstrated impressive characteristics, like ultra-fast switching and high cycling endurance, this technology still encounters challenges like low yields, large variability of switching characteristics, and ultimately device failure. Electroforming has been often considered responsible for introducing irreversible damage to devices, with high switching voltages contributing to device degradation. In this paper, we have employed Al doping for tuning the resistive switching characteristics of titanium oxide RRAM. The resistive switching threshold voltages of undoped and Al-doped TiO{sub x} thin films were first assessed by conductive atomic force microscopy. The thin films were then transferred in RRAM devices and tested with voltage pulse sweeping, demonstrating that the Al-doped devices could on average form at lower potentials compared to the undoped ones and could support both analog and binary switching at potentials as low as 0.9 V. This work demonstrates a potential pathway for implementing low-power RRAM systems.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
NASA NTRS1986

Performance testing of lidar receivers

In addition to the considerations about the different types of noise sources, dynamic range, and linearity of a lidar receiver, one requires information about the pulse shape retaining capabilities of the receiver. For this purpose, relatively precise information about the height resolution as well as the recovery time of the receiver, due both to large transients and to fast changes in the received signal, is required. As more and more analog receivers using fast analog to digital converters and transient recorders will be used in the future lidar systems, methods to test these devices are essential. The method proposed for this purpose is shown. Tests were carried out using LCW-10, LT-20, and FTVR-2 as optical parts of the optical pulse generator circuits. A commercial optical receiver, LNOR, and a transient recorder, VK 220-4, were parts of the receiver system.

Shams, M. Y.↗
NASA NTRS2000

A Boundary Scan Test Vehicle for Direct Chip Attach Testing

To facilitate the new faster, better and cheaper spacecraft designs, smaller more mass efficient avionics and instruments are using higher density electronic packaging technologies such as direct chip attach (DCA). For space flight applications, these technologies need to have demonstrated reliability and reasonably well defined fabrication and assembly processes before they will be accepted as baseline designs in new missions. As electronics shrink in size, not only can repair be more difficult, but 49 probing" circuitry can be very risky and it becomes increasingly more difficult to identify the specific source of a problem. To test and monitor these new technologies, the Direct Chip Attach Task, under NASA's Electronic Parts and Packaging Program (NEPP), chose the test methodology of boundary scan testing. The boundary scan methodology was developed for interconnect integrity and functional testing at hard to access electrical nodes. With boundary scan testing, active devices are used and failures can be identified to the specific device and lead. This technology permits the incorporation of "built in test" into almost any circuit and thus gives detailed test access to the highly integrated electronic assemblies. This presentation will describe boundary scan, discuss the development of the boundary scan test vehicle for DCA and current plans for testing of direct chip attach configurations.

Parsons, Heather A.↗
NASA NTRS2004

The NASA GSFC MEMS Colloidal Thruster

A number of upcoming missions require different thrust levels on the same spacecraft. A highly scaleable and efficient propulsion system would allow substantial mass savings. One type of thruster that can throttle from high to low thrust while maintaining a high specific impulse is a Micro-Electro-Mechanical System (MEMS) colloidal thruster. The NASA GSFC MEMS colloidal thruster has solved the problem of electrical breakdown to permit the integration of the electrode on top of the emitter by a novel MEMS fabrication technique. Devices have been successfully fabricated and the insulation properties have been tested to show they can support the required electric field. A computational finite element model was created and used to verify the voltage required to successfully operate the thruster. An experimental setup has been prepared to test the devices with both optical and Time-Of-Flight diagnostics.

Cardiff, Eric H.↗
NASA NTRS2010

Injecting Errors for Testing Built-In Test Software

Two algorithms have been conceived to enable automated, thorough testing of Built-in test (BIT) software. The first algorithm applies to BIT routines that define pass/fail criteria based on values of data read from such hardware devices as memories, input ports, or registers. This algorithm simulates effects of errors in a device under test by (1) intercepting data from the device and (2) performing AND operations between the data and the data mask specific to the device. This operation yields values not expected by the BIT routine. This algorithm entails very small, permanent instrumentation of the software under test (SUT) for performing the AND operations. The second algorithm applies to BIT programs that provide services to users application programs via commands or callable interfaces and requires a capability for test-driver software to read and write the memory used in execution of the SUT. This algorithm identifies all SUT code execution addresses where errors are to be injected, then temporarily replaces the code at those addresses with small test code sequences to inject latent severe errors, then determines whether, as desired, the SUT detects the errors and recovers

Gender, Thomas K.↗
NASA NTRS1991

Circuit For Current-vs.-Voltage Tests Of Semiconductors

Circuit designed for measurement of dc current-versus-voltage characteristics of semiconductor devices. Operates in conjunction with x-y pen plotter or digital storage oscilloscope, which records data. Includes large feedback resistors to prevent high currents damaging device under test. Principal virtues: low cost, simplicity, and compactness. Also used to evaluate diodes and transistors.

Huston, Steven W.↗
NASA NTRS1977

Cyclic and low temperature effects on microcircuits

Cyclic temperature and low temperature operating life tests, and pre-/post-life device evaluations were used to determine the degrading effects of thermal environments on microcircuit reliability. Low power transistor-transistor-logic gates and linear devices were included in each test group. Device metallization systems included aluminum metallization/aluminum wire, aluminum metallization/gold wire, and gold metallization/gold wire. Fewer than 2% electrical failures were observed during the cyclic and low temperature life tests and the post-life evaluations revealed approximately 2% bond pull failures. Reconstruction of aluminum die metallization was observed in all devices and the severity of the reconstruction appeared to be directly related to the magnitude of the temperature excursion. All types of bonds except the gold/gold bonds were weakened by exposure to repeated cyclic temperature stress.

Weissflug, V. A.↗
NASA NTRS1972

The visual standards for the selection and retention of astronauts, part 2

In preparation for the various studies planned for assessing visual capabilities and tasks in order to set vision standards for astronauts, the following pieces of equipment have been assembled and tested: a spectacle obstruction measuring device, a biometric glare susceptibility tester, a variable vergence amplitude testing device, an eye movement recorder, a lunar illumination simulation chamber, a night myopia testing apparatus, and retinal adaption measuring devices.

Allen, M. J.↗