Understanding, Predicting, and Mitigating Catastrophic Shorts for Improved OLED Lighting Panel Reliability (Final Report)
Catastrophic OLED lighting panel failure due to electrical shorting was a significant reliability challenge facing the industry. The goal of this program was to develop a basic scientific understanding of how incipient shorts in an OLED originate and grow to a catastrophic level, and to develop mitigation strategies that enable the industry to reach the DOE target of 0.01% failure rate. We accomplished this goal, identifying the origin of shorts, understanding how the evolve over time, and ultimately identifying a mitigation strategy that was implemented by our industry partner and demonstrated to completely eliminate catastrophic shorts in production OLED panels. We identified two general classes of panel defect, termed bright spots and hot spots, that respectively originate from indium-tin-oxide agglomerations and microscale organic semiconductor dust particles on the substrate. The former are largely benign whereas the latter can lead to local shunts that grow over time and cause catastrophic failure. We understand the growth process as a self-reinforcing cycle, where shunt-induced heating volatilizes the surrounding organic semiconductor, which in turn expands the shunt and leads to even more heating. Based on these results, we identified several practical strategies to arrest the growth of early-stage shorts or prevent them entirely. These results will reduce the cost and improve the reliability of OLED lighting.