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At least 847 records · Page 47

Microscopic optical potentials from a Green's function approach

Optical potentials are a standard tool in the study of nuclear reactions, as they describe the interaction between a target nucleus and a projectile. The use of phenomenological optical potentials built using experimental data on stable isotopes is widespread. Although successful in their dedicated domain, it is unclear whether these phenomenological potentials can provide reliable predictions for unstable isotopes. To address this problem, optical potentials based on microscopic nuclear structure input calculations prove to be crucial and are an important current line of research. In this work we present an explicit implementation of the Feshbach formalism for the systematic derivation of optical potentials using input from nuclear structure models. Numerical tools for the derivation of Green's functions associated with nonlocal potentials are presented. In conclusion, the new optical potential, based on the valence shell model, is applied to the calculations of 𝑛 + 24 Mg elastic scattering and yields a close agreement with the experimental data.

Direct reactions↗

Microwave microscope studies of trapped vortex dynamics in superconductors

Trapped vortices in superconductors introduce residual resistance in superconducting radio-frequency (SRF) cavities and disrupt the operation of superconducting quantum and digital electronic circuits. Understanding the detailed dynamics of trapped vortices under oscillating magnetic fields is essential for advancing these technologies. We have developed a near-field magnetic microwave microscope to study the dynamics of a limited number of trapped vortices under the probe when stimulated by a localized rf magnetic field. By measuring the local second-harmonic response (𝑃 2⁢f ) at subfemto-Watt levels, we isolate signals exclusively arising from trapped vortices, excluding contributions from surface defects and Meissner screening currents. Toy models of niobium superconductor hosting vortex pinning sites are introduced and studied with time-dependent Ginzburg-Landau (TDGL) simulations of probe/sample interaction to better understand the measured second-harmonic response. The simulation results demonstrate that the second-harmonic response of trapped vortex motion under a localized rf magnetic field shares key features with the experimental data. Here, this measurement technique provides access to vortex dynamics at the micrometer scale, such as depinning events and spatially resolved pinning properties, as demonstrated in measurements on a niobium film with an antidot flux pinning array.

43 PARTICLE ACCELERATORS↗

Connecting relativistic density functional theory to microscopic calculations

The development of systematic effective field theories (EFTs) for nuclear forces and advances in solving the nuclear many-body problem have greatly improved our understanding of dense nuclear matter and the structure of finite nuclei. For global nuclear calculations, density functional theories (DFTs) have been developed to reduce the complexity and computational cost required in describing nuclear systems. However, DFT often makes approximations and assumptions about terms included in the functional, which may introduce systematic uncertainties compared to microscopic calculations using EFTs. In this work, we investigate possible avenues of improving nuclear DFT using nonlinear relativistic mean-field (RMF) theory. We explore the impact of RMF model extensions by fitting the nonlinear RMF model to predictions of nuclear matter and selected closed-shell nuclei using four successful chiral EFT Hamiltonians. We find that these model extensions are impactful and important in capturing the physics present within chiral Hamiltonians, particularly for charge radii and neutron skins of closed-shell nuclei. However, there are additional effects that are not captured within the RMF model, particularly within the isoscalar sector of RMF theory. Additional model extensions and the reliability of the nonlinear RMF model are discussed.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗

A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II

The development, construction, and first commissioning results of a new scanning microscope installed at the 5-ID Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II are reported. The developed system utilizes Kirkpatrick–Baez mirrors for X-ray focusing. The instrument is designed to enable spectromicroscopy measurements in 2D and 3D with sub-200 nm spatial resolution. The present paper focuses on the design aspects, optical considerations, and specifics of the sample scanning stage, summarizing some of the initial commissioning results.

36 MATERIALS SCIENCE↗

Towards Full Field-of-View Fourier Ptychography for Extreme Ultraviolet Microscope

We evaluate various Fourier ptychographic microscopy (FPM) reconstruction algorithms using both simulated and experimental data acquired from an Extreme Ultraviolet (EUV, 13.5 nm wavelength) microscope. We specifically focus on the algorithms' ability to robustly address field-dependent aberrations, which enables increased spatial resolution and quantitative phase imaging across an expanded field of view. We systematically compare the algorithms' performance under aberrations for a single zoneplate imaging system, utilizing Fourier Ring Correlation (FRC) as a systematic metric for assessing reconstruction quality. Furthermore, we explore the impact of systematic errors on the reconstruction of experimental data, aiming to increase the effective field of view by 25-fold, from the nominal 5x5 um2 diffraction-limited area. Additionally, our evaluation incorporates innovative FPM-adjacent methodologies, including the Angular Ptychographic Imaging with Closed-form method (APIC), for reconstructing EUV images.

Gu, Chaoying↗

2-D MEMS Scanner for Handheld Multispectral Dual-Axis Confocal Microscopes

We describe a 2-D microelectromechanical systems (MEMS) scanner for a handheld multispectral confocal microscope for early detection and diagnosis of cervical cancer. This paper is an expansion of work originally reported in the Proceedings of IEEE International Conference on Optical MEMS and Nanophotonics 2012. The MEMS scanner and fabrication process has been designed to improve performance for the dual-axis confocal microscopy architecture. Dual-axis confocal microscopy achieves comparable transverse and depth resolution to high numerical aperture (NA) single-axis confocal microscopy but achieves longer working distance by utilizing low-NA optics. The MEMS scanner has an inner gimbal design with torsional flexures separated from the reflectors to reduce light loss and oxide-free outer axis torsional flexures by utilizing poly vial for electrical access to the inner gimbal electrodes. The devices are large-scale batch fabricated using a double layer silicon-on-insulator (SOI) process and predice postreleasing of dies. The scanner has electrostatic optical deflection angles of 2 degrees for the single-sided inner axis at 75 V and +/- 3 degrees for the outer axis at 120 V. The device has resonance frequencies of similar to 2.48 kHz and similar to 348 z for the inner and outer axis torsional modes, respectively. Reflectance and fluorescence images with 650 mu m x 800 mu m field of view are demonstrated at 15 frames/s. The transverse (axial) resolutions are 4.78 mu m (6.2 mu m), 5.77 mu m (6.2 mu m), and 7.45 mu m (5.6 Am) for wavelengths of 561, 662, and 781 nm, respectively.

cervical cancer↗

Microscopic Distributions of Defect Luminescence From Subgrain Boundaries in Multicrystalline Silicon Wafers

We investigate the microscopic distributions of sub-band-gap luminescence emission (the so-called D-lines D1/D2/D3/D4) and the band-to-band luminescence intensity, near recombination-active sub-grain boundaries in multicrystalline silicon wafers for solar cells. We find that the sub-band-gap luminescence from decorating defects/impurities (D1/D2) and from intrinsic dislocations (D3/D4) have distinctly different spatial distributions, and are asymmetric across the sub-grain boundaries. The presence of D1/D2 is correlated with a strong reduction in the band-to-band luminescence, indicating a higher recombination activity. In contrast, D3/D4 emissions are not strongly correlated with the band-to-band intensity. Based on spatially-resolved, synchrotron-based micro-X-ray fluorescence measurements of metal impurities, we confirm that high densities of metal impurities are present at locations with strong D1/D2 emission but low D3/D4 emission. Finally, we show that the observed asymmetry of the sub-band-gap luminescence across the sub-grain boundaries is due to their inclination below the wafer surface. Based on the luminescence asymmetries, the sub-grain boundaries are shown to share a common inclination locally, rather than be orientated randomly.

14 SOLAR ENERGY↗

Spectroscopic and Microscopic Defect and Carrier-Lifetime Analysis in Cadmium Telluride

Using experiments and theory, we analyze 'carrier-lifetime-killer' semiconductor bulk defects in CdTe. We can estimate the concentration of tellurium antisite (Te Cd ) recombination centers in undoped CdTe from the kinetic modeling of injection-dependent photoluminescence (PL) lifetimes. For the Cd-rich stoichiometry, the concentration of lifetime-limiting [Te Cd ] is =10 13 cm -3 . For the Te-rich stoichiometry, we find a smaller hole-capture rate constant than predicted by theory, which could be because of Te Cd association with the Te interstitials. We also compare PL emission spectra, carrier lifetimes, and radiative efficiencies for Cu, P, and As doping and analyze the microscopic distribution of carrier lifetimes in As-doped single-crystal CdTe. In all the cases examined here, point defects are the dominant bulk recombination centers. Carrier lifetimes are the longest in undoped CdTe, but radiative efficiencies are the highest with group-V doping.

14 SOLAR ENERGY↗

Identification of microscopic hole-trapping mechanisms in nitride semiconductors

Hole trapping has been observed in nitride heterostructure devices, where the Fermi level is in the vicinity of the valence-band maximum. Using hybrid density functional calculations, we examine microscopic mechanisms for hole trapping in GaN and AlN. In a defect-free material, hole trapping does not spontaneously occur, but trapping can occur in the vicinity of impurities, such as C-a common unintentional impurity in nitrides. As a result, using Schrodinger-Poisson simulations, we assess the effects of C-derived hole traps on N-face high-electron mobility transistors, which we find to be more detrimental than the previously proposed interface traps.

36 MATERIALS SCIENCE↗

Artifact-Free Coring Procedures for Removing Samples from Photovoltaic Modules for Microscopic Analysis

An important step in producing more reliable and efficient photovoltaic modules is to establish a relationship between the microscopic properties of modules deployed in the field for many years and efficiency-related parameters. The first step in accomplishing this task is to be able to identify and remove small areas from these modules without causing any damage to these samples. In this work, we will describe two different procedures to core small areas of deployed and stressed solar panels produced with different materials (Si, CIGS, and CdTe), and we will prove that these processes did not damage the cored material. We will also show that the coring procedure changes for different types of photovoltaic modules.

14 SOLAR ENERGY↗

A Systematic Comparison for Consistent Scenario Development Using Microscopic Simulation Software

This study aims to explore a methodology that enables the development of consistent traffic micro simulation for emerging traffic and vehicle control technologies for improved mobility and energy efficiency across different modeling platforms. Researchers might study the same application on different platforms and have the need to benchmark across platforms. However, there lacks a systematic study on simulation software comparison, especially for emerging mobility and energy efficiency applications. For this, a systematic scenario development and evaluation approach is presented and demonstrated to compare scenarios generated in different traffic microsimulation platforms. Network-level and vehicle-level trip performance results of the traffic scenario are evaluated in three microscopic simulation platforms - VISSIM, AIMSUN, and SUMO. The results indicate that the network-level performance is consistent among the three software suites except when the demand is high, where the energy consumption performance varies.

Saroj, Abhilasha [ORNL] (ORCID:0000000191178063)↗

A novel tensile device for in situ scanning electron microscope mechanical testing

To facilitate the study of deformation mechanisms and mechanical properties of bulk materials with feature size of centimeter level, a novel tensile device compatible with scanning electron microscope (SEM) was designed and built. Integrating the servo motor and three-stage reducer, the device could realize quasistatic loading mode with a loading speed of 10 nm/s. The device also presents broad compatibility with various types of SEMs due to its miniaturized dimensions and larger volume–output load ratio compared with existing and commercial tensile instruments. A small lead precise ball screw with left- and right-hand thread was adopted to keep the center of the specimen remain stationary without moving during the tensile testing. A novel gripping method was carefully taken into account to guarantee the alignment issues. The closed-loop control mode of the tensile process was developed. The displacement resolution of 40 nm was tested to verify the driving performance of the device. Furthermore, correction method on testing displacement was investigated based on the calibration experiments of the load sensor and displacement sensor, and the comparison tests based on stress–strain curve were carried out between the self-made device and the commercial tensile instrument (Instron 3345) to verify the feasibility and universality of the correction method.

36 MATERIALS SCIENCE↗

Calibration of tip and sample temperature of a scanning tunneling microscope using a superconductive sample

The temperature of the electrodes is a crucial parameter in virtually all tunneling experiments. The temperature not only controls the thermodynamic state of the electrodes but also causes thermal broadening, which limits the energy resolution. Unfortunately, the construction of many scanning tunneling microscopes inherits a weak thermal link between tip and sample in order to make one side movable. Such, the temperature of that electrode is badly defined. Here, the authors present a procedure to calibrate the tip temperature by very simple means. The authors use a superconducting sample (Nb) and a standard tip made from W. Due to the asymmetry in the density of states of the superconductor (SC)—normal metal (NM) tunneling junction, the SC temperature controls predominantly the density of states while the NM controls the thermal smearing. By numerically simulating the I-V curves and numerically optimizing the tip temperature and the SC gap width, the tip temperature can be accurately deduced if the sample temperature is known or measureable. In our case, the temperature dependence of the SC gap may serve as a temperature sensor, leading to an accurate NM temperature even if the SC temperature is unknown.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Growth of microscopic cones on titanium cathodes of sputter-ion pumps driven by sorption of large argon quantities

Microscopic cones have been observed on titanium cathodes of sputter-ion pumps (SIPs) after pump operation. The cones were studied by means of scanning electron microscopy and energy dispersive x-ray analysis. Size and morphology of these cones are clearly correlated with the nature and the relative amount of each gas species pumped by each SIP during its working life. In particular, their growth was found to be fed by sputtering mechanisms, mostly during Ar pumping, and to be driven by the electromagnetic field applied to the Penning cells of each SIP. Experimental findings suggest that the formation and extent of such conic structures on cathode surfaces might play a leading role in the onset of phenomena typically related to the functioning of SIPs, e.g., the so-called argon instability.

36 MATERIALS SCIENCE↗

Atomic precision imaging with an on-chip scanning tunneling microscope integrated into a commercial ultrahigh vacuum STM system

In this article, we replace the Z axis of the piezotube of a conventional Ultrahigh-Vacuum (UHV) Scanning Tunneling Microscope (STM) with a one-degree-of-freedom Microelectromechanical-System (MEMS) nanopositioner. As a result, a hybrid system is realized in which motions in the XY plane are carried out by the piezotube, while the MEMS device performs the Z-axis positioning with a smaller footprint and higher sensitivity. With the proposed system and a feedback loop, STM imaging is conducted on an H-passivated Si (100)-2×1 sample in a UHV condition, demonstrating that this on-chip STM is conducive to atomic precision scanning tunneling microscopy.

Engineering↗

Surface deposition of nanometer scale carbon structures on Bi 2 Sr 2 CaCu 2 O 8+δ using a low-cost scanning electron microscope

In this work, we investigate optically active nanostructures on Bi 2 Sr 2 CaCu 2 O 8+δ (BSCCO). The nanostructures are constructed from carbon nanocrystals formed using the electron beam of a scanning electron microscope to locally decompose residual hydrocarbons at the BSCCO surface. Atomic force microscopy is used to characterize the dimensions of these structures as a function of beam exposure time. This technique has been used to induce localized intercalation to form carbon nanoparticles up to tens of nanometers into a variety of 2D materials. Cross-sectional scanning transmission electron microscopy in BSCCO shows the presence of these carbon deposits on the surface, but there is no evidence they penetrate into the BSCCO substrate. Therefore, this technique is not suitable for localized intercalation in BSCCO, and it does have promise as a cost-effective approach to pattern nanometer scale etch stops.

2D materials↗

Binary pseudorandom test standard to determine the modulation transfer function of optical microscopes

This work reports on the development of a binary pseudo-random test sample optimized to calibrate the MTF of optical microscopes. The sample consists of a number of 1-D and 2-D patterns, with different minimum sizes of spatial artifacts from 300 nm to 2 microns. We describe the mathematical background, fabrication process, data acquisition and analysis procedure to return spatial frequency based instrument calibration. We show that the developed samples satisfy the characteristics of a test standard: functionality, ease of specification and fabrication, reproducibility, and low sensitivity to manufacturing error. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Three-dimensional super line-localization in low signal-to-noise microscope images via prior-apprised unsupervised learning (PAUL)

Biological processes such as processive enzyme turnover and intracellular cargo tracking involve the dynamic motion of a small "article" along a curvilinear biopolymer track. To understand these processes that occur across multiple length and time scales, one must acquire both the trajectory of the particle and the position of the track along which it moves, possibly by combining high-resolution single-particle tracking with conventional microscopy. Yet, usually there is a significant resolution mismatch between these modalities: while the tracked particle is localized with a precision of 10 nm, the image of the surroundings is limited by optical difraction, with 200 nm lateral and 500 nm axial resolutions. Compared to the particle's trajectory, the surrounding curvilinear structure appears as a blurred and noisy image. This disparity in the spatial resolutions of the particle trajectory and the surrounding curvilinear structure image makes data reconstruction, as well as interpretation, particularly challenging. Analysis is further complicated when the curvilinear structures are oriented arbitrarily in 3D space. Here, we present a prior-apprised unsupervised learning (PAUL) approach to extract information from 3D images where the underlying features resemble a curved line such as a filament or microtubule. This three-stage framework starts with a Hessian-based feature enhancement, which is followed by feature registration, where local line segments are detected on repetitively sampled subimage tiles. In the final stage, statistical learning, segments are clustered based on their geometric relationships. Principal curves are then approximated from each segment group via statistical tools including principal component analysis, bootstrap and kernel transformation. This procedure is characterized on simulated images, where sub-voxel medium deviations from true curves have been achieved. The 3D PAUL approach has also been implemented for successful line localization in experimental 3D images of gold nanowires obtained using a multifocal microscope. Lastly, this work not only bridges the resolution gap between two microscopy modalities, but also allows us to conduct 3D super line-localization imaging experiments, without using super-resolution techniques.

42 ENGINEERING↗