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At least 91 records · Page 5

Single Event Effects Test Results for Advanced Field Programmable Gate Arrays

Reconfigurable Field Programmable Gate Arrays (FPGAs) from Altera and Actel and an FPGA-based quick-turnApplication Specific Integrated Circuit (ASIC) from Altera were subjected to single-event testing using heavy ions. Both Altera devices (Stratix II and HardCopy II) exhibited a low latchup threshold (below an LET of 3 MeV-cm2/mg) and thus are not recommended for applications in the space radiation environment. The flash-based Actel ProASIC Plus device did not exhibit latchup to an effective LET of 75 MeV-cm2/mg at room temperature. In addition, these tests did not show flash cell charge loss (upset) or retention damage. Upset characterization of the design-level flip-flops yielded an LET threshold below 10 MeV-cm2/mg and a high LET cross section of about lxlO-6 cm2/bit for storing ones and about lxl0-7 cm2/bit for storing zeros . Thus, the ProASIC device may be suitable for critical flight applications with appropriate triple modular redundancy mitigation techniques.

Field Programmable Gate Arrays

Self-Recovery Experiments in Extreme Environments Using a Field Programmable Transistor Array

Temperature and radiation tolerant electronics, as well as long life survivability are key capabilities required for future NASA missions. Current approaches to electronics for extreme environments focus on component level robustness and hardening. However, current technology can only ensure very limited lifetime in extreme environments. This paper describes novel experiments that allow adaptive in-situ circuit redesign/reconfiguration during operation in extreme temperature and radiation environments. This technology would complement material/device advancements and increase the mission capability to survive harsh environments. The approach is demonstrated on a mixed-signal programmable chip (FPTA-2), which recovers functionality for temperatures until 28 C and with total radiation dose up to 250kRad.

space vehicle electronics

Single Event Test Methodologies and System Error Rate Analysis for Triple Modular Redundant Field Programmable Gate Arrays

We present a test methodology for estimating system error rates of Field Programmable Gate Arrays (FPGAs) mitigated with Triple Modular Redundancy (TMR). The test methodology is founded in a mathematical model, which is also presented. Accelerator data from 90 nm Xilins Military/Aerospace grade FPGA are shown to fit the model. Fault injection (FI) results are discussed and related to the test data. Design implementation and the corresponding impact of multiple bit upset (MBU) are also discussed.

error rate calculations

Single-Event Effect (SEE) Survey of Advanced Reconfigurable Field Programmable Gate Arrays: NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance

The NEPP Reconfigurable Field-Programmable Gate Array (FPGA) task has been charged to evaluate reconfigurable FPGA technologies for use in space. Under this task, the Xilinx single-event-immune, reconfigurable FPGA (SIRF) XQR5VFX130 device was evaluated for SEE. Additionally, the Altera Stratix-IV and SiliconBlue iCE65 were screened for single-event latchup (SEL).

Xilinx Single-Event Effects (SEE) Test Consortium

Single Event Analysis and Fault Injection Techniques Targeting Complex Designs Implemented in Xilinx-Virtex Family Field Programmable Gate Array (FPGA) Devices

An informative session regarding SRAM FPGA basics. Presenting a framework for fault injection techniques applied to Xilinx Field Programmable Gate Arrays (FPGAs). Introduce an overlooked time component that illustrates fault injection is impractical for most real designs as a stand-alone characterization tool. Demonstrate procedures that benefit from fault injection error analysis.

Single Event Upset Testing

NEPP Update of Independent Single Event Upset Field Programmable Gate Array Testing

This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independent Single Event Upset (SEU) Field Programmable Gate Array (FPGA) testing including FPGA test guidelines, Microsemi RTG4 heavy-ion results, Xilinx Kintex-UltraScale heavy-ion results, Xilinx UltraScale+ single event effect (SEE) test plans, development of a new methodology for characterizing SEU system response, and NEPP involvement with FPGA security and trust.

Field Programmable Gate Array (FPGA); Triple Modul

Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

The goal of this study was to perform an independent investigation of single event destructive and transient susceptibility of the Microsemi RTG4 device. The devices under test were the Microsemi RTG4 field programmable gate array (FPGA) Rev C. The devices under test will be referenced as the DUT or RTG4 Rev C throughout this document. The DUT was configured to have various test structures that are geared to measure specific potential susceptibilities of the device. DesignDevice susceptibility was determined by monitoring the DUT for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) was checked throughout heavy-ion testing by monitoring device current.

Field Programmable Gate Array (FPGA)

Model Evaluation of Short-Lived Climate Forcers for the Arctic Monitoring and Assessment Programme: A Multi-Species, Multi-Model Study

While carbon dioxide is the main cause for global warming, modeling short-lived climate forcers (SLCFs) such as methane, ozone, and particles in the Arctic allows us to simulate near-term climate and health impacts for a sensitive, pristine region that is warming at 3 times the global rate. Atmospheric modeling is critical for understanding the long-range transport of pollutants to the Arctic, as well as the abundance and distribution of SLCFs throughout the Arctic atmosphere. Modeling is also used as a tool to determine SLCF impacts on climate and health in the present and in future emissions scenarios. In this study, we evaluate 18 state-of-the-art atmospheric and Earth system models by assessing their representation of Arctic and Northern Hemisphere atmospheric SLCF distributions, considering a wide range of different chemical species (methane, tropospheric ozone and its precursors, black carbon, sulfate, organic aerosol, and particulate matter) and multiple observational datasets. Model simulations over 4 years (2008-2009 and 2014-2015) conducted for the 2022 Arctic Monitoring and Assessment Programme (AMAP) SLCF assessment report are thoroughly evaluated against satellite, ground, ship, and aircraft-based observations. The annual means, seasonal cycles, and 3-D distributions of SLCFs were evaluated using several metrics, such as absolute and percent model biases and correlation coefficients. The results show a large range in model performance, with no one particular model or model type performing well for all regions and all SLCF species. The multi-model mean (mmm) was able to represent the general features of SLCFs in the Arctic and had the best overall performance. For the SLCFs with the greatest radiative impact (CH4, 03, BC, and SO(sup 2-)(sub 4)), the mmm was within ±25 % of the measurements across the Northern Hemisphere. Therefore, we recommend a multi-model ensemble be used for simulating climate and health impacts of SLCFs. Of the SLCFs in our study, model biases were smallest for C"4 and greatest for OA. For most SLCFs, model biases skewed from positive to negative with increasing latitude. Our analysis suggests that vertical mixing, long-range transport, deposition, and wildfires remain highly uncertain processes. These processes need better representation within atmospheric models to improve their simulation of SLCFs in the Arctic environment. As model development proceeds in these areas, we highly recommend that the vertical and 3-D distribution of SLCFs be evaluated, as that information is critical to improving the uncertain processes in models.

Arctic Monitoring and Assessment Programme

From Natural Language Requirements to the Verification of Programmable Logic Controllers: Integrating FRET into PLCverif

PLCverif is an actively developed project at CERN, enabling the formal verification of Programmable Logic Controller (PLC) programs in critical systems. In this paper, we present our work on improving the formal requirements specification experience in PLCverif through the use of natural language. To this end, we integrate NASA’s FRET, a formal requirement elicitation and authoring tool, into PLCverif. FRET is used to specify formal requirements in structured natural language, which automatically translates into temporal logic formulae. FRET’s output is then directly used by PLCverif for verification purposes. We discuss practical challenges that PLCverif users face when authoring requirements and the FRET features that help alleviate these problems. We present the new requirement formalization workflow and report our experience using it on two critical CERN case studies.

FRET

Automated Verification of Programmable Logic Controller Programs Against Structured Natural Language Requirements

PLCverif is an actively developed project at CERN, enabling the formal verification of Programmable Logic Controller (PLC) programs in critical systems. In this paper, we present our work on improving the formal requirements specification experience in PLCverif through the use of natural language. To this end, we integrate NASA’s FRET, a formal requirement elicitation and authoring tool, into PLCverif. FRET is used to specify formal requirements in structured natural language, which automatically translates into temporal logic formulae. FRET’s output is then directly used by PLCverif for verification purposes. We discuss practical challenges that PLCverif users face when authoring requirements and the FRET features that help alleviate these problems. We present the new requirement formalization workflow and report our experience using it on two critical CERN case studies.

formal methods

From Natural Language Requirements to the Verification of Programmable Logic Controllers: Integrating FRET into PLCverif

PLCverif is an actively developed project at CERN, enabling the formal verification of Programmable Logic Controller (PLC) programs in critical systems. In this paper, we present our work on improving the formal requirements specification experience in PLCverif through the use of natural language. To this end, we integrate NASA’s FRET, a formal requirement elicitation and authoring tool, into PLCverif. FRET is used to specify formal requirements in structured natural language, which automatically translates into temporal logic formulae. FRET’s output is then directly used by PLCverif for verification purposes. We discuss practical challenges that PLCverif users face when authoring requirements and the FRET features that help alleviate these problems. We present the new requirement formalization workflow and report our experience using it on two critical CERN case studies.

FRET

Field-Programmable Gate Array Implementation of a Single Photon-Counting Receive Modem

We present a field-programmable gate array (FPGA) implementation of a single photon-counting receive modem for a pulse position modulated signal. The modem is compliant with the Consultative Committee for Space Data Systems (CCSDS) High Photon Efficiency (HPE) Optical Communications Coding and Synchronization standard and is capable of a maximum data rate of 267 Mbps. The system is designed on a commercial off-the-shelf FPGA platform and utilizes superconducting nanowire single photon counting detectors, analog to digital converters (ADC s) to sample the detectors, and two FPGAs. Symbol timing recovery, photon counting, convolutional deinterleaving, and codeword synchronization areis performed in the first FPGA. The second FPGA performs iterative decoding on each codeword of the serially concatenated pulse position modulated (SCPPM) signal. A digital filter is included to compensate for timing jitter of the detector, and the decoder throughput can be modified adjusted through reconfigurable parallelization. The decoder also implements a resource-efficient, algorithmic polynomial interleaver and deinterleaver. Both FPGAs can be reconfigured to switch between pulse position modulation (PPM)-16 and PPM-32 with code rates 1/3, 1/2, and 2/3. In this paper, we describe the receiver architecture and FPGA implementation of the timing recovery loop and SCPPM decoder, FPGA utilization for the different modes, and receive modem characterization test results.

Field-programmable Gate Array

Universal Coating by 3D Hybrid Programmable Matter

Motivated by the prospect of nano-robots that assist human physiological functions at the nanoscale, we investigate the coating problem in the three-dimensional model for hybrid programmable matter. In this model, a single agent with strictly limited viewing range and the computational capability of a deterministic finite automaton can act on passive tiles by picking up a tile, moving, and placing it at some spot. The goal of the coating problem is to fill each node of some surface graph of size n with a tile. We first solve the problem on a restricted class of graphs with a single tile type, and then use constantly many tile types to encode this graph in certain surface graphs capturing the surface of 3D objects. Our algorithm requires O(n^2) steps, which is worst-case optimal compared to an agent with global knowledge and no memory restrictions.

programmable matter

Goddard space flight center computer programmer's manual

This manual describes the several different programming support systems employed at the Goddard Space Flight Center, namely, 7094 FORTRAN, MYSTIC, EXEC II PROCESSOR-1107, and AUTOCODER-SPS. It is tailored to the experienced programmer as it presents in detail how to use the various support systems. Each Chapter in this manual is a separate entity, and as such can be removed without disturbing the contents of the other chapters. There is a detailed table of contents for each Chapter, as well as a general table of contents covering the manual as a whole.

System Development Corporation