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Results for “Radiation testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 91 records · Page 5
All sourcesNASA NTRSDOE OSTI
NASA NTRS1976

Space shuttle I-tube radiator testing at Johnson Space Center, May 1976, volume 1

During the two weeks of thermal vacuum testing a representative forward panel was successfully operated in a variety of simulated environmental conditions. Performance limits for both high and low load operations were established. Confidence in the stable operation of the panel throughout its typical operating range was verified by the testing, and design studies were conducted to analyze the effects of the payload bay door, and the panel deployment angle, on performance.

Scheps, P. B.↗
NASA NTRS1990

Radiation test results on TK 1024 CCDs

Results are presented from tests on TK 1024 CCDs with a multipinned phase (MPP) implant built into an experiental mask set. The average dark current as a function of temperature increased by a factor of about 3 for the 5 krads of gammas, which is a 10-fold increase for the extra 2 krads of protons. Histograms of the dark current show two types of dark current, an average level change, and dark current spikes.

Delamere, Alan↗
NASA NTRS2003

Recent radiation test results at JPL

This paper documents recent TID (including ELDRS) and proton damage test results obtained by JPL. Unusual test results, such as abnormally low or high failure levels or unusual failure or response mechanisms, are emphasized.

total ionizing dose↗
NASA NTRS2012

Uniform Dust Distributor for Testing Radiative Emittance of Dust-Coated Surfaces

This apparatus distributes dust (typical of the Martian surface) in a uniform fashion on the surface of multiple samples simultaneously. The primary innovation is that the amount of dust deposited on the multiple surfaces can be controlled by the time that the apparatus operates, and each sample will be subject to the same amount of dust deposition. The exact weight of dust that is added per unit of sample area is determined by the use of slides that can be removed sequentially after each dusting.

Hurlbert, Kathryn Miller↗
NASA NTRS2013

Recent Radiation Test Results for Power MOSFETs

Single-event effect (SEE) and total ionizing dose (TID) test results are presented for various hardened and commercial power metal-oxide-semiconductor field effect transistors (MOSFETs), including vertical planar, trench, superjunction, and lateral process designs.

Lauenstein, Jean-Marie↗
NASA NTRS2016

Team Update on North American Proton Facilities for Radiation Testing

In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation provides an overview of the options for North American proton facilities. This includes those in use by the aerospace community as well as new additions from the cancer therapy regime. In addition, proton single event testing background is provided for understanding the criteria needed for these facilities for electronics testing.

Single event effects testing↗
NASA NTRS2016

Team Update on North American Proton Facilities for Radiation Testing

In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation provides an overview of the options for North American proton facilities. This includes those in use by the aerospace community as well as new additions from the cancer therapy regime. In addition, proton single event testing background is provided for understanding the criteria needed for these facilities for electronics testing.

Proton cyclotrons↗
NASA NTRS2016

Team Update on North American Proton Facilities for Radiation Testing

In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation provides an overview of the options for North American proton facilities. This includes those in use by the aerospace community as well as new additions from the cancer therapy regime. In addition, proton single event testing background is provided for understanding the criteria needed for these facilities for electronics testing.

Single event effects testing↗