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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 109 records · Page 6
All sourcesNASA NTRSDOE OSTI
NASA NTRS1981

Effects of secondary electron emission on charging

Laboratory charging studies using two electron sources with different energies show that the charging behaviors of typical spacecraft thermal control dielectric surface are extremely sensitive to the shape of their secondary emission curves. The results also suggest that the electron spectrum in a natural charging environment can be separated into three distinct regions (noninteracting, discharging, and charging) depending on the kinetic energy of the incident electron relative to the charged surface, and on the secondary emission characteristics of the material. To a first order approximation, the relative number of electrons in these different regions determines the potential of the charged surface. Detailed measurements of the secondary electron emission characteristics of Kapton, the effects of bulk conductivity and secondary emission on surface charging of these materials is reported.

Leung, M. S.↗
NASA NTRS1996

A Portable Surface Contamination Monitor Based on the Principle of Optically Stimulated Electron Emission (OSEE)

Many industrial and aerospace processes involving the joining of materials, require sufficient surface cleanliness to insure proper bonding. Processes as diverse as painting, welding, or the soldering of electronic circuits will be compromised if prior inspection and removal of surface contaminants is inadequate. As process requirements become more stringent and the number of different materials and identified contaminants increases, various instruments and techniques have been developed for improved inspection. One such technique, based on the principle of Optically Stimulated Electron Emission (OSEE), has been explored for a number of years as a tool for surface contamination monitoring. Some of the benefits of OSEE are: it is non-contacting; requires little operator training; and has very high contamination sensitivity. This paper describes the development of a portable OSEE based surface contamination monitor. The instrument is suitable for both hand-held and robotic inspections with either manual or automated control of instrument operation. In addition, instrument output data is visually displayed to the operator and may be sent to an external computer for archiving or analysis.

Perey, D. F.↗
NASA NTRS2012

Charging of Individual Micron-Size Interstellar/Planetary Dust Grains by Secondary Electron Emissions

Dust grains in various astrophysical environments are generally charged electrostatically by photoelectric emissions with UV/X-ray radiation, as well as by electron/ion impact. Knowledge of physical and optical properties of individual dust grains is required for understanding of the physical and dynamical processes in space environments and the role of dust in formation of stellar and planetary systems. In this paper, we discuss experimental results on dust charging by electron impact, where low energy electrons are scattered or stick to the dust grains, thereby charging the dust grains negatively, and at sufficiently high energies the incident electrons penetrate the grain leading to excitation and emission of electrons referred to as secondary electron emission (SEE). Currently, very limited experimental data are available for charging of individual micron-size dust grains, particularly by low energy electron impact. Available theoretical models based on the Sternglass equation (Sternglass, 1954) are applicable for neutral, planar, and bulk surfaces only. However, charging properties of individual micron-size dust grains are expected to be different from the values measured on bulk materials. Our recent experimental results on individual, positively charged, micron-size lunar dust grains levitated in an electrodynamic balance facility (at NASA-MSFC) indicate that the SEE by electron impact is a complex process. The electron impact may lead to charging or discharging of dust grains depending upon the grain size, surface potential, electron energy, electron flux, grain composition, and configuration (e.g. Abbas et al, 2010). Here we discuss the complex nature of SEE charging properties of individual micron-size lunar dust grains and silica microspheres.

Tankosic, D.↗
NASA NTRS1993

Ballistic-Electron-Emission Microscopy Techniques for Nanometer-scale Characterization of Interfaces

Semiconductor interface properties are among the most important phenomena in materials science and technology. The study of metal/semiconductor Schottky barrier interfaces has been the primary focus of a large research and development community for decades. Throughout the long history of interface investigation, the study of interface defect electronic properties have been seriously hindered by the fundamental experimental difficulty of probing subsurface structures. A new method, Ballistic-Electron-Emission Microscopy (BEEM), has been developed which not only enables spectroscopic probing of subsurface interface properties, but also, provides nanometer-resolution imaging capabilities. BEEM employs Scanning Tunneling Microscopy (STM) and a unique spatially localized ballistic electron spectroscopy method...

Bell, L. D.↗
NASA NTRS2009

Characterization of a Carbon Nanotube Field Emission Electron Gun for the VAPoR Miniaturized Pyrolysis-Time-of-Flight Mass Spectrometer

We are developing the VAPoR (Volatile Analysis by Pyrolysis of Regolith) instrument towards studying soil composition, volatiles, and trapped noble gases in the polar regions of the Moon. VAPOR will ingest a soil sample and conduct analysis by pyrolysis and time-of-flight mass spectrometry (ToF-MS). Here, we describe miniaturization efforts within this development, including a carbon nanotube (CNT) field emission electron gun that is under consideration for use as the electron impact ionization source for the ToF-MS.

Getty, Stephanie↗
NASA NTRS1986

Process Produces Low-Secondary-Electron-Emission Surfaces

Textured carbon layer applied to copper by sputtering. Carbon surface characterized by dense, random array of needle-like spires or peaks that extend perpendicularly from local copper surface. Spires approximately 7 micrometers in height and spaced approximately 3 micrometers apart, on average. Copper substrate essentially completely covered by carbon layer, is tenacious and not damaged by vibration loadings representative of multistage depressed collector (MDC) applications. Process developed primarily to provide extremely low-secondary-electron-emission surface for copper for use as highefficiency electrodes in MDC's for microwave amplifier traveling-wave tubes (TWT's). Tubes widely used in space communications, aircraft, and terrestrial applications.

Curren, A. N.↗
NASA NTRS2008

Using Optically Stimulated Electron Emission as an Inspection Method to Monitor Surface Contamination

During redesign of the Space Shuttle reusable solid rocket motor (RSRM), NASA amended the contract with ATK Launch Systems (then Morton Thiokol Inc.) with Change Order 966 to implement a contamination control and cleanliness verification method. The change order required: (1) A quantitative inspection method (2) A written record of actual contamination levels versus a known reject level (3) A method that is more sensitive than existing methods of visual and black light inspection. Black light inspection is only useful for inspection of contaminants that fluoresce near the 365 nm spectral line and is not useful for inspection of most silicones that will not produce strong fluorescence. Black light inspection conducted by a qualified inspector under controlled light is capable of detecting Conoco HD-2 grease in gross amounts and is very subjective due to operator sensitivity. Optically stimulated electron emission (OSEE), developed at the Materials and Process Laboratory at Marshall Space Flight Center (MSFC), was selected to satisfy Change Order 966. OSEE offers several important advantages over existing laboratory methods with similar sensitivity, e.g., spectroscopy and nonvolatile residue sampling, which provide turn around time, real time capability, and full coverage inspection capability. Laboratory methods require sample gathering and in-lab analysis, which sometimes takes several days to get results. This is not practical in a production environment. In addition, these methods do not offer full coverage inspection of the large components

Lingbloom, Mike S.↗
NASA NTRS1971

Development of reverse biased p-n junction electron emission

A cold cathode emitter of hot electrons for use as a source of electrons in vacuum gauges and mass spectrometers was developed using standard Norton electroluminescent silicon carbide p-n diodes operated under reverse bias conditions. Continued development including variations in the geometry of these emitters was carried out such that emitters with an emission efficiency (emitted current/junction current) as high as 3 x 10-0.00001 were obtained. Pulse measurements of the diode characteristics were made and showed that higher efficiency can be attained under pulse conditions probably due to the resulting lower temperatures resulting from such operation.

Fowler, P.↗
NASA NTRS1988

Observation of interface band structure by ballistic-electron-emission microscopy

The paper reports an advanced ballistic electron spectroscopy technique that was used to directly measure semiconductor band structure properties at a subsurface interface. Two interface systems having contrasting band structures were investigated by this method: Au-Si and Au-GaAs. It is concluded that the proposed method, based on scanning tunneling microscopy, enables the spatially resolved carrier-transport spectroscopy of interfaces.

Bell, L. D.↗
NASA NTRS1998

Charging of Single Micron Sized Dust Grains by Secondary Electron Emission: A Laboratory Study

We present the details of a new laboratory study whose objective is to experimentally study the interaction of micron sized particles with plasmas and electromagnetic radiation. Specifically, to investigate under what conditions and to what extent do particles of various compositions and sizes become charged, or discharged, while exposed to an electron beam and ultraviolet radiation environment The emphasis is the study of the two charging mechanisms, secondary emission of electrons and photoelectric effect. The experiment uses a technique known as electrodynamic suspension of particles. With this technique, a single charged particle is electrodynamically levitated and then exposed to a controlled environment. Its charge to mass ratio is directly measured. Viscous drag measurements and the light scattering measurements characterize its size and optical characteristics. The environment to which the particle is expose may consist of room temperature and pressure or a rarefied atmosphere where only one major gaseous constituent is present, or, as in this case, a vacuum environment under electron bombardment or UV radiation . In addition, the environment can be cycled as part of the experiment. Therefore, using this technique, a single particle can be repeatedly exposed to a controlled environment and its response measured, or a single particle can be exposed to similar environments with minor differences and its response measured as a function of only the changed environmental conditions.

Spann, James F., Jr.↗