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This presentation provides information on approach to total dose radiation hardness assurance that was developed that includes variability of the space radiation environment.
CubeSats have become an attractive platform for universities, industry, and government space missions because they are cheaper and quicker to develop than full-scale satellites. One way CubeSats keep costs low is by using commercial off-the-shelf parts (COTS) instead of space-qualified parts. Space-qualified parts are often costlier, larger, and consume more power than their commercial counterparts precluding their use within the CubeSat form-factor. Given typical power budgets, monetary budgets, and timelines for CubeSat missions, conventional radiation hardness assurance, like the use of space-qualified parts and radiation testing campaigns of COTS parts, is not practical. Instead, a system-level approach to radiation effects mitigation is needed. In this paper an assurance case for a system-level approach to mitigate radiation effects of a CubeSat science experiment is expressed using Goal Structuring Notation (GSN), a graphical argument standard. The case specifically looks at three main mitigation strategies for the radiation environment: total ionizing dose (TID) screening of parts, detection and recovery from single-event latch-ups (SEL) and single-event functional interrupts (SEFI). The graphical assurance case presented makes a qualitative argument for the radiation reliability of the CubeSat experiment using part and system-level mitigation strategies.
This part of the course first outlines the conventional Single Event Effect (SEE), radiation hardness assurance (RHA) approach, which emphasizes mission success. Next, Dr. Ladbury will discuss the challenges posed by new satellite platforms (e.g., cubesats, nanosats, etc.), where cost and schedule receive emphasis equal to if not greater than mission success. These additional pressures, along with growing demands to reduce size, weight and power, coupled with increased performance, drive many projects toward expanding their use of commercial-off-the-shelf (COTS) technologies. While this may reduce direct parts cost and procurement lead times, it undermines many cost-reduction strategies used for conventional SEE RHA and can make radiation testing and analysis one of the most significant risks or worse, a risk neglected altogether. That section will end with some approaches for restoring balance in the troika of mission success, cost, and schedule. This is captured in SEE RHA as risk management: identify the threat, evaluate the threat, and mitigate the threat.
This part of the course first outlines the conventional Single Event Effect (SEE), radiation hardness assurance (RHA) approach, which emphasizes mission success. Next, Dr. Ladbury will discuss the challenges posed by new satellite platforms (e.g., cubesats, nanosats, etc.), where cost and schedule receive emphasis equal to if not greater than mission success. These additional pressures, along with growing demands to reduce size, weight and power, coupled with increased performance, drive many projects toward expanding their use of commercial-off-the-shelf (COTS) technologies. While this may reduce direct parts cost and procurement lead times, it undermines many cost-reduction strategies used for conventional SEE RHA and can make radiation testing and analysis one of the most significant risksor worse, a risk neglected altogether. That section will end with some approaches for restoring balance in the troika of mission success, cost, and schedule. This is captured in SEE RHA as risk management: identify the threat, evaluate the threat, and mitigate the threat.
Several new radiation phenomena have been observed in laboratory testing of advanced microelectonics that are not yet of sufficient importance for typical space applications, but provide insight into the likely effects of scaling and device design on radiation hardness.
A confidence level based approach to total dose radiation hardness assurance is presented for spacecraft electronics. It is applicable to both ionizing and displacement damage dose. Results are compared to the traditional approach that uses radiation design margin and advantages of the new approach are discussed.
SEAM is a useful resource for model-based radiation hardness assurance but can be technically challenging for new users. R-Gentic is a NASA developed website that aims at assisting engineers better understand the radiation concerns in their EEE parts. This work aims at providing an update on an ongoing effort to interface R-Gentic with SEAM. Once integration is completed, R-Gentic can be used to seed new SEAM projects, making project creation easier and more accessible.
A probabilistic TID radiation hardness assurance method is compared to worst-case, military test standards. A case study is used to demonstrate different failure assessment outcomes between the methods and the impact of incorporating environment variability.
This presentation gives an overview pulsed laser testing methods and practical examples for radiation hardness assurance in space system electronics.
We review the Artemis-I mission and corresponding radiation-hardness assurance (RHA) process. We discuss the RHA methodologies employed, design challenges, culture challenges and some flight data vs. rate estimations.
We review the Artemis-I mission and corresponding radiation-hardness assurance (RHA) process. We discuss the RHA methodologies employed, design challenges, culture challenges and some flight data vs. rate estimations.
Motorola and National Semiconductor 54HC00 and 54HC74 microcircuits were evaluated using CO-60 to determine their total dose radiation hardness. The devices were found to be radiation soft failing parametrically between 5 and 10 K rads and functionally between 20 and 40 K rads. The failures were bias dependent, relatively insensitive to dose rate, and only annealed moderately when left unbiased at room temperature.
A paper discusses the successful development of a miniaturized radiation hardened high-voltage switching module operating at 2.5 kV suitable for space application. The high-voltage architecture was designed, fabricated, and tested using a commercial process that uses a unique combination of 0.25 micrometer CMOS (complementary metal oxide semiconductor) transistors and high-voltage lateral DMOS (diffusion metal oxide semiconductor) device with high breakdown voltage (greater than 650 V). The high-voltage requirements are achieved by stacking a number of DMOS devices within one module, while two modules can be placed in series to achieve higher voltages. Besides the high-voltage requirements, a second generation prototype is currently being developed to provide improved switching capabilities (rise time and fall time for full range of target voltages and currents), the ability to scale the output voltage to a desired value with good accuracy (few percent) up to 10 kV, to cover a wide range of high-voltage applications. In addition, to ensure miniaturization, long life, and high reliability, the assemblies will require intensive high-voltage electrostatic modeling (optimized E-field distribution throughout the module) to complete the proposed packaging approach and test the applicability of using advanced materials in a space-like environment (temperature and pressure) to help prevent potential arcing and corona due to high field regions. Finally, a single-event effect evaluation would have to be performed and single-event mitigation methods implemented at the design and system level or developed to ensure complete radiation hardness of the module.
The structure and method of fabricating a radiation and temperature hard avalanche photodiode with integrated radiation and temperature hard readout circuit, comprising a substrate, an avalanche region, an absorption region, and a plurality of Ohmic contacts are presented. The present disclosure provides for tuning of spectral sensitivity and high device efficiency, resulting in photon counting capability with decreased crosstalk and reduced dark current.
The rediation effects and testing programs in place at the Jet Propulsion Laboratory support the insertion of traditional, advanced, and emerging microelectronic and photonic technologies in NASA systems through research and testing that enhances the radiation hardness assurance (RHA) of these technologies. With the decreasing availability of radiation hardened electronics and the new NASA paradigm of faster, more aggressive and less expensive space missions, there has been an increasing emphasis on using high performance commercial microelectronic parts and circuits in NASA spacecraft.
Recent progress in the study of flare precursors and onset is reviewed. New theoretical results on filament formation and erution are presented, including especially the dynamical effects of magnetic fields. Ample evidence is found that energetic processes are already at work in the onset phase, a few minutes before the rapid rise of the hard-radiation impulse. In particular, the prevalence of soft and hard X-ray preheating (to less than 100 million K) is detailed, along with a connection to the launch of coronal mass ejections. A possible interpretation of the empirical time profiles near onset is that 'preheating' signifies that the flare has slowly started, and the transition to the impulsive stage then represents a change of phase in the flare-instability process. Finally, the problem of the interpretation of microwave preflare data is delineated.
Outer space is vast, cold, devoid of matter, radiation filled with essentially no gravity. These factors present an environmental challenge for any form of life. Earth's biosphere has evolved for more than 3 billion years shielded from the hostile environment of outer space by the protective blanket of the atmosphere and magnetosphere. Space is a nutritional wasteland with no liquid water and readily available organic carbon. Moving beyond a life's planet of origin requires a means for transport, the ability to withstand transport, and the ability to colonize, thrive and ultimately evolve in the new environment. Can life survive beyond its home planet? The key to answering this question is to identify organisms that first have the ability to withstand space radiation, space vacuum desiccation and time in transit, and second the ability to grow in an alien environment. Within the last 60 years space technology allowed us to transport life beyond Earth's protective shield so we may study, in situ, their responses to selected conditions of space. To date a variety of microbes ranging from viruses, to Bacteria, to Archaea, to Eukarya have been tested in the space environment. Most died instantly, but not all. These studies revealed that ultraviolet radiation is the near-term lethal agent, while hard radiation is the long-term lethal agent when the organism is shielded from ultraviolet radiation. In fact, bacterial spores, halophilic cyanobacteria and Archaea as well as some lichens survive very well if protected from ultraviolet radiation [1]. Some microbes, then, may be able to survive the trip in outer space to Mars on a spacecraft or in a meteorite. Once on Mars can a terrestrial microbe survive? Although the conditions on Mars are not as harsh as those in space, they are not hospitable for a terrestrial microbe. Studies, however, have shown that certain microbes that can survive in space for several years may also be able to survive on Mars if protected from ultraviolet radiation [1]. Laboratory simulation experiments using a mock-up of the Phoenix lander have shown that microbes transported to the surface of Mars on a spacecraft come off the spacecraft and mix into the Martian regolith [2]. Additionally, studies simulating Martian dust storms demonstrate that microbes can survive in the Martian wind blown dust and be scattered across the Martian surface away from the spacecraft. Would these microbes that may survive on Mars metabolize and propagate? Growth requires liquid water, a carbon source and an energy source. Survival on Mars also requires protection from ultraviolet radiation. In the cold, dry environment of Mars the probability of microbial metabolism and growth at or just beneath the surface is extremely low. Although the probability is low, Mars may be contaminated with potentially live terrestrial organisms. In light of that statistic we must be extremely diligent and cautious in our search for Martian life. If we are not cautious we may find life on Mars and it may be a contaminant from Earth.
Dr. Jean-Marie Lauenstein, NASA Goddard Space Flight Center, will present the radiation challenges of adopting wide-bandgap semiconductors for space applications. Wide-bandgap devices are attractive for space applications due to improved performance such as faster switching speeds, lower power losses, and their ability to operate at higher temperature as compared with their silicon counterparts. Their tolerance to total ionizing dose levels (> 100 krad(Si)) further enhances the desirability of these technologies. This short course will focus on silicon carbide and gallium nitride power rectifying, switching, and RF devices as these technologies are now readily available commercially. The radiation hardness assurance issues presented by the heavy-ion radiation environment will be discussed.