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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 1,207 records · Page 67
All sourcesNASA NTRSDOE OSTI
DOE OSTI2015

SU-E-T-112: An OpenCL-Based Cross-Platform Monte Carlo Dose Engine (oclMC) for Coupled Photon-Electron Transport

Purpose: Low computational efficiency of Monte Carlo (MC) dose calculation impedes its clinical applications. Although a number of MC dose packages have been developed over the past few years, enabling fast MC dose calculations, most of these packages were developed under NVidia’s CUDA environment. This limited their code portability to other platforms, hindering the introduction of GPU-based MC dose engines to clinical practice. To solve this problem, we developed a cross-platform fast MC dose engine named oclMC under OpenCL environment for external photon and electron radiotherapy. Methods: Coupled photon-electron simulation was implemented with standard analogue simulation scheme for photon transport and Class II condensed history scheme for electron transport. We tested the accuracy and efficiency of oclMC by comparing the doses calculated using oclMC and gDPM, a previously developed GPU-based MC code on NVidia GPU platform, for a 15MeV electron beam and a 6MV photon beam in a homogenous water phantom, a water-bone-lung-water slab phantom and a half-slab phantom. We also tested code portability of oclMC on different devices, including an NVidia GPU, two AMD GPUs and an Intel CPU. Results: Satisfactory agreements were observed in all photon and electron cases, with ∼0.48%–0.53% average dose differences at regions within 10% isodose line for electron beam cases and ∼0.15%–0.17% for photon beam cases. It took oclMC 3–4 sec to perform transport simulation for electron beam on NVidia Titan GPU and 35–51 sec for photon beam, both with ∼0.5% statistical uncertainty. The computation was 6%–17% slower than gDPM due to the differences in both physics model and development environment, which is considered not significant for clinical applications. In terms of code portability, gDPM only runs on NVidia GPUs, while oclMC successfully runs on all the tested devices. Conclusion: oclMC is an accurate and fast MC dose engine. Its high cross-platform portability makes it clinically attractive.

60 APPLIED LIFE SCIENCES↗
DOE OSTI2016

SPE-5 Booster System: Design and Qualification Testing

The SPE-5 device presents a unique set of requirements for the initiation and booster system. This report documents the design of the booster and qualification test results to meet the requirements.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
NASA NTRS2025

Evaluating the Viability of Compact and Portable X-Ray Systems for an Exploration Medical System in a Ground Demonstration

MOTIVATION FOR INCLUDING X-RAY CAPABILITIES For upcoming exploration missions, the need for enhanced medical care becomes critical due to extended mission durations, significant communication delays, and minimal evacuation opportunities. Previous evidence by our team has revealed that among the 119 medical conditions targeted for management during spaceflight within NASA Exploration Medical Capability’s IMPACT Condition List, at least 36 could benefit from radiography (XR). Utilizing XR for diagnosis and management is hypothesized to significantly improve management of crew health by enabling the immediate evaluation and confirmation of potential injuries or illnesses. Beyond clinical applications, XR also holds potential for non-destructive testing (NDT). This includes applications such as assessing the structural integrity of the spacecraft, analyzing surface and meteorite samples, and inspecting onboard electronics. THREE CANDIDATE X-RAY SYSTEMS CHOSEN FOR GROUND DEMONSTRATION The Exploration Medical Capability Element (ExMC) and the Exploration Medical Integrated Product Team (XMIPT) of the Mars Campaign Office initiated early background work for ground demonstrations. In FY21, ExMC published a Concept of Operations to guide requirements development. By FY23, XMIPT and yet2, a technology scouting and open innovation consulting firm, had completed a market survey and trade study to identify potential miniature XR systems. Selection criteria included commercial-off-the-shelf availability, low mass and volume, and regulatory compliance. The top three candidate devices—Remedi REMEX-KA6, MinXray Impact, and FujiFilm Xair—were acquired to characterize the requirements and capabilities of each device. To facilitate testing, phantoms, and radiographic personal protective equipment (PPE) were purchased, and a dedicated space was designated for XRS usage at Glenn Research Center. During this presentation, the mass, volume, and power requirements for each of the three piloted devices are revealed, as well as information regarding the detector, mA, and kV of the devices. GOAL AND OBJECTIVES OF A MINI XRS GROUND DEMONSTRATION The primary goal of ExMC/XMIPT technology demonstrations is to bridge the gap in available, flight-ready medical device technology by flight-testing diagnostic and treatment technologies essential for managing medical conditions during exploration missions. These technologies must adhere to vehicle constraints such as mass, volume, power, and data requirements, integrate seamlessly with medical decision-support tools, and support increasingly Earth-independent operations. There are three main objectives for the future ground demonstration of these three devices. First, we aim to determine the full capabilities of these three miniature XR systems within the context of the spaceflight environment. While medical applications are the primary focus for the miniature XR, a comprehensive exploration of non-medical uses has been initiated by an XMIPT-sponsored NASA SPARK campaign to identify collaborators. Second, we plan to establish criteria and to use insights gained from evaluating each miniature XR against those criteria to select the most suitable system among the three candidates. Third, we intend to evaluate their suitability for flight certification, which includes assessing its durability for launch, reentry, and exposure to high background radiation, as well as its compatibility with existing data architecture systems. Numerous subject matter experts from NASA and partner institutions will support these objectives.

C A Haddix↗
DOE OSTI2018

Improving performance of the MgZnO ultraviolet photodetectors by changing the interdigital electrode width

Highlights: • The different electrode width of the metal-semiconductor-metal photodetectors are fabricated by the radio frequency magnetron sputtering technique. • The responsivity and the dark current of the photodetectors will vary with the electrode width. • The main reason of the interesting phenomenon is the change of the density of the carriers. - Abstract: We grow the Mg{sub 0.24}Zn{sub 0.76}O thin film onto a quartz substrate by the radio frequency magnetron sputtering technique. Planar geometry metal-semiconductor-metal structured ultraviolet detectors were fabricated by conventional ultraviolet lithography and wet etching on the Mg{sub 0.24}Zn{sub 0.76}O thin films. To improve the performance of the device, three kinds of photodetectors with different electrode width were fabricated, after a series of tests on those device, it is amusing to find an interesting phenomenon, the Mg{sub 0.24}Zn{sub 0.76}O photodetectors with different electrode width have a great influence on the performance of the whole device. The Mg{sub 0.24}Zn{sub 0.76}O photodetectors that own larger electrode width had a higher responsivity and lower dark current than the photodetectors own littler electrode width. These interesting results are very meaningful for the photodetector industry.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
NASA NTRS1978

Scanning microscopy in microcircuit failure analysis

A three-phase microcircuit failure analysis procedure is presented. In the first phase, the device is nondestructively tested and the data obtained is correlated with the circumstances surrounding the failure event. The device is then subjected to a limited nondestructive analysis dominated by optical and scanning electron microscopy (SEM). Knowing that microcircuits usually fail from manufacturing defects or misuse, the analyst looks for one of the probable mechanisms. The SEM has two special operating modes that provide unique data for nondestructive analysis: voltage contrast and conductive current. These are used with other SEM modes and surface analysis techniques to analyze complicated microcircuits. The last phase includes the destructive procedures. The end product of these analyses is a corrective action that will yield a highly reliable system.

Nicolas, D. P.↗
NASA NTRS1990

Dynamic test input generation for multiple-fault isolation

Recent work is Causal Reasoning has provided practical techniques for multiple fault diagnosis. These techniques provide a hypothesis/measurement diagnosis cycle. Using probabilistic methods, they choose the best measurements to make, then update fault hypotheses in response. For many applications such as computers and spacecraft, few measurement points may be accessible, or values may change quickly as the system under diagnosis operates. In these cases, a hypothesis/measurement cycle is insufficient. A technique is presented for a hypothesis/test-input/measurement diagnosis cycle. In contrast to generating tests a priori for determining device functionality, it dynamically generates tests in response to current knowledge about fault probabilities. It is shown how the mathematics previously used for measurement specification can be applied to the test input generation process. An example from an efficient implementation called Multi-Purpose Causal (MPC) is presented.

Schaefer, Phil↗
DOE OSTI2015

A device for the application of uniaxial strain to single crystal samples for use in synchrotron radiation experiments

We present the design, construction, and testing of a straining device compatible with many different synchrotron radiation techniques, in a wide range of experimental environments (including low temperature, high field and ultra-high vacuum). The device has been tested by X-ray diffraction on single crystal samples of quasi-one-dimensional Cs{sub 2}Mo{sub 6}Se{sub 6} and K{sub 2}Mo{sub 6}Se{sub 6}, in which microscopic strains up to a Δc/c = 0.12% ± 0.01% change in the c lattice parameters have been achieved. We have also used the device in an inelastic X-ray scattering experiment, to probe the strain-dependent speed of sound ν along the c axis. A reduction Δν/ν of up to −3.8% was obtained at a strain of Δc/c = 0.25% in K{sub 2}Mo{sub 6}Se{sub 6}.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
NASA NTRS1966

Ultrasonic water column probe speeds up testing of welds

Ultrasonic device consisting of a coaxial rod and transducer enclosed in a cylindrical probe which is filled with deionized or distilled water speeds up the testing of welds. Rubber diaphragm is molded to produce the desired test beam angle.

Hoop, J. M.↗
NASA NTRS2003

High-Temperature RF Probe Station For Device Characterization Through 500 deg C and 50 GHz

A high-temperature measurement system capable of performing on-wafer microwave testing of semiconductor devices has been developed. This high temperature probe station can characterize active and passive devices and circuits at temperatures ranging from room temperature to above 500 C. The heating system uses a ceramic heater mounted on an insulating block of NASA shuttle tile material. The temperature is adjusted by a graphical computer interface and is controlled by the software-based feedback loop. The system is used with a Hewlett-Packard 8510C Network Analyzer to measure scattering parameters over a frequency range of 1 to 50 GHz. The microwave probes, cables, and inspection microscope are all shielded to protect from heat damage. The high temperature probe station has been successfully used to characterize gold transmission lines on silicon carbide at temperatures up to 540 C.

Schwartz, Zachary D.↗
NASA NTRS1989

Ignitability test method

To overcome serious weaknesses in determining the performance of initiating devices, a novel 'ignitability test method', representing actual design interfaces and ignition materials, has been developed. Ignition device output consists of heat, light, gas an burning particles. Past research methods have evaluated these parameters individually. This paper describes the development and demonstration of an ignitability test method combining all these parameters, and the quantitative assessment of the ignition performance of two widely used percussion primers, the M42C1-PA101 and the M42C2-793. The ignition materials used for this evaluation were several powder, granule and pellet sizes of black powder and boron-potassium nitrate. This test method should be useful for performance evaluation of all initiator types, quality assurance, evaluation of ignition interfaces, and service life studies of initiators and ignition materials.

Bement, Laurence J.↗
NASA NTRS1984

Preparation and cleanliness verifications of a space simulation chamber for contamination sensitive test specimens

Contamination sensitive optical devices were to be evaluated under thermal vacuum conditions. Test specifications called for an extremely clean chamber environment, ambient temperature chamber walls, and optical surface temperatures at approximately - 30 C. Chamber preparation included the replacement of diffusion pumps with cryopumps and the cleaning of the chamber walls to reduce contamination levels. Chamber cleaning using vacuum bake was tried and abandoned as time consuming and ineffective. Chemical cleaning and cleanliness verification methods were developed. Gas chromatograph analysis techniques were used extensively throughout the cleaning process to verify cleanliness levels prior to evacuating the chamber. A chamber cleanliness verification test using a thermoelectric quartz crystal microbalance and witness samples was performed to demonstrate that an appropriate cleanliness level was achieved.

Koch, W. R.↗
NASA NTRS2018

Guideline for Single-Event Effect (SEE) Testing of System on a Chip (SOC) Devices

The use of complex single and multicore processors with significant cache memory, on-chip peripherals, memory controllers, and high speed input/output (IO) that integrate many of the parts of a traditional computer system is becoming more common in space applications. Such devices are often referred to as system on a chip devices (SOCs), even though the term is used somewhat inaccurately due to the lack of analog and mixed signal subcircuits. These devices are complex combinations of single- or multi-core processors with memory controllers, high-speed input/output (IO), and other peripheral structures that formerly would have been handled by off-chip resources. In the past the processors were tested for single event effects (SEE) separately, and the peripherals were often put into custom application-specific integrated circuits (ASICs) along with other resources required by the user. Performance and cost pressures have pushed commercial devices to incorporate many of the functional blocks into a single chip, an SOC. The NASA Electronic Parts and Packaging Program (NEPP) has been examining ways to perform SEE radiation hardness assurance (RHA) testing of these processor-centric SOCs to achieve reasonable understanding of their performance in space missions.

Guertin, Steven M.↗
NASA NTRS1973

Three-axis adjustable loading structure

A three axis adjustable loading structure for testing the movable surfaces of aircraft by applying pressure, is described. The device has three electric drives where the wall angle, horizontal position, and vertical position of the test device can be rapidly and accurately positioned.

Lynch, E. J.↗
NASA NTRS1976

Long-life mission reliability for outer planet atmospheric entry probes

The results of a literature analysis on the effects of prolonged exposure to deep space environment on the properties of outer planet atmospheric entry probe components are presented. Materials considered included elastomers and plastics, pyrotechnic devices, thermal control components, metal springs and electronic components. The rates of degradation of each component were determined and extrapolation techniques were used to predict the effects of exposure for up to eight years to deep space. Pyrotechnic devices were aged under accelerated conditions to an equivalent of eight years in space and functionally tested. Results of the literature analysis of the selected components and testing of the devices indicated that no severe degradation should be expected during an eight year space mission.

Mccall, M. T.↗
NASA NTRS1983

Low background IR detector and detector array evaluations

A technology program has been underway at Ames since 1978 to develop and evaluate detectors and integrated detector arrays for low-background astronomical applications. The approach is to evaluate existing (less than 24 micron) array technology under low-background conditions, with the aim of adapting and optimizing existing devices. For longer wavelengths, where the technology is much less mature, development is sponsored and devices are evaluated, in both discrete and array formats, for eventual applications. The status of this program has been reported previously. We rely on industrial and university sources for the detectors. Typically, after a brief functionality check in the supplier's laboratory, we work with the device at Ames to characterize its low-background performance. In the case of promising arrays or detectors, we conduct ground-based telescope testing to face the problems associated with real applications. A list of devices tested at Ames is given. In the array category, accumulation-mode charge-injection-devices (AMCIDs) appear repeatedly; this reflects our recent experience with the 2 x 64 and 16 x 16 arrays. Results from the 1 x 16 CID and InSb CCD have been reported. The status of our tests of the discrete Ge:x detectors from Lawrence Berkeley Laboratory are described below. Tests of a 1 x 2 switched sample photoconductor array are just beginning. A 32-channel CMOS multiplexer has been tested at 10 K. Low-temperature silicon MOSFETs and germanium JFETs have also been tested, primarily at Ball Aerospace. This paper describes results to date on three elements of this program: AMCID array, discrete Ge:Ga detectors, and Ge JFET preamplifiers.

Goebel, J. H.↗
NASA NTRS1991

Silicon device performance measurements to support temperature range enhancement

The results of the NPN bipolar transistor (BJT) (2N6023) breakdown voltage measurements were analyzed. Switching measurements were made on the NPN BJT, the insulated gate bipolar transistor (IGBT) (TA9796) and the N-channel metal oxide semiconductor field effect transistor (MOSFET) (RFH75N05E). Efforts were also made to build a H-bridge inverter. Also discussed are the plans that have been made to do life testing on the devices, to build an inductive switching test circuit and to build a dc/dc switched mode converter.

Johnson, R. Wayne↗
NASA NTRS1995

Dynamic response tests of inertial and optical wind-tunnel model attitude measurement devices

Results are presented for an experimental study of the response of inertial and optical wind-tunnel model attitude measurement systems in a wind-off simulated dynamic environment. This study is part of an ongoing activity at the NASA Langley Research Center to develop high accuracy, advanced model attitude measurement systems that can be used in a dynamic wind-tunnel environment. This activity was prompted by the inertial model attitude sensor response observed during high levels of model vibration which results in a model attitude measurement bias error. Significant bias errors in model attitude measurement were found for the measurement using the inertial device during wind-off dynamic testing of a model system. The amount of bias present during wind-tunnel tests will depend on the amplitudes of the model dynamic response and the modal characteristics of the model system. Correction models are presented that predict the vibration-induced bias errors to a high degree of accuracy for the vibration modes characterized in the simulated dynamic environment. The optical system results were uncorrupted by model vibration in the laboratory setup.

Buehrle, R. D.↗
DOE OSTI2018

New Zealand Multi-Mode Technology Demonstration at the US Navy's Wave Energy Test Site

The objective of the project is to redeploy the Wave Energy Technology – New Zealand (WET-NZ and now known as Azura) device that was tested at the NNMREC test site in 2013 at the United States Navy’s Wave Energy Test Site (WETS). The goal is to conduct open-ocean, grid connected testing for a period of up to 12 months to 1) optimize energy capture and 2) validate LCOE model.

16 TIDAL AND WAVE POWER↗