Electron microscope method for measuring diffraction grating groove geometry.
Electron microscope method for measuring diffraction grating groove geometry in conjunction with fiber shadowing
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Electron microscope method for measuring diffraction grating groove geometry in conjunction with fiber shadowing
Ion microscopic studies of solute atoms in solid solution lattices
Phase retardation measurements in polarization and interference microscopy, theory and application of phase modulated light methods, and design of photoelectric microscope
Lattice defects in nickel-molybdenum alloys, and computer simulation of field ion microscope
Remote automatic microscopic system for Mars life detection
Microscope modification for time-lapse cinematography noting holding camera stand, deflecting light mirror, culture chamber, etc
Cesium ion emission patterns obtained from rear- fed porous refractory metals, using thermal emission microscope
Fast scanning IR microscope for semiconductor evaluation used for engineering design analysis, reliability improvement, failure analysis, etc
Defect structures in ion emission images of metals and stress distributions under imaging conditions studied with field ion microscope
Fast scan infrared microscope for inspecting microelectronic circuits
Scanning electron microscope for evaluating failure mechanisms in semiconductor devices, and for three-dimensional representation of biological specimens
Fast scan infrared microscope for measuring thermal and electromechanical parameters affecting reliability of microelectronic devices
Two magnetically geared microscope stages for nuclear track plates
Oxygen caused bright spots in field ion microscope patterns of tungsten, noting oxygen variation effects
Reflected light microscope for viewing unstained brain and ganglion cells
Threshold voltage for onset of image-spot blurring of field-ion microscope screen and function of tip temperature
The Camera, Hand Lens, and Microscope Probe (CHAMP) will allow examination of martian surface features and materials (terrain, rocks, soils, samples) on spatial scales ranging from kilometers to micrometers, thus enabling both microscopy and context imaging with high operational flexibility. CHAMP is designed to allow the detailed and quantitative investigation of a wide range of geologic features and processes on Mars, leading to a better quantitative understanding of the evolution of the martian surface environment through time. In particular, CHAMP will provide key data that will help understand the local region explored by Mars Surface Laboratory (MSL) as a potential habitat for life. CHAMP will also support other anticipated MSL investigations, in particular by helping identify and select the highest priority targets for sample collection and analysis by the MSL's analytical suite.
The Miniaturized Variable Pressure Scanning Electron Microscope(MVP-SEM) project, funded by the NASA Planetary Instrument Concepts for the Advancement of Solar System Observations (PICASSO) Research Opportunities in Space and Earth Science (ROSES), will build upon previous miniaturized SEM designs for lunar and International Space Station (ISS) applications and recent advancements in variable pressure SEM's to design and build a SEM to complete analyses of samples on the surface of Mars using the atmosphere as an imaging medium. By the end of the PICASSO work, a prototype of the primary proof-of-concept components (i.e., the electron gun, focusing optics and scanning system)will be assembled and preliminary testing in a Mars analog chamber at the Jet Propulsion Laboratory will be completed to partially fulfill Technology Readiness Level to 5 requirements for those components. The team plans to have Secondary Electron Imaging(SEI), Backscattered Electron (BSE) detection, and Energy Dispersive Spectroscopy (EDS) capabilities through the MVP-SEM.