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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 145 records · Page 8
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

Statistical characterization of high voltage vacuum surface flashover with gapped and ungapped anodes

This manuscript reports the experimental study of a novel vacuum high-voltage (HV) feedthrough geometry with a recessed anode triple junction (ATJ) relevant to large-scale pulsed power systems. It is shown experimentally that introducing a vacuum gap between the insulator–anode interface and recessing the ATJ farther away from the cathode triple junction significantly enhances high voltage (HV) vacuum surface flashover hold-off. The results for “first pulse” and “consecutive pulse” tests are reported. The physical mechanisms contributing to the electrical failure of this feedthrough geometry appear to be unique to this geometry. These findings show the potential to allow for HV vacuum surface flashover geometries with significantly improved electrical characteristics.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
NASA NTRS1992

NPB Cesium Space Experiment

Neutral Particle Beam (NPB) weapons systems are planned to perform the ballistic missile defense functions of nuclear weapon/decoy discrimination and warhead kill at appropriate energy levels and ion currents. Negatively charged ions are produced in a specialized ion source and focused into a high quality particle beam. NPB linear accelerators accelerate and steer the negatively charged ions using electric and magnetic fields. After acceleration and steering the neutralizer system strips away extra electrons from ions to form the electrically neutral particle beam. The neutral beam then travels through space to the target unaffected by the Earth's magnetic fields. Continuing technological advances have greatly reduced the size and weight of NPB accelerator systems. Ion current production has been enhanced by over 100 percent with the intermittent addition of cesium at the NPB ion source device. This increase in current is essential to attain the most light weight, compact NPB platforms and minimize expensive launch costs. Addition of cesium into the ion source has been identified by the NPB community as the highest priority risk reduction space experiment necessary prior to planned NPB accelerator experiments and later weapons systems. The NPB Cesium Space Experiment is planned to successfully demonstrate controlled cesium introduction and vaporization into a simulated ion source chamber. Microgravity effects on the cesium deposition will be studied as will the effects of small amounts of cesium on high voltage accelerator components that might be susceptible to electrical insulator break downs. The experiment design will simulate as closely as possible the environment, physical and operational characteristics of the actual NPB ion source.

Parsons, George M., III↗
NASA NTRS2016

Post-Test Inspection of NASA's Evolutionary Xenon Thruster Long-Duration Test Hardware: Discharge Chamber

The NEXT Long-Duration Test is part of a comprehensive thruster service life assessment intended to demonstrate overall throughput capability, validate service life models, quantify wear rates as a function of time and operating condition, and identify any unknown life-limiting mechanisms. The test was voluntarily terminated in February 2014 after demonstrating 51,184 hours of high-voltage operation, 918 kg of propellant throughput, and 35.5 MN-s of total impulse. The post-test inspection of the thruster hardware began shortly afterwards with a combination of non-destructive and destructive analysis techniques, and is presently nearing completion. This paper presents relevant results of the post-test inspection for the discharge chamber as well as other miscellaneous components such as the high-voltage propellant isolators and electrical cabling. Comparison of magnetic field measurements taken during pretest and post-test inspections indicate that the field strength did not degrade, consistent with performance data obtained during the test. Inspection of discharge chamber mesh samples show a deposition coating primarily composed of grid material that is approximately 15 micrometers in thickness. This thickness is well within the retention capability of the mesh and is therefore not expected to present any issues. Approximately 3.1 grams of deposition flakes were found at the bottom of the discharge chamber, composed primarily of grid material and carbon. Calculated size histograms of these flakes indicate that 99% have a maximum dimension of 200 micrometers or smaller, which is significantly less than the ion optics grid gap. Larger flakes that are capable of causing a grid-to-grid short will be analyzed to determine if their formation will occur in flight or is a facility effect. The high-voltage propellant isolators as well as numerous other electrical insulators were inspected and no evidence of arcing or any other issues were found.

Electric Propulsion↗
NASA NTRS2021

Post-test Inspection of NASA’s Evolutionary Xenon Thruster Long-Duration Test Hardware: Discharge Chamber

The NEXT Long-Duration Test is part of a comprehensive thruster service life assessment intended to demonstrate overall throughput capability, validate service life models, quantify wear rates as a function of time and operating condition, and identify any unknown life-limiting mechanisms. The test was voluntarily terminated in February 2014after demonstrating 51,184 hours of high-voltage operation, 918 kg of propellant throughput, and 35.5 MN-s of total impulse. The post-test inspection of the thruster hardware began shortly afterwards with a combination of non-destructive and destructive analysis techniques, and is presently nearing completion. This paper presents relevant results of the post-test inspection for the discharge chamber as well as other miscellaneous components such as the high-voltage propellant isolators and electrical cabling. Comparison of magnetic field measurements taken during pretest and post-test inspections indicate that the field strength did not degrade, consistent with performance data obtained during the test. Inspection of discharge chamber mesh samples show a deposition coating primarily composed of grid material that is approximately 15 μm in thickness. This thickness is well within the retention capability of the mesh and is therefore not expected to present any issues. Approximately 3.1 grams of deposition flakes were found at the bottom of the discharge chamber, composed primarily of grid material and carbon. Calculated size histograms of these flakes indicate that 99% have a maximum dimension of 200 μm or smaller, which is significantly less than the ion optics grid gap. Larger flakes that are capable of causing a grid-to-grid short will be analyzed to determine if their formation will occur in flight or is a facility effect. The high-voltage propellant isolators as well as numerous other electrical insulators were inspected and no evidence of arcing or any other issues were found.

Rohit Shastry↗
NASA NTRS1982

J series thruster isolator failure analysis

Three Hg propellant isolators (two cathode and one main) failed during testing in the Mission Profile Life Test. These failures involved contamination of the surface of the alumina insulating body which resulted in heating of the vaporizer by leakage current from the high voltage supply, with subsequent loss of propellant flow rate control. Failure analysis of the isolators showed the surface resistance was temperature dependent and that the alumina could be restored to its original insulating state by grit blasting the surface. The contaminant was identified as carbon and the most likely sources identified as ambient facility hydrocarbons, directed back-sputtered facility materials, and outgassing from organic insulating materials within the thruster envelope. Methods to eliminate contamination from each of these sources are described.

Campbell, J. W.↗
NASA NTRS1970

Flat conductor cable connector with contact separation seal

Cable connector is developed in which each pair of contact elements is isolated by plastic cells and the mating interface is sealed by an elastic gasket. So insulated, the connector may be operated under high vacuum conditions at voltages up to 600 V ac without electrical leakage or intercontact ionization.

Angele, W.↗
NASA NTRS1985

Dielectric material in the space environment

The irradiation encountered in space environments causes high insulation materials to discharge, either through electrical breakdown or surface voltage effect mechanisms. Attention is presently given to polymers which, serving as 'leaky' insulators, avoid this problem by means of conduction mechanisms that are acceptable in space applications. The class of conductive polymers encompasses polyvinylcarbazole, polyacrylonitrile, Kapton, and polythiazil. A testing procedure useful in the qualification of such polymers is outlined.

Frederickson, A. R.↗
NASA NTRS1993

Electronic passivation of n- and p-type GaAs using chemical vapor deposited GaS

We report on the electronic passivation of n- and p-type GaAs using CVD cubic GaS. Au/GaS/GaAs-fabricated metal-insulator-semiconductor (MIS) structures exhibit classical high-frequency capacitor vs voltage (C-V) behavior with well-defined accumulation and inversion regions. Using high- and low-frequency C-V, the interface trap densities of about 10 exp 11/eV per sq cm on both n- and p-type GaAs are determined. The electronic condition of GaS/GaAs interface did not show any deterioration after a six week time period.

Tabib-Azar, Massood↗
NASA NTRSDate not supplied

NASA-GRC High Voltage Materials Development and Test Capabilities Portfolio

This presentation provides the background information on NASA-GRC high voltage (HV) materials team research efforts towards electrified propulsion systems since 2016 . Additionally, it covers polymer and ceramic filler materials development for HV electrical insulation composites, copper/ carbon nanotube hybrid conductors, modeling efforts, HV test capabilities, and future material processing capabilities.

Boron Nitride↗
NASA NTRS1985

Ramp technique for dc partial discharge testing

The partial discharge (PD) data presently obtained by means of a stepwise ramp technique, for the cases of high voltage (HV) components and such resin-packaged HV devices as the Space Telescope's Faint Object Camera, is acquired separately on part-way ramps to rated voltage and on the intermediate voltage plateaus. For test specimens intended for dc service, this ramp method yields more data on insulation integrity than quiescent dc measurements, especially in the case of specimens of high resistivity which causes the discharge frequency to be deceptively low at constant dc voltage. During upward ramping the voltage distribution is capacitive, and the PD behavior resembles that of an ac test. Many more pulses are obtained in the voids without the heat otherwise generated by the application of 60-Hz ac. PD histograms are presented for various materials, with and without intentional defects.

Bever, R. S.↗
NASA NTRSDate not supplied

Measurement of Secondary Electron Yield from Dielectric Materials

Secondary Electron Yield (SEY) is a material property that plays a fundamental role in material and spacecraft charging. SEY values for dielectric materials (insulators) are crucial inputs to models used to assess mission risk posed by high differential voltages and electrostatic discharge (ESD) on spacecraft. There are only two (non-NASA) facilities that attempt such measurements. The lack of NASA capability results in high cost and long, unpredictable schedules to obtain measurements. Future Artemis crewed lunar surface missions will involve the first use of many insulating materials for which SEY properties are poorly understood or absent entirely. Unconstrained SEY values in models increase uncertainty in charging/ESD risk assessment. The capability for reliable SEY determination will lead to improved charging and ESD risk assessments. We are developing a new capability, using pulsed ultralow (<femtoampere) incident electron beam intensity to eliminate sample charging, coupled with sensitive non-contact surface potential measurements, to measure secondary electron yield (SEY) from insulating materials. Present methods for SEY measurement on insulators suffer from highly inconsistent results due to sample charging from the incident electron beam during the measurement. In this first phase we are leveraging existing EM41 instrumentation, facilities, and expertise to perform proof-of-concept tests.

secondary electron emission↗
DOE OSTI2023

Partial discharge suppression in high voltage solid-state devices

Devices, methods and techniques are disclosed to suppress electrical discharge and breakdown in insulating or encapsulation material(s) applied to solid-state devices. In one example aspect, a multi-layer encapsulation film includes a first layer of a first dielectric material and a second layer of a second dielectric material. An interface between the first layer and the second layer is configured to include molecular bonds to prevent charge carriers from crossing between the first layer and the second layer. The multi-layer encapsulation configuration is structured to allow an electrical contact and a substrate of the solid-state device to be at least partially surrounded by the multi-layer encapsulation configuration.

Sampayan, Stephen↗
DOE OSTI2024

Partial discharge suppression in high voltage solid-state devices

Devices, methods and techniques are disclosed to suppress electrical discharge and breakdown in insulating or encapsulation material(s) applied to solid-state devices. In one example aspect, a multi-layer encapsulation film includes a first layer of a first dielectric material and a second layer of a second dielectric material. An interface between the first layer and the second layer is configured to include molecular bonds to prevent charge carriers from crossing between the first layer and the second layer. The multi-layer encapsulation configuration is structured to allow an electrical contact and a substrate of the solid-state device to be at least partially surrounded by the multi-layer encapsulation configuration.

Sampayan, Stephen↗
DOE OSTI2020

High‐Performance Zinc Tin Oxide TFTs with Active Layers Deposited by Atomic Layer Deposition

Abstract New deposition techniques for amorphous oxide semiconductors compatible with silicon back end of line manufacturing are needed for 3D monolithic integration of thin‐film electronics. Here, three atomic layer deposition (ALD) processes are compared for the fabrication of amorphous zinc tin oxide (ZTO) channels in bottom‐gate, top‐contact n‐channel transistors. As‐deposited ZTO films, made by ALD at 150–200 °C, exhibit semiconducting, enhancement‐mode behavior with electron mobility as high as 13 cm 2 V −1 s −1 , due to a low density of oxygen‐related defects. ZTO deposited at 200 °C using a hybrid thermal‐plasma ALD process with an optimal tin composition of 21%, post‐annealed at 400 °C, shows excellent performance with a record high mobility of 22.1 cm 2 V –1 s –1 and a subthreshold slope of 0.29 V dec –1 . Increasing the deposition temperature and performing post‐deposition anneals at 300–500 °C lead to an increased density of the X‐ray amorphous ZTO film, improving its electrical properties. By optimizing the ZTO active layer thickness and using a high‐ k gate insulator (ALD Al 2 O 3 ), the transistor switching voltage is lowered, enabling electrical compatibility with silicon integrated circuits. This work opens the possibility of monolithic integration of ALD ZTO‐based thin‐film electronics with silicon integrated circuits or onto large‐area flexible substrates.

Allemang, Christopher R.↗
NASA NTRS1970

High-voltage solar array for ion engines

High voltage solar arrays for ion engines, discussing spacecraft propulsion, electric generation, insulation integrity, cell degradation and current leakage

Oman, H.↗
NASA NTRS2015

Flexible Electrostatic Technologies for Capture and Handling, Phase 1

Fundamental to many of NASA's in-space transportation missions is the capture and handling of various objects and vehicles in various orbits for servicing, debris disposal, sample retrieval, and assembly without the benefit of sufficient grapple fixtures and docking ports. To perform similar material handling tasks on Earth, pincher grippers, suction grippers, or magnetic chucks are used, but are unable to reliably grip aluminum and composite spacecraft, insulation, radiators, solar arrays, or extra-terrestrial objects in the vacuum of outer space without dedicated handles in the right places. The electronic Flexible Electrostatic Technologies for space Capture and Handling (FETCH) will enable reliable and compliant gripping (soft dock) of practically any object in various orbits or surfaces without dedicated mechanical features, very low impact capture, and built-in proximity sensing without any conventional actuators. Originally developed to handle semiconductor and glass wafers during vacuum chamber processing without contamination, the normal rigid wafer handling chucks are replaced with thin metal foil segments laminated in flexible insulation driven by commercial off-the-shelf solid state, high-voltage power supplies. Preliminary testing in NASA Marshall Space Flight Center's (MSFC's) Flat Floor Robotics Lab demonstrated compliant alignment and gripping with a full-sized, 150-lb microsat mockup and translation before a clean release with a flip of a switch. The flexible electrostatic gripper pads can be adapted to various space applications with different sizes, shapes, and foil electrode layouts even with openings through the gripper pads for addition of guidance sensors or injection of permanent adhesives. With gripping forces estimated between 0.5 and 2.5 lb/in2 or 70-300 lb/ft2 of surface contact, the FETCH can turn on and off rapidly and repeatedly to enable sample handling, soft docking, in-space assembly, precision relocation, and surface translation for accurate anchoring.

Bryan, Thomas↗
NASA NTRS2017

Environmental Testbed Development to Evaluate Power Distribution Materials in Electrified Aircraft (EA)

NASA is pursuing the development of electrified propulsion (EP) technologies to improve air transportation in terms of efficiency, affordability, and sustainability. The power requirements are expected to reach 20 megawatts for large EP commercial airliners. A key challenge is transmission and distribution of the high voltage (20 kilovolts) needed for some EP systems. This is a challenge because the risk of electrical failure in aircraft at high altitude (low pressure) due to corona discharge and other forms of partial discharge increases significantly when voltages exceed 327 V. Corona discharge is a form of partial discharge in which gaseous molecules are ionized by strong electric fields. Corona discharge leads to aging in power transmission lines. Aging is a leading cause of electrical failure in electrical insulation materials. In particular, aging from electrical, vibrational, and thermal stresses decrease the performance life of insulation materials. There are currently no test standards or equipment that can effectively age materials under high altitude, voltage and frequency conditions. This poster proposes a design for a test system including an environmental chamber that can simulate the environment of future EP systems for material and component aging tests.

Materials Test chamber Design↗
DOE OSTI2020

Sudden-Discharge Cycling Characteristics and Millisecond Dynamic Behaviors of a HTS Stainless-Steel Insulated Double-Pancake Coil With Thin Copper Plates

We have tested an intermediate-sized HTS stainless-steel (co-wound) insulated double pancake coil (~132 turns per coil) and discovered dynamic effects during sudden discharge on both millisecond and second scales. For soft break, the power supply is turned off suddenly but the shunt resistor (164 milliohm) is still connected; for hard break, a high voltage contactor is used to suddenly open the circuit so that the leads are completely open. Hard break is dangerous to traditionally insulated LTS magnets, but the SS-insulated HTS DPC retained integrity over ¡80 charge-discharge cycles. Voltage decay curves for soft and hard breaks are studied on short and long timescales. On long timescales, we observe the expected exponential decay and measure the time constant to calculate contact resistance. On short timescales, we observe highly dynamic effects: a hyper-exponential decay suggesting that the inductance or contact resistance is suddenly changing with time, likely an indication of the RL circuit forming. Moreover, peak voltage immediately (ms) after the sudden discharge were collected and compared. It is found that the peak voltage in soft-discharge is proportional to the applied current, while the those in hard-break has a unique pattern and tends to stay flat even though the applied current increases.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗