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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 145 records · Page 8
All sourcesNASA NTRSDOE OSTI
NASA NTRS1965

An Emergency Helium Bubbling Control System for the Prevention of Geysering in the Lox Suction Lines of S-IC

An emergency helium bubbling system was devised for geyser suppression in the LOX suction lines of S-IC . Flight model pressure and temperature transducers were compared to more accurate transducers to determine the best sensor configuration. Transducers were electronically simulated to calibrate the circuit design. A development system was tested for feasibility on a full- scale LOX flow line test facility.

BUBBLE↗
NASA NTRS1972

Static aerodynamic characteristics of the S-IC booster/GAC H-33 orbiter launch vehicle configuration

This test at the trisonic tunnel was divided into two parts. The first part utilized the H-33 orbiter with drop tanks and cradle mounted on an S-IC booster with 75 square-foot fins oriented 45 deg off the horizontal and vertical reference planes. Runs were initially made to determine the optimum incidence angle to be used for the remainder of the tests. The angle so determined was 0 degrees. Additional testing was performed with drop tanks removed, orbiter vertical tail removed, drop tanks and orbiter wing removed, booster fins removed and booster fins located in the horizontal and vertical reference planes. The second part utilized the H-33 orbiter and cradle only, sting mounted on a strain gage balance. These data were used in conjunction with test number 504 (orbiter alone on balance) to determine cradle effects.

Sims, J. F.↗
NASA NTRS1971

The infrared spectrum of IC 418.

Observations of the intensities of the Paschen lines in the spectrum of IC 418 together with published measurements of the Balmer-line intensities are utilized to derive a reddening constant, c = 0.31. Two additional emission lines, one at 1.087 micron and the second at 1.698 micron, are briefly discussed.

Kovar, R. P.↗
NASA NTRS1973

Glass encapsulation provides extra protection for IC semiconductor devices

Oxide-passivated semiconductor chip is given protective glass coating by means of vapor deposition over metallic substrate of integrated circuit (IC). Method provides more reliable oxide-passivation and hermetic sealing in current use. Chips and scratches incurred during dicing, testing, and assembly are markedly reduced.

Doelp, W. L., Jr.↗
NASA NTRS1980

Azimuth correlator design for IC chip

Azimuth correlator circuit synthetic-aperature radar (SAR) is designed for single integrated circuit (IC) chip. Azimuth correlator modules constructed with sets of such chips could make real-time signal processing possible. Primary advantages are realized in areas of weight and power requirement reductions.

Tyree, V. C.↗
NASA NTRS1979

Reversal of the /O III/lambda 4363/H sub gamma lambda 4340 ratio in the planetary nebula IC 4997

Five image-tube spectrograms of the planetary nebula IC 4997 obtained during August 1977 show that the intensity forbidden ratio O III 4363 A/H-gamma 4340 A was equal to unity, but a sixth one obtained in April 1978 showed the ratio to be 0.91. These results represent a significant increase in the intensity ratio, which had been declining from 1895 to 1962 (when it was considerably less than unity), and is interpreted as resulting from a gradual increase in temperature of the nebula's central star accompanied by a transient event which led to a temporarily high value for the ratio in mid-1977.

Feibelman, W. A.↗
NASA NTRS1980

Automated ion implantation for IC's

Report discusses automated ion-implantation facility under development at Marshall Space Flight Center. Facility will produce ultra-reliable IC's with minimal human intervention.

Kennedy, B. W.↗
NASA NTRS1980

An automated oxide and diffusion facility for IC's

Report discusses totally-automated oxidation and diffusion facility for fabricating IC's. Several innovations are demonstrated: process controller specifically designed for semiconductor processing; automatic loading system to accept wafers from air track, insert them in quartz carrier, and place carrier on paddle for insertion into furnace; automatic unloading of wafers back onto air track; and boron diffusion using diborane.

Kennedy, B. W.↗
NASA NTRS1980

Star formation in IC 1848 A

Recent far-infrared photometric and near-infrared spectroscopic observations of IC 1848 A/W5 East are reported. The source appears to be excited by a star of spectral type near B0, which can explain the far-infrared luminosity, 2 micron spectrum, radio continuum, and radio molecular observations. Although this star appears surrounded by a local very compact H II region, the density over a large scale is relatively low. This puts constraints on models for the formation of this star.

Thronson, H. A., Jr.↗