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At least 163 records · Page 9

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NASA NTRS2005

CRYOGENIC UPPER STAGE SYSTEM SAFETY

NASA s Exploration Initiative will require development of many new systems or systems of systems. One specific example is that safe, affordable, and reliable upper stage systems to place cargo and crew in stable low earth orbit are urgently required. In this paper, we examine the failure history of previous upper stages with liquid oxygen (LOX)/liquid hydrogen (LH2) propulsion systems. Launch data from 1964 until midyear 2005 are analyzed and presented. This data analysis covers upper stage systems from the Ariane, Centaur, H-IIA, Saturn, and Atlas in addition to other vehicles. Upper stage propulsion system elements have the highest impact on reliability. This paper discusses failure occurrence in all aspects of the operational phases (Le., initial burn, coast, restarts, and trends in failure rates over time). In an effort to understand the likelihood of future failures in flight, we present timelines of engine system failures relevant to initial flight histories. Some evidence suggests that propulsion system failures as a result of design problems occur shortly after initial development of the propulsion system; whereas failures because of manufacturing or assembly processing errors may occur during any phase of the system builds process, This paper also explores the detectability of historical failures. Observations from this review are used to ascertain the potential for increased upper stage reliability given investments in integrated system health management. Based on a clear understanding of the failure and success history of previous efforts by multiple space hardware development groups, the paper will investigate potential improvements that can be realized through application of system safety principles.

Smith, R. Kenneth↗

NASA NTRS2012

Determining Performance Acceptability of Electrochemical Oxygen Sensors

A method has been developed to screen commercial electrochemical oxygen sensors to reduce the failure rate. There are three aspects to the method: First, the sensitivity over time (several days) can be measured and the rate of change of the sensitivity can be used to predict sensor failure. Second, an improvement to this method would be to store the sensors in an oxygen-free (e.g., nitrogen) environment and intermittently measure the sensitivity over time (several days) to accomplish the same result while preserving the sensor lifetime by limiting consumption of the electrode. Third, the second time derivative of the sensor response over time can be used to determine the point in time at which the sensors are sufficiently stable for use.

Gonzales, Daniel↗

NASA NTRS2015

Common Cause Failure Modeling

Common Cause Failures (CCFs) are a known and documented phenomenon that defeats system redundancy. CCFS are a set of dependent type of failures that can be caused by: system environments; manufacturing; transportation; storage; maintenance; and assembly, as examples. Since there are many factors that contribute to CCFs, the effects can be reduced, but they are difficult to eliminate entirely. Furthermore, failure databases sometimes fail to differentiate between independent and CCF (dependent) failure and data is limited, especially for launch vehicles. The Probabilistic Risk Assessment (PRA) of NASA's Safety and Mission Assurance Directorate at Marshall Space Flight Center (MFSC) is using generic data from the Nuclear Regulatory Commission's database of common cause failures at nuclear power plants to estimate CCF due to the lack of a more appropriate data source. There remains uncertainty in the actual magnitude of the common cause risk estimates for different systems at this stage of the design. Given the limited data about launch vehicle CCF and that launch vehicles are a highly redundant system by design, it is important to make design decisions to account for a range of values for independent and CCFs. When investigating the design of the one-out-of-two component redundant system for launch vehicles, a response surface was constructed to represent the impact of the independent failure rate versus a common cause beta factor effect on a system's failure probability. This presentation will define a CCF and review estimation calculations. It gives a summary of reduction methodologies and a review of examples of historical CCFs. Finally, it presents the response surface and discusses the results of the different CCFs on the reliability of a one-out-of-two system.

Hark, Frank↗

NASA NTRS2016

Common Cause Failure Modeling

Common Cause Failures (CCFs) are a known and documented phenomenon that defeats system redundancy. CCFS are a set of dependent type of failures that can be caused by: system environments; manufacturing; transportation; storage; maintenance; and assembly, as examples. Since there are many factors that contribute to CCFs, the effects can be reduced, but they are difficult to eliminate entirely. Furthermore, failure databases sometimes fail to differentiate between independent and CCF (dependent) failure and data is limited, especially for launch vehicles. The Probabilistic Risk Assessment (PRA) of NASA's Safety and Mission Assurance Directorate at Marshal Space Flight Center (MFSC) is using generic data from the Nuclear Regulatory Commission's database of common cause failures at nuclear power plants to estimate CCF due to the lack of a more appropriate data source. There remains uncertainty in the actual magnitude of the common cause risk estimates for different systems at this stage of the design. Given the limited data about launch vehicle CCF and that launch vehicles are a highly redundant system by design, it is important to make design decisions to account for a range of values for independent and CCFs. When investigating the design of the one-out-of-two component redundant system for launch vehicles, a response surface was constructed to represent the impact of the independent failure rate versus a common cause beta factor effect on a system's failure probability. This presentation will define a CCF and review estimation calculations. It gives a summary of reduction methodologies and a review of examples of historical CCFs. Finally, it presents the response surface and discusses the results of the different CCFs on the reliability of a one-out-of-two system.

Hark, Frank↗

NASA NTRS2020

Lower Level Repair Can Easily Fail Due to High Complexity

The International Space Station (ISS) uses Orbital Replacement Units (ORU’s) to repair failures on orbit. Using ORU’s reduces the crew time required to repair failures, but several copies of each ORU must be stored on ISS to ensure system availability. A typical ORU contains many components and has significant mass, but each ORU can repair only a single component failure. A full set of the ORU internal components could repair many different failures. Lower level assembly or component repair should reduce total spares mass. Successful electronics repair experiments were conducted on ISS. However, implementing component level repair would require a significant effort. The systems must be designed so they can be repaired during a mission, considering component layout and accessibility. The repair procedures must be developed and repair facilities, tools, and diagnostic and test instruments provided. Tracing a fault to a component is much more difficult than isolating it to an ORU. Replacing a component is much more difficult than replacing an ORU. Some problems with lower level repair are discussed. The mass savings of lower level repair will not save as much launch cost as before since launch cost has recently been reduced by an order of magnitude. Most system failures are not component failures that can be fixed by replacing a component but are due to system level problems. Repair and maintenance should be planned as part of an overall maintainability design. The risk that a lower level repair will fail is considerably greater than when using ORUs. With modern high reliability packaged systems, failure diagnosis and repair has become a lost art. However, diagnosis and repair data from the 1960’s show that increasing complexity often causes much longer diagnosis and repair times and may prevent successful repair. Increasing complexity by using lower level repair directly increases system cost, failure rate, crew time for repair, and the risk of an unrepairable system failure.

Harry W Jones↗

NASA NTRS2002

Historic and Current Launcher Success Rates

This presentation reviews historic and current space launcher success rates from all nations with a mature launcher industry. Data from the 1950's through present day is reviewed for possible trends such as when in the launch timeline a failure occurred, which stages had the highest failure rate, overall launcher reliability, a decade by decade look at launcher reliability, when in a launchers history did failures occur, and the reliability of United States human-rated launchers. This information is useful in determining where launcher reliability can be improved and where additional measures for crew survival (i.e., Crew Escape systems) will have the greatest emphasis

Rust, Randy↗

NASA NTRS2005

Reproductive Ecology Of The Florida Scrub-Jay (Aphelocoma Coerulescens) On John F. Kennedy Space Center/Merritt Island National Wildlife Refuge: A Long-Term Study

From 1988 to 2002 we studied the breeding ecology of Florida Scrub-Jays (Aphelocoma coerulescens) on John F. Kennedy Space Center/Merritt Island National Wildlife Refuge. We examined phenology, clutch size, hatching failure rates, fledgling production, nest success, predation rates, sources egg and nestling mortality, and the effects of helpers on these measures. Nesting phenology was similar among sites. Mean clutch size at Titan was significantly larger than at HC or T4. Pairs with helpers did not produce larger clutches than pairs without helpers. Fledgling production at T4 was significantly greater than at HC and similar to Titan. Pairs with helpers at HC produced significantly more fledglings than pairs without helpers; helpers did not influence fledgling production at the other sites. Nest success at HC and Titan was low, 19% and 32% respectively. Nest success at T4 was 48% and was significantly greater than at HC. Average predation rates at all sites increased with season progression. Predation rates at all sight rose sharply by early June. The main cause of nest failure at all sites was predation, 93%.

Carter, Geoffry M.↗

NASA NTRS2024

Extended Investigation into Fault-Tolerant Integrated Motor Drive for a Quadrotor Urban Air Mobility (UAM) Aircraft

Electric propulsor machines and their associated power electronics have been identified in past studies as low-reliability components in emerging Urban Air Mobility (UAM) Vertical Takeoff and Landing (VTOL) vehicles that raise their predicted catastrophic failure rates. This research effort extends previously presented work investigating the use of fault-tolerant (FT) motor drives in quadrotor aircraft as a promising approach to significantly increase their mean-time-to-failure (MTTF). In particular, fault-tolerant modular motor drives (FT-MMDs) are identified as strong candidates for closing the electric propulsor reliability gap. These FT-MMDs divide a machine drive into multiple redundant modules, each consisting of three phase stator windings and power electronics units, enabling continued machine operation after a module failure. Achieving the highest possible isolation between modules (physical, magnetic, thermal, electrical) is critically important in FT-MMDs to prevent the propagation of any failure between modules. Key additional requirements for achieving the highest possible reliability characteristics with FT-MMDs are high repair rates and aggressive suppression of all single-point failures.

quadrotor↗

NASA NTRS1975

Techniques of Final Preseal Visual Inspection

A dissertation is given on the final preseal visual inspection of microcircuit devices to detect manufacturing defects and reduce failure rates in service. The processes employed in fabricating monolithic integrated circuits and hybrid microcircuits, various failure mechanisms resulting from deficiencies in those processes, and the rudiments of performing final inspection are outlined.

Anstead, R. J.↗

NASA NTRS1988

An experiment in software reliability: Additional analyses using data from automated replications

A study undertaken to collect software error data of laboratory quality for use in the development of credible methods for predicting the reliability of software used in life-critical applications is summarized. The software error data reported were acquired through automated repetitive run testing of three independent implementations of a launch interceptor condition module of a radar tracking problem. The results are based on 100 test applications to accumulate a sufficient sample size for error rate estimation. The data collected is used to confirm the results of two Boeing studies reported in NASA-CR-165836 Software Reliability: Repetitive Run Experimentation and Modeling, and NASA-CR-172378 Software Reliability: Additional Investigations into Modeling With Replicated Experiments, respectively. That is, the results confirm the log-linear pattern of software error rates and reject the hypothesis of equal error rates per individual fault. This rejection casts doubt on the assumption that the program's failure rate is a constant multiple of the number of residual bugs; an assumption which underlies some of the current models of software reliability. data raises new questions concerning the phenomenon of interacting faults.

Dunham, Janet R.↗

NASA NTRS1984

Solar-cell interconnect design for terrestrial photovoltaic modules

Useful solar cell interconnect reliability design and life prediction algorithms are presented, together with experimental data indicating that the classical strain cycle (fatigue) curve for the interconnect material does not account for the statistical scatter that is required in reliability predictions. This shortcoming is presently addressed by fitting a functional form to experimental cumulative interconnect failure rate data, which thereby yields statistical fatigue curves enabling not only the prediction of cumulative interconnect failures during the design life of an array field, but also the quantitative interpretation of data from accelerated thermal cycling tests. Optimal interconnect cost reliability design algorithms are also derived which may allow the minimization of energy cost over the design life of the array field.

Mon, G. R.↗

NASA NTRS1988

Investigation of energy transfer in the ignition mechanism of a NASA standard initiator

The principal objective of the proposed research was to construct a detailed computer model of the NASA Standard Initiator (NSI). The NSI plays a critical role in initiating various pyrotechnic events in the National Space Transportation System and is also used in Shuttle payload applications. Several initiators failed when being tested at very low temperatures (4 to 20 K). During subsequent investigation an unacceptable high failure rate was found even at higher temperatures (100 to 150 K) but the precise cause of failure was not determined. The modelling work was undertaken to investigate reasons for failure and to predict the performance of alternate firing schemes. The work has shown that the most likely cause of failure at low temperature is poor thermal contact between the electrically heated bridgewire and the pyrotechnic charge. This problem may be masked if there is good thermal contact between the bridgewire and the alumina charge cup. The high thermal conductivity of alumina at cryogenic temperatures was overlooked in previous analyses, which assumed that the charge cup acted as a thermal insulator.

Varghese, Philip L.↗

NASA NTRS2004

Cryogenic Characterization and Testing of Magnetically-Actuated Microshutter Arrays for the James Webb Space Telescope

Two-dimensional MEMS microshutter arrays (MSA) have been fabricated at the NASA Goddard Space Flight Center (GSFC) for the James Webb Space Telescope (JWST) to enable cryogenic (approximately 35 K) spectrographic astronomy measurements in the near-infrared region. Functioning as a focal plane object selection device, the MSA is a 2-D programmable aperture mask with fine resolution, high efficiency and high contrast. The MSA are close- packed silicon nitride shutters (cell size of 100 x 200 microns) patterned with a torsion flexure to allow opening to 90 degrees. A layer of magnetic material is deposited onto each shutter to permit magnetic actuation. Two electrodes are deposited, one onto each shutter and another onto the support structure side-wall, permitting electrostatic latching and 2-D addressing. New techniques were developed to test MSA under mission-similar conditions (8 K less than or equal to T less than 300K). The magnetic rotisserie has proven to be an excellent tool for rapid characterization of MSA. Tests conducted with the magnetic rotisserie method include accelerated cryogenic lifetesting of unpackaged 128 x 64 MSA and parallel measurement of the magneto-mechanical stiffness of shutters in pathfinder test samples containing multiple MSA designs. Lifetest results indicate a logarithmic failure rate out to approximately 10(exp 6) shutter actuations. These results have increased our understanding of failure mechanisms and provide a means to predict the overall reliability of MSA devices.

King, T. T.↗

NASA NTRS2017

Field Programmable Gate Array Reliability Analysis Guidelines for Launch Vehicle Reliability Block Diagrams

Field Programmable Gate Arrays (FPGAs) integrated circuits (IC) are one of the key electronic components in today's sophisticated launch and space vehicle complex avionic systems, largely due to their superb reprogrammable and reconfigurable capabilities combined with relatively low non-recurring engineering costs (NRE) and short design cycle. Consequently, FPGAs are prevalent ICs in communication protocols and control signal commands. This paper will identify reliability concerns and high level guidelines to estimate FPGA total failure rates in a launch vehicle application. The paper will discuss hardware, hardware description language, and radiation induced failures. The hardware contribution of the approach accounts for physical failures of the IC. The hardware description language portion will discuss the high level FPGA programming languages and software/code reliability growth. The radiation portion will discuss FPGA susceptibility to space environment radiation.

Al Hassan, Mohammad↗

NASA NTRS1980

JANTX1N3893 diode

Diodes manufactured by Siemens and Motorola were tested. Testing of Motorola diodes was stopped in all 3 groups because 50% failure-rate limit was reached. Siemens lot endured more testing in groups 1 and 2 and completed testing on group 3. Failure analysis was performed for group 2 testing.

Source record↗

NASA NTRS1980

LSA field test

After almost four years of endurance testing of photovoltaic modules, no fundamental life-limiting mechanisms were identified that could prevent the twenty-year life goal from being met. The endure data show a continual decline in the failure rate with each new large-scale procurement. Cracked cells and broken interconnects continue to be the principal causes of failure. Although the modules are more adversely affected physically by hot, humid environments than by cool or dry environments there are insufficient data to correlate failure with environment. There is little connection between the outward physical condition of a module and changes in its electrical performance.

Jaffe, P.↗

NASA NTRS1990

Is it possible to identify a trend in problem/failure data

One of the major obstacles in identifying and interpreting a trend is the small number of data points. Future trending reports will begin with 1983 data. As the problem/failure data are aggregated by year, there are just seven observations (1983 to 1989) for the 1990 reports. Any statistical inferences with a small amount of data will have a large degree of uncertainty. Consequently, a regression technique approach to identify a trend is limited. Though trend determination by failure mode may be unrealistic, the data may be explored for consistency or stability and the failure rate investigated. Various alternative data analysis procedures are briefly discussed. Techniques that could be used to explore problem/failure data by failure mode are addressed. The data used are taken from Section One, Space Shuttle Main Engine, of the Calspan Quarterly Report dated April 2, 1990.

Church, Curtis K.↗

NASA NTRS1978

On-orbit spacecraft reliability

Operational and historic data for 350 spacecraft from 52 U.S. space programs were analyzed for on-orbit reliability. Failure rates estimates are made for on-orbit operation of spacecraft subsystems, components, and piece parts, as well as estimates of failure probability for the same elements during launch. Confidence intervals for both parameters are also given. The results indicate that: (1) the success of spacecraft operation is only slightly affected by most reported incidents of anomalous behavior; (2) the occurrence of the majority of anomalous incidents could have been prevented piror to launch; (3) no detrimental effect of spacecraft dormancy is evident; (4) cycled components in general are not demonstrably less reliable than uncycled components; and (5) application of product assurance elements is conductive to spacecraft success.

Bloomquist, C.↗