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At least 163 records · Page 9

A simplified optical model description of heavy ion fragmentation

The abrasion-ablation model of heavy-ion frgmentation by target nuclei of Townsend (1983) and the EVAP Monte Carlo computer program (Guthrie, 1970) for decay probabilities are applied to calculate the production cross sections of isotopes of S, P, Si, and Al for the fragmentation of 213-MeV/nucleon Ar-40 ions by C-12 targets and of Fe, Mn, Cr, V, Ti, Sc, and Ca for 1.88-GeV Fe-56 fragmentation by Pb-208 and by C-12. The results are presented in tables and graphs and shown to be in good agreement with the experimental data of Viyogi et al. (1979) and Westfall et al. (1979). The implications of these studies for the design of radiation shielding for long-term manned space missions are indicated.

Townsend, L. W.↗

Heavy ions from interplanetary dust.

Most atoms that are evaporated from interplanetary dust near the sun are quickly ionized and are probably carried away by the interplanetary magnetic field and the solar wind. The contribution of these heavy ions to the solar-wind flux has been estimated by using estimates of the mass required to maintain the zodiacal cloud. This contribution appears to be small compared with the heavy-ion flux of coronal origin. Many ions from dust remain singly ionized; some of these, such as Ca(+), can resonantly scatter solar radiation. The contribution of this interplanetary glow to the background of twilight glow has been estimated. Interplanetary glow may be detectable. Some atoms from dust may be accelerated by radiation pressure before being ionized. Estimates of velocities and fluxes for Fe indicate that this acceleration is not very effective.

Nakada, M. P.↗

Effects of heavy ion to the primary culture of mouse brain cells

To investigate effects of low dose heavy particle radiation to CNS system, we adopted mouse neonatal brain cells in culture being exposed to heavy ions by HIMAC at NIRS and NSRL at BNL. The applied dose varied from 0.05 Gy up to 2.0 Gy. The subsequent biological effects were evaluated by an induction of apoptosis and neuron survival focusing on the dependencies of the animal strains, SCID, B6, B6C3F1, C3H, used for brain cell culture, SCID was the most sensitive and C3H the least sensitive to particle radiation as evaluated by 10% apoptotic criterion. The LET dependency was compared with using SCID and B6 cells exposing to different ions (H, C, Ne, Si, Ar, and Fe). Although no detectable LET dependency was observed in the high LET (55-200 keV/micrometers) and low dose (<0.5 Gy) regions. The survivability profiles of the neurons were different in the mouse strains and ions. In this report, a result of memory and learning function to adult mice after whole-body and brain local irradiation at carbon ion and iron ion.

NASA Discipline Radiation Health↗

Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

This is an independent investigation that evaluates the single event destructive and transient susceptibility of the Xilinx Kintex-UltraScale device. Design/Device susceptibility is determined by monitoring the device under test (DUT) for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) is monitored throughout heavy-ion testing by examining device current. This device does not have embedded mitigation. Hence, user implemented mitigation is investigated using Synopsys mitigation tools.

Single Event Transient (SET)↗

The Use of High Energy Heavy Ion Facilities for Single Event Effects (SEE) Testing: A Perspective on Return on Investment (ROI)

With challenges related to testing highly complex integrated circuits as well as entire systems continuing to grow, the use of higher energy heavy ions for single-event effects (SEE) testing becomes a critical technical need. This presentation, however, focuses only partially on the technical side with the main emphasis on the economics of using a high-energy heavy ion beam and comparing via notional cost models for testing.

Kenneth A. LaBel↗

Heavy-ion induced single-event upset in integrated circuits

The cosmic ray environment in space can affect the operation of Integrated Circuit (IC) devices via the phenomenon of Single Event Upset (SEU). In particular, heavy ions passing through an IC can induce sufficient integrated current (charge) to alter the state of a bistable circuit, for example a memory cell. The SEU effect is studied in great detail in both static and dynamic memory devices, as well as microprocessors fabricated from bipolar, Complementary Metal Oxide Semiconductor (CMOS) and N channel Metal Oxide Semiconductor (NMOS) technologies. Each device/process reflects its individual characteristics (minimum scale geometry/process parameters) via a unique response to the direct ionization of electron hole pairs by heavy ion tracks. A summary of these analytical and experimental SEU investigations is presented.

Zoutendyk, J. A.↗

Heavy ion dynamics and auroral arc formation in the Jovian magnetosphere

This paper gives a brief review of some of the current controversial issues surrounding the Jovian aurora. In particular, the manner of its excitation be it that of electron or heavy ion precipitation is examined critically in the context of proposed models for magnetospheric dynamics, particle energization, and auroral energy input. A model for the X-ray aurora based on bremsstrahlung by a primary electron beam and its ionization secondaries is high-lighted and the connection to the outward magnetospheric transport of heavy ion plasma from the satellite Io is made.

Barbosa, D. D.↗

Heavy Ion Microbeam- and Broadbeam-Induced Current Transients in SiGe HBTs

IBM 5AM SiGe HBT is device-under-test. High-speed measurement setup. Low-impedance current transient measurements. SNL, JYFL, GANIL. Microbeam to broadbeam position inference. Improvement to state-of-the-art. Microbeam (SNL) transients reveal position dependent heavy ion response, Unique response for different device regions Unique response for different bias schemes. Similarities to TPA pulsed-laser data. Broadbeam transients (JYFL and GANIL) provide realistic heavy ion response. Feedback using microbeam data. Overcome issues of LET and ion range with microbeam. **Angled Ar-40 data in full paper. Data sets yield first-order results, suitable for TCAD calibration feedback.

Pellish, Jonathan A.↗

Heavy Ion Acceleration in 3he-Rich Solar Energetic Particle Events: New Insights From Solar Orbiter

We present Solar Orbiter energetic particle observations of two 3 He-rich events with features more clearly observed than in prior studies. The event of 2022 November 9 observed from 0.59 au contained hundreds of ultra-heavy ions (UH, mass >78 amu) whereas previous observations at 1 au have shown only an occasional count or two. The event of 2023 April 8 observed from 0.29 au fortuitously had very low ambient activity, making it possible to observe spectra from the 3 He acceleration mechanism without contamination, revealing extremely low H and 4 He intensities arriving simultaneously with other ions observed in typical 3 He-rich events. Taken together with previous studies we believe these data show that 3 He-rich events have a single acceleration mechanism that is responsible for the unique abundance features of 3 He, heavy ions, and UH ions. Considering the acceleration model of Roth and Temerin (1997) that heats the ions over a broad range of gyrofrequencies away from those damped by H and 4 He, we calculate reasonable fits to the observed abundances O-Fe. A key result is that high values of, e.g., Fe/O typical of such events is not due to preferential Fe heating, but on the contrary is due mainly to the depletion of O which at elevated temperatures has a charge-to-mass ratio in the region of the waves damped by 4He. The model also naturally incorporates features of high ionization states and neutron-rich isotope enhancements that have been long-standing puzzles in observations of this type of flare.

Solar flares↗

Heavy Ion and Proton Induced Single Event Transients in Linear Devices

This paper presents a display of heavy-ion and proton-induced single event transients for selected linear devices. The transient vital signs are serious; low LET threshold, high voltage amplitude and extended pulse duration (microsecs.).

heavy ions ions transients linear devices LET thre↗

Methods of galactic heavy ion transport

Two methods of calculating the transition of galactic heavy ions in the earth's atmosphere are compared with respect to accuracy, generality, and computer efficiency. The most general method is shown to have the highest accuracy and is a simple numerical procedure.

Wilson, John W.↗

Heavy Ion Microbeam and Broadbeam Transients in SiGe HBTs

SiGe HBT heavy ion current transients are measured using microbeam and both high- and low-energy broadbeam sources. These new data provide detailed insight into the effects of ion range, LET, and strike location.

Pellish, Jonathan A.↗

Source Regions of the Interplanetary Magnetic Field and Variability in Heavy-Ion Elemental Composition in Gradual Solar Energetic Particle Events

Gradual solar energetic particle (SEP) events are those in which ions are accelerated to their observed energies by interactions with a shock driven by a fast coronal mass-ejection (CME). Previous studies have shown that much of the observed event-to-event variability can be understood in terms of shock speed and evolution in the shock-normal angle. But an equally important factor, particularly for the elemental composition, is the origin of the suprathermal seed particles upon which the shock acts. To tackle this issue, we (1) use observed solar-wind speed, magnetograms, and the PFSS model to map the Sun-L1 interplanetary magnetic field (IMF) line back to its source region on the Sun at the time of the SEP observations; and (2) then look for correlation between SEP composition (as measured by Wind and ACE at approx. 2-30 MeV/nucleon) and characteristics of the identified IMF-source regions. The study is based on 24 SEP events, identified as a statistically-significant increase in approx. 20 MeV protons and occurring in 1998 and 2003-2006, when the rate of newly-emergent solar magnetic flux and CMEs was lower than in solar-maximum years and the field-line tracing is therefore more likely to be successful. We find that the gradual SEP Fe/O is correlated with the field strength at the IMF-source, with the largest enhancements occurring when the footpoint field is strong, due to the nearby presence of an active region. In these cases, other elemental ratios show a strong charge-to-mass (q/M) ordering, at least on average, similar to that found in impulsive events. These results lead us to suggest that magnetic reconnection in footpoint regions near active regions bias the heavy-ion composition of suprathermal seed ions by processes qualitatively similar to those that produce larger heavy-ion enhancements in impulsive SEP events. To address potential technical concerns about our analysis, we also discuss efforts to exclude impulsive SEP events from our event sample.

magnetic field↗

Schottky Diode Derating for Survivability in a Heavy Ion Environment

In this paper, we irradiate a number of silicon power Schottky diodes from a variety of manufacturers. The tested diodes represent a wide assortment of reverse voltages and forward currents. Additionally, we review correlations between single-event failures in Schottky diodes and device electrical parameters. The spatial locations of failures in the diode are discussed, as well as a possible explanation for why the failures occur. Based on these correlations to date, we propose a derating scheme for Schottky diodes flown in a heavy ion environment and suggest screening procedures for decreasing the risks of such failures.

Radiation effects↗

Dosimetry of heavy ions by use of CCD detectors

The design and the atomic composition of Charge Coupled Devices (CCD's) make them unique for investigations of single energetic particle events. As detector system for ionizing particles they detect single particles with local resolution and near real time particle tracking. In combination with its properties as optical sensor, particle transversals of single particles are to be correlated to any objects attached to the light sensitive surface of the sensor by simple imaging of their shadow and subsequent image analysis of both, optical image and particle effects, observed in affected pixels. With biological objects it is possible for the first time to investigate effects of single heavy ions in tissue or extinguished organs of metabolizing (i.e. moving) systems with a local resolution better than 15 microns. Calibration data for particle detection in CCD's are presented for low energetic protons and heavy ions.

Schott, J. U.↗

A guideline for heavy ion radiation testing for Single Event Upset (SEU)

A guideline for heavy ion radiation testing for single event upset was prepared to assist new experimenters in preparing and directing tests. How to estimate parts vulnerability and select an irradiation facility is described. A broad brush description of JPL equipment is given, certain necessary pre-test procedures are outlined and the roles and testing guidelines for on-site test personnel are indicated. Detailed descriptions of equipment needed to interface with JPL test crew and equipment are not provided, nor does it meet the more generalized and broader requirements of a MIL-STD document. A detailed equipment description is available upon request, and a MIL-STD document is in the early stages of preparation.

Nichols, D. K.↗