NASA NTRS1994
A hollow cathode-based plasma contactor has been baselined for use on the Space Station to reduce station charging. The plasma contactor provides a low impedance connection to space plasma via a plasma produced by an arc discharge. The hollow cathode of the plasma contactor is a refractory metal tube, through which xenon gas flows, which has a disk-shaped plate with a centered orifice at the downstream end of the tube. Within the cathode, arc attachment occurs primarily on a Type S low work function insert that is next to the orifice plate. This low work function insert is used to reduce cathode operating temperatures and energy requirements and, therefore, achieve increased efficiency and longevity. The operating characteristics and lifetime capabilities of this hollow cathode, however, are greatly reduced by oxygen bearing contaminants in the xenon gas. Furthermore, an optimized activation process, where the cathode is heated prior to ignition by an external heater to drive contaminants such as oxygen and moisture from the insert absorbed during exposure to ambient air, is necessary both for cathode longevity and a simplified power processor. In order to achieve the two year (approximately 17,500 hours) continuous operating lifetime requirement for the plasma contactor, a test program was initiated at NASA Lewis Research Center to demonstrate the extended lifetime capabilities of the hollow cathode. To date, xenon hollow cathodes have demonstrated extended lifetimes with one test having operated in excess of 8000 hours in an ongoing test utilizing contamination control protocols developed by Sarver-Verhey. The objectives of this study were to verify the transportability of the contamination control protocols developed by Sarver-Verhey and to evaluate cathode contamination control procedures, activation processes, and cathode-to-cathode dispersions in operating characteristics with time. These were accomplished by conducting a 2000 hour wear test of four hollow cathodes with different xenon gas purities and activation processes. The following will be presented: a description of the facility and test hardware, testing procedures and operating conditions, a discussion of test results, and conclusions.