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Results for “DIELECTRIC MATERIAL”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2014

Tailorable Dielectric Material with Complex Permittivity Characteristics

A dielectric material includes a network of nanosubstrates, such as but not limited to nanotubes, nanosheets, or other nanomaterials or nanostructures, a polymer base material or matrix, and nanoparticles constructed at least partially of an elemental metal. The network has a predetermined nanosubstrate loading percentage by weight with respect to a total weight of the dielectric material, and a preferential or predetermined longitudinal alignment with respect to an orientation of an incident electrical field. A method of forming the dielectric material includes depositing the metal-based nanoparticles onto the nanosubstrates and subsequently mixing these with a polymer matrix. Once mixed, alignment can be achieved by melt extrusion or a similar mechanical shearing process. Alignment of the nanosubstrate may be in horizontal or vertical direction with respect to the orientation of an incident electrical field.

Dudley, Kenneth L.↗
NASA NTRS1995

Application of FEM to estimate complex permittivity of dielectric material at microwave frequency using waveguide measurements

A simple waveguide measurement technique is presented to determine the complex dielectric constant of a dielectric material. The dielectric sample is loaded in a shorted x-band rectangular waveguide. Using a network analyzer; the reflection coefficient of the shorted waveguide (loaded with sample) is measured. Using the Finite Element Method (FEM), the exact reflection coefficient of the shorted waveguide (loaded with sample) is determined as a function of the dielectric constant. Matching the measured value of the reflection coefficient with the reflection coefficient calculated using the FEM utilizing the Newton-Raphson Method, an estimate of the dielectric constant of a dielectric material is obtained. A comparison of estimated values of dielectric constant obtained from simple waveguide modal theory and the present approach is presented.

Deshpande, M. D.↗
NASA NTRS1984

Wave attenuation and mode dispersion in a waveguide coated with lossy dielectric material

The modal attenuation constants in a cylindrical waveguide coated with a lossy dielectric material are studied as functions of frequency, dielectric constant, and thickness of the dielectric layer. A dielectric material best suited for a large attenuation is suggested. Using Kirchhoff's approximation, the field attenuation in a coated waveguide which is illuminated by a normally incident plane wave is also studied. For a circular guide which has a diameter of two wavelengths and is coated with a thin lossy dielectric layer (omega sub r = 9.1 - j2.3, thickness = 3% of the radius), a 3 dB attenuation is achieved within 16 diameters.

Lee, C. S.↗
NASA NTRS1985

Discharge characteristics of dielectric materials examined in mono-, dual-, and spectral energy electron charging environments

The effects of midenergy electrons on the charge and discharge characteristics of spacecraft dielectric materials and the data base from which basic discharge models can be formulated is expanded. Thin dielectric materials were exposed to low, mid combined low and mid, and spectral energy electron environments. Three important results are presented: (1) it determined electron environments that lead to dielectric discharges at potentials less negative than -5 kV; (2) two types of discharges were identified that dominate the kinds of discharges seen; and (3) it is shown that, for the thin dielectric materials tested, the worst-case discharges observed in the various environments are similar.

Coakley, P.↗
NASA NTRS1989

Spiral configuration of electrodes and dielectric material for sensing an environmental property

A reliable moisture-indicating capactive sensor is provided with wire electrodes at least one of which includes a coating of moisture-absorbing dielectric material by spirally twisting the wire electrodes about each other, thereby establishing a pair of electrodes in contact with opposite surfaces of a layer of dielectric material, and assuring consistent contact of each electrode with the dielectric material despite changes in environmental conditions.

Laue, Eric G.↗
NASA NTRS1999

Pulse Power Capability Of High Energy Density Capacitors Based on a New Dielectric Material

A new dielectric composite consisting of a polymer coated onto a high-density metallized Kraft has been developed for application in high energy density pulse power capacitors. The polymer coating is custom formulated for high dielectric constant and strength with minimum dielectric losses. The composite can be wound and processed using conventional wound film capacitor manufacturing equipment. This new system has the potential to achieve 2 to 3 J/cu cm whole capacitor energy density at voltage levels above 3.0 kV, and can maintain its mechanical properties to temperatures above 150 C. The technical and manufacturing development of the composite material and fabrication into capacitors are summarized in this paper. Energy discharge testing, including capacitance and charge-discharge efficiency at normal and elevated temperatures, as well as DC life testing were performed on capacitors manufactured using this material. TPL (Albuquerque, NM) has developed the material and Aerovox (New Bedford, MA) has used the material to build and test actual capacitors. The results of the testing will focus on pulse power applications specifically those found in electro-magnetic armor and guns, high power microwave sources and defibrillators.

Winsor, Paul↗
NASA NTRS2011

Simultaneous Noncontact Precision Imaging of Microstructural and Thickness Variation in Dielectric Materials Using Terahertz Energy

A process for simultaneously measuring the velocity of terahertz electromagnetic radiation in a dielectric material sample without prior knowledge of the thickness of the sample and for measuring the thickness of a material sample using terahertz electromagnetic radiation in a material sample without prior knowledge of the velocity of the terahertz electromagnetic radiation in the sample is disclosed and claimed. The process evaluates, in a plurality of locations, the sample for microstructural variations and for thickness variations and maps the microstructural and thickness variations by location. A thin sheet of dielectric material may be used on top of the sample to create a dielectric mismatch. The approximate focal point of the radiation source (transceiver) is initially determined for good measurements.

Roth, Donald J↗
NASA NTRS1972

Handbook of the optical, thermal and mechanical properties of six polycrystalline dielectric materials

The design data for six polycrystalline dielectric materials are presented to describe the optical, thermal, and mechanical properties. The materials are aluminum oxide, calcium fluoride, magnesium fluoride, magnesium oxide, silicon dioxide, and titanium dioxide. The primary interest is in the polycrystalline state, although single crystal data are included when appropriate. The temperature range is room temperature to melting point. The wavelength range is from near ultraviolet to near infrared.

Dewitt, D. P.↗
NASA NTRSDate not supplied

Measurement of Secondary Electron Yield from Dielectric Materials

Secondary Electron Yield (SEY) is a material property that plays a fundamental role in material and spacecraft charging. SEY values for dielectric materials (insulators) are crucial inputs to models used to assess mission risk posed by high differential voltages and electrostatic discharge (ESD) on spacecraft. There are only two (non-NASA) facilities that attempt such measurements. The lack of NASA capability results in high cost and long, unpredictable schedules to obtain measurements. Future Artemis crewed lunar surface missions will involve the first use of many insulating materials for which SEY properties are poorly understood or absent entirely. Unconstrained SEY values in models increase uncertainty in charging/ESD risk assessment. The capability for reliable SEY determination will lead to improved charging and ESD risk assessments. We are developing a new capability, using pulsed ultralow (<femtoampere) incident electron beam intensity to eliminate sample charging, coupled with sensitive non-contact surface potential measurements, to measure secondary electron yield (SEY) from insulating materials. Present methods for SEY measurement on insulators suffer from highly inconsistent results due to sample charging from the incident electron beam during the measurement. In this first phase we are leveraging existing EM41 instrumentation, facilities, and expertise to perform proof-of-concept tests.

secondary electron emission↗
NASA NTRS2016

500 C Electronic Packaging and Dielectric Materials for High Temperature Applications

High-temperature environment operable sensors and electronics are required for exploring the inner solar planets and distributed control of next generation aeronautical engines. Various silicon carbide (SiC) high temperature sensors, actuators, and electronics have been demonstrated at and above 500C. A compatible packaging system is essential for long-term testing and application of high temperature electronics and sensors. High temperature passive components are also necessary for high temperature electronic systems. This talk will discuss ceramic packaging systems developed for high temperature electronics, and related testing results of SiC circuits at 500C and silicon-on-insulator (SOI) integrated circuits at temperatures beyond commercial limit facilitated by these high temperature packaging technologies. Dielectric materials for high temperature multilayers capacitors will also be discussed. High-temperature environment operable sensors and electronics are required for probing the inner solar planets and distributed control of next generation aeronautical engines. Various silicon carbide (SiC) high temperature sensors, actuators, and electronics have been demonstrated at and above 500C. A compatible packaging system is essential for long-term testing and eventual applications of high temperature electronics and sensors. High temperature passive components are also necessary for high temperature electronic systems. This talk will discuss ceramic packaging systems developed for high electronics and related testing results of SiC circuits at 500C and silicon-on-insulator (SOI) integrated circuits at temperatures beyond commercial limit facilitated by high temperature packaging technologies. Dielectric materials for high temperature multilayers capacitors will also be discussed.

dielectric performance↗
NASA NTRS1972

Dynamic measurement of bulk modulus of dielectric materials using a microwave phase shift technique

A microwave Doppler shift technique was developed for measuring the dynamic bulk modulus of dielectric materials such as solid propellants. The system has a demonstrated time resolution on the order of milliseconds and a theoretical spatial resolution of a few microns. Accuracy of the technique is dependent on an accurate knowledge of the wavelength of the microwave in the sample being tested. Such measurement techniques are discussed. Preliminary tests with two solid propellants, one non-aluminized and one containing 16% aluminum, yielded reasonable, reproducible results. It was concluded that with refinements the technique holds promise as a practical means for obtaining accurate dynamic bulk modulus data over a variety of transient conditions.

Barker, B. J.↗
NASA NTRS2009

Non-Contact Measurement of Density and Thickness Variation in Dielectric Materials

This non-contact, single-sided terahertz electromagnetic measurement and imaging method characterizes micro structural (e.g., spatially-lateral density) and thickness variation in dielectric (insulating) materials. This method was demonstrated for space shuttle external tank sprayed-on foam insulation and has been designed for use as an inspection method for current and future NASA thermal protection systems and other dielectric material inspection applications where no contact can be made with the sample due to fragility and it is impractical to use ultrasonic methods

Roth, Ron↗