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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1992

X-Ray Microanalysis and Electron Energy Loss Spectrometry in the Analytical Electron Microscope: Review and Future Directions

This paper reviews and discusses future directions in analytical electron microscopy for microchemical analysis using X-ray and Electron Energy Loss Spectroscopy (EELS). The technique of X-ray microanalysis, using the ratio method and k(sub AB) factors, is outlined. The X-ray absorption correction is the major barrier to the objective of obtaining I% accuracy and precision in analysis. Spatial resolution and Minimum Detectability Limits (MDL) are considered with present limitations of spatial resolution in the 2 to 3 microns range and of MDL in the 0.1 to 0.2 wt. % range when a Field Emission Gun (FEG) system is used. Future directions of X-ray analysis include improvement in X-ray spatial resolution to the I to 2 microns range and MDL as low as 0.01 wt. %. With these improvements the detection of single atoms in the analysis volume will be possible. Other future improvements include the use of clean room techniques for thin specimen preparation, quantification available at the I% accuracy and precision level with light element analysis quantification available at better than the 10% accuracy and precision level, the incorporation of a compact wavelength dispersive spectrometer to improve X-ray spectral resolution, light element analysis and MDL, and instrument improvements including source stability, on-line probe current measurements, stage stability, and computerized stage control. The paper reviews the EELS technique, recognizing that it has been slow to develop and still remains firmly in research laboratories rather than in applications laboratories. Consideration of microanalysis with core-loss edges is given along with a discussion of the limitations such as specimen thickness. Spatial resolution and MDL are considered, recognizing that single atom detection is already possible. Plasmon loss analysis is discussed as well as fine structure analysis. New techniques for energy-loss imaging are also summarized. Future directions in the EELS technique will be the development of new spectrometers and improvements in thin specimen preparation. The microanalysis technique needs to be simplified and software developed so that the EELS technique approaches the relative simplicity of the X-ray technique. Finally, one can expect major improvements in EELS imaging as data storage and processing improvements occur.

Goldstein, J. I.↗
DOE OSTI2025

Mixed Element Microparticle Characterization by Electron Probe Microanalysis

Abstract Microparticle compositional characterization for nuclear forensics has traditionally been achieved by “gold-standard” destructive analytical techniques such as large geometry-secondary ion mass spectrometry and fission track-thermal ionization mass spectrometry, but long processing times and total sample consumption eliminate the option of subsequent analysis by other methods. Electron probe microanalysis has long been widely employed for rapid, nondestructive, micrometer-scale compositional measurements and imaging in fields such as material science and geology and may therefore need to be reevaluated as an alternative tool for microparticle analysis for the nuclear forensics community. This study presents the use of electron probe microanalysis for imaging and quantitative characterization of homogeneous microparticles utilizing a calibration curve based on high-precision quadrupole-inductively coupled plasma-mass spectrometry analyses. Samples of opportunity synthesized at Savannah River National Laboratory, nickel-doped cerium oxide microparticles, were selected as analogs for plutonium-doped uranium oxide microparticles. Positive detection and accurate quantification of variable amounts of nickel dopant down to trace levels (10s of parts per million) suggest applicability of this technique to other mixed element systems (e.g., actinides). Quantitative single-particle characterization via electron probe microanalyzer may thus provide a high fidelity, nondestructive complement to techniques currently in use.

Riche, Alexis T. (ORCID:0009000121978126)↗
NASA NTRS1990

Spatial Resolution and Detectability Limits in Thin-Film X-Ray Microanalysis

The major advantages of performing x-ray microanalysis in the analytical electron microscope (AEM) are the high compositional spatial resolution and the elemental analysis sensitivity. Unfortunately, there is usually a trade-off between these two advantages. This paper discusses the factors involved in the optimization of both spatial resolution and sensitivity during x-ray microanalysis and shows the results of such optimization experiments for several AEM instruments.

Goldstein, J. I.↗
NASA NTRS2003

Electron Probe MicroAnalysis (EPMA) Standards. Issues Related to Measurement and Accuracy Evaluation in EPMA

Electron-probe microanalysis standards and issues related to measurement and accuracy of microanalysis will be discussed. Critical evaluation of standards based on homogeneity and comparison with wet-chemical analysis will be made. Measurement problems such as spectrometer dead-time will be discussed. Analytical accuracy issues will be evaluated for systems by alpha-factor analysis and comparison with experimental k-ratio databases.

Carpenter, Paul↗
NASA NTRS2005

Analysis of Iron Meteorites Using Computed Tomography and Electron-probe Microanalysis

Computed tomography (CT) imaging and electron-probe microanalysis (EPMA) have been used to study samples of the Mundrabilla and Colomera iron meteorites in order to perform structural, textural, and mineralogical analysis. Both gamma-ray (Co-60 source, essentially monochromatic 1.25MeV avg.) and x-ray (420 KeV, continuous) sources have been used, with effective resolution of approximately 1 mm and 0.25 mm, respectively. The gamma-ray source provides approx. 15 cm penetration through steel and is used for larger samples, whereas the x-ray source provides superior resolution at reduced penetration but exhibits beam hardening artifacts. Here we present a combined approach where CT and EPMA imaging and microanalysis aid in the identification of structural and compositional features in iron meteorites.

Carpenter, P. K.↗
NASA NTRS2012

Microanalysis of Hypervelocity Impact Residues of Possible Interstellar Origin

The NASA Stardust spacecraft deployed two collector trays, one dedicated to the collection of dust from Comet Wild 2, and the other for the capture of interstellar dust (ISD). The samples were returned successfully to Earth in 2006, and now provide an unprecedented opportunity for laboratory-based microanalysis of materials from the outer solar system and beyond. Results from the cometary sample studies have demonstrated that Wild 2 contains much more refractory condensate material and much less pristine extra-solar material than expected, which further indicates that there was significant transport of inner solar system materials to the Kuiper Belt in the early solar system [1]. The analysis of the interstellar samples is still in the preliminary examination (PE) phase, due to the level of difficulty in the definitive identification of the ISD features, the overall low abundance, and its irreplaceable nature, which necessitates minimally invasive measurements [2]. We present here coordinated microanalysis of the impact features on the Al foils, which have led to the identification of four impacts that are possibly attributable to interstellar dust. Results from the study of four ISD candidates captured in aerogel are presented elsewhere [2].

Stroud, Rhonda M.↗
NASA NTRS1966

Standards for electron probe microanalysis of silicates prepared by convenient method

Standard compositions suitable for electron probe microanalysis of various silicates are prepared by coprecipitation of specified salts with colloidal silica to form a gel which is decomposed into a powdered oxide mixture and compressed into thin pellets. These pellets of predetermined standard are compared with a silicate sample to determine its composition.

Walter, L. S.↗
NASA NTRS1966

Apparatus enables automatic microanalysis of body fluids

Apparatus will automatically and quantitatively determine body fluid constituents which are amenable to analysis by fluorometry or colorimetry. The results of the tests are displayed as percentages of full scale deflection on a strip-chart recorder. The apparatus can also be adapted for microanalysis of various other fluids.

Soffen, G. A.↗
NASA NTRS1989

Calibration approach to electron probe microanalysis: A study with PWA-1480, a nickel base superalloy

The utility of an indirect calibration approach in electron probe microanalysis is explored. The methodology developed is based on establishing a functional relationship between the uncorrected k-ratios and the corresponding concentrations obtained using one of the ZAF correction schemes, for all the desired elements in the concentration range of interest. In cases where a very large number of analyses are desired, such a technique significantly reduces the total time required for the microprobe analysis without any significant loss of precision in the data. A typical application of the method in the concentration mapping of the transverse cross-section of a dendrite in directionally solidified PWA-1480, a nickel-based superalloy, is described.

Terepka, F. M.↗
NASA NTRS1989

Isotopic microanalysis of returned comet nucleus samples

If isotopic measurements of interplanetary dust particles (IDPs) and primitive meteorites can serve as a guide to the isotopic analysis of returned comet nucleus material, an essential requirement will be the capability for microanalysis. The reason is that in both types of extraterrestrial samples large isotopic heterogeneities on a small spatial scale have become apparent once it was possible to measure isotopes in small samples. In the discovery of large isotopic anomalies the ion microprobe has played a significant role because of its high spatial resolution for isotopic ratio measurements. The largest isotopic anomalies in C, N, O, Mg, Si, Ca and Ti found to date were measured by ion microprobe mass spectrometry. The most striking examples are D/H measurements in IDPs and isotopic measurements of C, N and Si in SiC from the CM chondrites Murray and Murchison.

Zinner, Ernst↗
NASA NTRS1991

Failure analysis of the lithium battery: A study of the header deposit on the cell top and diffusion within the electrode glass seal using nuclear microanalysis and FFTIR spectroscopy

The Solid Rocket Booster Range Safety System (SRBRSS) uses a lithium/poly-carbon monofluoride primary battery as a source of electrical power. After cell fabrication and activation, some battery cells have shown self discharge. One possible source of this cell discharge has been suggested to be the formation and growth of a conducting crystallized chemical compound across the glass bead insulator, electrically shorting the glass bead to the casing. This laboratory has begun an analysis of this compound, the glass seal holding the cathode into place, and the cell electrolyte, using Fast Fourier Transform Infrared (FFTIR) Analysis, Rutherford Backscattering Spectroscopy (RBS), and Nuclear Reaction Microanalysis. Preliminary measurements have confirmed the existence of lithium, nitrogen, fluorine, and oxygen on a reddish-brown deposit covering parts of the glass seal holding the positive electrode in place. Cells using Li metal electrodes, have many advantages over conventional primary batteries. One principal disadvantage of using Li batteries on a commercial basis would be the environmental impact of the fluorocarbon material. Another would be the relatively high expense of (CF)n.

Hassan, Razi A.↗
NASA NTRS1992

Indirect Calibration In Electron-Probe Microanalysis

Technique for indirect calibration in electron-probe microanalysis reduces number of measurements needed without significantly degrading precision of measurement data. Advantageous when many analyses must be performed; for example, determining varying chemical composition at many positions across specimen of multicomponent alloy. Time spent acquiring data reduced considerably.

Terepka, F. M.↗
NASA NTRS1992

Definition of the Spatial Resolution of X-Ray Microanalysis in Thin Foils

The spatial resolution of X-ray microanalysis in thin foils is defined in terms of the incident electron beam diameter and the average beam broadening. The beam diameter is defined as the full width tenth maximum of a Gaussian intensity distribution. The spatial resolution is calculated by a convolution of the beam diameter and the average beam broadening. This definition of the spatial resolution can be related simply to experimental measurements of composition profiles across interphase interfaces. Monte Carlo calculations using a high-speed parallel supercomputer show good agreement with this definition of the spatial resolution and calculations based on this definition. The agreement is good over a range of specimen thicknesses and atomic number, but is poor when excessive beam tailing distorts the assumed Gaussian electron intensity distributions. Beam tailing occurs in low-Z materials because of fast secondary electrons and in high-Z materials because of plural scattering.

Williams, D. B.↗