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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1979

Calibration standards for PIND tests

Calibrated set of microcircuit packages containing tiny particles with known masses can be used as reference standards for Particle-Impact Noise-Detection (PIND) tests.

Gaudiano, S.↗
NASA NTRS1979

Shock during PIND test frees particles

Recent study on Particle-Impact Noise-Detection (PIND) shows impact at 1,500 to 4,000 G normally imparted to hybrid microcircuits during testing knocks loose stray trapped particle that can be subsequentially removed. Process may be 80 to 90 percent effective in removal of particles depending on type of test utilized.

Caruso, S. V.↗
NASA NTRS1978

Particle-impact noise detector (PIND)

Package, in page assembly, is subjected to low-frequency vibration, and noise generated by particle impacts is picked up by transducer. Test procedure calls for three transverse shocks to be applied to page to dislodge any trapped particles.

Barr, R. J.↗
NASA NTRSDate not supplied

PIND Task Group Report

Explore the source record for details and available documents.

particle detection in cavity devices↗
NASA NTRS1977

Sensitivities of particle impact noise detection

The results of a study on Particle Impact Noise Detection commonly referred to as PIND testing is described. Certain sensitivities of PIND testing as applicable to hybrid microcircuits were determined, and techniques for removing particles from sealed hybrid packages were evaluated. Methods for freeing particles which have become trapped or hung up inside the hybrid package and, therefore, give no PIND test response were examined.

Keister, F. Z.↗
NASA NTRS1977

Preparation of calibrated test packages for particle impact noise detection

A standard calibration method for any particle impact noise detection (PIND) test system used to detect loose particles responsible for failures in hybrid circuits was developed along with a procedure for preparing PIND standard test devices. Hybrid packages were seeded with a single gold ball, hermetically sealed, leak tested, and PIND tested. Conclusions are presented.

Source record↗
NASA NTRS1978

Some aspects of contamination detection, analyses, and control in microcircuits for the NASA Space Shuttle program

The Space Shuttle system is currently one of the National Aeronautics and Space Administration's (NASA) most important and complex programs. A significant number of hybrid microcircuits are being developed and used on the Space Shuttle. Since the Shuttle is a manned vehicle, reliability of the hybrids is flight critical. Loose particle contamination is one of the major causes of failure and reduced operating life for microcircuits. Process controls, surface coatings, and the particle impact noise detection (PIND) test were assessed for control of particle contamination, and the decision was made by NASA to require PIND test for all hybrid circuits. Selected hybrids from the production line of one vendor that had failed the PIND test were analyzed. Results of this program are presented.

Caruso, S. V.↗
NASA NTRS1995

Neural Networks Analyze Data In Particle-Impact-Noise Tests

Electronic neural networks and computers put to use in analyzing data acquired in particle-impact-noise-detection (PIND) tests of packaged electronic components. PIND tests detect loose particles in packages that cause failures during subsequent operation of packages in presence of accelerations or other effects - for example, loose electrically conductive particles that bounce into positions in which they cause short circuits. Interpretation of test data more objective and accurate. Preliminary results suggest use of neural networks result in significant improvement in quality and reliability and decrease in cost of PIND testing.

Scaglione, Lois J.↗
NASA NTRS1981

Loose Particle Detection

PIND, developed by Dunegan/Endevco is an acronym for Particle Impact Noise Detection, a means of finding tiny, loose conductive particles introduced during fabrication of integrated circuits, which sometimes cause system failures. One type of automated system used for PIND testing has undergone a study by Goddard Space Flight Center to determine its effectiveness. Analysis of the test data indicated that an average PIND detection capability of about 45 percent can be expected.

Source record↗
NASA NTRS1995

Acoustic Detection Of Loose Particles In Pressure Sensors

Particle-impact-noise-detector (PIND) apparatus used in conjunction with computer program analyzing output of apparatus to detect extraneous particles trapped in pressure sensors. PIND tester essentially shaker equipped with microphone measuring noise in pressure sensor or other object being shaken. Shaker applies controlled vibration. Output of microphone recorded and expressed in terms of voltage, yielding history of noise subsequently processed by computer program. Data taken at sampling rate sufficiently high to enable identification of all impacts of particles on sensor diaphragm and on inner surfaces of sensor cavities.

Kwok, Lloyd C.↗