Validation and Verification of the Remote Agent For Spacecraft Autonomy
The six-day Remote Agent Experiment (RAX) on the Deep Space 1 mission will be the first time that an artificially intelligent agent will control a NASA spacecraft.
autonomy↗
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Remote Agent Demonstration
We describe the computer demonstration of the Remote Agent Experiment (RAX). The Remote Agent is a high-level, model-based, autonomous control agent being validated on the NASA Deep Space 1 spacecraft.
Dorais, Gregory A.↗
Science of Opportunity: Heliophysics on the FASTSAT Mission and STP-S26
The FASTSAT spacecraft, which was launched on November 19, 2010 on the DoD STP-S26 mission, carries three instruments developed in joint collaboration by NASA GSFC and the US Naval Academy: PISA, TTl, and MINI_ME.I,1 As part of a rapid-development, low-cost instrument design and fabrication program, these instruments were a perfect match for FASTSAT, which was designed and built in less than one year. These instruments, while independently developed, provide a collaborative view of important processes in the upper atmosphere relating to solar and energetic particle input, atmospheric response, and ion outflow. PISA measures in-situ irregularities in electron number density, TIl provides limb measurements of the atomic oxygen temperature profile with altitude, and MINI-ME provides a unique look at ion populations by a remote sen sing technique involving neutral atom imaging. Together with other instruments and payloads on STP-S26 such as the NSF RAX mission, FalconSat-5, and NanoSail-D (launched as a tertiary payload from FASTSAT), these instruments provide a valuable "constellation of opportunity" for following the now of energy and charged and neutral particles through the upper atmosphere. Together, and for a small fraction of the price of a major mission, these spacecraft will measure the energetic electrons impacting the upper atmosphere, the ions leaving it, and the large-scale plasma and neutral response to these energy inputs. The result will be a new model for maximizing scientific return from multiple small, distributed payloads as secondary payloads on a larger launch vehicle.
Rowland, Douglas E.↗
Challenges and Methods in Testing the Remote Agent Planner
The Remote Agent Experiment (RAX) on the Deep Space 1 (DS1) mission was the first time that an artificially intelligent agent controlled a NASA spacecraft.
planning↗
Challenges and Methods in Testing the Remote Agent Planner
The Remote Agent Experiment (RAX) on the Deep Space 1 (DS1) mission was the first time that an artificially intelligent agent controlled a NASA spacecraft.
planning↗
Full temperature single event upset characterization of two microprocessor technologies
Data for the 9450 I3L bipolar microprocessor and the 80C86 CMOS/epi (vintage 1985) microprocessor are presented, showing single-event soft errors for the full MIL-SPEC temperature range of -55 to 125 C. These data show for the first time that the soft-error cross sections continue to decrease with decreasing temperature at subzero temperatures. The temperature dependence of the two parts, however, is very different.
Nichols, Donald K.↗
Post irradiation effects (PIE) in integrated circuits
Post-irradiation effects (PIE) ranging from normal recovery to catastrophic failure have been observed in integrated circuits during the PIE period. Data presented show failure due to rebound after a 10 krad(Si) dose. In particular, five device types are investigated with varying PIE response. Special attention has been given to the HI1-507A analog multiplexer because its PIE response is extreme. X-ray diffraction has been uniquely employed to measure physical stress in the HI1-507A metallization. An attempt has been made to show a relationship between stress relaxation and radiation effects. All data presented support the current MIL-STD Method 1019.4 but demonstrate the importance of performing PIE measurements, even when mission doses are as low as 10 krad(Si).
Shaw, D. C.↗
Effect Of Clock Mode On Radiation Hardness Of An ADC
Report discusses techniques for testing and evaluating effects of total dosages of ionizing radiation on performances of high-resolution successive-approximation analog-to-digital converters (ADCs), without having to test each individual bit or transition. Reduces cost of testing by reducing tests to few critical parametric measurements, from which one determines approximate radiation failure levels providing good approximations of responses of converters for purpose of total-dose-radiation evaluations.
Lee, Choon I.↗
Recent radiation effects activities at JPL: Coping with COTS
Radiation effects and testing programs on commercial off-the-shelf (COTS) devices and circuits, which are important for NASA programs, are discussed. Demands for increased performance levels in spacecraft systems is stimulating the use of electronic and photonic devices. Some advances in electronics to reach high performance will result in the miniaturization of devices, which will lead to increased radiation vulnerability.
Barnes, C.↗
Displacement Damage in Bipolar Linear Integrated Circuits
Although many different processes can be used to manufacture linear integrated circuits, the process that is used for most circuits is optimized for high voltage -- a total power supply voltage of about 40 V -- and low cost. This process, which has changed little during the last twenty years, uses lateral and substrate p-n-p transistors. These p-n-p transistors have very wide base regions, increasing their sensitivity to displacement damage from electrons and protons. Although displacement damage effects can be easily treated for individual transistors, the net effect on linear circuits can be far more complex because circuit operation often depends on the interaction of several internal transistors. Note also that some circuits are made with more advanced processes with much narrower base widths. Devices fabricated with these newer processes are not expected to be significantly affected by displacement damage for proton fluences below 1 x 10(exp 12) p/sq cm. This paper discusses displacement damage in linear integrated circuits with more complex failure modes than those exhibited by simpler devices, such as the LM111 comparator, where the dominant response mode is gain degradation of the input transistor. Some circuits fail catastrophically at much lower equivalent total dose levels compared to tests with gamma rays. The device works satisfactorily up to nearly 1 Mrad(Si) when it is irradiated with gamma rays, but fails catastrophically between 50 and 70 krad(Si) when it is irradiated with protons.
Rax, B. G.↗
Proton Damage in Linear and Digital Optocouplers
Optocoupler failures occurred on the Topex-Poseidon spacecraft after about two years of operation. Later work in the laboratory showed that the failures were due to extreme sensitivity of LEDs within the optocouplers to displacement damage from protons. Although earlier work had been done on displacement damage in light-emitting diodes, none of the devices studied previously had been heavily damaged at the low radiation levels where the optocouplers failed in space. Subsequent work has shown that LED damage varies over an extremely wide range, depending on the particular manufacturing technology. This paper discusses proton degradation of linear and digital optocouplers. One obvious way to harden optocoupler technologies is to select LEDs that are more resistant to displacement damage. A direct comparison is made of degradation of a commercial linear optocoupler from one manufacturer with a modified version of the same device with a different LED technology. Other factors, including degradation of optical photoresponse and transistor -ain are also discussed, along with basic comparisons of digital and analog optocouplers. Linear optocouplers are designed with somewhat different requirements than digital optocouplers, which not only affects their radiation response but also the interpretation of radiation test data.
Johnston, A. H.↗
Proton Degradation of Light-Emitting Diodes
The severe degradation of optocouplers in space has been shown to be mainly due to proton displacement damage in the light-emitting diodes that are used within the optocouplers. However, a variety of LED technologies can be used in optocouplers and their sensitivity to proton displacement damage varies by about two orders of magnitude. Optocouplers are very simple hybrid devices, and the type of LED can be readily changed by the manufacturers with little cost impact. many optocoupler manufacturers purchase LEDs from outside sources with little knowledge or control of the manufacturing process used for the LED, leading to the possibility of very dramatic differences in radiation response (JPL has observed such differences for one type of optocoupler that is used in a hybrid power converter).
Johnston, A. H.↗
Total dose dependency and ELDRS effects on bipolar linear devices
The use of bipolar linear devices is prevalent in most satellite and some space applications. However, degradation as a result of low dose irradiations known as ELDERS (effects of enhanced low dose rate sensitivity) is a major concern when selecting flight hardware. Many studies and reports have been conducted on this possible phenomenon as well as their responsible physical mechanisms.
ELDRS voltage regulator voltage reference↗
Low dose failures of hardened DC-DC power converters
Box-level total dose testing of the FOG (Fiber Optic Gyro) by IXSEA at ESA's GammabeamFacility were abruptly terminated at 8krad (Si) due to catastrophic failure (complete shutdown). This was unexpected because all components within the gyro were supposedly radiation tolerant. Further testing showed that the components responsible for the failure were two DC-DC converters, manufactured by Interpoint, that stopped regulating shortly before shutdown. This paper summarizes diagnostic test results for the converters to determine the underlying cause of the unexpected failure at low levels of radiation.
Interpoint Rad-hard DC-DC power converter TC4426 M↗
Physical Oxide Properties as a Hardness Assurance Screen for Bipolar Devices
This paper examines the oxide properties of several different device types, including three devices produced by one major manufacturer.
bipolar transistors oxide properties dose tests↗
The On-Board Software Manager for the Remonte Agent Experiment on Deep Space One
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New Millennium program technology validation missi↗
Total Dose Effects and Hardness Assurance for Optocouplers
The operation and efficiency of optocouplers depend on a number of different factors, and the way that these factors are degraded by radiation must be properly understood in order to apply these devices in space systems.
optocouplers optocoupler efficiency LED degradatio↗
Hardness Assurance Techniques for New Generation COTS Devices
Hardness Assurance (HA) techniques and total dose radiation characterization data for new generation linear and COTS devices from various manufacturers are presented. A bipolar op amp showed significant degradation at HDR, not at low dose rate environment. New generation low-power op amps showed more degradation at low voltage applications. HA test techniques for COTS devices are presented in this paper.
New Millenium advanced technologies miniature spac↗