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Results for “Reliability assessment”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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All sourcesNASA NTRSDOE OSTI
NASA NTRSDate not supplied

Artemis Missions Probabilistic Risk Assessment (PRA) & Reliability Assessment Overview

To show how NASA’s Moon-to-Mars (M2M) program can use hardware reliability assessments and comprehensive Probabilistic Risk Assessments (PRAs) to estimate risk of future missions and manage risk via safety and mission success requirements from the top down, so that this risk can be balanced with other program metrics like cost and schedule. These PRAs and reliability assessments can be used during the concept, design, and operational phases of development. This presentation also provides some thoughts on how the NASA process can be utilized for a lunar surface power grid development.

PRA↗
NASA NTRS2005

A Reliability Model to Assess Reliability of Shuttle Derived Launch Vehicle and Next Generation Vehicles

One important thrust in NASA s space exploration vision is to improve the safety and reliability of future launch vehicles. A quantitative reliability model is an essential technical tool to evaluate launch vehicle reliability and to enhance launch vehicle configuration down selection and detailed designs. A quantitative reliability model that supports NASA's thrust has been developed and implemented in an MS Excel spreadsheet. The model addresses key reliability parameters, and provides for sensitivity analysis of various vehicle designs. This paper presents the specific elements of the model and examples of selected sensitivity analysis results. Reliability input parameters in the model include the following: 1. Main propulsion element failure probability; 2. Propulsion element catastrophic failure fraction (Cf). This is defined as the ratio of probability of uncontained failures over sum of probability of uncontained failures and contained failures); 3. Engine-out design vs. no-engine-out design; 4. Engine with redlines vs. no redlines; 5. Different levels of health management system implementation; 6. Launch Escape System (LES) reliability; and 7. Power level correlation with reliability. The sensitivity results will illustrate the impact of each of the above parameters on several reliability metrics: Loss of Mission (LOM), LOV (Loss of Vehicle) and Loss of Crew (LOC).

Huang, Zhao↗
NASA NTRS2009

Parts and Components Reliability Assessment: A Cost Effective Approach

System reliability assessment is a methodology which incorporates reliability analyses performed at parts and components level such as Reliability Prediction, Failure Modes and Effects Analysis (FMEA) and Fault Tree Analysis (FTA) to assess risks, perform design tradeoffs, and therefore, to ensure effective productivity and/or mission success. The system reliability is used to optimize the product design to accommodate today?s mandated budget, manpower, and schedule constraints. Stand ard based reliability assessment is an effective approach consisting of reliability predictions together with other reliability analyses for electronic, electrical, and electro-mechanical (EEE) complex parts and components of large systems based on failure rate estimates published by the United States (U.S.) military or commercial standards and handbooks. Many of these standards are globally accepted and recognized. The reliability assessment is especially useful during the initial stages when the system design is still in the development and hard failure data is not yet available or manufacturers are not contractually obliged by their customers to publish the reliability estimates/predictions for their parts and components. This paper presents a methodology to assess system reliability using parts and components reliability estimates to ensure effective productivity and/or mission success in an efficient manner, low cost, and tight schedule.

Lee, Lydia↗
NASA NTRS1974

Spaceflight tracking and data network operational reliability assessment for Skylab

Data on the spaceflight communications equipment status during the Skylab mission were subjected to an operational reliability assessment. Reliability models were revised to reflect pertinent equipment changes accomplished prior to the beginning of the Skylab missions. Appropriate adjustments were made to fit the data to the models. The availabilities are based on the failure events resulting in the stations inability to support a function of functions and the MTBF's are based on all events including 'can support' and 'cannot support'. Data were received from eleven land-based stations and one ship.

Seneca, V. I.↗
NASA NTRS2019

Assessing Reliability of NDE Flaw Detection Using Smaller Number of Demonstration Data Points

The paper provides an engineering analysis approach for assessing reliability of NDE flaw detection using smaller number of demonstration data points. It explores dependence of probability of detection (POD), probability of false positive (POF), on contrast-to-noise ratio, and net decision threshold-to-noise ratio in a simulated data; and draws some generically applicable inferences to devise the approach. ASTM nondestructive evaluation standards provide requirements on signal-to-noise ratio and/or contrast-to-noise ratio in order to provide reliable flaw detection and limit false positive calls. POD analysis of inspection test data results in an estimated flaw size, denoted by 𝑎90/95. This flaw size has 90% POD and minimum 95% confidence. POF is also estimated in the analysis. POD demonstration requires specimens with flaws of known size. In many situations, it is very expensive to produce the large number of flaws required for the POD analysis. In some situations, only real flaws can truly represent the flaws for demonstration. Real flaws of correct size and location in part configuration specimen may be difficult to produce, if not impossible. Here, an engineering analysis approach is devised using simulation to assess reliability of NDE technique when a limited number of flaws are available for demonstration. In this simulation, a technique is considered reliable, if it provides flaw detectability size equal to or better than the theoretical 𝑎90𝑡ℎ used in simulation and also provides a POF less than or equal to a chosen value. The paper uses simulated signal response versus flaw size data to devise the approach. Linear correlation is used between the signal response data and flaw size. POD software mh1823 uses generalized linear model (GLM) in POD analysis after transforming the flaw size and signal response, if needed, using logarithm. Therefore, this approach is in agreement with the linear signal correlation used in mh1823. Using the POD analysis of data, generic conditions on contrast-to-noise ratio and net decision threshold-to-noise ratio are derived for reliable flaw detection. In order to assess technique reliability using the engineering approach, signal response-to-flaw size correlation about the flaw size of concern is needed. In addition, measurement of noise is also needed. If the technique meets the above requirements, assumption of linear signal-to-flaw size correlation and conditions on noise, then the technique can be assessed using this analysis as it fits the underlying POD model used here. The approach is conservative and is designed to provide a larger flaw size compared to the POD approach. Such NDE technique assessment approach, although, not as rigorous as POD, can be cost effective if the larger flaw size can be tolerated. Typically, this is a situation for all quality control NDE inspections. Here, an NDE technique needs to be reliable and 𝑎90/95 is not estimated, but the assessed flaw size is assumed to be larger than the unknown a90 due to conservative factors or margins. Applicability of the approach for assessing reliability of flaw detection in x-ray radiography and 2D imaging in general is also explored.

Koshti, Ajay M.↗
NASA NTRS2005

Reliability Assessment of Advanced Flip-clip Interconnect Electronic Package Assemblies under Extreme Cold Temperatures (-190 and -120 C)

Flip-chip interconnect electronic package boards have been assembled, underfilled, non-destructively evaluated and subsequently subjected to extreme temperature thermal cycling to assess the reliability of this advanced packaging interconnect technology for future deep space, long-term, extreme temperature missions. In this very preliminary study, the employed temperature range covers military specifications (-55 C to 100 C), extreme cold Martian (-120 C to 115 C) and asteroid Nereus (-180 C to 25 C) environments. The resistance of daisy-chained, flip-chip interconnects were measured at room temperature and at various intervals as a function of extreme temperature thermal cycling. Electrical resistance measurements are reported and the tests to date have not shown significant change in resistance as a function of extreme temperature thermal cycling. However, the change in interconnect resistance becomes more noticeable with increasing number of thermal cycles. Further research work has been carried out to understand the reliability of flip-chip interconnect packages under extreme temperature applications (-190 C to 85 C) via continuously monitoring the daisy chain resistance. Adaptation of suitable diagnostic techniques to identify the failure mechanisms is in progress. This presentation will describe the experimental test results of flip-chip testing under extreme temperatures.

thermal cycling↗
NASA NTRSDate not supplied

A Methodology for Reliability Assessments of Arbitrary Satellite Constellations

The commercial success of small satellite development and multi-satellite missions has led to constellation missions being proposed in every sector of the market. This paradigm shift has the potential to enable more capable and cost-effective space science missions. However, these novel approaches to space missions have outstripped existing policy and analysis methods for assessing the reliability of multi-satellite missions. Mission designers and decisionmakers need new methods and standards for modeling how the reliability of constituent spacecraft elements affect the aggregate reliability of constellations across a wide range of concepts and application-specific requirements. The Space Mission Analysis Branch at NASA’s Langley Research Center has developed a methodology for simulating the on-orbit reliability of arbitrary spacecraft constellations. In this paper, the authors describe the methodology and provides examples of how it can be used to evaluate specific constellation designs. To demonstrate the flexibility of the approach, several different constellation configurations are considered, including both homogenous and heterogenous designs. Next, the authors demonstrate the ability to perform broad parameter sweeps to develop greater insight into the intrinsic reliability trends associated with constellation concepts. Finally, the authors provide tables and novel data graphics which enable decisionmakers to quickly discern the relationships between constellation sizes, topologies, replenishment strategies, and overall constellation reliability.

satellite↗
NASA NTRS1986

A study of fault prediction and reliability assessment in the SEL environment

An empirical study on estimation and prediction of faults, prediction of fault detection and correction effort, and reliability assessment in the Software Engineering Laboratory environment (SEL) is presented. Fault estimation using empirical relationships and fault prediction using curve fitting method are investigated. Relationships between debugging efforts (fault detection and correction effort) in different test phases are provided, in order to make an early estimate of future debugging effort. This study concludes with the fault analysis, application of a reliability model, and analysis of a normalized metric for reliability assessment and reliability monitoring during development of software.

Basili, Victor R.↗
NASA NTRS2003

Reliability Assessment of a Robust Design Under Uncertainty for a 3-D Flexible Wing

The paper presents reliability assessment results for the robust designs under uncertainty of a 3-D flexible wing previously reported by the authors. Reliability assessments (additional optimization problems) of the active constraints at the various probabilistic robust design points are obtained and compared with the constraint values or target constraint probabilities specified in the robust design. In addition, reliability-based sensitivity derivatives with respect to design variable mean values are also obtained and shown to agree with finite difference values. These derivatives allow one to perform reliability based design without having to obtain second-order sensitivity derivatives. However, an inner-loop optimization problem must be solved for each active constraint to find the most probable point on that constraint failure surface.

Gumbert, Clyde R.↗
NASA NTRS2024

Fault Diagnosis of Power Components with Reliability Assessment in Extraterrestrial Microgrids

This research investigates the possible failures caused by aging and other environmental and external factors that could significantly impact the performance of extraterrestrial power systems. Additionally, it presents a reliability assessment model for the space microgrid based on fault tree analysis (FTA). The reliability assessment model developed in this paper represents a tool that can be used by engineers to harden the system design for operational and economic benefits. To improve the reliability of the system, this work provides a broad review of the different fault detection and diagnosis (FDD) algorithms used for power microgrids and space applications. Using data sets from the Habitat Simulator developed through the NASA-funded Resilient Extraterrestrial Habitat Institute, this paper compares the applicability and accuracy of the different FDD methods. The primary FDD approach proposed and assessed in this work is based on the Markov reliability model. It predicts and detects future faults in the space microgrids by using past data samples and categorizing them into different classes. Data-driven-based models such as artificial neural networks are also investigated, tested, and evaluated using simulation data sets. According to the simulation results and the broad FDD algorithm comparison, this study provides the crew or maintenance engineers with a clear methodology to detect and localize power system failures.

Leila Chebbo↗
NASA NTRS2021

Acceleration Factors for Reliability Assessment of Polymer Tantalum Capacitors

Using polymer tantalum capacitors in Hi-Rel systems requires an assessment of the reliability characteristics of the parts. For this assessment, tantalum capacitors are typically subjected to reliability testing at temperatures and voltages exceeding their specified values, and the failure rate (FR) — or the probability of failure during use conditions — is calculated based on voltage and temperature acceleration factors. In this work, various types and lots of polymer tantalum capacitors have been tested at highly accelerated life test (HALT) conditions and the acceleration factors have been determined using different techniques. It has been shown that the behavior of capacitors under HALT conditions can be described based on the time-dependent dielectric breakdown (TDDB) model, which explains the presence of infant mortality (IM) and wear-out failures using the same failure mechanisms and allows for an assessment of the acceleration factors. The difference in acceleration factors obtained using exponential and power models is discussed. Analysis shows that with proper derating, screening, and qualification testing, the reliability of frameless Hi-Rel COTS polymer tantalum capacitors is adequate for space missions.

Alex Eidelman↗
NASA NTRS2021

Acceleration Factors for Reliability Assessment of Polymer Tantalum Capacitors

Using polymer tantalum capacitors in Hi-Rel systems requires an assessment of the reliability characteristics of the parts. For this assessment, tantalum capacitors are typically subjected to reliability testing at temperatures and voltages exceeding their specified values, and the failure rate (FR) — or the probability of failure during use conditions — is calculated based on voltage and temperature acceleration factors. In this work, various types and lots of polymer tantalum capacitors have been tested at highly accelerated life test (HALT) conditions and the acceleration factors have been determined using different techniques. It has been shown that the behavior of capacitors under HALT conditions can be described based on the time-dependent dielectric breakdown (TDDB) model, which explains the presence of infant mortality (IM) and wear-out failures using the same failure mechanisms and allows for an assessment of the acceleration factors. The difference in acceleration factors obtained using exponential and power models is discussed. Analysis shows that with proper derating, screening, and qualification testing, the reliability of frameless Hi-Rel COTS polymer tantalum capacitors is adequate for space missions.

Alex Eidelman↗