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Report and detailed appendix describe protective coat of SiOx (where x is 1.9 - 2.0) on Kapton H(R) polyimide sheet. Surface film protects substrate from bombardment by atomic oxygen. Intended for use as blanket substrate material of flexible array of solar photovoltaic cells on Space Station Freedom.
This work reports the numerical values of the dielectric functions derived from far-infrared measurements of silicon nitride, silicon oxide, and bulk high-purity silicon. These dielectric parameters have been previously reported in the literature and are presented here in a convenient form for future optical and sensor design applications.
Silicones have been widely used on spacecraft as potting compounds, adhesives, seals, gaskets, hydrophobic surfaces, and atomic oxygen protective coatings. Contamination of optical and thermal control surfaces on spacecraft in low Earth orbit (LEO) has been an ever-present problem as a result of the interaction of atomic oxygen with volatile species from silicones and hydrocarbons onboard spacecraft. These interactions can deposit a contaminant that is a risk to spacecraft performance because it can form an optically absorbing film on the surfaces of Sun sensors, star trackers, or optical components or can increase the solar absorptance of thermal control surfaces. The transmittance, absorptance, and reflectance of such contaminant films seem to vary widely from very transparent SiOx films to much more absorbing SiOx-based films that contain hydrocarbons. At the NASA Glenn Research Center, silicone contamination that was oxidized by atomic oxygen has been examined from LEO spacecraft (including the Long Duration Exposure Facility and the Mir space station solar arrays) and from ground laboratory LEO simulations. The findings resulted in the development of predictive models that may help explain the underlying issues and effects. Atomic oxygen interactions with silicone volatiles and mixtures of silicone and hydrocarbon volatiles produce glassy SiOx-based contaminant coatings. The addition of hydrocarbon volatiles in the presence of silicone volatiles appears to cause much more absorbing (and consequently less transmitting) contaminant films than when no hydrocarbon volatiles are present. On the basis of the LDEF and Mir results, conditions of high atomic oxygen flux relative to low contaminant flux appear to result in more transparent contaminant films than do conditions of low atomic oxygen flux with high contaminant flux. Modeling predictions indicate that the deposition of contaminant films early in a LEO flight should depend much more on atomic oxygen flux than it does later in a mission.
The behavior in space environment of evaporated Al uncoated and coated with reactively deposited silicon oxide (SiOx), electron beam evaporated SiO2 and Al2O3, and Al and Ag coated with double layers of Al2O3 + SiOx is compared with metallized Teflon and Kapton, anodized Al (Alzak), and white paints. Flight data from three calorimetric experiments and one reflectometer flown in different orbital environments are compared with laboratory test data. The results demonstrate that evaporated thin films are extremely versatile and stable coatings for space applications. Through the use of control samples studied in different laboratory tests and monitored for up to 12,000 hours of solar exposure in different orbits, a classification of orbital severity and an estimate of laboratory simulation accuracy is obtained.
New process excludes usual silicon oxide passivation. Changes in principal electrical parameters during two kinds of processing suggest antireflection treatment almost as effective as oxide treatment in passivating cells. Does so without disadvantages of SiOx passivation.
A cold process using an excimer laser for junction formation in silicon has been evaluated as a way to avoid problems associated with thermal diffusion. Conventional thermal diffusion can cause bulk precipitation of SiOx and SiC or fail to completely activate the dopant, leaving a degenerate layer at the surface. Experiments were conducted to determine the feasibility of fabricating high quality p-n junctions using a pulsed excimer laser for junction formation at remelt temperature with ion-implanted surfaces. Solar-cell efficiency exceeding 16 percent was obtained using Czochralski single-crystal silicon without benefit of back surface field or surface passivation. Characterization shows that the formation of uniform, shallow junctions (approximately 0.25 micron) by excimer laser scanning preserves the minority carrier lifetime that leads to high current collection. However, the process is sensitive to initial surface conditions and handling parameters that drive the cost up.
The decrease of minority carrier lifetime as resistivity decreases in dendritic-web silicon solar cells is addressed. This variation is shown to be consistent with the presence of defect levels in the bandgap which arise from extended defects in the web material. The extended defects are oxide precipitates (SiOx) and the dislocation cores they decorate. Sensitivity to this background distribution of defect levels increases with doping because the Fermi level moves closer to the majority carrier band edge. For high-resistivity dendritic-web silicon, which has a low concentration of these extended defects, cell efficiencies as high as 16.6 percent (4 sq cm, 40 ohm-cm boron-doped base, AM1.5 global, 100 mW/sq cm, 25 C JPL LAPSS1 measurement) and a corresponding electron lifetime of 38 microsec have been obtained. Thickness effects occur in bifacial cell designs and in designs which use light trapping. In some cases, the dislocation/precipitate defect can be passivated through the full thickness of web cells by hydrogen ion implantation.
Atomic oxygen in the low-Earth-orbital environment oxidizes SiOx protected polyimide Kapton solar array blankets at sites which are not protected such as pin windows or scratches in the protective coatings. The magnitude and shape of the atomic oxygen undercutting which occurs at these sites is dependent upon the exposure environment details such as arrival direction and reaction probability. The geometry of atomic oxygen undercutting at defect sites exposed to atomic oxygen in plasma asher was used to develop a Monte Carlo model to simulate atomic oxygen erosion processes at defect sites in protected Kapton. Comparisons of Monte Carlo predictions and experimental results are presented for plasma asher atomic oxygen exposures for large and small defects as well as for protective coatings on one or both sides of Kapton. The model is used to predict in-space exposure results at defect sites for both directed and sweeping atomic oxygen exposure. A comparison of surface textures predicted by the Monte Carlo model and those experimentally observed from both directed space ram and laboratory plasma asher atomic oxygen exposure indicate substantial agreement.
The low earth orbital (LEO) durability of Space Station Freedom (SSF) solar array materials and surfaces is evaluated using results from the Long Duration Exposure Facility (LDEF), ground laboratory simulation tests, and Monte Carlo modeling. These results indicate that thin-film SiOx protective coatings are adequately durable to atomic oxygen, ultraviolet (UV) radiation, thermal cycling, and micrometeroid or debris impact.
Commercially applied SiOx was evaluated as a protective coating for the polyimide Kapton solar array blankets for Space Station Freedom. Three different rolls of coated material were tested in a plasma asher to determine their durability to attack by atomic oxygen. Mass loss data indicated that all of the coatings tested would structurally survive for 15 years in LEO (low earth orbit), except for one which had several uncoated lines across the sample which were caused by ridgelanes in the Kapton. It appears that the size rather than number of defects alone effects the mass loss the most. Careful handling of the material after coating and during processing may be critical for array survival.
Pulsed-laser irradiation causes the visible-near-infrared spectral slope of olivine (Fo90 and Fo99+) and SiO2 to increase (redden), while the olivine samples darken and the SiO2 samples brighten slightly. XPS analysis shows that irradiation of Fo90 produces metallic Fe. Analytical SEM and TEM measurements confirm that reddening in the Fo90 olivine samples correlates with the production of "nanophase" metallic Fe (npFe0) grains, 20-50 nm in size. The reddening observed in the SiO2 sample is consistent with the formation of SiO or other SiOx species that absorb in the visible. The weak spectral brightening induced by laser irradiation of SiO2 is consistent with a change in surface topography of the sample. The darkening observed in the olivine samples is likely caused by the formation of larger npFe0 particles, such as the 100-400 nm diameter npFe0 identified during our TEM analysis of Fo90 samples. The Fo90 reflectance spectra are qualitatively similar to those in previous experiments suggesting that in all cases formation of npFe0 is causing the spectral alteration. Finally, we find that the accumulation of successive laser pulses cause continued sample darkening in the Vis-NIR, which suggests that repeated surface impacts are an efficient way to darken airless body surfaces.
A thermal protection system (TPS) comprising a mixture of silicon carbide and SiOx that has been converted from Si that is present in a collection of diatom frustules and at least one diatom has quasi-periodic pore-to-pore separation distance d(p-p) in a selected range. Where a heat shield comprising the converted SiC/SiOx frustules receives radiation, associated with atmospheric (re)entry, a portion of this radiation is reflected so that radiation loading of the heat shield is reduced.