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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2018

The International Space Station Space Radiation Environment: Avionics Systems Performance in Low-Earth Orbit Single Event Effects (SEE) Environments

Single event effects (SEE) are those errors, anomalies, or failures in microelectronic devices caused by the passage of a single energetic charged particle through the device. Spacecraft SEE environments consist primarily of energetic charged particles; both primary particles originating in the natural environment and secondary particles (including secondary neutrons) produced by nuclear reactions of primary particles with spacecraft materials. The energetic charged particle components (electrons, protons, and atomic nuclei) of the spacecraft SEE environment include galactic cosmic rays (GCR), and planetary radiation belt charged particles, as well as solar energetic particle event (SPE) charged particles. The International Space Station (ISS) orbital altitude and inclination (~350 km to ~420 km at 51.6o inclination) results in a spacecraft SEE environment that varies dramatically with the location in Earth?s geomagnetic field. Geomagnetic GCR shielding diminishes with distance from the geomagnetic equator. Near + 51.6o latitude the ISS GCR environment has a high degree of similarity to the interplanetary GCR environment in cis-Lunar space.SEE environments supporting ISS avionics systems design, development, test, and verification are documented in SSP-30512, Space Station Ionizing Radiation Design Environment. Comparisons of overall ISS avionics systems in-flight performance with pre-flight verification report predictions have been previously reported and meet or exceed expectations in all cases.In this paper we report the results of more detailed investigations of the effects of geographic location, altitude, solar cycle, and shielding mass effects on the in-flight SEE performance of the ISS command and data handling system during the past 17 years. In addition, we report on the preflight testing and in-flight performance of the commercial-off-the-shelf lap top computers used on ISS. Finally, we present an assessment of ISS as an avionics SEE test and flight demonstration platform for exploration hardware destined for the cis-lunar or other inner solar system environments.

International Space Station↗
NASA NTRS2002

Proton Single Event Effects (SEE) Testing of the Myrinet Crossbar Switch and Network Interface Card

As part of the Remote Exploration and Experimentation Project (REE), work was performed to do a proton SEE (Single Event Effect) evaluation of the Myricom network protocol system (Myrinet). This testing included the evaluation of the Myrinet crossbar switch and the Network Interface Card (NIC). To this end, two crossbar switch devices and five components in the NIC were exposed to the proton beam at the University of California at Davis Crocker Nuclear Laboratory (CNL).

Howard, James W., Jr.↗
NASA NTRS2021

The Future of Electronics Single Event Effects (SEE) Testing

In this presentation, the driving factors changing the world of single-event effects (SEE) testing will be discussed. This includes both semiconductor technological advances and morphing space system philosophies. Considerations for meeting these new challenges will then follow.

Kenneth A Label↗
NASA NTRS2003

In-Flight Observations of Long-Term Single Event Effect(SEE)Performance on Orbview-2 and Xray Timing Explorer(XTE)Solid State Recorders (SSR)

This paper presents Single Event Effect (SEE) in-flight data on Solid State Recorders (SSR) that have been collected over a long period of time for two NASA spacecraft: Orbview-2 and XTE. SEE flight data on solid-state memories give an opportunity to study the behavior in space of SEE sensitive commercial devices. The actual Single Event Upset (SEU) rates can be compared with the calculated rates based on environment models and ground test data. The SEE mitigation schemes can also be evaluated in actual implementation. A significant amount of data has already been published concerning observed SEE effects on memories in space. However, most of the data presented cover either a short period of time or a small number of devices. The data presented here has been collected on a large number of devices during several years. This allows statistically significant information about the effect of space weather fluctuations on SEU rates, and the effectiveness of SEE countermeasures used to be analyzed. Only Orbview-2 data is presented in this summary. XTE data will be included in the final paper.

Poivey, Christian↗
NASA NTRS2003

Scaling and Single Event Effects (SEE) Sensitivity

This paper begins by discussing the potential for scaling down transistors and other components to fit more of them on chips in order to increasing computer processing speed. It also addresses technical challenges to further scaling. Components have been scaled down enough to allow single particles to have an effect, known as a Single Event Effect (SEE). This paper explores the relationship between scaling and the following SEEs: Single Event Upsets (SEU) on DRAMs and SRAMs, Latch-up, Snap-back, Single Event Burnout (SEB), Single Event Gate Rupture (SEGR), and Ion-induced soft breakdown (SBD).

Oldham, Timothy R.↗
NASA NTRS2011

Single Event Effects (SEE) Testing of Embedded DSP Cores within Microsemi RTAX4000D Field Programmable Gate Array (FPGA) Devices

Motivation for this work is: (1) Accurately characterize digital signal processor (DSP) core single-event effect (SEE) behavior (2) Test DSP cores across a large frequency range and across various input conditions (3) Isolate SEE analysis to DSP cores alone (4) Interpret SEE analysis in terms of single-event upsets (SEUs) and single-event transients (SETs) (5) Provide flight missions with accurate estimate of DSP core error rates and error signatures.

Perez, Christopher E.↗
NASA NTRS2018

Guideline for Single-Event Effect (SEE) Testing of System on a Chip (SOC) Devices

The use of complex single and multicore processors with significant cache memory, on-chip peripherals, memory controllers, and high speed input/output (IO) that integrate many of the parts of a traditional computer system is becoming more common in space applications. Such devices are often referred to as system on a chip devices (SOCs), even though the term is used somewhat inaccurately due to the lack of analog and mixed signal subcircuits. These devices are complex combinations of single- or multi-core processors with memory controllers, high-speed input/output (IO), and other peripheral structures that formerly would have been handled by off-chip resources. In the past the processors were tested for single event effects (SEE) separately, and the peripherals were often put into custom application-specific integrated circuits (ASICs) along with other resources required by the user. Performance and cost pressures have pushed commercial devices to incorporate many of the functional blocks into a single chip, an SOC. The NASA Electronic Parts and Packaging Program (NEPP) has been examining ways to perform SEE radiation hardness assurance (RHA) testing of these processor-centric SOCs to achieve reasonable understanding of their performance in space missions.

Guertin, Steven M.↗
NASA NTRS2021

The Use of High Energy Heavy Ion Facilities for Single Event Effects (SEE) Testing: A Perspective on Return on Investment (ROI)

With challenges related to testing highly complex integrated circuits as well as entire systems continuing to grow, the use of higher energy heavy ions for single-event effects (SEE) testing becomes a critical technical need. This presentation, however, focuses only partially on the technical side with the main emphasis on the economics of using a high-energy heavy ion beam and comparing via notional cost models for testing.

Kenneth A. LaBel↗
NASA NTRS2018

Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

This is an independent investigation that evaluates the single event destructive and transient susceptibility of the Xilinx Kintex-UltraScale device. Design/Device susceptibility is determined by monitoring the device under test (DUT) for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) is monitored throughout heavy-ion testing by examining device current. This device does not have embedded mitigation. Hence, user implemented mitigation is investigated using Synopsys mitigation tools.

Single Event Transient (SET)↗
NASA NTRS2019

Radiation Single Event Effects (SEE) Impact on Complex Avionics Architecture Reliability

The NASA Engineering and Safety Center (NESC) has an urgent need to understand how system-level reliability of an avionics architecture is compromised when portions of the architecture are temporarily unavailable due to single event effects (SEE). The proposed activity parametrically evaluated these SEE impacts on system reliability based on mission duration, upset rate and recovery times for a representative redundant architecture. The key stakeholders for this study are NASA programs and projects that expect to use avionics architectures with electrical, electronic and electromechanical (EEE) parts susceptible to SEE when exposed to the mission expected radiation environment.

Hodson, Robert F.↗
NASA NTRS2011

Single Event Effect (SEE) Test Planning 101

This is a course on SEE Test Plan development. It is an introductory discussion of the items that go into planning an SEE test that should complement the SEE test methodology used. Material will only cover heavy ion SEE testing and not proton, LASER, or other though many of the discussed items may be applicable. While standards and guidelines for how-to perform single event effects (SEE) testing have existed almost since the first cyclotron testing, guidance on the development of SEE test plans has not been as easy to find. In this section of the short course, we attempt to rectify this lack. We consider the approach outlined here as a "living" document: mission specific constraints and new technology related issues always need to be taken into account. We note that we will use the term "test planning" in the context of those items being included in a test plan.

LaBel, Kenneth A.↗
NASA NTRS2019

Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

The goal of this study was to perform an independent investigation of single event destructive and transient susceptibility of the Microsemi RTG4 device. The devices under test were the Microsemi RTG4 field programmable gate array (FPGA) Rev C. The devices under test will be referenced as the DUT or RTG4 Rev C throughout this document. The DUT was configured to have various test structures that are geared to measure specific potential susceptibilities of the device. DesignDevice susceptibility was determined by monitoring the DUT for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) was checked throughout heavy-ion testing by monitoring device current.

Field Programmable Gate Array (FPGA)↗
NASA NTRS2011

Single-Event Effect (SEE) Survey of Advanced Reconfigurable Field Programmable Gate Arrays: NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance

The NEPP Reconfigurable Field-Programmable Gate Array (FPGA) task has been charged to evaluate reconfigurable FPGA technologies for use in space. Under this task, the Xilinx single-event-immune, reconfigurable FPGA (SIRF) XQR5VFX130 device was evaluated for SEE. Additionally, the Altera Stratix-IV and SiliconBlue iCE65 were screened for single-event latchup (SEL).

Xilinx Single-Event Effects (SEE) Test Consortium↗