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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1998

Synchrontron VUV and Soft X-Ray Radiation Effects on Aluminized Teflon FEP

Surfaces of the aluminized Teflon FEP multi-layer thermal insulation on the Hubble Space Telescope (HST) were found to be cracked and curled in some areas at the time of the second servicing, mission in February 1997, 6.8 years after HST was deployed in low Earth orbit (LEO). As part of a test program to assess environmental conditions which would produce embrittlement sufficient to cause cracking of Teflon on HST, samples of Teflon FEP with a backside layer of vapor deposited aluminum were exposed to vacuum ultraviolet (VUV) and soft x-ray radiation of various energies using facilities at the National Synchrotron Light Source. Brookhaven National Laboratory. Samples were exposed to synchrotron radiation of narrow energy bands centered on energies between 69 eV and 1900 eV. Samples were analyzed for ultimate tensile strength and elongation. Results will be compared to those of aluminized Teflon FEP retrieved from HST after 3.6 years and 6.8 years on orbit and will he referenced to estimated HST mission doses of VUV and soft x-ray radiation.

Dever, Joyce A.↗
NASA NTRS1999

Synchrotron Vacuum Ultraviolet Light and Soft X-Ray Radiation Effects on Aluminized Teflon FEP Investigated

Since the Hubble Space Telescope (HST) was deployed in low Earth orbit in April 1990, two servicing missions have been conducted to upgrade its scientific capabilities. Minor cracking of second-surface metalized Teflon FEP (DuPont; fluorinated ethylene propylene) surfaces from multilayer insulation (MLI) was first observed upon close examination of samples with high solar exposure retrieved during the first servicing mission, which was conducted 3.6 years after deployment. During the second HST servicing mission, 6.8 years after deployment, astronaut observations and photographic documentation revealed significant cracks in the Teflon FEP layer of the MLI on both the solar- and anti-solar-facing surfaces of the telescope. NASA Goddard Space Flight Center directed the efforts of the Hubble Space Telescope MLI Failure Review Board, whose goals included identifying the low-Earth-orbit environmental constituent(s) responsible for the cracking and embrittling of Teflon FEP which was observed during the second servicing mission. The NASA Lewis Research Center provided significant support to this effort. Because soft x-ray radiation from solar flares had been considered as a possible cause for the degradation of the mechanical properties of Teflon FEP (ref. 1), the effects of soft xray radiation and vacuum ultraviolet light on Teflon FEP were investigated. In this Lewisled effort, samples of Teflon FEP with a 100-nm layer of vapor-deposited aluminum (VDA) on the backside were exposed to synchrotron radiation of various vacuum ultraviolet and soft x-ray wavelengths between 18 nm (69 eV) and 0.65 nm (1900 eV). Synchrotron radiation exposures were conducted using the National Synchrotron Light Source at Brookhaven National Laboratory. Samples of FEP/VDA were exposed with the FEP surface facing the synchrotron beam. Doses and fluences were compared with those estimated for the 20-yr Hubble Space Telescope mission.

Dever, Joyce A.↗
NASA NTRS2016

Performance of the PRAXyS X-Ray Polarimeter

The performance of the Time Projection Chamber (TPC) polarimeter for the Polarimeter for Relativistic Astrophysical X-ray Sources (PRAXyS) Small Explorer was evaluated using polarized and unpolarized X-ray sources. The PRAXyS mission will enable exploration of the universe through X-ray polarimetry in the 2-10 keV energy band. We carried out performance tests of the polarimeter at the Brookhaven National Laboratory, National Synchrotron Light Source (BNL-NSLS) and at NASA's Goddard Space Flight Center. The polarimeter was tested with linearly polarized, monochromatic X-rays at 11 different energies between 2.5 and 8.0 keV. At maximum sensitivity, the measured modulation factors at 2.7, 4.5 and 8.0 keV are 27%, 43% and 59%, respectively and the measured angle of polarization is consistent with the expected value at all energies. Measurements with a broadband, unpolarized X-ray source placed a limit of less than 1% on false polarization in the PRAXyS polarimeter.

PRAXyS↗
NASA NTRS2014

Design Improvements and X-Ray Performance of a Time Projection Chamber Polarimeter for Persistent Astronomical Sources

The design of the Time-Projection Chamber (TPC) Polarimeter for the Gravity and Extreme Magnetism Small Explorer (GEMS) was demonstrated to Technology Readiness Level 6 (TRL-6)3 and the flight detectors fabricated, assembled and performance tested. A single flight detector was characterized at the Brookhaven National Laboratory Synchrotron Light Source with polarized X-rays at 10 energies from 2.3-8.0 keV at five detector positions. The detector met all of the GEMS performance requirements. Lifetime measurements have shown that the existing flight design has 23 years of lifetime4, opening up the possibility of relaxing material requirements, in particular the consideration of the use of epoxy, to reduce risk elsewhere. We report on design improvements to the GEMS detector to enable a narrower transfer gap that, when operated with a lower transfer field, reduces asymmetries in the detector response. In addition, the new design reduces cost and risk by simplifying the assembly and reducing production time. Finally, we report on the performance of the narrow-gap detector in response to polarized and unpolarized X-rays.

GEMS↗
NASA NTRS1989

Non-destructive trace element microanalysis of as-received cometary nucleus samples using synchrotron x ray fluorescence

The Synchrotron X ray Fluorescence (SXRF) microprobe at the National Synchrotron Light Source (NSLS), Brookhaven National Laboratory, will be an excellent instrument for non-destructive trace element analyses of cometary nucleus samples. Trace element analyses of as-received cometary nucleus material will also be possible with this technique. Bulk analysis of relatively volatile elements will be important in establishing comet formation conditions. However, as demonstrated for meteorites, microanalyses of individual phases in their petrographic context are crucial in defining the histories of particular components in unequilibrated specimens. Perhaps most informative in comparing cometary material with meteorites will be the halogens and trace metals. In-situ, high spatial resolution microanalyses will be essential in establishing host phases for these elements and identifying terrestrial (collection/processing) overprints. The present SXRF microprobe is a simple, yet powerful, instrument in which specimens are excited with filtered, continuum synchrotron radiation from a bending magnet on a 2.5 GeV electron storage ring. A refrigerated cell will be constructed to permit analyses at low temperatures. The cell will consist essentially of an air tight housing with a cold stage. Kapton windows will be used to allow the incident synchrotron beam to enter the cell and fluorescent x rays to exit it. The cell will be either under vacuum or continuous purge by ultrapure helium during analyses. Several other improvements of the NSLS microprobe will be made prior to the cometary nucleus sample return mission that will greatly enhance the sensitivity of the technique.

Sutton, S. R.↗
NASA NTRS1999

Effects of Melt Processing on Evolution of Structure in PEEK

We report on the effects of melt processing temperature on structure formation in Poly(ether-ether-ketone), PEEK. Real time Small Angle X-ray Scattering, SAXS, and thermal analysis are used to follow the melting behavior after various stages of processing. Assignment of peaks to structural entities within the material, the relative perfection of the crystals, and the possibility of their reorganization, are all influenced by the melt processing history. With the advent of high intensity synchrotron sources of X-radiation, polymer scientists gain a research tool which, when used along with thermal analysis, provides additional structural information about the crystals during growth and subsequent melting. PEEK is an engineering thermoplastic polymer with a very high glass transition temperature (145 C) and crystal melting point (337 C). PEEK has been the subject of recent studies by X-ray scattering in which melt and cold crystallization were followed in real-time. X-ray scattering and thermal studies have been used to address the formation of dual endothermic response which has been variously ascribed to lamellar insertion, dual crystal populations, or melting followed by re-crystallization. Another important issue is whether all of the amorphous phase is located in interlamellar regions, or alternatively whether some is located in "pockets" away from the crystalline lamellar stacks. The interpretation of scattering from lamellar stacks varies depending upon whether such amorphous pockets are formed. Some groups believe all of the amorphous phase is interlamellar. This leads to selection of a smaller thickness for the crystals. Other groups suggest that most amorphous phase is not interlamellar, and this leads to the suggestion that the crystal thickness is larger than the amorphous layer within the stacks. To investigate these ideas, we used SAXS and Differential Scanning Calorimetry to compare results of single and dual stage melt crystallization of PEEK using a treatment scheme involving annealing/crystallization at T(sub a1) followed by annealing at T(sub a2) where either T(sub a1) < T(sub a2) or T(sub a1) > T(sub a2). We proposed a model to explain multiple melting endotherms in PPS, treated according to one or two-stage melt or cold crystallization. Key features of this model are that multiple endotherms: (1) are due to reorganization/recrystallization after cold crystallization; and, (2) are dominated by crystal morphology after melt crystallization at high T. In other words, multiple distinct crystal populations are formed by the latter treatment, leading to observation of multiple melting. PEEK 45OG pellets (ICI Americas) were the starting material for this study. Films were compression molded at 400 C, then quenched to ice water. Samples were heated to 375 C in a Mettler FP80 hot stage and held for three min. to erase crystal seeds before cooling them to T(sub a1) = 280 C . Samples were held at T(sub a2) for a period of time, then immediately heated to 360 C. In the second treatment samples were held at T(sub a1) = 31 C for different crystallization times t(sub c) then cooled to 295 C and held 15 min. In situ (SAXS) experiments were performed at the Brookhaven National Synchrotron Light Source with the sample located inside the Mettler hot stage. The system was equipped with a two-dimensional position sensitive detector. The sample to detector distance was 172.7 cm and the X-ray wavelength was 1.54 Angstroms. SAXS data were taken continuously during the isothermal periods and during the heating to 360 C at 5 C/min. Each SAXS scan was collected for 30 sec. Since the samples were isotropic, circular integration was used to increase the signal to noise ratio. After dual stage melt crystallization with T(sub a1) < T(sub a2) the lower melting endotherm arises from holding at T(sub a1). During cooling a broad distribution of crystals forms, and the low-melting tail is perfected during T(sub al). Heating to T(sub a2) melts these imperfect crystals and allows others with greater average long spacing to form in their place. After dual stage crystallization with T(sub a1) > T(sub a2), the amount of space remaining for additional growth at T(sub a2) depends upon the holding time at T(sub a1). The long period of crystals formed at T(sub a2) is smaller than that formed at T(sub a1) due to growth in a now-restricted geometry. Perfection of crystals is seen as an increase of the intensity of the population scattering at higher s, while the intensity of the population scattering at lower s stays constant. During heating from below to above the minor endotherm, we see rapid decrease of the intensity of the X-ray scattering corresponding to the population of crystals scattering in the shoulder. Another important observation is that after the sample is annealed at 295 C, the shoulder intensity is restored once again. The population scattering at higher s remains longer before it disappears in the sample treated to the second stage of melt crystallization, compared to the sample crystallized with a single stage. This could be interpreted as an effect of continued perfection of the less perfect population, which is also reflected in the increased melting temperature of the smaller endotherm as the holding time at 295 C increases. In the corresponding DSC scans we see a shift in the area and the peak temperature of the lower melting endotherm with an increase of the annealing time.

Georgiev, Georgi↗
NASA NTRS1972

An extreme ultraviolet photometer for solar observations from the Atmosphere Explorer satellites

A broadband photometer experiment is being fabricated for the Atmosphere Explorer C, D and E missions to record the solar irradiance in the 40 to 1250 A region with seven distinct passbands. The experiment consists principally of four spinal electron multipliers located behind a moving eight position filter wheel. Six metallic filters are used to spectrally isolate the solar irradiance. In addition three Al2O3 diodes, two with filters, are being used to record the solar irradiance over the range of orbital altitudes from perigee through apogee. A principal goal of the experiment will be to measure time dependence of the solar irradiance with respect to a storage ring synchrotron light source which has been calibrated in terms of the best currently available standards of irradiance.

Heath, D. F.↗
NASA NTRS1979

Dissociative and double photoionization of CO2 from threshold to 90 A

The molecular photoionization, dissociative photoionization and double photoionization cross sections for CO2 were measured from their onsets down to 90 A by using various combinations of mass spectrometers (a coincidence time-of-flight mass spectrometer and a magnetic mass spectrometer) and light sources (synchrotron radiation, and glow and spark discharge). It is concluded that the one broad peak and the three shoulders in the total adsorption cross section curve between 640 and 90 A are caused completely by dissociative ionization processes. Several peaks observed in the cross section curve for the total fragmentation CO(+)3, O(+) and C(+) are compared with those in the photoelectron spectrum reported for CO2.

Masuoka, T.↗
NASA NTRS1989

Center for the development of commercial crystal growth in space

The second year of operation of the Center for Commercial Crystal Growth in Space is described. This center is a consortium of businesses, universities and national laboratories. The primary goal of the Center's research is the development of commercial crystal growth in space. A secondary goal is to develop scientific understanding and technology which will improve commercial crystal growth on earth. In order to achieve these goals the Center's research is organized into teams by growth technique; melt growth, solution growth, and vapor growth. The melt growth team is working on solidification and characterization of bulk crystals of gallium arsenide and cadmium telluride. They used high resolution X-ray topography performed at the National Synchrotron Light Source at Brookhaven National Laboratory. Streak-like features were found in the diffraction images of semi-insulating undoped LEC GaAs. These were shown to be (110) antiphase boundaries, which have not been reported before but appear to be pervasive and responsible for features seen via less-sensitive characterization methods. The results on CdTe were not as definitive, but indicate that antiphase boundaries may also be responsible for the double peaks often seen in X-ray rocking curves of this material. A liquid encapsulated melt zone system for GaAs has been assembled and techniques for casting feed rods developed. It was found that scratching the inside of the quartz ampoules with silicon carbide abrasive minimized sticking of the GaAs to the quartz. Twelve floating zone experiments were done.

Wilcox, William R.↗
NASA NTRS1989

Efficiency measurements of reflection gratings in the 100-300-A band

Zero-order and first-order efficiencies of plane diffraction grazings over the 100-300-A band have been measured using the NRL beamline facility at the National Synchrotron Light Source. Measurements were taken at grating angles of 5, 10, and 15 deg, and the incident radiation was polarized primarily in the transverse magnetic mode. Four (three laminar, one blazed) of the gratings were ion etched in high quality quartz blanks, overcoated with 200 A of gold. A fifth (blazed) grating was ruled in gold. The line densities are 1000, 2000, and 3600 grooves/mm for those with laminar profiles. Both blazed gratings have a blaze angle of 8 deg and line densities of 3600 grooves/mm. Measured first-order efficiencies up to 15 percent were obtained for the laminar gratings and up to 8 percent was obtained for the ion-etched blazed grating. Much lower efficiencies (not greater than 2 percent) were measured for the ruled grating. A computer program was written to calculate grating efficiencies using a full electromagnetic model. Measured efficiencies of the ion-etched gratings agree well with predicted values, but the measured first-order efficiency of the ruled grating is much lower than predicted.

Meekins, John F.↗
NASA NTRS1989

Trace element abundance determinations by Synchrotron X Ray Fluorescence (SXRF) on returned comet nucleus mineral grains

Trace element analyses were performed on bulk cosmic dust particles by Proton Induced X Ray Emission (PIXE) and Synchrotron X Ray Fluorescence (SXRF). When present at or near chondritic abundances the trace elements K, Ti, Cr, Mn, Cu, Zn, Ga, Ge, Se, and Br are presently detectable by SXRF in particles of 20 micron diameter. Improvements to the SXRF analysis facility at the National Synchrotron Light Source presently underway should increase the range of detectable elements and permit the analysis of smaller samples. In addition the Advanced Photon Source will be commissioned at Argonne National Laboratory in 1995. This 7 to 8 GeV positron storage ring, specifically designed for high-energy undulator and wiggler insertion devices, will be an ideal source for an x ray microprobe with one micron spatial resolution and better than 100 ppb elemental sensitivity for most elements. Thus trace element analysis of individual micron-sized grains should be possible by the time of the comet nucleus sample return mission.

Flynn, G. J.↗
NASA NTRS1990

Synchrotron X-ray fluorescence analyses of stratospheric cosmic dust - New results for chondritic and low-nickel particles

Trace element abundance determinations were performed using synchrotron X-ray fluorescence on nine particles collected from the stratosphere and classified as cosmic. Improvements to the Synchrotron Light Source allowed the detection of all elements between Cr and Mo, with the exceptions of Co and As, in our largest particle. The minor and trace element abundance patterns of three Ni-depleted particles were remarkably similar to those of extraterrestrial igneous rocks. Fe/Ni and Fe/Mn ratios suggest that one of these may be of lunar origin. All nine particles exhibited an enrichment in Br, ranging from 1.3 to 38 times the C1 concentration. Br concentrations were uncorrelated with particle size, as would be expected for a surface correlated component acquires from the stratosphere.

Flynn, G. J.↗
NASA NTRS1991

High-resolution absorption cross sections of carbon monoxide bands at 295 K between 91.7 and 100.4 nanometers

Theoretical descriptions of the abundance and excitation of carbon monoxide in interstellar clouds require accurate data on the vacuum-ultraviolet absorption spectrum of the molecule. The 6.65 m spectrometer at the Photon Factory synchrotron light source was used to measure photoabsorption cross sections of CO features between 91.2 and 100.4 nm. These data were recorded at a resolving power of 170,000, more than 20 times greater than that used in previous work.

Stark, G.↗
NASA NTRS1993

Reflectance calibrations of AXAF mirror samples at absorption edges using synchrotron radiation

We are developing a system to calibrate reflectances of witness coupons to the AXAF flight mirrors at the National Synchrotron Light Source over the 0.05-12 keV energy range. These witness coupons will be coated in the same process as the AXAF mirror elements. One of the key issues is the accurate determination of mirror efficiencies across the absorption edges of the mirror coating elements. We present a series of reflectance measurements with 2 eV resolution of a nickel-coated flat mirror in the region of the Ni L-II (870 eV) and L-III (853 eV) absorption edges. Scans of reflectance versus grazing angle at fixed energies in this region show distinct interference fringes at grazing angles larger than the critical angle which are extinguished as the photon energy is increased beyond the low point of the L-III edge, indicating total absorption of the evanescent wave within the Ni film. At 51 arc minutes grazing angle, measured reflectance decreases smoothly by 35 percent and then recovers in an 8 eV band at the L-III edge. We have also measured reflectances in the M absorption edge region for gold, platinum, and iridium coated mirrors. We derive optical parameters n and k specific to the film for comparison to the existing data tables.

Graessle, D. E.↗
NASA NTRS1993

Multilayer diffraction at 104 keV

We have measured the diffraction peak of a W:Si synthetic multilayer reflector at 104 keV using the High Energy Bonse-Hart Camera at the X-17B hard X-ray wiggler beam line of the National Synchrotron Light Source at Brookhaven National Laboratory. The characteristics of the diffraction peak are described and compared to theory.

Krieger, Allen S.↗
NASA NTRS1992

Feasibility study of the use of synchrotron radiation in the calibration of AXAF - Initial reflectivity results

The 1-percent calibration accuracy goal of the Advanced X-ray Astrophysics Facility is being approached by way of an experiment at the National Synchrotron Light Source that will demonstrate the accuracy achievable in reflectance measurements conducted on coated flat mirrors in the 50 eV-12 keV energy range. The coatings will be of commercially produced Au, Ni, and Ir, deposited either by sputtering or by e-beam deposition. Optical constants will be estimated via the reflectance vs. angle-of-incidence method.

Graessle, D. E.↗
NASA NTRS1993

Processing of semicrystalline polymers

Our research group has been interested in the processing-structure-property relationships in semicrystalline polymers and blends for many years. In situ real time x ray scattering at elevated temperatures is being used to monitor the development of structure. An ongoing collaboration with Dr. Malcolm Capel at the Brookhaven National Synchrotron Light Source allows the performance of real time wide and small angle x ray scattering to study the phase transformations in semicrystalline polymers. The first part of my presentation will be about our recent use of x ray scattering to study blends of poly(ethylene terephthalate) with polyarylates. The purpose of the next portion of the presentation is to show how we may study effects of self-deformation of polymers during processing in the gravity environment, using real time x ray scattering. In this way, how processing stresses alter the microstructure of semicrystalline polymers was learned, and ultimately microgravity processing strategies that will result in more uniform morphology in these polymers is hoped to be developed.

Cebe, Peggy↗
NASA NTRS1996

Trace Element Abundance Measurements on Cosmic Dust Particles

The X-Ray Microprobe on beamline X-26A at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory was used to determine the abundances of elements from Cr through Sr in individual interplanetary dust particles (IDPs) collected from the Earth's stratosphere and the Scanning Transmission X-ray Microscope (STXM) on beamline X-1A at the NSLS was used to determine the carbon abundances and spatial distributions in IDPs. In addition, modeling was performed in an attempt to associate particular types of IDPs with specific types of parent bodies, and thus to infer the chemistry, mineralogy, and structural properties of those parent bodies.

Flynn, George↗