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At least 19 records

X-Ray Diffraction Study of the Internal Structure of Supercooled Water

A Bragg X-ray spectrometer equipped with a volume-sensitive Geiger counter and Soller slits and employing filtered molybdenum Ka radiation was used to obtain a set of diffracted intensity curves as a Punction of angle for supercooled water. Diffracted intensity curves in the temperature region of 21 to -16 C were obtained. The minimum between the two main diffraction peaks deepened continuously with lowering temperature, indicating a gradual change in the internal structure of the water. No discontinuity in this trend was noted at the melting point. The internal structure of supercooled water was concluded to become progressively more ice-like as the temperature is lowered.

Dorsch, Robert G.↗

Crystalline Colloidal Arrays in Polymer Matrices

Crystalline Colloidal Arrays (CCA, also known as colloidal crystals), composed of aqueous or nonaqueous dispersions of self-assembled nanosized polymer colloidal spheres, are emerging toward the development of advanced optical devices for technological applications. The spontaneous self assembly of polymer spheres in a dielectric medium results from the electrostatic repulsive interaction between particles of uniform size and charge distribution. In a way similar to atomic crystals that diffract X-rays, CCA dispersions in thin quartz cells selectively and efficiently Bragg diffract the incident visible light. The reason for this diffraction is because the lattice (body or face centered cubic) spacing is on the order of the wavelength of visible light. Unlike the atomic crystals that diffract a fixed wavelength, colloidal crystals in principle, depending on the particle size, particle number and charge density, can diffract W, Vis or IR light. Therefore, the CCA dispersions can be used as laser filters. Besides, the diffraction intensity depends on the refractive index mismatch between polymer spheres and dielectric medium; therefore, it is possible to modulate incident light intensities by manipulating the index of either the spheres or the medium. Our interest in CCA is in the fabrication of all-optical devices such as optical switches, limiters, and spatial light modulators for optical signal processing. The two major requirements from a materials standpoint are the incorporation of suitable nonlinear optical materials (NLO) into polymer spheres which will allow us to alter the refractive index of the spheres by intense laser radiation, and preparation of solid CCA filters which can resist laser damage. The fabrication of solid composite filters not only has the advantage that the films are easier to handle, but also the arrays in solid films are more robust than in liquid media. In this paper, we report the photopolymerization process used to trap CCA in polymer matrices, the factors which affect the optical diffraction qualities of resulting polymer films, and methods to improve the efficiencies of solid optical filters. Before this, we also present the experimental demonstration, of controlling the optical diffraction intensities from aqueous CCA dispersions by varying the temperature, which establishes the feasibility of fabricating all-optical switching devices with nonlinear periodic array structures.

Sunkara, Hari B.↗

Holographic Optical Data Storage

Although the basic idea may be traced back to the earlier X-ray diffraction studies of Sir W. L. Bragg, the holographic method as we know it was invented by D. Gabor in 1948 as a two-step lensless imaging technique to enhance the resolution of electron microscopy, for which he received the 1971 Nobel Prize in physics. The distinctive feature of holography is the recording of the object phase variations that carry the depth information, which is lost in conventional photography where only the intensity (= squared amplitude) distribution of an object is captured. Since all photosensitive media necessarily respond to the intensity incident upon them, an ingenious way had to be found to convert object phase into intensity variations, and Gabor achieved this by introducing a coherent reference wave along with the object wave during exposure. Gabor's in-line recording scheme, however, required the object in question to be largely transmissive, and could provide only marginal image quality due to unwanted terms simultaneously reconstructed along with the desired wavefront. Further handicapped by the lack of a strong coherent light source, optical holography thus seemed fated to remain just another scientific curiosity, until the field was revolutionized in the early 1960s by some major breakthroughs: the proposition and demonstration of the laser principle, the introduction of off-axis holography, and the invention of volume holography. Consequently, the remainder of that decade saw an exponential growth in research on theory, practice, and applications of holography. Today, holography not only boasts a wide variety of scientific and technical applications (e.g., holographic interferometry for strain, vibration, and flow analysis, microscopy and high-resolution imagery, imaging through distorting media, optical interconnects, holographic optical elements, optical neural networks, three-dimensional displays, data storage, etc.), but has become a prominent am advertising, and security medium as well. The evolution of holographic optical memories has followed a path not altogether different from holography itself, with several cycles of alternating interest over the past four decades. P. J. van Heerden is widely credited for being the first to elucidate the principles behind holographic data storage in a 1963 paper, predicting bit storage densities on the order of 1/lambda(sup 3) with source wavelength lambda - a fantastic capacity of nearly 1 TB/cu cm for visible light! The science and engineering of such a storage paradigm was heavily pursued thereafter, resulting in many novel hologram multiplexing techniques for dense data storage, as well as important advances in holographic recording materials. Ultimately, however, the lack of such enabling technologies as compact laser sources and high performance optical data I/O devices dampened the hopes for the development of a commercial product. After a period of relative dormancy, successful applications of holography in other arenas sparked a renewed interest in holographic data storage in the late 1980s and the early 1990s. Currently, with most of the critical optoelectronic device technologies in place and the quest for an ideal holographic recording medium intensified, holography is once again considered as one of several future data storage paradigms that may answer our constantly growing need for higher-capacity and faster-access memories.

Timucin, Dogan A.↗

Ultra-High-Spectral-Resolution X-Ray/EUV Monochromator

Ultra-high-spectral-resolution X-Ray/EUV monochromator depends on Bragg reflection from multilayer coats and diffraction by mutlilayer-coated grating to select narrow wavelength band from input beam. Its monochromatic output beam of accurately known wavelength very useful in testing and calibration of x-ray telescopes, x-ray microscopes, photographic films, and photodetectors; in research in biological and biomedical disciplines, x-ray crystallography, properties and processing of materials, and x-ray lasers; and in x-ray lithography.

Hoover, Richard B.↗

High Resolution Triple Axis X-Ray Diffraction Analysis of II-VI Semiconductor Crystals

The objective of this research program is to develop methods of structural analysis based on high resolution triple axis X-ray diffractometry (HRTXD) and to carry out detailed studies of defect distributions in crystals grown in both microgravity and ground-based environments. HRTXD represents a modification of the widely used double axis X-ray rocking curve method for the characterization of grown-in defects in nearly perfect crystals. In a double axis rocking curve experiment, the sample is illuminated by a monochromatic X-ray beam and the diffracted intensity is recorded by a fixed, wide-open detector. The intensity diffracted by the sample is then monitored as the sample is rotated through the Bragg reflection condition. The breadth of the peak, which is often reported as the full angular width at half the maximum intensity (FWHM), is used as an indicator of the amount of defects in the sample. This work has shown that high resolution triple axis X-ray diffraction is an effective tool for characterizing the defect structure in semiconductor crystals, particularly at high defect densities. Additionally, the technique is complimentary to X-ray topography for defect characterization in crystals.

Volz, H. M.↗

Nucleation and Crystallization of Globular Proteins: What we Know and What is Missing

Recently. much progress has been made in understanding the nucleation and crystallization of globular proteins, including the formation of compositional and structural crystal defects, Insight into the interactions of (screened) protein macro-ions in solution, obtained from light scattering, small angle X-ray scattering and osmotic pressure studies. can guide the search for crystallization conditions. These studies show that the nucleation of globular proteins is governed by the same principles as that of small molecules. However, failure to account for direct and indirect (hydrodynamic) protein interactions in the solutions results in unrealistic aggregation scenarios. Microscopic studies of numerous proteins reveal that crystals grow by the attachment of growth units through the same layer-spreading mechanisms as inorganic crystals. Investigations of the growth kinetics of hen-egg-white lysozyme (HEWL) reveal non-steady behavior under steady external conditions. Long-term variations in growth rates are due to changes in step-originating dislocation groups. Fluctuations on a shorter timescale reflect the non-linear dynamics of layer growth that results from the interplay between interfacial kinetics and bulk transport. Systematic gel electrophoretic analyses suggest that most HEWL crystallization studies have been performed with material containing other proteins at percent levels. Yet, sub-percent levels of protein impurities impede growth step propagation and play a role in the formation of structural/compositional inhomogeneities. In crystal growth from highly purified HEWL solutions, however, such inhomogeneities are much weaker and form only in response to unusually large changes in growth conditions. Equally important for connecting growth conditions to crystal perfection and diffraction resolution are recent advances in structural characterization through high-resolution Bragg reflection profiling and X-ray topography.

Rosenberger, F.↗

Calculated performance of a Wolter type I X-ray telescope coated by multilayers

Deposition of multilayered diffraction coatings on the reflecting surfaces of a Wolter type I X-ray telescope offers the potential of using Bragg reflection to achieve enhanced effective area in selected high energy bandpasses. The structure of a gold-carbon multilayer has been optimized for study of 1.8 A iron-line emission with an X-ray telescope designed for observations from Spacelab. The response of this mirror assembly has been calculated as a function of X-ray energy and the resulting effective area is enhanced by a factor of 10 and peaks at 160 sq cm with a bandpass of 0.4 keV FWHM. This enhanced response is sufficient to allow study of the angular distribution of iron-line emission from the 20 brightest cluster X-ray sources during a 7 day Spacelab mission. The possibility of achieving X-ray imaging in narrow bandpasses at even higher energies has been investigated. It is concluded that it should be possible to achieve effective areas of approximately 5 sq cm in bandpasses approximately 1 keV wide for energies in the 15-25 keV range, a spectral region of much importance during the impulsive phase of solar flares.

Catura, R. C.↗

Crystals for astronomical X-ray spectroscopy

Crystal spectrometric properties and the factors that affect their measurement are discussed. Theoretical and experimental results on KAP are summarized and theoretical results based on the dynamical theory of X-ray diffraction are given for the acid phthalates as well as for the commonly used planes of ADP, PET and EDDT. Anomalous dispersion is found to be important for understanding the details of crystal Bragg reflection properties at long X-ray wavelengths and some important effects are pointed out. The theory of anomalous dispersion is applied to explain the anomalous reflectivity exhibited by KAP at 23.3 A.

Burek, A.↗

Determination of a Two-Phase Structure of Nanocrystals: GaN and SiC

The properties of nano-crystalline materials are critically dependent on the structure of the constituent grains. Experimental conditions necessary to perform structural analysis of nanocrystalline materials as a two-phase core-surface shell system are discussed. It is shown, that a standard X-ray diffraction measurements and analysis are insufficient and may lead to incorrect conclusions as to the real structure of the materials. A new method of evaluation of powder diffraction data based on the analysis of the shift of the Bragg reflections from their perfect-lattice positions was developed. "Apparent lattice parameters" quantity, alp, was introduced and calculated from the actual positions of each individual Bragg reflection. The alp values plotted versus diffraction vector (Q) show characteristic features that are used for evaluation of the experimental results. The study was based on modeling of nano-grains and simulations of theoretical intensity profiles using the Debye functions. The method was applied to the analysis of synchrotron X-ray diffraction data of GaN and SiC nanocrystals. A presence of strained surface shell and a considerable internal pressure (GaN) in the nanoparticles was concluded.

Palosz, W.↗

Soft X-ray images of the solar corona using normal incidence optics

A solar coronal loop system has been photographed in soft X-rays using a normal incidence telescope based on multilayer mirror technology. The telescope consisted of a spherical objective mirror of 4 cm aperture and 1 m focal length, a film cassette, and a focal plane shutter. A metallized thin plastic film filter was used to exclude visible light. The objective mirror was covered with a multilayer coating consisting of alternating layers of tungsten and carbon whose combined thicknesses satisfied the Bragg diffraction condition for 44 A radiation. The image was recorded during a rocket flight on October 25, 1985 and was dominated by emission lines arising from the Si XII spectrum. The rocket also carried a high resolution soft X-ray spectrograph that confirmed the presence of Si XII line radiation in the source. This image represents the first successful use of multilayer technology for astrophysical observations.

Bruner, M. E.↗

Computation of Bragg Reflection for Layered Microstructures

Bragg diffractors analyzed for use in X-ray mirrors and other applications. SLM tailored to specific applications by varying layer thicknesses and number of layers to control reflectivity diffraction width, and wavelength resolution. Applications as glancing incidence mirrors or filters for wavelengths of few to few hundred angstroms.

Underwood, J. W.↗

Synchrotron X-Ray Reciprocal Space Mapping, Topography and Diffraction Resolution Studies of Macromolecular Crystal Quality

A comprehensive study of microgravity and ground grown chicken egg white lysozyme crystals is presented using synchrotron X-ray reciprocal space mapping, topography techniques and diffraction resolution. Microgravity crystals displayed, on average, reduced intrinsic mosaicities but no differences in terms of stress over their earth grown counterparts. Topographic analysis revealed that in the microgravity case the majority of the crystal was contributing to the peak of the reflection at the appropriate Bragg angle. In the earth case at the diffraction peak only a small volume of the crystal contributed to the intensity. The techniques prove to be highly complementary with the reciprocal space mapping providing a quantitative measure of the crystal mosaicity and stress (or variation in lattice spacing) and topography providing a qualitative overall assessment of the crystal in terms of its X-ray diffraction properties. Structural data collection was also carried out both at the synchrotron and in the laboratory.

Boggon, T. J.↗

The X-ray polarization experiment on the OSO-8

The OSO-8 satellite, launched on June 21, 1975 contains two X-ray polarimeters. These polarimeters use mosaic crystals of graphite to yield polarization-sensitive Bragg reflection of stellar X-rays. The crystals reflect a narrow energy bandwidth centered at 2.6 and 5.2 keV. The polarimeter background signal is minimized by mounting the crystals on parabolic surfaces which focus the diffracted X-rays onto small-area, beryllium-window proportional counters. This technique permits the observation of low-intensity X-ray sources and reduces the possibility of systematic background effects which could lead to a false signature of polarization. A description of the instrument is given, and the sensitivity to polarization, particularly in regard to binary sources, is discussed. Preliminary results for Cen X-3 and GX5-1 are presented.

Weisskopf, M. C.↗

The OSO-8 mosaic graphite stellar X-ray polarimeter

The OSO 8 satellite, launched on June 21, 1975, contains two X-ray polarimeters. These polarimeters use mosaic crystals of graphite to yield polarization-sensitive Bragg reflection of stellar X-rays. The crystals reflect a narrow energy bandwidth centered at 2.6 and 5.2 keV. The polarimeter background signal is minimized by mounting the crystals on parabolic surfaces which focus the diffracted X-rays onto small-area beryllium-window proportional counters. This technique permits the observation of low-intensity X-ray sources and reduces the possibility of systematic background effects which could lead to a false signature of polarization. A description of the instrument is given, and preliminary results for the Crab Nebula and Cyg X-1 are presented.

Novick, R.↗

Crystals and collimators for X-ray spectrometry

Results of the measurement of Bragg reflection properties of crystals suitable for use in X-ray astronomy are presented. Measurements with a double crystal spectrometer were performed on rubidium acid phthalate and thallium acid phthalate to yield values of the integrated reflectivity and diffraction width in the range 8-18 A, and measurements of integrated reflectivity were also performed on ammonium dihydrogen phosphate. The theory and design of an arc-minute range multigrid collimator to be flown on a rocket for solar X-ray studies are also described, along with a method for determining the collimator's X-ray axis.

Mckenzie, D. L.↗

The crystalline phases present in carbon cathodes of discharged Li/SOCl2-LiAlCl4 cells

The X-ray diffraction patterns of 100 percent discharged Schawinigan black cathodes from Li/SOCl2-LiAlCl4 cells were obtained using a high resolution Guinier camera. The previous assignments of the diffraction lines to Li2O2 and rhombohedral sulfur are all found to be incorrect; all sharp Bragg diffraction lines not assignable to anhydrous LiCl can be assigned to LiCl.H2O.

Williams, R. M.↗

A new method for focusing and imaging X-rays and gamma-rays with diffraction crystals

Bent diffraction crystals in which the intercrystalline-plane spacing is varied as a function of position in the crystal are used to focus monochromatic radiation from a point source or parallel beam down to a point image. Conversely, radiation from a point source can be focused into an outgoing parallel beam. The Bragg angle for diffraction of monochromatic radiation will now vary as a function of position in the crystal and this new degree of freedom is used to obtain focusing and imaging of the diffracted beam. This approach to focusing and imaging is applied to the design of a large-area, high resolution X-ray telescope that is also a high resolution monochromator with the unique feature that the width of the energy increment that is diffracted can be controlled and varied during the operation of the instrument. The field can be scanned with a wide energy increment and then switched to a narrow energy increment for the high resolution work. Both transmission and reflection type diffraction crystals can be used.

Smither, R. K.↗

Apparatus for use in examining the lattice of a semiconductor wafer by X-ray diffraction

An improved apparatus for examining the crystal lattice of a semiconductor wafer utilizing X-ray diffraction techniques was presented. The apparatus is employed in a method which includes the step of recording the image of a wafer supported in a bent configuration conforming to a compound curve, produced through the use of a vacuum chuck provided for an X-ray camera. The entire surface thereof is illuminated simultaneously by a beam of incident X-rays which are projected from a distant point-source and satisfy conditions of the Bragg Law for all points on the surface of the water.

Parker, D. L.↗