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Results for “absolute metrology”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2004

Design considerations and validation of the MSTAR absolute metrology system

Absolute metrology measures the actual distance between two optical fiducials. A number of methods have been employed, including pulsed time-of-flight, intensity-modulated optical beam, and two-color interferometry. The rms accuracy is currently limited to -5 microns. Resolving the integer number of wavelengths requires a 1-sigma range accuracy of -0.1 microns. Closing this gap has a large pay-off the range (length measurement) accuracy can be increased substantially using the unambiguous optical phase. The MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. In this paper, we present recent experiments that use dispersed white light interferometry to independently validate the zero-point of the system. We also describe progress towards reducing the size of optics, and stabilizing the laser wavelength for operation over larger target ranges. MSTAR is a general-purpose tool for conveniently measuring length with much greater accuracy than was previously possible, and has a wide range of possible applications.

Jeganathan, Muthu↗
NASA NTRS2004

MSTAR: an absolute metrology system with submicrometer accuracy

Laser metrology systems are a key component of stellar interferometers, used to monitor path lengths and dimensions internal to the instrument. Most interferometers use ‘relative’ metrology, in which the integer number of wavelengths along the path is unknown, and the measurement of length is ambiguous. Changes in the path length can be measured relative to an initial calibration point, but interruption of the metrology beam at any time requires a re- calibration of the system. iThe MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. We describe the design of the system, show results for target distances up to 1 meter, and demonstrate how the system can be scaled to kilometer-scale distances. In recent experiments, we have used white light interferometry to augment the ‘truth’ measurements and validate the zero-point of the system. MSTAR is a general-purpose tool for conveniently measuring length with much greater accuracy than was previously possible, and has a wide range of possible applications.

Lay, Oliver↗
NASA NTRS2004

MSTAR: an absolute metrology system with submicrometer accuracy

Laser metrology systems are a key component of stellar interferometers, used to monitor path lengths and dimensions internal to the instrument. Most interferometers use ‘relative’ metrology, in which the integer number of wavelengths along the path is unknown, and the measurement of length is ambiguous. Changes in the path length can be measured relative to an initial calibration point, but interruption of the metrology beam at any time requires a re-calibration of the system. The MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. We describe the design of the system, show results for target distances up to 1 meter, and demonstrate how the system can be scaled to kilometer-scale distances. In recent experiments, we have used white light interferometry to augment the ‘truth’ measurements and validate the zero-point of the system. MSTAR is a general-purpose tool for conveniently measuring length with much greater accuracy than was previously possible, and has a wide range of possible applications

Fetterman, Harrold R.↗
NASA NTRS1996

Metrology for Spatial Interferometry III

Very high resolution spatial interferometry requires picometer level one-dimensional metrology, surface metrology, and 3-dimensional metrology. The absolute distance measurements with accuracies of only 1 part in a million are required due to the careful design of spacecraft like the proposed Stellar Interferometry Mission (SIM), carrying high resolution stellar interferometers. An absolute calibration system for the surface gauge described in a previous paper is demonstrated. A self-calibrating absolute metrology system with a repeatability of 2 microns rms over a one-way distance of a meter is demonstrated. The accuracy calibration of this gauge is in progress. An auto-aligning, 3-dimensional metrology gauge is constructed using the sub-picometer linear metrology gauge described in earlier papers. Initial test results from this demonstration are presented.

high↗
NASA NTRS2005

Absolute optical metrology : nanometers to kilometers

We provide and overview of the developments in the field of high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor.

optical metrology↗
NASA NTRS2011

Laser Truss Sensor for Segmented Telescope Phasing

A paper describes the laser truss sensor (LTS) for detecting piston motion between two adjacent telescope segment edges. LTS is formed by two point-to-point laser metrology gauges in a crossed geometry. A high-resolution (<30 nm) LTS can be implemented with existing laser metrology gauges. The distance change between the reference plane and the target plane is measured as a function of the phase change between the reference and target beams. To ease the bandwidth requirements for phase detection electronics (or phase meter), homodyne or heterodyne detection techniques have been used. The phase of the target beam also changes with the refractive index of air, which changes with the air pressure, temperature, and humidity. This error can be minimized by enclosing the metrology beams in baffles. For longer-term (weeks) tracking at the micron level accuracy, the same gauge can be operated in the absolute metrology mode with an accuracy of microns; to implement absolute metrology, two laser frequencies will be used on the same gauge. Absolute metrology using heterodyne laser gauges is a demonstrated technology. Complexity of laser source fiber distribution can be optimized using the range-gated metrology (RGM) approach.

Liu, Duncan T.↗
NASA NTRS2008

Integrated Formation Optical Communication and Estimation System

An architecture has been designed that integrates formation estimation methodologies, precision formation sensing, and high-bandwidth formation communication into a robust, strap-on system that meets knowledge and communication requirements for the majority of planned, precision formation missions. Specifically, the integrated system supports (a) sub-millimeter metrology, (b) multiple greater than 10 Mbps communication channels over a large, 10 deg field-of-view (FOV), and (c) generalized formation estimation methodologies. The sensing sub-system consists of several absolute, metrology gauges with up to 0.1 mm precision that use amplitude-modulated lasers and a LISA-heritage phase meter. Since amplitude modulation is used, inexpensive and robust diode lasers may be used instead of complex, frequency-stabilized lasers such as for nanometer-level metrology. The metrology subsystem laser transceivers consist of a laser diode, collecting optics, and an avalanche photo diode (APD) for detecting incoming laser signals. The APD is necessary since received power is small due to the large (for optical applications) FOV. The phase meter determines the phase of the incoming amplitude modulations as measured by the APD. This phase is equivalent to time-of-flight and, therefore, distance. By placing three laser transceivers on each spacecraft, 18 clock-offset-corrupted distances are calculated. These measurements are communicated and averaged to obtain nine correct distances between the transceivers. From these correct distances, the range and bearing between spacecraft and their relative attitude are determined. Next, communication is integrated on the laser carrier through spectral separation. Metrology amplitude modulations are limited to the 45-50 MHz band, leaving 0-45 MHz for communication. Through careful design of coding scheme, error correction, and filters, six independent 10 Mbps receive channels are possible. Hence, a spacecraft can simultaneously broadcast at 10 Mbps and listen to six other spacecraft. The integrated sensing and communication architecture has been developed, as have formation estimation methodologies that allow the sensing topology to reconfigure as spacecraft maneuver. A bench-top implementation of the integrated sensing and communication architecture is in progress. The final, multiple sensing/communication systems will be tied together via formation estimation algorithms that are also undergoing further development.

Scharf, Daniel↗
NASA NTRSDate not supplied

Absolute Characterization of Gravity Sag

G-release –defined as the knowledge uncertainty of a mirror’s gravity-sag or the residual error between the mirror’s predicted and actual on-orbit shape –is a critical error budget element for space telescopes. For a UV/Optical telescope, G-release needs to be less than 4 nm rms. Absolute metrology techniques developed for high-accuracy optical surface testing can be used for characterizing gravity-sag of space optics. This paper presents the importance of gravity sag for space optics and reviews methods for its compensation, characterization or correction.

H Philip Stahl↗
NASA NTRS1997

Metrology for Spatial Interferometry IV

The proposed Space Interferometry Mission (SIM) spacecraft carries high resolution stellar interferometers for micro-arc-second accuracy astrometric measurements.

stellar↗
NASA NTRS1991

Optical system design for a Lunar Optical Interferometer

The moon offers particular advantages for interferometry, including a vacuum environment, a large stable base on which to assemble multi-kilometer baselines, and a cold nighttime temperature to allow for passive cooling of optics for high IR sensitivity. A baseline design for a Lunar Optical Interferometer (LOI) which exploits these features is presented. The instrument operates in the visible to mid-IL region, and is designed for both astrometry and synthesis imaging. The design uses a Y-shaped array of 12 siderostats, with maximum arm lengths of about 1 km. The inner siderostats are monitored in three dimensions from a central laser metrology structure to allow for high precision astrometry. The outer siderostats, used primarily for synthesis imaging, exploit the availability of bright reference stars in order to determine the instrument geometry. The path delay function is partitioned into coarse and fine components, the former accomplished with switched banks of range mirrors monitored with an absolute laser metrology system, and the latter with a short cat's eye delay line. The back end of the instrument is modular, allowing for beam combiners for astrometry, visible and IR synthesis imaging, and direct planet detection. With 1 m apertures, the instrument will have a point-source imaging sensitivity of about 29 mag; with the laser metrology system, astrometry at the microarcsecond level will be possible.

Colavita, M. M.↗
NASA NTRS2006

Laser Metrology Sensing and Control for Large Segmented-Mirror Telescopes

Described an optical hexapod metrology concept: a) Can work together with edge sensors; b) Can measure M1 - M2 distance and M1 global curvature. Swept-frequency laser metrology system: a) Absolute optical path length measurement (approx.1 micron); b) Relative optical path length measurement (approx.nm) Air turbulence is a concern for ground-based telescopes and needs further study.

large telescopes↗
NASA NTRS1991

Optical figure testing of prototype mirrors for JPL's Precision Segmented Reflector (PSR) program

JPL's PSR program is developing enabling technologies for large space telescopes employing segmented optics, and in particular, lightweight, thermally stable mirrors for telescopes operating at sub-mm wavelengths. JPL's vacuum cryointerferometric optical test facility includes a computer-controlled phase shifting interferometer operating at 10.59 microns and laser metrology for measurement of piston and absolute radius of curvature. The optical metrology has been integrated with a large vacuum chamber including a liquid nitrogen shroud capable of radiatively cooling 1.5 meter aperture mirrors down to 150 K. The facility is now being used to characterize prototype mirrors in both their room-temperature 'as-replicated' condition, and under orbital temperature conditions. The performance and limitations of the optical metrology hardware and software components are noted. Representative test results on prototype one meter-class composite mirrors being developed for PSR and related ground-based programs are also presented.

Hochberg, Eric B.↗
NASA NTRS2007

A Precision Deployable Aperture System Facility

This paper describes an overview of the precision environment test enclosure for testing the structures, a metrology system for absolute measurement at the micron level and the formulation of a modeling methodology that integrates the measurement of aperture components or subsystems w1th models for direct validation.

modeling↗