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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1992

Giotto data analysis: Electron plasma and heavy ion composition measurements at Comet Halley

This investigation involved the analysis of electron plasma and heavy ion composition measurements made by the COPERNIC (COmplete Positive ion, Electron, and Ram Negative Ion measurements near Comet Halley) plasma experiment during the close fly-by of Halley by the European Space Agency's Giotto spacecraft. The experiment provided measurements of the full 3-dimensional distribution of 10 eV-30 keV electrons, and mass analysis of cold cometary ions from 10-210 amu. The analysis of the COPERNIC data has yielded some remarkable results, including: The discovery of negatively charged ions in the inner coma; the discovery of far heavier (mass is greater than 50 amu) ions than predicted, dominated by complex molecular ions made up of C, H, O, and N; the discovery of an adiabatic heating effect on electrons from the compression of the solar wind plasma; the identification of several organic and sulfur bearing ions; and the discovery of a new 'mystery region' where electrons are accelerated to high energies. These discoveries were in addition to the detailed analysis of 'expected' features at Comet Halley. Although this grant has expired, analysis continues on the data at a low (unfunded) level, and it is expected that more significant results will be obtained. A bibliography of the papers resulting from this research is attached, and a copy of each paper is included.

Lin, Robert P.↗
NASA NTRS1983

Plasma electron analysis: Voyager plasma science experiment

The Plasma Science Experiment (PLS) on the Voyager spacecraft provide data on the plasma ions and electrons in the interplanetary medium and the magnetospheres of the giant planets Jupiter and Saturn. A description of the analysis used to obtain electron parameters (density, temperature, etc.) from the plasma science experiment PLS electron measurements which cover the energy range from 10 eV to 5950 eV is presented. The electron sensor (D cup) and its transmission characteristics are described. A derivation of the fundamental analytical expression of the reduced distribution function F(e) is given. The electron distribution function F(e), used in the moment integrations, can be derived from F(e). Positive ions produce a correction current (ion feedthrough) to the measured electron current, which can be important to the measurements of the suprathermal electron component. In the case of Saturn, this correction current, which can either add to or subtract from the measured electron current, is less than 20% of the measured signal at all times. Comments about the corrections introduced by spacecraft charging to the Saturn encounter data, which can be important in regions of high density and shadow when the spacecraft can become negatively charged are introduced.

Sittler, E. C., Jr.↗
NASA NTRS1980

Electron microprobe mineral analysis guide

Electron microprobe mineral analysis guide is a compilation of X-ray tables and spectra recorded from various mineral matrices. Spectra were obtained using electron microprobe, equipped with LiF geared, curved crystal X-ray spectrometers, utilizing typical analytical operating conditions: 15 Kv acceleration potential, 0.02 microampere sample current as measured on a clinopyroxene standard (CP19). Tables and spectra are presented for the majority of elements, fluorine through uranium, occurring in mineral samples from lunar, meteoritic and terrestrial sources. Tables for each element contain relevant analytical information, i.e., analyzing crystal, X-ray peak, background and relative intensity information, X-ray interferences and a section containing notes on the measurement. Originally intended to cover silicates and oxide minerals the tables and spectra have been expanded to cover other mineral phases. Electron microprobe mineral analysis guide is intended as a spectral base to which additional spectra can be added as the analyst encounters new mineral matrices.

Brown, R. W.↗
NASA NTRS2012

Systematic Destruction of Electronic Parts for Aid in Electronic Failure Analysis

NASA analyzes electrical, electronic, and electromechanical (EEE) parts used in space vehicles to understand failure modes of these components. Operational amplifiers and transistors are two examples of EEE parts critical to NASA missions that can fail due to electrical overstress (EOS). EOS is the result of voltage or current over time conditions that exceeds a component s specification limit. The objective of this study was to provide known voltage pulses over well-defined time intervals to determine the type and extent of damage imparted to the device. The amount of current was not controlled but measured so that pulse energy was determined. The damage was ascertained electrically using curve trace plots and optically using various metallographic techniques. The resulting data can be used to build a database of physical evidence to compare to damaged components removed from flight avionics. The comparison will provide the avionics failure analyst necessary information about voltage and times that caused flight or test failures when no other electrical data is available.

Decker, S. E.↗
NASA NTRS1971

EPR-atomic scale experimental stress analysis

Electron paramagnetic resonance atomic scale stress analysis of high polymer fibers and rubber, measuring chain scission and bond rupture for different loading histories

Devries, K. L.↗
NASA NTRS1984

Sampling of Silicon Powder for Impurity Analysis

Electron beam forms dense pellets of powdered silicon for Zeeman analysis. Sampling method focuses electron beam on submicron silicon powder. Process enhances quality control in production of low-cost silicon powder for semiconductor industry.

Yamakawa, K. A.↗
NASA NTRS2023

Ceramic Capacitor Grain Size Analysis Using Electron Backscatter Diffraction (EBSD)

The overall scope of this NESC study was to identify (or develop) a tool, methodology, or process that can inspect a ceramic capacitor and consistently return repeatable grain size distribution results. It is important to note that the development of a machine learning technique was considered as an option for this study, but only if an existing automated tool was not available. This report explains why the Electron Backscatter Diffraction analysis method for grain structure and size distribution was deemed a suitable candidate for this work.

Electron Backscatter Diffraction↗
NASA NTRS1975

Failure analysis of electronic parts: Laboratory methods

Failure analysis test methods are presented for use in analyzing candidate electronic parts and in improving future design reliability. Each test is classified as nondestructive, semidestructive, or destructive. The effects upon applicable part types (i.e. integrated circuit, transitor) are discussed. Methodology is given for performing the following: immersion tests, radio graphic tests, dewpoint tests, gas ambient analysis, cross sectioning, and ultraviolet examination.

Anstead, R. J.↗
NASA NTRS1972

Scanning electron microscopy, non-dispersive X-ray analysis and electron microprobe studies of lunar soil, rocks and microbreccia

Silicate glass of composition similar to brown lunar glass was reduced with carbon and hydrogen. The typical complex iron sulfide and metallic iron mound formed by reduction with carbon is zoned. Its interior is metallic iron or a mixture of iron sulfide and metallic iron. The outer layer is pure metallic iron which is generally discontinuous, but the surface of the mound next to the silicate host is iron sulfide. This type of mound commonly has a waist of metallic iron and a void beneath it. The silicate surface of the void is covered with droplets or stringers of iron sulfide. The complex iron sulfide and metallic iron mounds formed by reduction with hydrogen generally are zoned. The outer layer is iron sulfide or a mixture of iron sulfide and metallic iron but the interior is metallic iron and iron sulfide, and the mound material next to the silicate host is iron sulfide. On the surface of some complex mounds, globules of silicate material are present. In one example, the globules consist of particles of aluminum oxide surrounded by silicate material. In turn, the margin of the globules is surrounded by iron sulfide. Dimples are present and surface of the dimples is covered by dendritic sheaths of iron sulfide and isolated metallic iron globules.

Carter, J. L.↗
NASA NTRS1989

Electron beam analysis of particulate cometary material

Electron microscopy will be useful for characterization of inorganic dust grains in returned comet nucleus samples. The choice of instrument(s) will depend primarily on the nature of the samples, but ultimately a variety of electron-beam methods could be employed. Scanning and analytical (transmission) electron microscopy are the logical choise for morphological, mineralogical, and bulk chemical analyses of dust grains removed from ices. It may also be possible to examine unmelted ice/dust mixtures using an environmental scanning electron microscope equipped with a cryo-transfer unit and a cold stage. Electron microscopic observations of comet nuclei might include: (1) porosities of dust grains; (2) morphologies and microstructures of individual mineral grains; (3) relative abundances of olivine, pyroxene, and glass; and (4) the presence of phases that might have resulted from aqueous alteration (layer silicates, carbonates, sulfates).

Bradley, John↗
NASA NTRS1981

Vapor phase diamond growth technology

Ion beam deposition chambers used for carbon film generation were designed and constructed. Features of the developed equipment include: (1) carbon ion energies down to approx. 50 eV; (2) in suit surface monitoring with HEED; (3) provision for flooding the surface with ultraviolet radiation; (4) infrared laser heating of substrate; (5) residual gas monitoring; (6) provision for several source gases, including diborane for doping studies; and (7) growth from either hydrocarbon source gases or from carbon/argon arc sources. Various analytical techniques for characterization of from carbon/argon arc sources. Various analytical techniques for characterization of the ion deposited carbon films used to establish the nature of the chemical bonding and crystallographic structure of the films are discussed. These include: H2204/HN03 etch; resistance measurements; hardness tests; Fourier transform infrared spectroscopy; scanning auger microscopy; electron spectroscopy for chemical analysis; electron diffraction and energy dispersive X-ray analysis; electron energy loss spectroscopy; density measurements; secondary ion mass spectroscopy; high energy electron diffraction; and electron spin resonance. Results of the tests are summarized.

Angus, J. C.↗
NASA NTRS1991

NASA Li/CF(x) cell problem analysis: Scanning electron microscopy with energy dispersive x ray spectrometry

An analysis was made of Lithium/carbon fluoride cell parts for possible chloride contamination induced by exposure to thionyl chloride (SOCl2); various samples were submitted for analysis. Only a portion of the analysis which has been conducted is covered, herein, namely analysis by scanning electron microscopy with energy dispersive x ray spectrometry (SEM/EDS). A strip of nickel was exposed to SOCl2 vapors to observe variations in surface concentrations of sulfur and chlorine with time. By detecting chlorine one can not infer contamination by SOCl2 only that contamination is present. Six samples of stainless steel foil were analyzed for chlorine using EDS. Chlorine was not detected on background samples but was detected on the samples which had been handled including those which had been cleaned. Cell covers suspected of being contaminated while in storage and covers which were not exposed to the same storage conditions were analyzed for chlorine. Although no chlorine was found on the covers from cells, it was found on all stored covers. Results are presented with techniques shown for analysis and identification. Relevant photomicrographs are presented.

Baker, John↗