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At least 19 records

Dual Target Metrology

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metrology optical interferometry dual target heter↗

Metrology system for Space Interferometry Mission system testbed 3

In a 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines and calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability of better than 1 nm error.

interferometry↗

Optical metrology for Starlight Separated Spacecraft Stellar Interferometry Mission

We describe a high-precision inter-spacecraft metrology system designed for NASA 's StarLight mission, a space-based separated-spacecraft stellar interferometer. It consists of dual-target linear metrology, based on a heterodyne interferometer with carrier phase modulation, and angular metrology designed to sense the pointing of the laser beam and provides bearing information. The dual-target operation enables one metrology beam to sense displacement of two targets independently. We present the current design, breadboard implementation of the Metrology Subsystem in a stellar interferometer testbed and the present state of development of flight qualifiable subsystem components.

metrology stellar interferometry formation flying↗

Metrology Optical Power Budgeting in SIM Using Statistical Analysis Techniques

The Space Interferometry Mission (SIM) is a space-based stellar interferometry instrument, consisting of up to three interferometers, which will be capable of micro-arc second resolution. Alignment knowledge of the three interferometer baselines requires a three-dimensional, 14-leg truss with each leg being monitored by an external metrology gauge. In addition, each of the three interferometers requires an internal metrology gauge to monitor the optical path length differences between the two sides. Both external and internal metrology gauges are interferometry based, operating at a wavelength of 1319 nanometers. Each gauge has fiber inputs delivering measurement and local oscillator (LO) power, split into probe-LO and reference-LO beam pairs. These beams experience power loss due to a variety of mechanisms including, but not restricted to, design efficiency, material attenuation, element misalignment, diffraction, and coupling efficiency. Since the attenuation due to these sources may degrade over time, an accounting of the range of expected attenuation is needed so an optical power margin can be book kept. A method of statistical optical power analysis and budgeting, based on a technique developed for deep space RF telecommunications, is described in this paper and provides a numerical confidence level for having sufficient optical power relative to mission metrology performance requirements.

stellar interferometry↗

SIM PlanetQuest: Status and Recent Progress

The SIM project is approaching the end of its technology development phase. With the successful completion of a number of testbeds, including micro-arcsecond stellar interferometry, picometer optical truss metrology, and milli-kelvin thermo-optical characterization, the project is now on a sure footing for the development of requirement for the flight instrument. Here we review the latest technological progress and give a status of the project.

astrometry↗

SIM technolgy development overview - light at the end of the tunnel

Optical and infrared interferometry will open new vistas for astronomy over the next decade. Space based interferometers, operating unfettered by the Earth's atmosphere, will offer the greatest scientific payoff. They also present the greatest technological challenge: laser metrology systems must perform with sub-nanometer precision; mechanical vibrations must be controlled to nanometers requiring orders of magnitude disturbance rejection; a multitude of actuators and sensors must operate flawlessly and in concert. The Jet Propulsion Laboratory along with its industry partners are addressing these challenges with a development program that plans to establish technology readiness for the Space Interferometry Mission by end of 2004.

interferometry↗

The Least-Squares Calibration on the Micro-Arcsecond Metrology Test Bed

The Space Interferometry Mission (S1M) will measure optical path differences (OPDs) with an accuracy of tens of picometers, requiring precise calibration of the instrument. In this article, we present a calibration approach based on fitting star light interference fringes in the interferometer using a least-squares algorithm. The algorithm is first analyzed for the case of a monochromatic light source with a monochromatic fringe model. Using fringe data measured on the Micro-Arcsecond Metrology (MAM) testbed with a laser source, the error in the determination of the wavelength is shown to be less than 10pm. By using a quasi-monochromatic fringe model, the algorithm can be extended to the case of a white light source with a narrow detection bandwidth. In SIM, because of the finite bandwidth of each CCD pixel, the effect of the fringe envelope can not be neglected, especially for the larger optical path difference range favored for the wavelength calibration.

interferometer calibrations↗

High-Speed Digital Interferometry

Digitally enhanced heterodyne interferometry (DI) is a laser metrology technique employing pseudo-random noise (PRN) codes phase-modulated onto an optical carrier. Combined with heterodyne interferometry, the PRN code is used to select individual signals, returning the inherent interferometric sensitivity determined by the optical wavelength. The signal isolation arises from the autocorrelation properties of the PRN code, enabling both rejection of spurious signals (e.g., from scattered light) and multiplexing capability using a single metrology system. The minimum separation of optical components is determined by the wavelength of the PRN code.

De Vine, Glenn↗

Optical Testing of Retroreflectors for Cryogenic Applications

A laser tracker (LT) is an important coordinate metrology tool that uses laser interferometry to determine precise distances to objects, points, or surfaces defined by an optical reference, such as a retroreflector. A retroreflector is a precision optic consisting of three orthogonal faces that returns an incident laser beam nearly exactly parallel to the incident beam. Commercial retroreflectors are designed for operation at room temperature and are specified by the divergence, or beam deviation, of the returning laser beam, usually a few arcseconds or less. When a retroreflector goes to extreme cold (.35 K), however, it could be anticipated that the precision alignment between the three faces and the surface figure of each face would be compromised, resulting in wavefront errors and beam divergence, degrading the accuracy of the LT position determination. Controlled tests must be done beforehand to determine survivability and these LT coordinate errors. Since conventional interferometer systems and laser trackers do not operate in vacuum or at cold temperatures, measurements must be done through a vacuum window, and care must be taken to ensure window-induced errors are negligible, or can be subtracted out. Retroreflector holders must be carefully designed to minimize thermally induced stresses. Changes in the path length and refractive index of the retroreflector have to be considered. Cryogenic vacuum testing was done on commercial solid glass retroreflectors for use on cryogenic metrology tasks. The capabilities to measure wavefront errors, measure beam deviations, and acquire laser tracker coordinate data were demonstrated. Measurable but relatively small increases in beam deviation were shown, and further tests are planned to make an accurate determination of coordinate errors.

Ohl, Raymond G.↗

The Space Interferometry Mission (SIM): technology development progress and plans

Optical and infrared interferometry will open new vistas for astronomy over the next decade. Space based interferometers, operating unfettered by the Earth's atmosphere, will offer the greatest scientific payoff. They also present the greatest technological challenge: laser metrology systems must perform with sub-nanometer precision; mechanical vibrations must be controlled to nanometers requiring orders of magnitude distrubance rejection; a multitude of actuators and sensors must operate flawlessly and in concert.

interferometry metrology pointing control nanomete↗