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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1994

Microwave imaging of metal objects

The procedure of microwave imaging by maximum entropy method is discussed. First, the relationship between the induced current on the metal object surface and the scattered field is introduced. Our imaging concept is to reconstruct the induced current on the object surface from the measured scattered field. The object configuration will be provided by the induced current which is zero everywhere except on the object surface. Future work is also included with focus on the application of microwave imaging to both NASA and industry.

Krishen, Kumar↗
NASA NTRS1998

Microwave Imaging on Metal Objects

This final report for the project discusses the attempts to model, using different methods, microwave image reconstruction. Maximum Entropy Method was not successful. Attempts to use Singular Value Decomposition (SVD) got some good results after initial failure. SVD is based upon a theory of linear algebra, to the effect that any M X N Matrix A whose number of rows M is greater than or equal to its number of columns, N can be written as the product of an M X N column-orthogonal matrix U, an N X N diagonal Matrix, W, with m positive or zero elements (the singular values) and the transposition of an N X N orthogonal matrix V. In microwave imaging, the scattered fields can be expressed by the induced current distribution. The SVD method required more contiguous computer memory than was available. Work was also done on the Conjugate Gradient Method (CGM), which didn't work well when tried earlier. It was found that separation of the imaginary part and the real part during calculation may work. This work was considered incomplete as of the end of the grant period.

Tolliver, C. L.↗
NASA NTRS1998

An Evanescent Microwave Probe for Super-Resolution Nondestructive Imaging of Metals, Semiconductors, Dielectrics, Composites and Biological Specimens

Using evanescent microwaves with decay lengths determined by a combination of microwave wavelength (lambda) and waveguide termination geometry, we have imaged and mapped material non-uniformities and defects with a resolving capability of lambda/3800=79 microns at 1 GHz. In our method a microstrip quarter wavelength resonator was used to generate evanescent microwaves. We imaged materials with a wide range of conductivities. Carbon composites, dielectrics (Duroid, polymers), semiconductors (3C-SiC, polysilicon, natural diamond), metals (tungsten alloys, copper, zinc, steel), high-temperature superconductors, and botanical samples were scanned for defects, residual stresses, integrity of brazed junctions, subsurface features, areas of different film thickness and moisture content. The evanescent microwave probe is a versatile tool and it can be used to perform very fast, large scale mapping of a wide range of materials. This method of characterization compares favorably with ultrasound testing, which has a resolution of about 0.1 mm and suffers from high absorption in composite materials and poor transmission across boundaries. Eddy current methods which can have a resolution on the order of 50 microns are restricted to evaluating conducting materials. Evanescent microwave imaging, with careful choice of operating frequency and probe geometry, can have a resolution of up to 1 micron. In this method we can scan hot and moving objects, sample preparation is not required, testing is non-destructive, non-invasive and non-contact, and can be done in air, in liquid or in vacuum.

Pathak, P. S.↗
NASA NTRS2005

Computed Tomography 3-D Imaging of the Metal Deformation Flow Path in Friction Stir Welding

In friction stir welding (FSW), a rotating threaded pin tool is inserted into a weld seam and literally stirs the edges of the seam together. To determine optimal processing parameters for producing a defect free weld, a better understanding of the resulting metal deformation flow path is required. Marker studies are the principal method of studying the metal deformation flow path around the FSW pin tool. In our study, we have used computed tomography (CT) scans to reveal the flow pattern of a lead wire embedded in a FSW weld seam. At the welding temperature of aluminum, the lead becomes molten and is carried with the macro-flow of the weld metal. By using CT images, a 3-dimensional (3D) image of the lead flow pattern can be reconstructed. CT imaging was found to be a convenient and comprehensive way of collecting and displaying tracer data. It marks an advance over previous more tedious and ambiguous radiographic/metallographic data collection methods.

Schneider, Judy↗
NASA NTRSDate not supplied

Convolutional Neural Networks for Image Classification in Metal Selective Laser Meting Additive Manufacturing

Selective laser melting (SLM) is a metal additive manufacturing process that has several advantages such as the large range of metal materials that can be accommodated, 3D printing of complex shape components, the ability to adjust material properties, and cost reduction as expensive production equipment may not be required. Therefore, process monitoring is crucial in different stages of the component building. In this work, convolutional neural networks (CNNs) are investigated as a suitable technique for post-inspection of builds. The monitoring of manufactured parts was conducted by collecting computed tomography (CT) images and identifying defects. Five CNN models were implemented and tested for the classification of the CT images. The models were based on NASNetMobile and DenseNet121, and a custom built CNN model. The results of this work show that CNNs can be feasible and reliable for rapid monitoring and classification of defects in CT images from build fabrication using SLM.

Rodolfo Ledesma↗
NASA NTRS2004

Computer Tomography 3-D Imaging of the Metal Deformation Flow Path in Friction Stir Welding

In friction stir welding, a rotating threaded pin tool is inserted into a weld seam and literally stirs the edges of the seam together. This solid-state technique has been successfully used in the joining of materials that are difficult to fusion weld such as aluminum alloys. To determine optimal processing parameters for producing a defect free weld, a better understanding of the resulting metal deformation flow path is required. Marker studies are the principal method of studying the metal deformation flow path around the FSW pin tool. In our study, we have used computed tomography (CT) scans to reveal the flow pattern of a lead wire embedded in a FSW weld seam. At the welding temperature of aluminum, the lead becomes molten and thus tracks the aluminum deformation flow paths in a unique 3-dimensional manner. CT scanning is a convenient and comprehensive way of collecting and displaying tracer data. It marks an advance over previous more tedious and ambiguous radiographic/metallographic data collection methods.

Schneider, Judy↗
NASA NTRS1988

Producing CCD imaging sensor with flashed backside metal film

A backside illuminated CCD imaging sensor for reading out image charges from wells of the array of pixels is significantly improved for blue, UV, far UV and low energy x-ray wavelengths (1-5000.ANG.) by so overthinning the backside as to place the depletion edge at the surface and depositing a thin transparent metal film of about 10.ANG. on a native-quality oxide film of less than about 30.ANG. grown on the thinned backside. The metal is selected to have a higher work function than that of the semiconductor to so bend the energy bands (at the interface of the semiconductor material and the oxide film) as to eliminate wells that would otherwise trap minority carriers. A bias voltage may be applied to extend the frontside depletion edge to the interface of the semiconductor material with the oxide film in the event there is not sufficient thinning. This metal film (flash gate), which improves and stabilizes the quantum efficiency of a CCD imaging sensor, will also improve the QE of any p-n junction photodetector.

Janesick, James R.↗
NASA NTRS1991

CCD imaging sensor with flashed backside metal film

A backside illuminated CCD imaging sensor for reading out image charges from wells of the array of pixels is significantly improved for blue, UV, far UV and low energy x-ray wavelengths (1-5000.ANG.) by so overthinning the backside as to place the depletion edge at the surface and depositing a thin transparent metal film of about 10.ANG. on a native-quality oxide film of less than about 30.ANG. grown on the thinned backside. The metal is selected to have a higher work function than that of the semiconductor to so bend the energy bands (at the interface of the semiconductor material and the oxide film) as to eliminate wells that would otherwise trap minority carriers. A bias voltage may be applied to extend the frontside depletion edge to the interface of the semiconductor material with the oxide film in the event there is not sufficient thinning. This metal film (flash gate), which improves and stabilizes the quantum efficiency of a CCD imaging sensor, will also improve the QE of any p-n junction photodetector.

Janesick, James R.↗
NASA NTRS1992

Imaging flaws in thin metal plates using a magneto-optic device

An account is given of the capabilities of the magnetooptic/eddy-current imager (MEI) apparatus in the case of aging aircraft structure-type flaws in 2024-T3 Al alloy plates. Attention is given to images of cyclically grown fatigue cracks from rivetted joints in fabricated lap-joint structures, electrical discharge machining notches, and corrosion spots. Although conventional eddy-current methods could have been used, the speed and ease of MEI's use in these tests is unmatched by such means. Results are displayed in real time as a test piece is scanned, furnishing easily interpreted flaw images.

Wincheski, B.↗
NASA NTRS1989

Microwave and camera sensor fusion for the shape extraction of metallic 3D space objects

The vacuum of space presents special problems for optical image sensors. Metallic objects in this environment can produce intense specular reflections and deep shadows. By combining the polarized RCS with an incomplete camera image, it has become possible to better determine the shape of some simple three-dimensional objects. The radar data are used in an iterative procedure that generates successive approximations to the target shape by minimizing the error between computed scattering cross-sections and the observed radar returns. Favorable results have been obtained for simulations and experiments reconstructing plates, ellipsoids, and arbitrary surfaces.

Shaw, Scott W.↗
NASA NTRS1989

Image understanding and interpretation in microwave diversity imaging

The authors investigate microwave imaging of metallic objects using a diversity method and interpret and predict the reconstructed image from an approach based on analysis of the scattering mechanism and a back-projection algorithm used in image retrieval. The connection between the various scattering mechanisms and the reconstructed images is discussed, what the images represent is interpreted, and a prediction is made as to what the image will look like over given spectral and angular windows. A brief description is given of the microwave diversity imaging system and the formulation of the microwave diversity imaging based on the physical optics approximation. The scattering mechanism of a complex shaped metallic object is then briefly reviewed and an alternate approach to interpreting the reconstructed image based on the understanding of the scattering mechanism and the reconstruction algorithm is given. Several numerical and experimental examples are included to support this interpretation approach.

Li, Hsueh-Jyh↗
NASA NTRS1986

Primary magmatic carbon in ureilites - Evidence from cohenite-bearing metallic spherules

The compositions and mineralogy of metal-sulfide spherules trapped in ureilites are studied. Electron microprobe analyses of metallic phases and sulfides in spherules were conducted and backscattered electron images of metallic spherules in olivine and in ureilites are presented. It is observed that the spherules are composed of cohenite, Fe-Ni metal, troilite, and rare phosphorus-bearing minerals. The intergranular metal and graphite in the ureilites are analyzed. The phase relations of cohenite-bearing spherules are considered. Spherules represent Fe-Ni-C-S alloys that exist as immiscible metallic liquid droplets in the silicate magma from which ureilite olivine and pigeonite crystallized. The data reveal that graphite crystals occur as inclusions in olivine and ureilites and therefore graphite in ureilites is a primary magnetic component. It is hypothesized that graphite is a residue from the solid source materials that melted to produce the ureilite parent magma or crystallized from the magma.

Goodrich, C. A.↗
NASA NTRS1999

Nondestructive Superresolution Imaging of Defects and Nonuniformities in Metals, Semiconductors, Dielectrics, Composites, and Plants Using Evanescent Microwaves

We have imaged and mapped material nonuniformities and defects using microwaves generated at the end of a microstripline resonator with 0.4 micrometer lateral spatial resolution at 1 GHz. Here we experimentally examine the effect of microstripline substrate permittivity, the feedline-to-resonator coupling strength, and probe tip geometry on the spatial resolution of the probe. Carbon composites, dielectrics, semiconductors, metals, and botanical samples were scanned for defects, residual stresses, subsurface features, areas of different film thickness, and moisture content. The resulting evanescent microwave probe (EMP) images are discussed. The main objective of this work is to demonstrate the overall capabilities of the EMP imaging technique as well as to discuss various probe parameters that can be used to design EMPs for different applications.

Tabib-Azar, M.↗
NASA NTRS2007

Sources of and Remedies for Removing Unwanted Reflections in Millimeter Wave Images of Complex SOFI-Covered Structures

In the recent years, continuous-wave (CW) near-field and lens-focused millimeter wave imaging systems have been effectively. used to demonstrate their utility for producing high-resolution images of metallic structures covered with spray on foam insulation (SOFI) such as the space shuttle external tank. These systems have produced images with a spatial resolution of approximately 2 mm at a frequency of 150 GHz, and can easily interrogate thin as well as thick SOFI (> 9") enabling detection and evaluation of flaws such as voids, disbands, delaminations and corrosion. These systems are relatively simple, inexpensive, easy-to-use, require little to no signal processing of the raw data, on-site friendly, real-time and small. However, for some specific structures a certain interference pattern may be superimposed on the produced images. Generally, this occurs when the SOFI surface is at a relatively significant angle with respect to the surface of the substrate (or other sub-structures) on which it is sprayed. Consequently, the reflection from the surface of the SOFI and that from the substrate (or sub-structure) coherently combine into an interference pattern as the SOFI surface is scanned. There are methods by which the influence of this unwanted interference can be reduced, such as the incorporation of an incidence angle and the proper use of signal polarization. This paper presents the basics of this problem and describes the use of the methods for reducing this unwanted influence through several specific examples. A discussion on how the use of a swept-frequency or pulsed method may also alleviate this problem is also presented.

Khakovsky, S.↗
NASA NTRS2001

Carbon Nanotube Tip Probes: Stability and Lateral Resolution in Scanning Probe Microscopy and Application to Surface Science to Semiconductors

In this paper we present results on the stability and lateral resolution capability of carbon nanotube (CNT) scanning probes as applied to atomic force microscopy (AFM). Surface topography images of ultra-thin films (2-5 nm thickness) obtained with AFM are used to illustrate the lateral resolution capability of single-walled carbon nanotube probes. Images of metal films prepared by ion beam sputtering exhibit grain sizes ranging from greater than 10 nm to as small as approximately 2 nm for gold and iridium respectively. In addition, imaging stability and lifetime of multi-walled carbon nanotube scanning probes are studied on a relatively hard surface of silicon nitride (Si3N4). AFM images Of Si3N4 surface collected after more than 15 hrs of continuous scanning show no detectable degradation in lateral resolution. These results indicate the general feasibility of CNT tips and scanning probe microscopy for examining nanometer-scale surface features of deposited metals as well as non-conductive thin films. AFM coupled with CNT tips offers a simple and nondestructive technique for probing a variety of surfaces, and has immense potential as a surface characterization tool in integrated circuit manufacturing.

Nguyen, Cattien V.↗