SEARCH · Search NASA

Results for “single-event upset advanced commercial power PC processors”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

SourceResearch connectionFrom yearThrough year

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

1 records

All sources NASA NTRS DOE OSTI

NASA NTRS2003

Single-event upset in advanced commercial power PC microprocessors

Single-event upset from heavy ions in measured for advanced commercial microprocessors, comparing upset sensitivity in registers and d-cache for several generations of devices. Multiple-bit upsets and asymmetry in registers upset cross sections are also discussed.

single-event upset advanced commercial power PC pr↗