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Results for “two-port equivalent”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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7 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2021

Power System Network Reduction for Power Hardware-in-the-Loop Simulation

This paper proposes single-port equivalent and two-port equivalent network reduction methods to respectively reduce single-port and two-port areas in a large power network. Parameters of the reduced systems are rigorously derived, which guarantees that the electrical quantities at the port(s) remain unchanged over the reduction, including voltage magnitude and phase and active and reactive power injections into the area to be reduced. The proposed techniques are applied to reduce a practical Maui grid, where the total numbers of buses, lines and transformers are respectively reduced from 212, 106 and 108 to 45, 30 and 13. Dynamic behaviors between the full model and the reduced model are compared in detail to illustrate the efficacy and accuracy of the proposed network reduction.

model reduction↗
DOE OSTI2021

Network Reduction for Power Hardware-in-the-Loop (PHIL) Simulation

This paper proposes single-port equivalent and two-port equivalent network reduction methods to respectively reduce single-port and two-port areas in a large power network. Parameters of the reduced systems are rigorously derived, which guarantees that the electrical quantities at the port(s) remain unchanged over the reduction, including voltage magnitude and phase and active and reactive power injections into the area to be reduced. The proposed techniques are applied to reduce a practical Maui grid, where the total numbers of buses, lines and transformers are respectively reduced from 212, 106 and 108 to 45, 30 and 13. Dynamic behaviors between the full model and the reduced model are compared in detail to illustrate the efficacy and accuracy of the proposed network reduction.

41 EE - Solar Energy Technologies Office (EE-4S)↗
DOE OSTI2021

Power System Network Reduction for Power Hardware-in-the-Loop Simulation: Preprint

This paper proposes a single-port equivalent and a two-port equivalent to respectively reduce single-port and two-port areas in a large power network. Parameters of the reduced systems are rigorously derived, which guarantees that the electrical quantities at the port remain unchanged over the reduction, including voltage magnitude and phase, active and reactive power injections into the area to be reduced. The proposed techniques are applied to reduce a practical Maui grid, where the total numbers of buses, lines and transformers are respectively reduced from 212, 106 and 108 to 45, 30 and 13. Dynamic behaviors between the full model and the reduced model are compared in detail to illustrate the efficacy and accuracy of the proposed network reduction.

41 EE - Solar Energy Technologies Office (EE-4S)↗
NASA NTRS2006

Equipment for On-Wafer Testing From 220 to 325 GHz

A system of electronic instrumentation, constituting the equivalent of a two-port vector network analyzer, has been developed for use in on-wafer measurement of key electrical characteristics of semiconductor devices at frequencies from 220 to 325 GHz. A prior system designed according to similar principles was reported in Equipment for On-Wafer Testing at Frequencies Up to 220 GHz (NPO-20760), NASA Tech Briefs, Vol. 25, No. 11 (November 2001), page 42. As one would expect, a major source of difficulty in progressing to the present higher-frequency-range system was the need for greater mechanical precision as wavelengths shorten into the millimeter range, approaching the scale of mechanical tolerances of prior systems. The system (see figure) includes both commercial off-the-shelf and custom equipment. As in the system of the cited prior article, the equipment includes test sets that are extended versions of commercial network analyzers that function in a lower frequency range. The extension to the higher frequency range is accomplished by use of custom frequency-extension modules that contain frequency multipliers and harmonic mixers. On-wafer measurement is made possible by waveguide wafer probes that were custom designed and built for this wavelength range, plus an on-wafer calibration substrate designed for use with these probes. In this case, the calibration substrate was specially fabricated by laser milling. The system was used to make the first on-wafer measurements of a semiconductor device in the frequency range from 220 to 320 GHz. Some of the measurement results showed that the device had gain.

Samoska, Lorene↗
NASA NTRS1974

MICTPT - A minicomputer general-purpose microwave two-port analysis program

The implementation of a microwave network-analysis program for computers with 4K words of memory is described. The program is capable of the frequency analysis of networks which include interconnections of lumped elements, transmission lines, waveguides, and any two-port which is described by the elements of a scattering matrix. The network can be described mnemonically rather than by numerical codes. For each frequency in the range, the entire network is collapsed into a single equivalent A matrix, and the input impedance and other characteristics are calculated.

Olson, D. H.↗
NASA NTRS1992

Broadband vertical interconnects using slot-coupled shielded microstrip lines

A full-wave space-domain integral equation analysis of aperture coupled shielded microstrip lines is presented based on the Equivalence Principle. The formulation includes the capability to model multilayered substrates through the derivation of the associated dyadic Green's functions which represent the layers through impedance boundary conditions. The method of moments is used to solve for the line currents and slot voltage with even and odd mode excitations which are then interpreted through transmission line analysis to determine the two-port scattering parameters. A parametric study together with experimental data is presented which demonstrates the behavior of the coupler and the accuracy of the technique.

Vandenberg, Norman L.↗
NASA NTRS1991

Theoretical and experimental characterization of coplanar waveguide discontinuities for filter applications

A full-wave analysis of shielded coplanar waveguide two-port discontinuities based on the solution of an appropriate surface integral equation in the space domain is presented. Frequency-dependent scattering parameters for open-end and short-end coplanar waveguide (CPW) stubs are computed using this method. The numerically derived results are compared with measurements performed in the frequency range 5-25 GHz and show very good agreement. From the scattering parameters, lumped-element equivalent circuits have been derived to model the discontinuities. The inductors and capacitors of these models have been represented by closed-form equations, as functions of the stub length, to compute the circuit element values for these discontinuities.

Dib, Nihad I.↗