NASA NTRS · 19850000158
Modeling "Soft" Errors in Bipolar Integrated Circuits
Abstract
Mathematical models represent single-event upset in bipolar memory chips. Physics of single-event upset in integrated circuits discussed in theoretical paper. Pair of companion reports present mathematical models to predict critical charges for producing single-event upset in bipolar randomaccess memory (RAM) chips.
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Zoutendyk, J., Benumof, R., Vonroos, O.. 1985-10-01. Modeling "Soft" Errors in Bipolar Integrated Circuits. https://ntrs.nasa.gov/citations/19850000158
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