NASA NTRS · 19910037022
Microhardness variations in II-VI semiconducting compounds as a function of composition
Abstract
A comparison is made of microhardness variations as a function of composition in directionally solidified alloys of Hg(1-x)Cd(x)Te, Hg(1-x)Zn(x)Te, Hg(1-x)Cd(x)Se, and Hg(1-x)Zn(x)Se, using the same growth method for all four systems in order to eliminate preparation-induced mechanical property variations. In each case, compositional analysis was performed next to a microhardness indentation. Due to the 14-percent shorter bond length of ZnTe relative to HgTe, Zn-base alloy mechanical strength should exceed that of Cd-base systems. Experimental verification is furnished for this hardening effect in both Hg(1-x)Zn(x)Te and Hg(1-x)Zn(x)Se.
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Andrews, R. N., Walck, S. D., Price, M. W., Szofran, F. R., Su, C.-H., Lehoczky, S. L.. 1990-01-01. Microhardness variations in II-VI semiconducting compounds as a function of composition. https://ntrs.nasa.gov/citations/19910037022
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