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NASA NTRS · 19930030797

Critical range evaluation using a diagonal flat plate

Abstract

A novel technique is presented to image stray signals in RCS measurement ranges. In this technique, the scattered fields of a flat plate in the diagonal plane are measured in a range for various frequencies and look angles. The scattered field data is then processed to generate an inverse synthetic aperture radar (ISAR) image of the diagonal flat plate. It is shown that scattering mechanisms associated with various stray signals can be identified by using the ISAR image. This leads to better understanding of the range and possible chamber improvements. Scattering mechanisms as small as 90 dB below the plate broadside scattered field level have been observed in the image domain due to the high directivity and low sidelobe characteristics associated with the diagonal flat plate backscattered fields. The results obtained from evaluating the two compact range facilities at The Ohio State University ElectroScience Laboratory are presented to illustrate the virtues of this new range evaluation technique.

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BibTeXRIS

Lee, Teh-Hong, Clark, Tony L., Burnside, Walter D., Gupta, Inder J.. 1992-08-01. Critical range evaluation using a diagonal flat plate. https://ntrs.nasa.gov/citations/19930030797

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